CN1666295A - 可擦除且可编程非易失性单元 - Google Patents
可擦除且可编程非易失性单元 Download PDFInfo
- Publication number
- CN1666295A CN1666295A CN038161680A CN03816168A CN1666295A CN 1666295 A CN1666295 A CN 1666295A CN 038161680 A CN038161680 A CN 038161680A CN 03816168 A CN03816168 A CN 03816168A CN 1666295 A CN1666295 A CN 1666295A
- Authority
- CN
- China
- Prior art keywords
- transistor
- unit
- gate
- floating boom
- channel transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007667 floating Methods 0.000 claims abstract description 36
- 239000003990 capacitor Substances 0.000 claims abstract description 8
- 230000000295 complement effect Effects 0.000 claims abstract description 6
- 238000009792 diffusion process Methods 0.000 claims description 4
- 229920000642 polymer Polymers 0.000 claims description 2
- 238000005516 engineering process Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 238000010276 construction Methods 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 239000002784 hot electron Substances 0.000 description 3
- 238000001259 photo etching Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 230000001413 cellular effect Effects 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- -1 polyoxy Polymers 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/30—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0441—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0441—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates
- G11C16/045—Floating gate memory cells with both P and N channel memory transistors, usually sharing a common floating gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
- H01L29/7881—Programmable transistors with only two possible levels of programmation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
- G11C2216/02—Structural aspects of erasable programmable read-only memories
- G11C2216/10—Floating gate memory cells with a single polysilicon layer
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
- Read Only Memory (AREA)
- Medicines Containing Material From Animals Or Micro-Organisms (AREA)
- Immobilizing And Processing Of Enzymes And Microorganisms (AREA)
- Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
Abstract
Description
Vd(n-ch) | Vcg | Vd(p-ch) | |
编程 | 7.0 | 8.0 | 浮动 |
读取 | 浮动 | Vdd | 1到2.5V |
Claims (8)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02015181.7 | 2002-07-08 | ||
EP02015181 | 2002-07-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1666295A true CN1666295A (zh) | 2005-09-07 |
CN100431050C CN100431050C (zh) | 2008-11-05 |
Family
ID=30011062
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB038161680A Expired - Fee Related CN100431050C (zh) | 2002-07-08 | 2003-06-25 | 可擦除且可编程非易失性单元及其操作方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7289362B2 (zh) |
EP (1) | EP1522078B1 (zh) |
JP (1) | JP4749714B2 (zh) |
CN (1) | CN100431050C (zh) |
AT (1) | ATE371933T1 (zh) |
AU (1) | AU2003242913A1 (zh) |
DE (1) | DE60315985T2 (zh) |
WO (1) | WO2004006264A2 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4889268B2 (ja) * | 2005-09-22 | 2012-03-07 | ルネサスエレクトロニクス株式会社 | Eepromとeepromの駆動方法 |
FR2904464A1 (fr) * | 2006-07-27 | 2008-02-01 | St Microelectronics Sa | Circuit eeprom de retention de charges pour mesure temporelle |
DE602007007219D1 (de) * | 2006-07-27 | 2010-07-29 | St Microelectronics Sa | Selements zur zeitmessung |
US8331203B2 (en) * | 2006-07-27 | 2012-12-11 | Stmicroelectronics S.A. | Charge retention circuit for a time measurement |
FR2904463A1 (fr) * | 2006-07-27 | 2008-02-01 | St Microelectronics Sa | Programmation d'un circuit de retention de charges pour mesure temporelle |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03179780A (ja) * | 1989-12-07 | 1991-08-05 | Fujitsu Ltd | 半導体装置 |
EP0493640B1 (en) * | 1990-12-31 | 1995-04-19 | STMicroelectronics S.r.l. | EEPROM cell with single metal level gate having a (read) interface toward the external circuitry isolated from the (write/erase) interface toward the programming circuitry |
US5247478A (en) * | 1992-03-06 | 1993-09-21 | Altera Corporation | Programmable transfer-devices |
US5615150A (en) * | 1995-11-02 | 1997-03-25 | Advanced Micro Devices, Inc. | Control gate-addressed CMOS non-volatile cell that programs through gates of CMOS transistors |
US5646901A (en) * | 1996-03-26 | 1997-07-08 | Advanced Micro Devices, Inc. | CMOS memory cell with tunneling during program and erase through the NMOS and PMOS transistors and a pass gate separating the NMOS and PMOS transistors |
US5838040A (en) * | 1997-03-31 | 1998-11-17 | Gatefield Corporation | Nonvolatile reprogrammable interconnect cell with FN tunneling in sense |
JP4000654B2 (ja) * | 1997-02-27 | 2007-10-31 | セイコーエプソン株式会社 | 半導体装置及び電子機器 |
WO1998047151A1 (en) * | 1997-04-11 | 1998-10-22 | Programmable Silicon Solutions | Electrically erasable nonvolatile memory |
US5933732A (en) * | 1997-05-07 | 1999-08-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Nonvolatile devices with P-channel EEPROM devices as injector |
US5892709A (en) * | 1997-05-09 | 1999-04-06 | Motorola, Inc. | Single level gate nonvolatile memory device and method for accessing the same |
JP4666783B2 (ja) * | 2000-02-01 | 2011-04-06 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US6816154B2 (en) * | 2001-05-30 | 2004-11-09 | Palmone, Inc. | Optical sensor based user interface for a portable electronic device |
EP1306854A1 (en) * | 2001-10-29 | 2003-05-02 | Dialog Semiconductor GmbH | Floating gate programmable cell array for standard CMOS |
-
2003
- 2003-06-25 DE DE60315985T patent/DE60315985T2/de not_active Expired - Lifetime
- 2003-06-25 AT AT03762837T patent/ATE371933T1/de not_active IP Right Cessation
- 2003-06-25 WO PCT/IB2003/002807 patent/WO2004006264A2/en active IP Right Grant
- 2003-06-25 CN CNB038161680A patent/CN100431050C/zh not_active Expired - Fee Related
- 2003-06-25 JP JP2004519081A patent/JP4749714B2/ja not_active Expired - Fee Related
- 2003-06-25 US US10/520,340 patent/US7289362B2/en not_active Expired - Fee Related
- 2003-06-25 AU AU2003242913A patent/AU2003242913A1/en not_active Abandoned
- 2003-06-25 EP EP03762837A patent/EP1522078B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE60315985D1 (de) | 2007-10-11 |
JP4749714B2 (ja) | 2011-08-17 |
EP1522078A2 (en) | 2005-04-13 |
AU2003242913A1 (en) | 2004-01-23 |
JP2005532684A (ja) | 2005-10-27 |
EP1522078B1 (en) | 2007-08-29 |
DE60315985T2 (de) | 2008-05-21 |
CN100431050C (zh) | 2008-11-05 |
ATE371933T1 (de) | 2007-09-15 |
WO2004006264A2 (en) | 2004-01-15 |
WO2004006264A3 (en) | 2004-03-18 |
US7289362B2 (en) | 2007-10-30 |
US20050259488A1 (en) | 2005-11-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5892709A (en) | Single level gate nonvolatile memory device and method for accessing the same | |
US7839680B2 (en) | Electrically erasable programmable read-only memory (EEPROM) cell and methods for forming and reading the same | |
US7531868B2 (en) | Non-volatile semiconductor memory device | |
JPH11186419A (ja) | 不揮発性半導体記憶装置 | |
US11152383B2 (en) | Non-volatile memory (NVM) cell structure to increase reliability | |
US9368506B2 (en) | Integrated circuits and methods for operating integrated circuits with non-volatile memory | |
US6620683B1 (en) | Twin-bit memory cell having shared word lines and shared bit-line contacts for electrically erasable and programmable read-only memory (EEPROM) and method of manufacturing the same | |
US6545310B2 (en) | Non-volatile memory with a serial transistor structure with isolated well and method of operation | |
CN1320622C (zh) | 半导体元件及系统、晶片、晶片的用途及其测量方法 | |
KR100883282B1 (ko) | Eeprom | |
CN100431050C (zh) | 可擦除且可编程非易失性单元及其操作方法 | |
US20100213529A1 (en) | Semiconductor field-effect transistor, memory cell and memory device | |
KR19980086818A (ko) | 불휘발성 반도체 기억 장치 및 불휘발성 반도체 기억 장치의 제조 방법 | |
CN1638132A (zh) | Eeprom和闪速eeprom | |
US7102188B1 (en) | High reliability electrically erasable and programmable read-only memory (EEPROM) | |
KR19980055708A (ko) | 플래쉬 메모리 셀 | |
CN1277308C (zh) | 同时制造闪存元件及模拟电容器的方法 | |
JP4481004B2 (ja) | メモリーセルおよびメモリーセルに書込みを行う方法 | |
KR20010045232A (ko) | 플래시 메모리 셀 및 그 제조방법 | |
KR20090070468A (ko) | 반도체 소자 및 그 제조 방법 | |
CN1612350A (zh) | 适用于快闪的字节操作的非易失存储技术 | |
CN1285126C (zh) | 半导体存储装置 | |
KR100623185B1 (ko) | 반도체 장치 및 이의 제조 방법 | |
KR0151186B1 (ko) | 불휘발성 반도체 메모리장치의 제조방법 | |
US20070267683A1 (en) | Nonvolatile memory cell of a circuit integrated in a semiconductor chip, method for producing the same, and application of a nonvolatile memory cell |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: NXP CO., LTD. Free format text: FORMER OWNER: KONINKLIJKE PHILIPS ELECTRONICS N.V. Effective date: 20070810 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20070810 Address after: Holland Ian Deho Finn Applicant after: Koninkl Philips Electronics NV Address before: Holland Ian Deho Finn Applicant before: Koninklijke Philips Electronics N.V. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: KALAI HANXILE CO., LTD. Free format text: FORMER OWNER: KONINKL PHILIPS ELECTRONICS NV Effective date: 20120116 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20120116 Address after: American Delaware Patentee after: NXP BV Address before: Holland Ian Deho Finn Patentee before: Koninkl Philips Electronics NV |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20081105 Termination date: 20130625 |