KR100746932B1 - 기계 상의 대상물을 측정하기 위한 광학 측정 장치 - Google Patents
기계 상의 대상물을 측정하기 위한 광학 측정 장치 Download PDFInfo
- Publication number
- KR100746932B1 KR100746932B1 KR1020017009080A KR20017009080A KR100746932B1 KR 100746932 B1 KR100746932 B1 KR 100746932B1 KR 1020017009080 A KR1020017009080 A KR 1020017009080A KR 20017009080 A KR20017009080 A KR 20017009080A KR 100746932 B1 KR100746932 B1 KR 100746932B1
- Authority
- KR
- South Korea
- Prior art keywords
- detector
- time interval
- detection signal
- signal
- tool
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
- B23Q17/20—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring workpiece characteristics, e.g. contour, dimension, hardness
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
- B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
- B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
- B23Q17/248—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods
- B23Q17/2485—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods using interruptions of light beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/10—Detecting, e.g. by using light barriers
- G01V8/12—Detecting, e.g. by using light barriers using one transmitter and one receiver
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/941—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated using an optical detector
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
- H03K2217/941—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector
- H03K2217/94102—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector characterised by the type of activation
- H03K2217/94104—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector characterised by the type of activation using a light barrier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
- H03K2217/941—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector
- H03K2217/94116—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector increasing reliability, fail-safe
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T408/00—Cutting by use of rotating axially moving tool
- Y10T408/13—Cutting by use of rotating axially moving tool with randomly-actuated stopping means
- Y10T408/14—Responsive to condition of Tool or tool-drive
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Optics & Photonics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electromagnetism (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Machine Tool Sensing Apparatuses (AREA)
- Geophysics And Detection Of Objects (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9927471.4 | 1999-11-22 | ||
| GBGB9927471.4A GB9927471D0 (en) | 1999-11-22 | 1999-11-22 | Position determining apparatus for coordinate positioning machine |
| GB0020929.6 | 2000-08-25 | ||
| GB0020929A GB0020929D0 (en) | 2000-08-25 | 2000-08-25 | Optical measuring apparatus for measuring tools on machine |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010101597A KR20010101597A (ko) | 2001-11-14 |
| KR100746932B1 true KR100746932B1 (ko) | 2007-08-08 |
Family
ID=26244900
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020017009080A Expired - Fee Related KR100746932B1 (ko) | 1999-11-22 | 2000-11-17 | 기계 상의 대상물을 측정하기 위한 광학 측정 장치 |
Country Status (8)
| Country | Link |
|---|---|
| US (3) | US6635894B1 (enExample) |
| EP (2) | EP1562020B1 (enExample) |
| JP (1) | JP4695808B2 (enExample) |
| KR (1) | KR100746932B1 (enExample) |
| CN (2) | CN1202403C (enExample) |
| AT (2) | ATE293243T1 (enExample) |
| DE (2) | DE60019399T2 (enExample) |
| WO (1) | WO2001038822A1 (enExample) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003018251A1 (de) * | 2001-08-20 | 2003-03-06 | Blum-Novotest Gmbh | Verfahren und vorrichtung zur positionsbestimmung von drehantreibbaren werkzeugen |
| PL205531B1 (pl) | 2002-03-13 | 2010-04-30 | Janssen Pharmaceutica Nv | Pochodna karbonyloaminowa, jej zastosowanie i sposób wytwarzania oraz kompozycja farmaceutyczna |
| GB0210175D0 (en) * | 2002-05-03 | 2002-06-12 | Renishaw Plc | Broken tool detector |
| US20050230605A1 (en) * | 2004-04-20 | 2005-10-20 | Hamid Pishdadian | Method of measuring using a binary optical sensor |
| ATE426484T1 (de) * | 2004-09-08 | 2009-04-15 | Renishaw Plc | Erfassungsvorrichtung und -verfahren |
| GB0419943D0 (en) * | 2004-09-08 | 2004-10-13 | Renishaw Plc | Non-contact broken tool detection system |
| GB0625387D0 (en) * | 2006-12-21 | 2007-01-31 | Renishaw Plc | Object detector and method |
| GB0708499D0 (en) * | 2007-05-02 | 2007-06-06 | Renishaw Plc | Tool setting or analysis device |
| DE202007007160U1 (de) * | 2007-05-19 | 2007-08-02 | Leica Microsystems Nussloch Gmbh | Vorrichtung zur Erzeugung von Dünnschnitten |
| DE102007047499B4 (de) * | 2007-10-04 | 2017-04-13 | E. Zoller GmbH & Co. KG Einstell- und Messgeräte | Verfahren und Vorrichtung zur Erfassung von Informationen eines Werkzeugs |
| EP2402714B1 (fr) | 2010-07-02 | 2013-04-17 | Tesa Sa | Dispositif de mesure de dimensions |
| CN103433810B (zh) * | 2013-07-19 | 2014-08-27 | 华中科技大学 | 一种复杂曲面法矢在机检测装置及方法 |
| CN104439560B (zh) * | 2013-10-24 | 2017-07-18 | 高桥金属制品(苏州)有限公司 | 一种攻丝机弱电感应控制装置 |
| DE102016012726A1 (de) * | 2016-10-24 | 2018-04-26 | Blum-Novotest Gmbh | Messsystem zur Messung an Werkzeugen in einer Werkzeugmaschine |
| DE102016012727A1 (de) * | 2016-10-24 | 2018-04-26 | Blum-Novotest Gmbh | Messsystem zur Messung an Werkzeugen in einer Werkzeugmaschine |
| EP3450936A1 (en) * | 2017-09-05 | 2019-03-06 | Renishaw PLC | Optical apparatus and method for assessing the beam profile of a non-contact tool setting apparatus |
| EP3450909A1 (en) * | 2017-09-05 | 2019-03-06 | Renishaw PLC | Non-contact optical tool setting apparatus and method |
| EP3450097A1 (en) * | 2017-09-05 | 2019-03-06 | Renishaw PLC | Non-contact optical tool setting apparatus and method |
| EP3456469A1 (en) * | 2017-09-13 | 2019-03-20 | Renishaw PLC | Non-contact tool setting apparatus and method |
| CN110796209A (zh) * | 2018-08-03 | 2020-02-14 | 杭州海康机器人技术有限公司 | 一种触发检测方法、装置及系统 |
| DE102018006653A1 (de) * | 2018-08-22 | 2020-02-27 | Blum-Novotest Gmbh | Werkzeugkontrolle in einer Werkstückbearbeitugnsmaschine |
| EP3637043A1 (en) | 2018-10-09 | 2020-04-15 | Renishaw PLC | Non-contact tool measurement apparatus |
| GB202004933D0 (en) * | 2020-04-03 | 2020-05-20 | Renishaw Plc | Measuring device and method |
| GB202016009D0 (en) * | 2020-10-09 | 2020-11-25 | Renishaw Plc | Method for measuring non-toothed tools using a non-contact tool setter |
| TWI749961B (zh) | 2020-12-22 | 2021-12-11 | 雷應科技股份有限公司 | 刀具檢測器 |
| CN113433129B (zh) * | 2021-07-05 | 2023-01-06 | 无锡贝斯特精机股份有限公司 | 一种六轴机器人去毛刺刀具检测机构及其方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030090167A (ko) * | 2002-05-21 | 2003-11-28 | 삼성전자주식회사 | 다중 검출기를 이용한 광기록매체 데이터 재생 장치 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2123753A5 (enExample) | 1971-01-29 | 1972-09-15 | Cometa Sa | |
| FR2343555A1 (fr) | 1976-03-12 | 1977-10-07 | Dassault Avions | Procede et dispositif de determination de la position d'un objet tel qu'un element de machine |
| US4373804A (en) * | 1979-04-30 | 1983-02-15 | Diffracto Ltd. | Method and apparatus for electro-optically determining the dimension, location and attitude of objects |
| US4502823A (en) | 1981-12-21 | 1985-03-05 | Sperry Corporation | Broken drill bit detector |
| DE3218754C2 (de) | 1982-05-18 | 1985-11-28 | Friedrich Deckel AG, 8000 München | Verfahren und Einrichtung zur Vermessung eines in einem zustellbaren Werkzeughalter einer Werkzeugmaschine eingespannten Werkzeugs |
| US4518257A (en) | 1982-07-28 | 1985-05-21 | General Electric Company | Optical inspection system and method |
| JPH0278904A (ja) * | 1988-09-14 | 1990-03-19 | Toupure Kk | 回転形工具の測定方法 |
| CH677892A5 (enExample) * | 1988-12-21 | 1991-07-15 | Rollomatic Sa | |
| DE3905949A1 (de) | 1989-02-25 | 1990-08-30 | Herbert Prof Dr Ing Schulz | Verfahren zum vermessen von schneidkanten |
| DE69117715T2 (de) * | 1990-12-31 | 1996-07-18 | Excellon Automation | Überwachung des Zustandes eines rotierenden Werkzeuges |
| DE69223544T2 (de) | 1991-04-26 | 1998-07-09 | Nippon Telegraph & Telephone | Verfahren und Vorrichtung zum Messen des Profils eines Objekts |
| EP0532933B1 (en) * | 1991-08-21 | 1995-11-02 | Tokyo Seimitsu Co.,Ltd. | Blade position detection apparatus |
| DE59309003D1 (de) | 1992-08-25 | 1998-10-29 | Leuze Electronic Gmbh & Co | Aus einem Sender und einem Empfänger bestehende Einrichtung zum Erfassen von Gegenständen |
| JPH0691427A (ja) * | 1992-09-09 | 1994-04-05 | Nkk Corp | 間欠歯状体の歯欠け検出装置 |
| DE4244869C2 (de) | 1992-11-14 | 1997-08-28 | Chiron Werke Gmbh | Verfahren zum Vermessen eines Werkzeuges |
| DE4323910C2 (de) | 1993-07-16 | 1995-08-10 | Leuze Electronic Gmbh & Co | Lichtschranke mit einer Auswerteelektronik zum Erkennen von Störsignalen |
| US5940787A (en) * | 1993-12-10 | 1999-08-17 | U.S. Tech Corporation | Apparatuses and methods of monitoring the condition of tools and workpieces |
| JPH08197382A (ja) * | 1995-01-30 | 1996-08-06 | Toshiba Mach Co Ltd | 工具の切屑付着検知方法および装置 |
| US5841662A (en) * | 1996-07-31 | 1998-11-24 | Coburn Optical Industries, Inc. | Method and apparatus for chucked work piece recognition |
| JP3648886B2 (ja) * | 1996-11-05 | 2005-05-18 | 豊田工機株式会社 | 工具刃先位置検出装置及び工具刃先位置検出装置を備えた数値制御工作機械 |
| JP3421562B2 (ja) * | 1997-12-26 | 2003-06-30 | オークマ株式会社 | 刃具の振れ検出方法 |
| US6111262A (en) * | 1998-10-30 | 2000-08-29 | Sumitomo Metal Industries, Ltd. | Method for measuring a diameter of a crystal |
| US6496273B1 (en) | 1999-05-05 | 2002-12-17 | Renishaw Plc | Position determining apparatus for coordinate positioning machine |
| DE19950331C2 (de) * | 1999-10-19 | 2001-09-06 | Blum Novotest Gmbh | Verfahren und Vorrichtung zum Prüfen einer Schneidengeometrie eines drehantreibbaren Werkzeugs |
-
1999
- 1999-11-17 US US09/889,305 patent/US6635894B1/en not_active Expired - Lifetime
-
2000
- 2000-11-17 JP JP2001540323A patent/JP4695808B2/ja not_active Expired - Lifetime
- 2000-11-17 DE DE60019399T patent/DE60019399T2/de not_active Expired - Lifetime
- 2000-11-17 AT AT00976187T patent/ATE293243T1/de not_active IP Right Cessation
- 2000-11-17 EP EP05075841A patent/EP1562020B1/en not_active Expired - Lifetime
- 2000-11-17 KR KR1020017009080A patent/KR100746932B1/ko not_active Expired - Fee Related
- 2000-11-17 DE DE60036144T patent/DE60036144T2/de not_active Expired - Lifetime
- 2000-11-17 CN CNB008030014A patent/CN1202403C/zh not_active Expired - Fee Related
- 2000-11-17 AT AT05075841T patent/ATE371164T1/de not_active IP Right Cessation
- 2000-11-17 WO PCT/GB2000/004403 patent/WO2001038822A1/en not_active Ceased
- 2000-11-17 CN CN200510064136XA patent/CN1660541B/zh not_active Expired - Fee Related
- 2000-11-17 EP EP00976187A patent/EP1144944B1/en not_active Expired - Lifetime
-
2003
- 2003-10-06 US US10/678,075 patent/US6878953B2/en not_active Expired - Lifetime
-
2004
- 2004-09-23 US US10/947,345 patent/US7053392B2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030090167A (ko) * | 2002-05-21 | 2003-11-28 | 삼성전자주식회사 | 다중 검출기를 이용한 광기록매체 데이터 재생 장치 |
Non-Patent Citations (1)
| Title |
|---|
| 한국공개특허공보 2003-0090167호 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20040069936A1 (en) | 2004-04-15 |
| ATE293243T1 (de) | 2005-04-15 |
| CN1338040A (zh) | 2002-02-27 |
| EP1562020B1 (en) | 2007-08-22 |
| DE60036144D1 (de) | 2007-10-04 |
| KR20010101597A (ko) | 2001-11-14 |
| DE60019399D1 (de) | 2005-05-19 |
| US6635894B1 (en) | 2003-10-21 |
| JP4695808B2 (ja) | 2011-06-08 |
| JP2003524154A (ja) | 2003-08-12 |
| CN1202403C (zh) | 2005-05-18 |
| DE60019399T2 (de) | 2005-09-22 |
| DE60036144T2 (de) | 2008-01-03 |
| US7053392B2 (en) | 2006-05-30 |
| CN1660541B (zh) | 2010-12-01 |
| US6878953B2 (en) | 2005-04-12 |
| US20050167619A1 (en) | 2005-08-04 |
| EP1144944B1 (en) | 2005-04-13 |
| ATE371164T1 (de) | 2007-09-15 |
| WO2001038822A1 (en) | 2001-05-31 |
| CN1660541A (zh) | 2005-08-31 |
| EP1562020A1 (en) | 2005-08-10 |
| EP1144944A1 (en) | 2001-10-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
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