CN1237863C - 用于自动插装机上插装在基片上的器件的位置识别方法 - Google Patents
用于自动插装机上插装在基片上的器件的位置识别方法 Download PDFInfo
- Publication number
- CN1237863C CN1237863C CNB998114448A CN99811444A CN1237863C CN 1237863 C CN1237863 C CN 1237863C CN B998114448 A CNB998114448 A CN B998114448A CN 99811444 A CN99811444 A CN 99811444A CN 1237863 C CN1237863 C CN 1237863C
- Authority
- CN
- China
- Prior art keywords
- component
- substrate
- automatic insertion
- sensor
- identifying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 41
- 238000000034 method Methods 0.000 title claims abstract description 38
- 238000003780 insertion Methods 0.000 claims description 48
- 230000037431 insertion Effects 0.000 claims description 48
- 238000001514 detection method Methods 0.000 abstract description 2
- 238000011156 evaluation Methods 0.000 abstract 1
- 238000011179 visual inspection Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007717 exclusion Effects 0.000 description 1
- 238000003703 image analysis method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012634 optical imaging Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0815—Controlling of component placement on the substrate during or after manufacturing
Landscapes
- Engineering & Computer Science (AREA)
- Operations Research (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Manipulator (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19844456.7 | 1998-09-28 | ||
DE19844456 | 1998-09-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1320363A CN1320363A (zh) | 2001-10-31 |
CN1237863C true CN1237863C (zh) | 2006-01-18 |
Family
ID=7882526
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB998114448A Expired - Lifetime CN1237863C (zh) | 1998-09-28 | 1999-09-02 | 用于自动插装机上插装在基片上的器件的位置识别方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6408090B1 (zh) |
EP (1) | EP1118262B1 (zh) |
JP (1) | JP2002526940A (zh) |
KR (1) | KR100538912B1 (zh) |
CN (1) | CN1237863C (zh) |
AT (1) | ATE282944T1 (zh) |
DE (1) | DE59911111D1 (zh) |
WO (1) | WO2000019800A1 (zh) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6605500B2 (en) | 2000-03-10 | 2003-08-12 | Infotech Ag | Assembly process |
US7813559B2 (en) * | 2001-11-13 | 2010-10-12 | Cyberoptics Corporation | Image analysis for pick and place machines with in situ component placement inspection |
US7555831B2 (en) * | 2001-11-13 | 2009-07-07 | Cyberoptics Corporation | Method of validating component feeder exchanges |
US7239399B2 (en) * | 2001-11-13 | 2007-07-03 | Cyberoptics Corporation | Pick and place machine with component placement inspection |
KR100847294B1 (ko) * | 2001-11-22 | 2008-07-18 | 미래산업 주식회사 | 백업플레이트의 상승 제어장치 |
DE112004000479T5 (de) * | 2003-03-28 | 2006-02-16 | Assembléon N.V. | Verfahren zum Anordnen von wenigstens einem Bauelement auf wenigstens einem Substrat sowie System dafür |
US7559134B2 (en) * | 2003-11-04 | 2009-07-14 | Cyberoptics Corporation | Pick and place machine with improved component placement inspection |
US20050125993A1 (en) * | 2003-11-07 | 2005-06-16 | Madsen David D. | Pick and place machine with improved setup and operation procedure |
US7706595B2 (en) * | 2003-11-07 | 2010-04-27 | Cyberoptics Corporation | Pick and place machine with workpiece motion inspection |
US20060016066A1 (en) * | 2004-07-21 | 2006-01-26 | Cyberoptics Corporation | Pick and place machine with improved inspection |
US20060075631A1 (en) * | 2004-10-05 | 2006-04-13 | Case Steven K | Pick and place machine with improved component pick up inspection |
JP4563205B2 (ja) * | 2005-02-08 | 2010-10-13 | 富士機械製造株式会社 | 実装された電子部品の検査方法及び装置 |
US20070003126A1 (en) * | 2005-05-19 | 2007-01-04 | Case Steven K | Method and apparatus for evaluating a component pick action in an electronics assembly machine |
US7545514B2 (en) * | 2005-09-14 | 2009-06-09 | Cyberoptics Corporation | Pick and place machine with improved component pick image processing |
WO2007053557A1 (en) * | 2005-10-31 | 2007-05-10 | Cyberoptics Corporation | Electronics assembly machine with embedded solder paste inspection |
JP4803195B2 (ja) * | 2008-03-14 | 2011-10-26 | パナソニック株式会社 | 基板検査装置及び基板検査方法 |
US12063745B2 (en) * | 2020-05-05 | 2024-08-13 | Integrated Dynamics Engineering Gmbh | Method for processing substrates, in particular wafers, masks or flat panel displays, with a semi-conductor industry machine |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2176654B (en) * | 1985-06-11 | 1988-08-10 | Avx Corp | Method for optimising the decoupling of integrated circuit devices |
JPH02303100A (ja) * | 1989-05-17 | 1990-12-17 | Matsushita Electric Ind Co Ltd | 部品装着方法 |
DE69116709T2 (de) | 1990-03-19 | 1997-02-06 | Hitachi Ltd | Vorrichtung und Verfahren zum Transport von Bauteilen |
JP2619306B2 (ja) * | 1991-02-18 | 1997-06-11 | 株式会社 大昌プレテック | プリント実装基板検査装置 |
DE4121404A1 (de) * | 1991-06-28 | 1993-01-07 | W Schuh Gmbh & Co Dipl Ing | Vorrichtung zum erreichen hoher zuverlaessigkeit und positioniergenauigkeiten beim automatischen bestuecken von smd bauteilen |
US5991435A (en) * | 1992-06-30 | 1999-11-23 | Matsushita Electric Industrial Co., Ltd. | Inspecting apparatus of mounting state of component or printing state of cream solder in mounting line of electronic component |
JP2993398B2 (ja) * | 1995-05-31 | 1999-12-20 | ニチデン機械株式会社 | ピックアップ装置及びピックアップ方法 |
US5903662A (en) * | 1995-06-30 | 1999-05-11 | Dci Systems, Inc. | Automated system for placement of components |
JPH11502311A (ja) * | 1995-12-14 | 1999-02-23 | フィリップス エレクトロニクス ネムローゼ フェンノートシャップ | コンポーネント配置装置及びこのコンポーネント配置装置によってキャリヤ上にコンポーネントを配置する方法 |
KR970053283A (ko) * | 1995-12-26 | 1997-07-31 | 윌리엄 이. 힐러 | 반도체 패키지 윤곽 측정용 측정 유니트 |
GB2310716A (en) * | 1996-02-28 | 1997-09-03 | Daewoo Electronics Co Ltd | Recognition of a fiducial mark on a printed circuit board |
US5963662A (en) * | 1996-08-07 | 1999-10-05 | Georgia Tech Research Corporation | Inspection system and method for bond detection and validation of surface mount devices |
IE80676B1 (en) * | 1996-08-02 | 1998-11-18 | M V Research Limited | A measurement system |
KR19980039100A (ko) * | 1996-11-27 | 1998-08-17 | 배순훈 | 부품의 클린칭 방향을 이용한 미삽 검사장치 및 방법 |
JP3347621B2 (ja) * | 1996-11-29 | 2002-11-20 | 株式会社新川 | ボンディング装置 |
KR100234122B1 (ko) * | 1997-08-30 | 1999-12-15 | 윤종용 | Ic 패키지 리드핀 검사장치 및 그 제어방법과 레이저센서의포커스 검출장치 및 그 포커스검출방법 |
US6028319A (en) * | 1998-01-06 | 2000-02-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Calibration standard for lead configurations and method of using |
-
1998
- 1998-12-11 US US09/209,988 patent/US6408090B1/en not_active Expired - Lifetime
-
1999
- 1999-09-02 CN CNB998114448A patent/CN1237863C/zh not_active Expired - Lifetime
- 1999-09-02 WO PCT/DE1999/002781 patent/WO2000019800A1/de active IP Right Grant
- 1999-09-02 JP JP2000573149A patent/JP2002526940A/ja active Pending
- 1999-09-02 AT AT99953694T patent/ATE282944T1/de not_active IP Right Cessation
- 1999-09-02 DE DE59911111T patent/DE59911111D1/de not_active Expired - Lifetime
- 1999-09-02 EP EP99953694A patent/EP1118262B1/de not_active Expired - Lifetime
- 1999-09-02 KR KR10-2001-7003973A patent/KR100538912B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP2002526940A (ja) | 2002-08-20 |
DE59911111D1 (de) | 2004-12-23 |
EP1118262B1 (de) | 2004-11-17 |
KR20010075433A (ko) | 2001-08-09 |
ATE282944T1 (de) | 2004-12-15 |
WO2000019800A1 (de) | 2000-04-06 |
CN1320363A (zh) | 2001-10-31 |
EP1118262A1 (de) | 2001-07-25 |
US6408090B1 (en) | 2002-06-18 |
KR100538912B1 (ko) | 2005-12-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN1237863C (zh) | 用于自动插装机上插装在基片上的器件的位置识别方法 | |
JP3927353B2 (ja) | 比較検査における画像の位置合せ方法、比較検査方法及び比較検査装置 | |
US20060075631A1 (en) | Pick and place machine with improved component pick up inspection | |
JP3026981B2 (ja) | 潜在的歪曲プリント回路板点検のための補償システム | |
US20050123187A1 (en) | Pick and place machine with improved workpiece inspection | |
US20060016066A1 (en) | Pick and place machine with improved inspection | |
US20120327215A1 (en) | High speed optical sensor inspection system | |
US20070003126A1 (en) | Method and apparatus for evaluating a component pick action in an electronics assembly machine | |
KR20060116817A (ko) | 개선된 부품 배치 탐지기를 구비한 픽업 배치장치 | |
US4941256A (en) | Automatic visual measurement of surface mount device placement | |
US20140210993A1 (en) | Automatic programming of solder paste inspection system | |
WO2007053557A1 (en) | Electronics assembly machine with embedded solder paste inspection | |
CN101713635A (zh) | 印刷电路板及其定位系统和方法 | |
JP2006319332A (ja) | 実装された電子部品の検査装置を備えた電子部品実装機 | |
JP2013243273A (ja) | 部品吸着動作監視装置及び部品有無検出装置 | |
EP3737217B1 (en) | Electronic component evaluation method, electronic component evaluation device, and electronic component evaluation program | |
CN111583222B (zh) | 一种测试点自动定位方法、铜厚自动检测方法及系统 | |
JP6348832B2 (ja) | 部品実装装置、表面実装機、及び部品厚み検出方法 | |
KR100526035B1 (ko) | 메탈 마스크 검사 장치 및 그의 검사 방법 | |
CN113811178B (zh) | 一种用于向元件载体装配电子元件的装配机及其方法 | |
JP2003046300A (ja) | Pcb製造ラインの管理システムおよびpcb製造管理方法 | |
CN1498346A (zh) | 检测印刷电路板质量的方法和装置 | |
WO2006125102A1 (en) | Method and apparatus for evaluating a component pick action in an electronics assembly machine | |
JP2007067343A (ja) | 表面実装部品実装装置及び表面実装部品の平坦度補正方法 | |
JPH1051193A (ja) | 電子部品のマウント装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SIEMENS AG Free format text: FORMER OWNER: SIEMENS DIMEIDICK STOCK COMPANY Effective date: 20090918 Owner name: SIEMENS ELECTRONICS ASSEMBLY SYSTEMS LIMITED PARTN Free format text: FORMER OWNER: SIEMENS AG Effective date: 20090918 |
|
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee |
Owner name: SIEMENS DIMEIDICK STOCK COMPANY Free format text: FORMER NAME: SIEMENS PRODUCTION AND LOGISTICS SYSTEMS AG |
|
CP01 | Change in the name or title of a patent holder |
Address after: Nuremberg Patentee after: SIEMENS DEMATIC AG Address before: Nuremberg Patentee before: SIEMENS PRODUCTION AND LOGISTICS SYSTEMS AG |
|
TR01 | Transfer of patent right |
Effective date of registration: 20090918 Address after: Munich, Germany Patentee after: SIEMENS AG Address before: Nuremberg Patentee before: SIEMENS DEMATIC AG Effective date of registration: 20090918 Address after: Munich, Germany Patentee after: SIEMENS ELECTRONICS ASSEMBLY SYSTEMS GmbH & Co.KG Address before: Munich, Germany Patentee before: Siemens AG |
|
C56 | Change in the name or address of the patentee |
Owner name: ADVANCED ASSEMBLY SYSTEMS GMBH + CO. KG Free format text: FORMER NAME: SIEMENS AG (DE) |
|
CP01 | Change in the name or title of a patent holder |
Address after: Munich, Germany Patentee after: ASM Assembly Systems GmbH & Co. KG Address before: Munich, Germany Patentee before: SIEMENS ELECTRONICS ASSEMBLY SYSTEMS GmbH & Co.KG |
|
CX01 | Expiry of patent term |
Granted publication date: 20060118 |
|
CX01 | Expiry of patent term |