JP4695808B2 - 機械上の対象物を測定する光学測定装置 - Google Patents

機械上の対象物を測定する光学測定装置 Download PDF

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Publication number
JP4695808B2
JP4695808B2 JP2001540323A JP2001540323A JP4695808B2 JP 4695808 B2 JP4695808 B2 JP 4695808B2 JP 2001540323 A JP2001540323 A JP 2001540323A JP 2001540323 A JP2001540323 A JP 2001540323A JP 4695808 B2 JP4695808 B2 JP 4695808B2
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JP
Japan
Prior art keywords
detector
signal
light beam
generated
time interval
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2001540323A
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English (en)
Japanese (ja)
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JP2003524154A (ja
JP2003524154A5 (enExample
Inventor
ゴードン シンプソン ビクター
ポール フュージ ジョン
ケネス デービーズ ウィリアム
ジョン リート ノーマン
ティモシー ベル コリン
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Renishaw PLC
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Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB9927471.4A external-priority patent/GB9927471D0/en
Priority claimed from GB0020929A external-priority patent/GB0020929D0/en
Application filed by Renishaw PLC filed Critical Renishaw PLC
Publication of JP2003524154A publication Critical patent/JP2003524154A/ja
Publication of JP2003524154A5 publication Critical patent/JP2003524154A5/ja
Application granted granted Critical
Publication of JP4695808B2 publication Critical patent/JP4695808B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/20—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring workpiece characteristics, e.g. contour, dimension, hardness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/248—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods
    • B23Q17/2485—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods using interruptions of light beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/10—Detecting, e.g. by using light barriers
    • G01V8/12—Detecting, e.g. by using light barriers using one transmitter and one receiver
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/941—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated using an optical detector
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/941—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector
    • H03K2217/94102—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector characterised by the type of activation
    • H03K2217/94104—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector characterised by the type of activation using a light barrier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/941—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector
    • H03K2217/94116—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector increasing reliability, fail-safe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T408/00—Cutting by use of rotating axially moving tool
    • Y10T408/13—Cutting by use of rotating axially moving tool with randomly-actuated stopping means
    • Y10T408/14—Responsive to condition of Tool or tool-drive

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2001540323A 1999-11-22 2000-11-17 機械上の対象物を測定する光学測定装置 Expired - Lifetime JP4695808B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB9927471.4 1999-11-22
GBGB9927471.4A GB9927471D0 (en) 1999-11-22 1999-11-22 Position determining apparatus for coordinate positioning machine
GB0020929A GB0020929D0 (en) 2000-08-25 2000-08-25 Optical measuring apparatus for measuring tools on machine
GB0020929.6 2000-08-25
PCT/GB2000/004403 WO2001038822A1 (en) 1999-11-22 2000-11-17 Optical measuring apparatus for measuring objects on machines

Publications (3)

Publication Number Publication Date
JP2003524154A JP2003524154A (ja) 2003-08-12
JP2003524154A5 JP2003524154A5 (enExample) 2008-01-17
JP4695808B2 true JP4695808B2 (ja) 2011-06-08

Family

ID=26244900

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001540323A Expired - Lifetime JP4695808B2 (ja) 1999-11-22 2000-11-17 機械上の対象物を測定する光学測定装置

Country Status (8)

Country Link
US (3) US6635894B1 (enExample)
EP (2) EP1144944B1 (enExample)
JP (1) JP4695808B2 (enExample)
KR (1) KR100746932B1 (enExample)
CN (2) CN1660541B (enExample)
AT (2) ATE293243T1 (enExample)
DE (2) DE60036144T2 (enExample)
WO (1) WO2001038822A1 (enExample)

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JP4648628B2 (ja) 2002-03-13 2011-03-09 ジヤンセン・フアーマシユーチカ・ナームローゼ・フエンノートシヤツプ ヒストンデアセチラーゼの新規な阻害剤としてのカルボニルアミノ誘導体
GB0210175D0 (en) * 2002-05-03 2002-06-12 Renishaw Plc Broken tool detector
US20050230605A1 (en) * 2004-04-20 2005-10-20 Hamid Pishdadian Method of measuring using a binary optical sensor
DE602005013551D1 (de) * 2004-09-08 2009-05-07 Renishaw Plc Erfassungsvorrichtung und -verfahren
GB0419943D0 (en) * 2004-09-08 2004-10-13 Renishaw Plc Non-contact broken tool detection system
GB0625387D0 (en) * 2006-12-21 2007-01-31 Renishaw Plc Object detector and method
GB0708499D0 (en) 2007-05-02 2007-06-06 Renishaw Plc Tool setting or analysis device
DE202007007160U1 (de) * 2007-05-19 2007-08-02 Leica Microsystems Nussloch Gmbh Vorrichtung zur Erzeugung von Dünnschnitten
DE102007047499B4 (de) * 2007-10-04 2017-04-13 E. Zoller GmbH & Co. KG Einstell- und Messgeräte Verfahren und Vorrichtung zur Erfassung von Informationen eines Werkzeugs
EP2402714B1 (fr) 2010-07-02 2013-04-17 Tesa Sa Dispositif de mesure de dimensions
CN103433810B (zh) * 2013-07-19 2014-08-27 华中科技大学 一种复杂曲面法矢在机检测装置及方法
CN104439560B (zh) * 2013-10-24 2017-07-18 高桥金属制品（苏州）有限公司 一种攻丝机弱电感应控制装置
DE102016012726A1 (de) * 2016-10-24 2018-04-26 Blum-Novotest Gmbh Messsystem zur Messung an Werkzeugen in einer Werkzeugmaschine
DE102016012727A1 (de) * 2016-10-24 2018-04-26 Blum-Novotest Gmbh Messsystem zur Messung an Werkzeugen in einer Werkzeugmaschine
EP3450097A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Non-contact optical tool setting apparatus and method
EP3450936A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Optical apparatus and method for assessing the beam profile of a non-contact tool setting apparatus
EP3450909A1 (en) 2017-09-05 2019-03-06 Renishaw PLC Non-contact optical tool setting apparatus and method
EP3456469A1 (en) * 2017-09-13 2019-03-20 Renishaw PLC Non-contact tool setting apparatus and method
CN110796209A (zh) * 2018-08-03 2020-02-14 杭州海康机器人技术有限公司 一种触发检测方法、装置及系统
DE102018006653A1 (de) * 2018-08-22 2020-02-27 Blum-Novotest Gmbh Werkzeugkontrolle in einer Werkstückbearbeitugnsmaschine
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GB202016009D0 (en) 2020-10-09 2020-11-25 Renishaw Plc Method for measuring non-toothed tools using a non-contact tool setter
TWI749961B (zh) 2020-12-22 2021-12-11 雷應科技股份有限公司 刀具檢測器
CN113433129B (zh) * 2021-07-05 2023-01-06 无锡贝斯特精机股份有限公司 一种六轴机器人去毛刺刀具检测机构及其方法

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Also Published As

Publication number Publication date
CN1660541B (zh) 2010-12-01
CN1338040A (zh) 2002-02-27
DE60036144D1 (de) 2007-10-04
US20050167619A1 (en) 2005-08-04
ATE371164T1 (de) 2007-09-15
DE60019399T2 (de) 2005-09-22
ATE293243T1 (de) 2005-04-15
KR100746932B1 (ko) 2007-08-08
EP1144944B1 (en) 2005-04-13
DE60036144T2 (de) 2008-01-03
US6635894B1 (en) 2003-10-21
EP1562020A1 (en) 2005-08-10
JP2003524154A (ja) 2003-08-12
CN1660541A (zh) 2005-08-31
US7053392B2 (en) 2006-05-30
KR20010101597A (ko) 2001-11-14
US6878953B2 (en) 2005-04-12
US20040069936A1 (en) 2004-04-15
CN1202403C (zh) 2005-05-18
DE60019399D1 (de) 2005-05-19
WO2001038822A1 (en) 2001-05-31
EP1562020B1 (en) 2007-08-22
EP1144944A1 (en) 2001-10-17

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