CN1202403C - 测量机器上物体的位置的光测量装置和方法 - Google Patents

测量机器上物体的位置的光测量装置和方法 Download PDF

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Publication number
CN1202403C
CN1202403C CNB008030014A CN00803001A CN1202403C CN 1202403 C CN1202403 C CN 1202403C CN B008030014 A CNB008030014 A CN B008030014A CN 00803001 A CN00803001 A CN 00803001A CN 1202403 C CN1202403 C CN 1202403C
Authority
CN
China
Prior art keywords
detecting device
detection signal
time
interval
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB008030014A
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English (en)
Chinese (zh)
Other versions
CN1338040A (zh
Inventor
维克托·戈登·斯廷普森
乔恩·保罗·富格
威廉·肯尼思·戴维斯
诺曼·约翰·利特
科利亚·蒂莫西·贝尔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB9927471.4A external-priority patent/GB9927471D0/en
Priority claimed from GB0020929A external-priority patent/GB0020929D0/en
Application filed by Renishaw PLC filed Critical Renishaw PLC
Publication of CN1338040A publication Critical patent/CN1338040A/zh
Application granted granted Critical
Publication of CN1202403C publication Critical patent/CN1202403C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/20—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring workpiece characteristics, e.g. contour, dimension, hardness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/248—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods
    • B23Q17/2485—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods using interruptions of light beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/10—Detecting, e.g. by using light barriers
    • G01V8/12—Detecting, e.g. by using light barriers using one transmitter and one receiver
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/941—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated using an optical detector
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/941—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector
    • H03K2217/94102—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector characterised by the type of activation
    • H03K2217/94104—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector characterised by the type of activation using a light barrier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/941—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector
    • H03K2217/94116—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector increasing reliability, fail-safe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T408/00—Cutting by use of rotating axially moving tool
    • Y10T408/13—Cutting by use of rotating axially moving tool with randomly-actuated stopping means
    • Y10T408/14—Responsive to condition of Tool or tool-drive

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CNB008030014A 1999-11-22 2000-11-17 测量机器上物体的位置的光测量装置和方法 Expired - Fee Related CN1202403C (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB9927471.4 1999-11-22
GBGB9927471.4A GB9927471D0 (en) 1999-11-22 1999-11-22 Position determining apparatus for coordinate positioning machine
GB0020929.6 2000-08-25
GB0020929A GB0020929D0 (en) 2000-08-25 2000-08-25 Optical measuring apparatus for measuring tools on machine

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN200510064136XA Division CN1660541B (zh) 1999-11-22 2000-11-17 测量机器上物体的装置和方法

Publications (2)

Publication Number Publication Date
CN1338040A CN1338040A (zh) 2002-02-27
CN1202403C true CN1202403C (zh) 2005-05-18

Family

ID=26244900

Family Applications (2)

Application Number Title Priority Date Filing Date
CNB008030014A Expired - Fee Related CN1202403C (zh) 1999-11-22 2000-11-17 测量机器上物体的位置的光测量装置和方法
CN200510064136XA Expired - Fee Related CN1660541B (zh) 1999-11-22 2000-11-17 测量机器上物体的装置和方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN200510064136XA Expired - Fee Related CN1660541B (zh) 1999-11-22 2000-11-17 测量机器上物体的装置和方法

Country Status (8)

Country Link
US (3) US6635894B1 (enExample)
EP (2) EP1562020B1 (enExample)
JP (1) JP4695808B2 (enExample)
KR (1) KR100746932B1 (enExample)
CN (2) CN1202403C (enExample)
AT (2) ATE293243T1 (enExample)
DE (2) DE60019399T2 (enExample)
WO (1) WO2001038822A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12117791B2 (en) 2020-12-22 2024-10-15 Laser Application Technology Co., Ltd. Tool detector

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PL205531B1 (pl) 2002-03-13 2010-04-30 Janssen Pharmaceutica Nv Pochodna karbonyloaminowa, jej zastosowanie i sposób wytwarzania oraz kompozycja farmaceutyczna
GB0210175D0 (en) * 2002-05-03 2002-06-12 Renishaw Plc Broken tool detector
US20050230605A1 (en) * 2004-04-20 2005-10-20 Hamid Pishdadian Method of measuring using a binary optical sensor
ATE426484T1 (de) * 2004-09-08 2009-04-15 Renishaw Plc Erfassungsvorrichtung und -verfahren
GB0419943D0 (en) * 2004-09-08 2004-10-13 Renishaw Plc Non-contact broken tool detection system
GB0625387D0 (en) * 2006-12-21 2007-01-31 Renishaw Plc Object detector and method
GB0708499D0 (en) * 2007-05-02 2007-06-06 Renishaw Plc Tool setting or analysis device
DE202007007160U1 (de) * 2007-05-19 2007-08-02 Leica Microsystems Nussloch Gmbh Vorrichtung zur Erzeugung von Dünnschnitten
DE102007047499B4 (de) * 2007-10-04 2017-04-13 E. Zoller GmbH & Co. KG Einstell- und Messgeräte Verfahren und Vorrichtung zur Erfassung von Informationen eines Werkzeugs
EP2402714B1 (fr) 2010-07-02 2013-04-17 Tesa Sa Dispositif de mesure de dimensions
CN103433810B (zh) * 2013-07-19 2014-08-27 华中科技大学 一种复杂曲面法矢在机检测装置及方法
CN104439560B (zh) * 2013-10-24 2017-07-18 高桥金属制品（苏州）有限公司 一种攻丝机弱电感应控制装置
DE102016012726A1 (de) * 2016-10-24 2018-04-26 Blum-Novotest Gmbh Messsystem zur Messung an Werkzeugen in einer Werkzeugmaschine
DE102016012727A1 (de) * 2016-10-24 2018-04-26 Blum-Novotest Gmbh Messsystem zur Messung an Werkzeugen in einer Werkzeugmaschine
EP3450936A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Optical apparatus and method for assessing the beam profile of a non-contact tool setting apparatus
EP3450909A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Non-contact optical tool setting apparatus and method
EP3450097A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Non-contact optical tool setting apparatus and method
EP3456469A1 (en) * 2017-09-13 2019-03-20 Renishaw PLC Non-contact tool setting apparatus and method
CN110796209A (zh) * 2018-08-03 2020-02-14 杭州海康机器人技术有限公司 一种触发检测方法、装置及系统
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Publication number Priority date Publication date Assignee Title
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Also Published As

Publication number Publication date
US20040069936A1 (en) 2004-04-15
ATE293243T1 (de) 2005-04-15
CN1338040A (zh) 2002-02-27
EP1562020B1 (en) 2007-08-22
DE60036144D1 (de) 2007-10-04
KR100746932B1 (ko) 2007-08-08
KR20010101597A (ko) 2001-11-14
DE60019399D1 (de) 2005-05-19
US6635894B1 (en) 2003-10-21
JP4695808B2 (ja) 2011-06-08
JP2003524154A (ja) 2003-08-12
DE60019399T2 (de) 2005-09-22
DE60036144T2 (de) 2008-01-03
US7053392B2 (en) 2006-05-30
CN1660541B (zh) 2010-12-01
US6878953B2 (en) 2005-04-12
US20050167619A1 (en) 2005-08-04
EP1144944B1 (en) 2005-04-13
ATE371164T1 (de) 2007-09-15
WO2001038822A1 (en) 2001-05-31
CN1660541A (zh) 2005-08-31
EP1562020A1 (en) 2005-08-10
EP1144944A1 (en) 2001-10-17

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