JP4695808B2 - 機械上の対象物を測定する光学測定装置 - Google Patents

機械上の対象物を測定する光学測定装置 Download PDF

Info

Publication number
JP4695808B2
JP4695808B2 JP2001540323A JP2001540323A JP4695808B2 JP 4695808 B2 JP4695808 B2 JP 4695808B2 JP 2001540323 A JP2001540323 A JP 2001540323A JP 2001540323 A JP2001540323 A JP 2001540323A JP 4695808 B2 JP4695808 B2 JP 4695808B2
Authority
JP
Japan
Prior art keywords
detector
signal
light beam
generated
time interval
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2001540323A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003524154A (ja
JP2003524154A5 (enExample
Inventor
ゴードン シンプソン ビクター
ポール フュージ ジョン
ケネス デービーズ ウィリアム
ジョン リート ノーマン
ティモシー ベル コリン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB9927471.4A external-priority patent/GB9927471D0/en
Priority claimed from GB0020929A external-priority patent/GB0020929D0/en
Application filed by Renishaw PLC filed Critical Renishaw PLC
Publication of JP2003524154A publication Critical patent/JP2003524154A/ja
Publication of JP2003524154A5 publication Critical patent/JP2003524154A5/ja
Application granted granted Critical
Publication of JP4695808B2 publication Critical patent/JP4695808B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/20—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring workpiece characteristics, e.g. contour, dimension, hardness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/248—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods
    • B23Q17/2485—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods using interruptions of light beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/10—Detecting, e.g. by using light barriers
    • G01V8/12—Detecting, e.g. by using light barriers using one transmitter and one receiver
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/941—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated using an optical detector
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/941—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector
    • H03K2217/94102—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector characterised by the type of activation
    • H03K2217/94104—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector characterised by the type of activation using a light barrier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/941—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector
    • H03K2217/94116—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated using an optical detector increasing reliability, fail-safe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T408/00—Cutting by use of rotating axially moving tool
    • Y10T408/13—Cutting by use of rotating axially moving tool with randomly-actuated stopping means
    • Y10T408/14—Responsive to condition of Tool or tool-drive

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2001540323A 1999-11-22 2000-11-17 機械上の対象物を測定する光学測定装置 Expired - Lifetime JP4695808B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB9927471.4 1999-11-22
GBGB9927471.4A GB9927471D0 (en) 1999-11-22 1999-11-22 Position determining apparatus for coordinate positioning machine
GB0020929.6 2000-08-25
GB0020929A GB0020929D0 (en) 2000-08-25 2000-08-25 Optical measuring apparatus for measuring tools on machine
PCT/GB2000/004403 WO2001038822A1 (en) 1999-11-22 2000-11-17 Optical measuring apparatus for measuring objects on machines

Publications (3)

Publication Number Publication Date
JP2003524154A JP2003524154A (ja) 2003-08-12
JP2003524154A5 JP2003524154A5 (enExample) 2008-01-17
JP4695808B2 true JP4695808B2 (ja) 2011-06-08

Family

ID=26244900

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001540323A Expired - Lifetime JP4695808B2 (ja) 1999-11-22 2000-11-17 機械上の対象物を測定する光学測定装置

Country Status (8)

Country Link
US (3) US6635894B1 (enExample)
EP (2) EP1562020B1 (enExample)
JP (1) JP4695808B2 (enExample)
KR (1) KR100746932B1 (enExample)
CN (2) CN1202403C (enExample)
AT (2) ATE293243T1 (enExample)
DE (2) DE60019399T2 (enExample)
WO (1) WO2001038822A1 (enExample)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003018251A1 (de) * 2001-08-20 2003-03-06 Blum-Novotest Gmbh Verfahren und vorrichtung zur positionsbestimmung von drehantreibbaren werkzeugen
PL205531B1 (pl) 2002-03-13 2010-04-30 Janssen Pharmaceutica Nv Pochodna karbonyloaminowa, jej zastosowanie i sposób wytwarzania oraz kompozycja farmaceutyczna
GB0210175D0 (en) * 2002-05-03 2002-06-12 Renishaw Plc Broken tool detector
US20050230605A1 (en) * 2004-04-20 2005-10-20 Hamid Pishdadian Method of measuring using a binary optical sensor
ATE426484T1 (de) * 2004-09-08 2009-04-15 Renishaw Plc Erfassungsvorrichtung und -verfahren
GB0419943D0 (en) * 2004-09-08 2004-10-13 Renishaw Plc Non-contact broken tool detection system
GB0625387D0 (en) * 2006-12-21 2007-01-31 Renishaw Plc Object detector and method
GB0708499D0 (en) * 2007-05-02 2007-06-06 Renishaw Plc Tool setting or analysis device
DE202007007160U1 (de) * 2007-05-19 2007-08-02 Leica Microsystems Nussloch Gmbh Vorrichtung zur Erzeugung von Dünnschnitten
DE102007047499B4 (de) * 2007-10-04 2017-04-13 E. Zoller GmbH & Co. KG Einstell- und Messgeräte Verfahren und Vorrichtung zur Erfassung von Informationen eines Werkzeugs
EP2402714B1 (fr) 2010-07-02 2013-04-17 Tesa Sa Dispositif de mesure de dimensions
CN103433810B (zh) * 2013-07-19 2014-08-27 华中科技大学 一种复杂曲面法矢在机检测装置及方法
CN104439560B (zh) * 2013-10-24 2017-07-18 高桥金属制品（苏州）有限公司 一种攻丝机弱电感应控制装置
DE102016012726A1 (de) * 2016-10-24 2018-04-26 Blum-Novotest Gmbh Messsystem zur Messung an Werkzeugen in einer Werkzeugmaschine
DE102016012727A1 (de) * 2016-10-24 2018-04-26 Blum-Novotest Gmbh Messsystem zur Messung an Werkzeugen in einer Werkzeugmaschine
EP3450936A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Optical apparatus and method for assessing the beam profile of a non-contact tool setting apparatus
EP3450909A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Non-contact optical tool setting apparatus and method
EP3450097A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Non-contact optical tool setting apparatus and method
EP3456469A1 (en) * 2017-09-13 2019-03-20 Renishaw PLC Non-contact tool setting apparatus and method
CN110796209A (zh) * 2018-08-03 2020-02-14 杭州海康机器人技术有限公司 一种触发检测方法、装置及系统
DE102018006653A1 (de) * 2018-08-22 2020-02-27 Blum-Novotest Gmbh Werkzeugkontrolle in einer Werkstückbearbeitugnsmaschine
EP3637043A1 (en) 2018-10-09 2020-04-15 Renishaw PLC Non-contact tool measurement apparatus
GB202004933D0 (en) * 2020-04-03 2020-05-20 Renishaw Plc Measuring device and method
GB202016009D0 (en) * 2020-10-09 2020-11-25 Renishaw Plc Method for measuring non-toothed tools using a non-contact tool setter
TWI749961B (zh) 2020-12-22 2021-12-11 雷應科技股份有限公司 刀具檢測器
CN113433129B (zh) * 2021-07-05 2023-01-06 无锡贝斯特精机股份有限公司 一种六轴机器人去毛刺刀具检测机构及其方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2123753A5 (enExample) 1971-01-29 1972-09-15 Cometa Sa
FR2343555A1 (fr) 1976-03-12 1977-10-07 Dassault Avions Procede et dispositif de determination de la position d'un objet tel qu'un element de machine
US4373804A (en) * 1979-04-30 1983-02-15 Diffracto Ltd. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US4502823A (en) 1981-12-21 1985-03-05 Sperry Corporation Broken drill bit detector
DE3218754C2 (de) 1982-05-18 1985-11-28 Friedrich Deckel AG, 8000 München Verfahren und Einrichtung zur Vermessung eines in einem zustellbaren Werkzeughalter einer Werkzeugmaschine eingespannten Werkzeugs
US4518257A (en) 1982-07-28 1985-05-21 General Electric Company Optical inspection system and method
JPH0278904A (ja) * 1988-09-14 1990-03-19 Toupure Kk 回転形工具の測定方法
CH677892A5 (enExample) * 1988-12-21 1991-07-15 Rollomatic Sa
DE3905949A1 (de) 1989-02-25 1990-08-30 Herbert Prof Dr Ing Schulz Verfahren zum vermessen von schneidkanten
DE69117715T2 (de) * 1990-12-31 1996-07-18 Excellon Automation Überwachung des Zustandes eines rotierenden Werkzeuges
DE69223544T2 (de) 1991-04-26 1998-07-09 Nippon Telegraph & Telephone Verfahren und Vorrichtung zum Messen des Profils eines Objekts
EP0532933B1 (en) * 1991-08-21 1995-11-02 Tokyo Seimitsu Co.,Ltd. Blade position detection apparatus
DE59309003D1 (de) 1992-08-25 1998-10-29 Leuze Electronic Gmbh & Co Aus einem Sender und einem Empfänger bestehende Einrichtung zum Erfassen von Gegenständen
JPH0691427A (ja) * 1992-09-09 1994-04-05 Nkk Corp 間欠歯状体の歯欠け検出装置
DE4244869C2 (de) 1992-11-14 1997-08-28 Chiron Werke Gmbh Verfahren zum Vermessen eines Werkzeuges
DE4323910C2 (de) 1993-07-16 1995-08-10 Leuze Electronic Gmbh & Co Lichtschranke mit einer Auswerteelektronik zum Erkennen von Störsignalen
US5940787A (en) * 1993-12-10 1999-08-17 U.S. Tech Corporation Apparatuses and methods of monitoring the condition of tools and workpieces
JPH08197382A (ja) * 1995-01-30 1996-08-06 Toshiba Mach Co Ltd 工具の切屑付着検知方法および装置
US5841662A (en) * 1996-07-31 1998-11-24 Coburn Optical Industries, Inc. Method and apparatus for chucked work piece recognition
JP3648886B2 (ja) * 1996-11-05 2005-05-18 豊田工機株式会社 工具刃先位置検出装置及び工具刃先位置検出装置を備えた数値制御工作機械
JP3421562B2 (ja) * 1997-12-26 2003-06-30 オークマ株式会社 刃具の振れ検出方法
US6111262A (en) * 1998-10-30 2000-08-29 Sumitomo Metal Industries, Ltd. Method for measuring a diameter of a crystal
US6496273B1 (en) 1999-05-05 2002-12-17 Renishaw Plc Position determining apparatus for coordinate positioning machine
DE19950331C2 (de) * 1999-10-19 2001-09-06 Blum Novotest Gmbh Verfahren und Vorrichtung zum Prüfen einer Schneidengeometrie eines drehantreibbaren Werkzeugs
KR100906472B1 (ko) * 2002-05-21 2009-07-08 삼성전자주식회사 다중 검출기를 이용한 광기록매체 데이터 재생 장치

Also Published As

Publication number Publication date
US20040069936A1 (en) 2004-04-15
ATE293243T1 (de) 2005-04-15
CN1338040A (zh) 2002-02-27
EP1562020B1 (en) 2007-08-22
DE60036144D1 (de) 2007-10-04
KR100746932B1 (ko) 2007-08-08
KR20010101597A (ko) 2001-11-14
DE60019399D1 (de) 2005-05-19
US6635894B1 (en) 2003-10-21
JP2003524154A (ja) 2003-08-12
CN1202403C (zh) 2005-05-18
DE60019399T2 (de) 2005-09-22
DE60036144T2 (de) 2008-01-03
US7053392B2 (en) 2006-05-30
CN1660541B (zh) 2010-12-01
US6878953B2 (en) 2005-04-12
US20050167619A1 (en) 2005-08-04
EP1144944B1 (en) 2005-04-13
ATE371164T1 (de) 2007-09-15
WO2001038822A1 (en) 2001-05-31
CN1660541A (zh) 2005-08-31
EP1562020A1 (en) 2005-08-10
EP1144944A1 (en) 2001-10-17

Similar Documents

Publication Publication Date Title
JP4695808B2 (ja) 機械上の対象物を測定する光学測定装置
US6597464B2 (en) Method and device for testing a cutting-edge geometry of a rotatably drivable tool
CN110879298B (zh) 基于通讯式编码器的速度获取方法
KR20030022803A (ko) Ａｔｅ 타이밍 측정 유닛 및 방법
US8530823B2 (en) Tool setting or analysis device with backup or repeated trigger signal for detecting a tool
US6597205B2 (en) High accuracy method for determining the frequency of a pulse input signal over a wide frequency range
JP2001133364A (ja) 接触検出・監視装置
CN101726625A (zh) 防止转速测量值跳动的装置及其方法
TW534976B (en) Optical measuring apparatus for measuring objects on machines
KR20110063073A (ko) 박막 두께 모니터링 장치, 시스템 및 방법
JP2008089409A (ja) 回転速度検出器
SU1714340A1 (ru) Устройство дл измерени углового положени вала
KR100206779B1 (ko) 테이프 잔량 연산 방법 및 장치
JPH01304360A (ja) 電動機速度検出方法
KR100494899B1 (ko) 엔진용 밸브의 회전 측정장치
JP2005257482A (ja) 計測コントローラ
SU1177741A1 (ru) Устройство синхронизации дл ультразвукового дефектоскопа
JPH0839298A (ja) プレス機械のスライド停止時間測定装置
KR0164046B1 (ko) 속도적응 티 방법에 의한 전동기 회전속도 추정장치 및 그 방법
JP2009098076A (ja) 回転計
JP2001221807A (ja) 回転速度検出装置
JPS62240865A (ja) 回転計
JPH04348851A (ja) 部分的に外径が異なるドリルの最大径測定装置
CN105783834A (zh) 基于小孔影像法测量刀具直径的方法及装置
FR2643719A1 (fr) Procede et dispositif de mesure de la vitesse et de la tension d'un fil en defilement continu

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20071119

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20071119

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20071119

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100216

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20100514

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20100521

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100616

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20100817

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20101217

RD13 Notification of appointment of power of sub attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7433

Effective date: 20101220

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20101220

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20110117

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20110218

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20110228

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140304

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4695808

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term