CN1421868A - 具有测试压缩功能的存储电路 - Google Patents
具有测试压缩功能的存储电路 Download PDFInfo
- Publication number
- CN1421868A CN1421868A CN02154365A CN02154365A CN1421868A CN 1421868 A CN1421868 A CN 1421868A CN 02154365 A CN02154365 A CN 02154365A CN 02154365 A CN02154365 A CN 02154365A CN 1421868 A CN1421868 A CN 1421868A
- Authority
- CN
- China
- Prior art keywords
- output
- test
- circuit
- control circuit
- outlet terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 170
- 230000006835 compression Effects 0.000 title claims description 54
- 238000007906 compression Methods 0.000 title claims description 54
- 230000004044 response Effects 0.000 claims description 14
- 238000007689 inspection Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 10
- 101100383079 Schizosaccharomyces pombe (strain 972 / ATCC 24843) cdb4 gene Proteins 0.000 description 9
- 238000001514 detection method Methods 0.000 description 8
- 241001269238 Data Species 0.000 description 6
- 238000011084 recovery Methods 0.000 description 6
- 238000012795 verification Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 208000012978 nondisjunction Diseases 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/40—Response verification devices using compression techniques
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
- Dram (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP363871/01 | 2001-11-29 | ||
JP363871/2001 | 2001-11-29 | ||
JP2001363871A JP3874653B2 (ja) | 2001-11-29 | 2001-11-29 | 圧縮テスト機能を有するメモリ回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1421868A true CN1421868A (zh) | 2003-06-04 |
CN1252730C CN1252730C (zh) | 2006-04-19 |
Family
ID=19174137
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB021543658A Expired - Fee Related CN1252730C (zh) | 2001-11-29 | 2002-11-29 | 具有测试压缩功能的存储电路 |
Country Status (7)
Country | Link |
---|---|
US (1) | US6731553B2 (zh) |
EP (1) | EP1316966B1 (zh) |
JP (1) | JP3874653B2 (zh) |
KR (1) | KR100822980B1 (zh) |
CN (1) | CN1252730C (zh) |
DE (1) | DE60228809D1 (zh) |
TW (1) | TW594777B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100399295C (zh) * | 2004-11-04 | 2008-07-02 | 国际商业机器公司 | 管理阵列冗余数据的方法和设备 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100527535B1 (ko) * | 2003-04-17 | 2005-11-09 | 주식회사 하이닉스반도체 | 입출력 압축 회로 |
KR100541048B1 (ko) * | 2003-06-16 | 2006-01-11 | 삼성전자주식회사 | 반도체 메모리 장치 및 이 장치의 테스트 방법 |
JP2005332446A (ja) * | 2004-05-18 | 2005-12-02 | Fujitsu Ltd | 半導体メモリ |
US7120051B2 (en) * | 2004-12-14 | 2006-10-10 | Sandisk Corporation | Pipelined programming of non-volatile memories using early data |
US7420847B2 (en) * | 2004-12-14 | 2008-09-02 | Sandisk Corporation | Multi-state memory having data recovery after program fail |
JP5011818B2 (ja) * | 2006-05-19 | 2012-08-29 | 富士通セミコンダクター株式会社 | 半導体記憶装置及びその試験方法 |
US7596729B2 (en) * | 2006-06-30 | 2009-09-29 | Micron Technology, Inc. | Memory device testing system and method using compressed fail data |
JP2008097715A (ja) * | 2006-10-12 | 2008-04-24 | Elpida Memory Inc | 半導体メモリ及びメモリモジュール |
JP5181698B2 (ja) | 2008-01-30 | 2013-04-10 | 富士通セミコンダクター株式会社 | 半導体メモリおよび半導体メモリの製造方法 |
JP2009266317A (ja) | 2008-04-25 | 2009-11-12 | Elpida Memory Inc | 半導体記憶装置、およびデータ縮約テスト方法 |
JP2012038377A (ja) | 2010-08-05 | 2012-02-23 | Elpida Memory Inc | 半導体装置及びその試験方法 |
US8811101B2 (en) * | 2011-02-21 | 2014-08-19 | SK Hynix Inc. | SIP semiconductor system |
US10720197B2 (en) | 2017-11-21 | 2020-07-21 | Samsung Electronics Co., Ltd. | Memory device for supporting command bus training mode and method of operating the same |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2974219B2 (ja) * | 1990-08-02 | 1999-11-10 | 三菱電機株式会社 | 半導体記憶装置のテスト回路 |
JPH04328399A (ja) | 1991-04-26 | 1992-11-17 | Nippon Telegr & Teleph Corp <Ntt> | テスト機能を有する半導体メモリ |
JP3753190B2 (ja) * | 1995-04-26 | 2006-03-08 | 三菱電機株式会社 | 半導体装置 |
JP3774500B2 (ja) * | 1995-05-12 | 2006-05-17 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
KR100319887B1 (ko) * | 1999-05-04 | 2002-01-10 | 윤종용 | 프로그래머블 출력핀 지정 수단을 구비하는 반도체 메모리장치 및 이의 테스트 모드시의 독출방법 |
JP3945939B2 (ja) * | 1999-05-31 | 2007-07-18 | 富士通株式会社 | 圧縮テスト可能なメモリ回路 |
US6324087B1 (en) * | 2000-06-08 | 2001-11-27 | Netlogic Microsystems, Inc. | Method and apparatus for partitioning a content addressable memory device |
JP2001297600A (ja) * | 2000-04-11 | 2001-10-26 | Mitsubishi Electric Corp | 半導体集積回路およびそのテスト方法 |
-
2001
- 2001-11-29 JP JP2001363871A patent/JP3874653B2/ja not_active Expired - Fee Related
-
2002
- 2002-10-15 US US10/270,196 patent/US6731553B2/en not_active Expired - Lifetime
- 2002-10-17 TW TW091123963A patent/TW594777B/zh not_active IP Right Cessation
- 2002-10-21 DE DE60228809T patent/DE60228809D1/de not_active Expired - Lifetime
- 2002-10-21 EP EP02257282A patent/EP1316966B1/en not_active Expired - Lifetime
- 2002-10-28 KR KR1020020065765A patent/KR100822980B1/ko active IP Right Grant
- 2002-11-29 CN CNB021543658A patent/CN1252730C/zh not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100399295C (zh) * | 2004-11-04 | 2008-07-02 | 国际商业机器公司 | 管理阵列冗余数据的方法和设备 |
Also Published As
Publication number | Publication date |
---|---|
KR100822980B1 (ko) | 2008-04-16 |
TW594777B (en) | 2004-06-21 |
EP1316966A2 (en) | 2003-06-04 |
DE60228809D1 (de) | 2008-10-23 |
JP3874653B2 (ja) | 2007-01-31 |
CN1252730C (zh) | 2006-04-19 |
KR20030044782A (ko) | 2003-06-09 |
EP1316966A3 (en) | 2006-03-22 |
JP2003168299A (ja) | 2003-06-13 |
US6731553B2 (en) | 2004-05-04 |
EP1316966B1 (en) | 2008-09-10 |
US20030099143A1 (en) | 2003-05-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20090213 Address after: Tokyo, Japan, Japan Patentee after: Fujitsu Microelectronics Ltd. Address before: Kawasaki, Kanagawa, Japan Patentee before: Fujitsu Ltd. |
|
ASS | Succession or assignment of patent right |
Owner name: FUJITSU MICROELECTRONICS CO., LTD. Free format text: FORMER OWNER: FUJITSU LIMITED Effective date: 20090213 |
|
C56 | Change in the name or address of the patentee |
Owner name: FUJITSU SEMICONDUCTOR CO., LTD. Free format text: FORMER NAME: FUJITSU MICROELECTRON CO., LTD. |
|
CP03 | Change of name, title or address |
Address after: Japan's Kanagawa Prefecture Yokohama Patentee after: Fujitsu Semiconductor Co., Ltd. Address before: Tokyo, Japan, Japan Patentee before: Fujitsu Microelectronics Ltd. |
|
ASS | Succession or assignment of patent right |
Owner name: SUOSI FUTURE CO., LTD. Free format text: FORMER OWNER: FUJITSU SEMICONDUCTOR CO., LTD. Effective date: 20150513 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20150513 Address after: Kanagawa Patentee after: Co., Ltd. Suo Si future Address before: Yokohama City, Kanagawa Prefecture, Japan Patentee before: Fujitsu Semiconductor Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20060419 Termination date: 20151129 |