CN1720610B - 具有铜背部金属结构的薄GaAs管芯 - Google Patents
具有铜背部金属结构的薄GaAs管芯 Download PDFInfo
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- CN1720610B CN1720610B CN038254352A CN03825435A CN1720610B CN 1720610 B CN1720610 B CN 1720610B CN 038254352 A CN038254352 A CN 038254352A CN 03825435 A CN03825435 A CN 03825435A CN 1720610 B CN1720610 B CN 1720610B
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- gaas
- layer
- gaas substrate
- metal layer
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/306,834 US6870243B2 (en) | 2002-11-27 | 2002-11-27 | Thin GaAs die with copper back-metal structure |
| US10/308,334 | 2002-11-27 | ||
| PCT/US2003/030861 WO2004051733A1 (en) | 2002-11-27 | 2003-09-30 | Thin gaas die with copper back-metal structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1720610A CN1720610A (zh) | 2006-01-11 |
| CN1720610B true CN1720610B (zh) | 2010-10-13 |
Family
ID=32325776
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN038254352A Expired - Fee Related CN1720610B (zh) | 2002-11-27 | 2003-09-30 | 具有铜背部金属结构的薄GaAs管芯 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US6870243B2 (enExample) |
| JP (1) | JP2006517054A (enExample) |
| KR (1) | KR20050085143A (enExample) |
| CN (1) | CN1720610B (enExample) |
| AU (1) | AU2003277129A1 (enExample) |
| TW (1) | TWI339425B (enExample) |
| WO (1) | WO2004051733A1 (enExample) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6870243B2 (en) * | 2002-11-27 | 2005-03-22 | Freescale Semiconductor, Inc. | Thin GaAs die with copper back-metal structure |
| US6833289B2 (en) * | 2003-05-12 | 2004-12-21 | Intel Corporation | Fluxless die-to-heat spreader bonding using thermal interface material |
| US20050085084A1 (en) * | 2003-10-16 | 2005-04-21 | Chang Edward Y. | Method of fabricating copper metallization on backside of gallium arsenide devices |
| US7221055B2 (en) * | 2005-05-23 | 2007-05-22 | Texas Instruments Incorporated | System and method for die attach using a backside heat spreader |
| US7923842B2 (en) | 2006-03-16 | 2011-04-12 | Skyworks Solutions, Inc. | GaAs integrated circuit device and method of attaching same |
| CN100449740C (zh) * | 2006-06-19 | 2009-01-07 | 上海集成电路研发中心有限公司 | 降低半导体器件发热的散热方法、相应器件及其制造方法 |
| JP4917375B2 (ja) * | 2006-07-25 | 2012-04-18 | 株式会社豊田中央研究所 | パワー半導体モジュールの製造方法 |
| CN101641785B (zh) * | 2006-11-09 | 2011-07-13 | 怡得乐Qlp公司 | 具有延展层的微电路封装体 |
| US20090108437A1 (en) * | 2007-10-29 | 2009-04-30 | M/A-Com, Inc. | Wafer scale integrated thermal heat spreader |
| JP5103245B2 (ja) | 2008-03-31 | 2012-12-19 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US8987878B2 (en) | 2010-10-29 | 2015-03-24 | Alpha And Omega Semiconductor Incorporated | Substrateless power device packages |
| US8415805B2 (en) | 2010-12-17 | 2013-04-09 | Skyworks Solutions, Inc. | Etched wafers and methods of forming the same |
| JP2013098481A (ja) * | 2011-11-04 | 2013-05-20 | Sumitomo Electric Device Innovations Inc | 半導体装置 |
| US8900969B2 (en) | 2012-01-27 | 2014-12-02 | Skyworks Solutions, Inc. | Methods of stress balancing in gallium arsenide wafer processing |
| CN103377914A (zh) * | 2012-04-18 | 2013-10-30 | 稳懋半导体股份有限公司 | 半导体元件背面铜金属的改良结构及其加工方法 |
| US9093506B2 (en) | 2012-05-08 | 2015-07-28 | Skyworks Solutions, Inc. | Process for fabricating gallium arsenide devices with copper contact layer |
| JP2014099547A (ja) * | 2012-11-15 | 2014-05-29 | Mitsubishi Electric Corp | 電力半導体モジュールおよびその製造方法 |
| US9530719B2 (en) | 2014-06-13 | 2016-12-27 | Skyworks Solutions, Inc. | Direct die solder of gallium arsenide integrated circuit dies and methods of manufacturing gallium arsenide wafers |
| TWI660471B (zh) * | 2017-10-06 | 2019-05-21 | 財團法人工業技術研究院 | 晶片封裝 |
| US11133241B2 (en) | 2019-06-28 | 2021-09-28 | Stmicroelectronics, Inc. | Semiconductor package with a cavity in a die pad for reducing voids in the solder |
| CN112989744B (zh) * | 2021-02-08 | 2023-11-17 | 泰凌微电子(上海)股份有限公司 | 一种半导体芯片的封装设计方法以及装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN86101652A (zh) * | 1985-03-14 | 1986-11-12 | 奥林公司 | 半导体芯片附着装置 |
| US5851154A (en) * | 1994-11-29 | 1998-12-22 | Moser; Alfeo | Perfected amusement ride |
| US6211550B1 (en) * | 1999-06-24 | 2001-04-03 | Intersil Corporation | Backmetal drain terminal with low stress and thermal resistance |
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- 2003-09-30 WO PCT/US2003/030861 patent/WO2004051733A1/en not_active Ceased
- 2003-09-30 JP JP2004557131A patent/JP2006517054A/ja active Pending
- 2003-09-30 AU AU2003277129A patent/AU2003277129A1/en not_active Abandoned
- 2003-09-30 KR KR1020057009331A patent/KR20050085143A/ko not_active Ceased
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Also Published As
| Publication number | Publication date |
|---|---|
| WO2004051733A1 (en) | 2004-06-17 |
| AU2003277129A1 (en) | 2004-06-23 |
| US6870243B2 (en) | 2005-03-22 |
| KR20050085143A (ko) | 2005-08-29 |
| US20050127480A1 (en) | 2005-06-16 |
| CN1720610A (zh) | 2006-01-11 |
| TW200416970A (en) | 2004-09-01 |
| JP2006517054A (ja) | 2006-07-13 |
| US20040099932A1 (en) | 2004-05-27 |
| US7092890B2 (en) | 2006-08-15 |
| TWI339425B (en) | 2011-03-21 |
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