CN1295587A - 改性的多环聚合物 - Google Patents
改性的多环聚合物 Download PDFInfo
- Publication number
- CN1295587A CN1295587A CN99804515A CN99804515A CN1295587A CN 1295587 A CN1295587 A CN 1295587A CN 99804515 A CN99804515 A CN 99804515A CN 99804515 A CN99804515 A CN 99804515A CN 1295587 A CN1295587 A CN 1295587A
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- China
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- polymkeric substance
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G61/00—Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
- C08G61/02—Macromolecular compounds containing only carbon atoms in the main chain of the macromolecule, e.g. polyxylylenes
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G61/00—Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
- C08G61/02—Macromolecular compounds containing only carbon atoms in the main chain of the macromolecule, e.g. polyxylylenes
- C08G61/04—Macromolecular compounds containing only carbon atoms in the main chain of the macromolecule, e.g. polyxylylenes only aliphatic carbon atoms
- C08G61/06—Macromolecular compounds containing only carbon atoms in the main chain of the macromolecule, e.g. polyxylylenes only aliphatic carbon atoms prepared by ring-opening of carbocyclic compounds
- C08G61/08—Macromolecular compounds containing only carbon atoms in the main chain of the macromolecule, e.g. polyxylylenes only aliphatic carbon atoms prepared by ring-opening of carbocyclic compounds of carbocyclic compounds containing one or more carbon-to-carbon double bonds in the ring
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0395—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having a backbone with alicyclic moieties
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Materials For Photolithography (AREA)
Abstract
Description
聚合物组成碳酸酯/叔丁酯/酸 | 含酸官能团的重复单元的mol% | 接触角 | 聚合物实施例 |
50/50/050/40/1040/40/20 | 01020 | 78°74°69° | -2223 |
Claims (16)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US7555898P | 1998-02-23 | 1998-02-23 | |
US60/075,558 | 1998-02-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1295587A true CN1295587A (zh) | 2001-05-16 |
CN1315906C CN1315906C (zh) | 2007-05-16 |
Family
ID=22126537
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB998045152A Expired - Fee Related CN1315906C (zh) | 1998-02-23 | 1999-02-19 | 改性的多环聚合物 |
Country Status (12)
Country | Link |
---|---|
US (2) | US6451945B1 (zh) |
EP (1) | EP1060206B1 (zh) |
JP (1) | JP2002504577A (zh) |
KR (1) | KR100555605B1 (zh) |
CN (1) | CN1315906C (zh) |
AT (1) | ATE264352T1 (zh) |
AU (1) | AU2872499A (zh) |
DE (1) | DE69916434T2 (zh) |
HK (1) | HK1036290A1 (zh) |
ID (1) | ID26364A (zh) |
TW (1) | TW565575B (zh) |
WO (1) | WO1999042510A1 (zh) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2045275B1 (en) * | 1998-02-23 | 2012-01-25 | Sumitomo Bakelite Co., Ltd. | Polycyclic resist compositions with increased etch resistance |
JP4714955B2 (ja) * | 1999-09-29 | 2011-07-06 | 日本ゼオン株式会社 | 環状オレフィン系付加重合体およびその製造方法 |
JP3734012B2 (ja) * | 1999-10-25 | 2006-01-11 | 信越化学工業株式会社 | レジスト材料及びパターン形成方法 |
JP5095048B2 (ja) * | 1999-11-15 | 2012-12-12 | 信越化学工業株式会社 | 高分子化合物、レジスト材料及びパターン形成方法 |
KR100389912B1 (ko) * | 1999-12-08 | 2003-07-04 | 삼성전자주식회사 | 지환식 감광성 폴리머 및 이를 포함하는 레지스트 조성물 |
US6406828B1 (en) | 2000-02-24 | 2002-06-18 | Shipley Company, L.L.C. | Polymer and photoresist compositions |
EP1130468A3 (en) * | 2000-02-25 | 2003-07-30 | Shipley Company LLC | Polymer and photoresist compositions |
EP1127899A1 (en) * | 2000-02-25 | 2001-08-29 | Shipley Company LLC | Polymer and photoresist compositions |
JP4544389B2 (ja) * | 2000-04-28 | 2010-09-15 | 信越化学工業株式会社 | 高分子化合物、レジスト材料及びパターン形成方法 |
AU2003239123A1 (en) * | 2002-03-01 | 2003-09-16 | Massachusetts Institute Of Technology | Protecting group-containing polymers for lithographic resist compositions |
US6756180B2 (en) | 2002-10-22 | 2004-06-29 | International Business Machines Corporation | Cyclic olefin-based resist compositions having improved image stability |
US20050058606A1 (en) * | 2002-12-16 | 2005-03-17 | Boehringer Ingelheim Pharma Gmbh & Co. Kg | Tiotropium containing HFC solution formulations |
JP2006083361A (ja) * | 2003-10-24 | 2006-03-30 | Jsr Corp | アイオノマー及びその製造方法並びに成形品 |
KR20060120116A (ko) * | 2003-11-18 | 2006-11-24 | 제이에스알 가부시끼가이샤 | 신규한 (공)중합체 및 그의 제조 방법, 및 카르복실기 함유(공)중합체의 제조 방법 |
JP2005171234A (ja) * | 2003-11-18 | 2005-06-30 | Jsr Corp | 新規な(共)重合体およびその製造方法並びにカルボキシル基含有(共)重合体の製造方法 |
US7101654B2 (en) * | 2004-01-14 | 2006-09-05 | Promerus Llc | Norbornene-type monomers and polymers containing pendent lactone or sultone groups |
US7147986B2 (en) * | 2004-03-31 | 2006-12-12 | Intel Corporation | Resist compounds including acid labile groups attached to polymeric chains at anhydride linkages |
JP2007131704A (ja) | 2005-11-09 | 2007-05-31 | Fujifilm Corp | 環状オレフィン系重合体、およびそれを用いた光学材料、偏光板および液晶表示装置 |
US7727705B2 (en) * | 2007-02-23 | 2010-06-01 | Fujifilm Electronic Materials, U.S.A., Inc. | High etch resistant underlayer compositions for multilayer lithographic processes |
US8753790B2 (en) * | 2009-07-01 | 2014-06-17 | Promerus, Llc | Self-imageable film forming polymer, compositions thereof and devices and structures made therefrom |
JP5117484B2 (ja) * | 2009-12-28 | 2013-01-16 | 東京応化工業株式会社 | 新規な化合物、及びその製造方法 |
US10623846B2 (en) * | 2016-12-06 | 2020-04-14 | Bose Corporation | Earpieces employing viscoelastic materials |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6052845A (ja) * | 1983-09-02 | 1985-03-26 | Japan Synthetic Rubber Co Ltd | パタ−ン形成材料 |
US5340696A (en) * | 1993-01-29 | 1994-08-23 | Shipley Company Inc. | Photoresist compositions with copolymer binder having phenolic and nonaromatic cyclic alcohol units where the distribution of the cyclic alcohol concentration is less than 8 mole percent |
JPH07140666A (ja) * | 1993-06-04 | 1995-06-02 | Internatl Business Mach Corp <Ibm> | マイクロリトグラフィックレジスト組成物、酸不安定化合物、マイクロリトグラフィックレリーフ画像形成方法及び酸感知性ポリマー組成物 |
US5912313A (en) * | 1995-11-22 | 1999-06-15 | The B. F. Goodrich Company | Addition polymers of polycycloolefins containing silyl functional groups |
JP3804138B2 (ja) * | 1996-02-09 | 2006-08-02 | Jsr株式会社 | ArFエキシマレーザー照射用感放射線性樹脂組成物 |
ATE297562T1 (de) * | 1996-03-07 | 2005-06-15 | Sumitomo Bakelite Co | Photoresist zusammensetzungen mit polycyclischen polymeren mit säurelabilen gruppen am ende |
EP2045275B1 (en) * | 1998-02-23 | 2012-01-25 | Sumitomo Bakelite Co., Ltd. | Polycyclic resist compositions with increased etch resistance |
-
1999
- 1999-02-19 AT AT99909541T patent/ATE264352T1/de not_active IP Right Cessation
- 1999-02-19 EP EP99909541A patent/EP1060206B1/en not_active Expired - Lifetime
- 1999-02-19 ID IDW20001890A patent/ID26364A/id unknown
- 1999-02-19 US US09/253,499 patent/US6451945B1/en not_active Expired - Lifetime
- 1999-02-19 KR KR1020007009302A patent/KR100555605B1/ko not_active IP Right Cessation
- 1999-02-19 WO PCT/US1999/003771 patent/WO1999042510A1/en active IP Right Grant
- 1999-02-19 AU AU28724/99A patent/AU2872499A/en not_active Abandoned
- 1999-02-19 CN CNB998045152A patent/CN1315906C/zh not_active Expired - Fee Related
- 1999-02-19 JP JP2000532461A patent/JP2002504577A/ja active Pending
- 1999-02-19 DE DE69916434T patent/DE69916434T2/de not_active Expired - Lifetime
- 1999-04-07 TW TW088102555A patent/TW565575B/zh not_active IP Right Cessation
-
2001
- 2001-09-20 HK HK01106633A patent/HK1036290A1/xx not_active IP Right Cessation
-
2002
- 2002-08-21 US US10/224,994 patent/US6794459B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1060206A1 (en) | 2000-12-20 |
KR100555605B1 (ko) | 2006-03-03 |
DE69916434T2 (de) | 2005-03-24 |
CN1315906C (zh) | 2007-05-16 |
US20030018153A1 (en) | 2003-01-23 |
DE69916434D1 (de) | 2004-05-19 |
US6794459B2 (en) | 2004-09-21 |
AU2872499A (en) | 1999-09-06 |
WO1999042510A1 (en) | 1999-08-26 |
EP1060206B1 (en) | 2004-04-14 |
US6451945B1 (en) | 2002-09-17 |
HK1036290A1 (en) | 2001-12-28 |
ID26364A (id) | 2000-12-14 |
KR20010041217A (ko) | 2001-05-15 |
JP2002504577A (ja) | 2002-02-12 |
ATE264352T1 (de) | 2004-04-15 |
TW565575B (en) | 2003-12-11 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CI01 | Publication of corrected invention patent application |
Correction item: Applicant address Correct: North Carolina False: North Carolina, loa Number: 20 Page: 148 Volume: 17 |
|
CI02 | Correction of invention patent application |
Correction item: Applicant address Correct: North Carolina False: North Carolina, loa Number: 20 Page: The title page Volume: 17 |
|
ASS | Succession or assignment of patent right |
Owner name: SUMITOMO BAKELITE CO. Free format text: FORMER OWNER: B.F.GOODRICH CO. (US) 500 SOUTH MAIN STREET AKRON, OHIO 44318, USA |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20030731 Address after: Tokyo, Japan Applicant after: Sumitomo Bakelite Co., Ltd. Co-applicant after: International Business Machines Corp. Address before: North Carolina, loa Applicant before: B. F. Goodrich Company Co-applicant before: International Business Machines Corp. |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20070516 Termination date: 20140219 |