CN1198333C - 电路板及其制作方法和高输出模块 - Google Patents
电路板及其制作方法和高输出模块 Download PDFInfo
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- 229910052751 metal Inorganic materials 0.000 claims abstract description 113
- 239000002184 metal Substances 0.000 claims abstract description 113
- 238000005530 etching Methods 0.000 claims abstract description 36
- 239000010931 gold Substances 0.000 claims abstract description 33
- 229910052737 gold Inorganic materials 0.000 claims abstract description 23
- 239000000919 ceramic Substances 0.000 claims abstract description 22
- 239000004065 semiconductor Substances 0.000 claims abstract description 15
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 12
- 229910052719 titanium Inorganic materials 0.000 claims description 16
- 229910052759 nickel Inorganic materials 0.000 claims description 14
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- 238000001704 evaporation Methods 0.000 claims description 10
- 238000007747 plating Methods 0.000 claims description 9
- 239000011651 chromium Substances 0.000 claims description 7
- VNNRSPGTAMTISX-UHFFFAOYSA-N chromium nickel Chemical compound [Cr].[Ni] VNNRSPGTAMTISX-UHFFFAOYSA-N 0.000 claims description 7
- 229910001120 nichrome Inorganic materials 0.000 claims description 7
- 229910052804 chromium Inorganic materials 0.000 claims description 6
- 238000010276 construction Methods 0.000 claims description 6
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 claims description 5
- 239000011347 resin Substances 0.000 claims description 5
- 229920005989 resin Polymers 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 4
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- 229910003460 diamond Inorganic materials 0.000 claims description 3
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- 239000007788 liquid Substances 0.000 description 8
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 7
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 7
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- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 229910052750 molybdenum Inorganic materials 0.000 description 6
- 239000011733 molybdenum Substances 0.000 description 6
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- 229910052720 vanadium Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 1
- 229910004166 TaN Inorganic materials 0.000 description 1
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- 230000003287 optical effect Effects 0.000 description 1
- GNRSAWUEBMWBQH-UHFFFAOYSA-N oxonickel Chemical compound [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 description 1
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
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- 239000004094 surface-active agent Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
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Abstract
一种电路板包括在陶瓷基底(11)上形成第一金属层图形(14),在第一金属层上形成至少0.5μm厚的第二金属层图形(16),其中该第一金属层包含一由Ti/Mo/Ni,Ti/Pt/Ni,Ti/V/Ni,或者Ti/Pd/Ni组成的多层结构,该第二金属层包括Au,Ni/Au,Ag,Pd/Au,Pt/Au,或者V/Au,其中第一金属层通过刻蚀宽度减小。此外,第三金属层(13)可以与第一金属层在同一平面上形成图形。第二金属层(16)的最外层是金属,比如不会被刻蚀的金。该电路板具有精细的和高分辨率的布线图,使在其上面安装至少一个高输出半导体元件、实现小型高性能高输出模块成为可能。
Description
技术领域
本发明涉及利用陶瓷的半导体电路板,并涉及制作这种电路板的方法,以及涉及到高输出模块。
背景技术
半导体元件包括:LD(激光二极管或半导体激光器),APD(雪崩光电二极管),和其他这样的光半导体元件;HEMT(高电迁移率晶体管),HBT(异质双极晶体管),和其他使用GaAs,InP,Si/SiGe的半导体元件,或者能够高速工作的类似元件;IGBT(绝缘栅双极晶体管)和其他这样的变换器/整流器硅器件;BiTe和其他这样的热电半导体元件。为了更高的集成和速度,用于这些元件范围的电路板需要低电阻,良好的热辐射,很好匹配的热膨胀,和非常精细的布线图。
通过参考图4A-4E描述一种常规电路板。如图4A-4E所示,目前为止该方法一直如下所述。把金属掩模或者光掩模2应用到陶瓷基底1上(图4A),用蒸镀或溅射形成第三金属层3,并且把金属掩模或者光掩模2去除(图4B),之后形成抗蚀剂层4(图4C),然后用蒸镀或溅射形成第一金属层5(图4D),去除抗蚀剂层得到最终产品(图4E)。
陶瓷基底1用AlN或氧化铝制成。这已经被公开,比如在日本专利2-271585中。第三金属层用作抗蚀剂层,一般用TaN、NiCr或者钨制作。第一金属层用作导线或者电感,并且具有多层结构包括Ti/Mo/Au、Ti/Pt/Au、Cr/Mo/Au或者Ti/V/Au。该层使用钛或者铬与陶瓷基底接触的原因是为了提高对于基底的粘接强度。因为铂、钼或者钒有高的熔点,把它插入中间就是为了防止预层与在同基底接触部分的金属比如钛或者铬形成合金。金用作顶层,选择它是为了顺利进行引线接合或者芯片焊接。在最终产品中材料组合的例子如图4F所示。
对于用于功率半导体的基底,把铜或者金用蒸镀、镀覆或熔融应用到陶瓷基底的全部上表面,之后用刻蚀形成布线图。
为了生产高输出模块,把半导体元件用芯片焊接方法安装在这些电路板上。
对于目前的高输出模块,除了使模块更小来减少最终器件的尺寸,也需要使布线图更精细、尺寸减小,使其能够处理更高的频率。为了降低高频性能的损失和降低功耗,也有必要最小化引线金属部分的电阻,为此有必要采用厚膜技术来提高布线图的厚度。
这两个要求用常规电路板不能同时满足。这是因为用常规实际使用的精细布线方法,在依靠金属掩模或者光掩模用蒸镀方法形成了厚膜抗蚀剂层的基底上面,不能形成精细的布线图,并且为了获得厚膜,蒸镀必须连续进行很长时间,因此实际应用是困难的。此外,当布线图通过刻蚀形成时,因为出现侧面腐蚀,难于进行比引线厚度小的图形的精细处理,并且刻蚀去除尤其困难。因此,不能实现小型化的高性能、高输出模块。
发明内容
本发明的一个目的是提供具有厚膜精细布线图的电路板,并实现小型化高性能高输出模块。
本发明包括如下组成(1)到(9)。
(1)一种电路板,包括第一金属层,其在陶瓷基底上形成图形,和第二金属层,其至少0.5μm厚并在第一金属层上形成图形,其中该第一金属层包含一由Ti/Mo/Ni,Ti/Pt/Ni,Ti/V/Ni,或者Ti/Pd/Ni组成的多层结构,该第二金属层包括Au,Ni/Au,Ag,Pd/Au,Pt/Au,或者V/Au,其中第一金属层通过刻蚀宽度减小。
(2)按照(1)的电路板,具有第三金属层,并与第一金属层在同一平面上形成图形,该第三金属层包括TaN、含有铬的合金、或W。
(3)按照(1)或者(2)的电路板,其中第二金属层的最外层是金。
(4)按照(2)的电路板,其中第三金属层是NiCr。
(5)按照(1)到(4)中任一项的电路板,其中陶瓷基底包含至少一种选自由包含重量含量至少90%的AlN的AlN陶瓷和包含重量含量至少90%的Si3N4的Si3N4陶瓷构成的组。
(6)按照(1)到(4)中任一项的电路板,其中陶瓷基底为金刚石或者cBN。
(7)一种制作电路板的方法包括:
在陶瓷基底上蒸镀或者溅射第一金属层;
形成厚度至少为0.5μm的抗蚀剂图形;
用抗蚀剂层作为掩模在第一金属层上镀覆形成第二金属层;
去除抗蚀剂层,然后刻蚀第一金属层,用第二金属层作为掩模,借此第一金属层通过刻蚀宽度减小。
(8)一种制作电路板的方法包括:
在陶瓷基底上形成第三金属层图形,然后蒸镀或者溅射第一金属层;
形成厚度至少为0.5μm的抗蚀剂图形;
用抗蚀剂层作为掩模在第一金属层上镀覆形成第二金属层;
去除抗蚀剂层,然后刻蚀第一金属层,用第二金属层作为掩模,借此第一金属层通过刻蚀宽度减小。
(9)一种高输出模块,其中至少一种发热至少10mW的高输出半导体元件,用焊料或者导电树脂安装在按照(1)到(6)中任一项的电路板上。
附图说明
图1是描述本发明电路板中金属层结构组成例子的截面图。
图2A-2G是描述本发明例子的电路板制作的步骤简图。
图3是在例子中生产的高输出模块的结构简图。
图4A-4E是描述常规电路板制作步骤的简图,图4F表示完成后电路板的材料组合简图。
具体实施方式
在本发明中,包括例如Ti/Mo/Ni,Ti/Pt/Ni,Ti/V/Ni,或者Ti/Pd/Ni的多层结构用作第一金属层。第一金属层的厚度适宜为0.12到1.2μm。如果这一层太薄,在基底的整个上表面上获得均匀金属化是困难的,但是如果这一层太厚,将会有太多侧壁刻蚀以至于精细加工是困难的。保持第一金属层的厚度到0.4μm或更少,能充分消除侧壁刻蚀效应。当第一金属层由Ti/Mo/Ni组成时,钛的厚度应该为0.01到0.3μm,钼的厚度应该为0.01到0.3μm,镍的厚度应该为0.1到0.6μm。
第二金属层能由金,Ni/Au,银,Pd/Au,Pt/Au或者V/Au构成,其中金特别有利。当第二金属层具有多层结构时,最外层应该为金。第二金属层的厚度至少为0.5μm。保持该厚度至少0.5μm能降低布线电阻,减小功耗,并降低高频性能的损失。此外,当第二金属层具有多层结构时,最外层覆盖第二金属层的大部分是适宜的,并且如果至少80%的侧壁被最外层覆盖,那是特别有利的。如果最外层覆盖了几乎全部第二金属层,而且是不会被用于第一金属层的刻蚀液刻蚀的金属,那么在第一金属层的刻蚀期间,侧壁刻蚀效应能被最小化。
为了形成这个第二金属层,首先在上述第一金属层上用光掩模形成光刻胶图形。在这个阶段,基底的整个表面能用作电极,因此在没有光刻胶的地方能选择性地镀覆形成第二金属层厚膜。此时去除抗蚀剂层。然后用刻蚀去除第一金属层,如果第二金属层的最外层是不会被用于第一金属层上的刻蚀液刻蚀的金属,那么该刻蚀是选择性的。比如说,如果第一金属层由Ti/Mo/Ni组成,第二金属层是Ni/Au,金不会被用于镍和钼的刻蚀液刻蚀,因此金能用作这刻蚀的掩模。钛只溶解于独立的氢氟酸基刻蚀液,但是由于金甚至不会被这种刻蚀液刻蚀,所以金能够作为选择刻蚀的掩模。
图1描述的例子为用这种方法获得的金属层的层结构。第二金属层的金下面的侧壁,已经被侧壁刻蚀挖掉,钛甚至被挖掉的更大。
如果在开始应用铬基(比如NiCr)金属化图形来定位光掩模或者作为抗蚀剂层。它不会被任何上述的刻蚀液刻蚀,因此将保留到最后。
对于本发明,能用镀覆方法形成第二金属层,因此能获得至少0.5μm厚膜。
此外,由于第二金属层利用本发明抗蚀剂层的掩模作用形成,第一金属层图形的精细度和几何精度由如何形成用于第二金属层的光掩模决定,并且由于该光掩模不需要多次曝光,因此未对准引起的几何精度的下降能被忽略。在第一金属层上形成的抗蚀剂层的厚度应该至少为0.5μm。如果该抗蚀剂层太薄,第二金属层会覆盖抗蚀剂层的顶部,导致不希望有的蘑菇形状。进而,第二金属层中的相邻线条会在抗蚀剂层上相互连通。提高抗蚀剂层的厚度是困难的,但是通过优化曝光条件能够获得厚膜抗蚀剂层,使形成带有垂直侧壁的精细布线图成为可能。SOR(同步加速器轨道辐射)光用于曝光。
用于镀覆的光刻胶的图形精度在亚微米水平,光刻胶线条之间的微小间隔部分能用表面活化剂覆盖。
氧化铝可以用作陶瓷基底,但是由于热辐射对于高输出模块是重要的,因此更适宜用金刚石或cBN,或包括AlN和/或Si3N4重量含量至少90%的陶瓷。AlN是最低成本和高抗漏性的基底。当需要强度时,使用Si3N4是优选的。也可以使用AlN和Si3N4的混合物。此外,如果基底表面太粗糙,取决于分层的第一金属层的厚度,会发生断开,因此可能需要进行表面处理。
本发明也是一种高输出模块,包括至少一个产生至少10mW的热量的高输出半导体元件,通过焊料或者导电树脂连接在上述得到的电路板上。
本发明的例子将参照附图描述。
例1
在图2A中,含有AlN重量比例至少90%的陶瓷用作陶瓷基底11。该基底含有钇,并具有良好的热辐射,热导率为170W/(m·K)。陶瓷基底的表面被处理成表面粗糙度Ra小于0.8μm。这是因为后续层迭的第一金属层的厚度为0.5μm或更小,如果表面太粗糙可能发生断开。
金属掩模12应用到陶瓷基底11上,并且形成NiCr金属层(第三金属层)。溅射设备用于此目的。该层可以用作抗蚀剂层或者用作后续基底划线期间的定位掩模,这里NiCr层被选择用作抗蚀剂层。图2B描述当金属掩模12已经被除去时的阶段,之后NiCr图形作为第三金属层13形成在陶瓷基底11的表面上。然后,如图2C所示,Ti/Mo/Ni作为第一金属层14蒸镀在陶瓷基底11的整个上表面上。钛的厚度为0.05μm,钼的厚度为0.05μm,镍的厚度为0.3μm。
这时候,用光掩模形成抗蚀剂层15,如图2D所示。考虑到第二金属层的厚度,抗蚀剂层15的厚度为2μm。
然后,如图2E所示步骤中,Ni/Au用镀覆层迭作为第二金属层16。为了提高镀覆的粘接性,镍厚度为0.5μm,金厚度为3μm。因为抗蚀剂层15的厚度,第二金属层16有一点蘑菇形状,但是不足以引起问题。如果后续进行合金化处理来提高粘结强度,该金属层可以只是金。
如图2F所示,抗蚀剂层15被除去,之后第一金属层的镍和钼被刻蚀。这里,在抗蚀剂层除去期间表面上形成镍氧化物,因此除去该氧化物,之后立刻用反应刻蚀液刻蚀镍和钼。钛用氢氟酸基刻蚀液去除。这样的最终产品如图2G所示。
引线之间的电阻至少为1MQ,所得到的电路板也具有极好的绝缘。
在这个例子中,金属层形成在陶瓷基底的一侧,但是也能同时应用到两侧。
例2
用上述例1中描述的方法生产具有如图3所示图形的电路板。这里的布线层19中,第一金属层是Ti/Mo/Ni,第二金属层是Ni/Au,用作抗蚀剂层20的第三金属层是Ni/Cr。如图3所示,高输出LD(半导体激光器)17带有集成调制器,发热至少10mW,用焊料通过芯片焊接在电路板上,用焊线18进行引线接合。在安装LD之后,该模块的调制性能的SN比为0.1dB,比使用常规电路板好。用于安装LD的电路板的尺寸仅仅是常规电路板的四分之一,速度限制提高到40Gbps或者更高。
本发明使获得具有厚膜精细布线图形的小型化高性能电路板成为可能。因此获得小型化高性能高输出模块也成为可能。
Claims (11)
1、一种电路板,包括第一金属层,其在陶瓷基底上形成图形;和第二金属层,其至少0.5μm厚并在第一金属层上形成图形,其中该第一金属层包含一由Ti/Mo/Ni,Ti/Pt/Ni,Ti/V/Ni,或者Ti/Pd/Ni组成的多层结构,该第二金属层包括Au,Ni/Au,Ag,Pd/Au,Pt/Au,或者V/Au,其中第一金属层通过刻蚀宽度减小。
2、如权利要求1的电路板,具有第三金属层,并与第一金属层在同一平面上形成图形,该第三金属层包括TaN、含有铬的合金、或W。
3、如权利要求1的电路板,其中第二金属层的最外层是金。
4、如权利要求2的电路板,其中第三金属层是NiCr。
5、如权利要求1-4的任一项的电路板,其中陶瓷基底包含至少一种选自由包含重量含量至少90%的AlN的AlN陶瓷和包含重量含量至少90%的Si3N4的Si3N4陶瓷构成的组。
6、如权利要求1-4的任一项的电路板,其中陶瓷基底为金刚石或者cBN。
7、一种制作电路板的方法,包括:
在陶瓷基底上蒸镀或者溅射第一金属层;
形成厚度至少为0.5μm的抗蚀剂图形;
用抗蚀剂层作为掩模在第一金属层上镀覆形成第二金属层;
去除抗蚀剂层,然后刻蚀第一金属层,用第二金属层作为掩模,借此第一金属层通过刻蚀宽度减小。
8、一种制作电路板的方法,包括:
在陶瓷基底上形成第三金属层图形,然后蒸镀或者溅射第一金属层;
形成厚度至少为0.5μm的抗蚀剂图形;
用抗蚀剂层作为掩模在第一金属层上镀覆形成第二金属层;
去除抗蚀剂层,然后刻蚀第一金属层,用第二金属层作为掩模,借此第一金属层通过刻蚀宽度减小。
9、一种高输出模块,其中至少一种发热至少10mW的高输出半导体元件,用焊料或者导电树脂安装在权利要求1-4的电路板上。
10、一种高输出模块,其中至少一种发热至少10mW的高输出半导体元件,用焊料或者导电树脂安装在权利要求5的电路板上。
11、一种高输出模块,其中至少一种发热至少10mW的高输出半导体元件,用焊料或者导电树脂安装在权利要求6的电路板上。
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US20070037333A1 (en) * | 2005-08-15 | 2007-02-15 | Texas Instruments Incorporated | Work function separation for fully silicided gates |
US7470577B2 (en) * | 2005-08-15 | 2008-12-30 | Texas Instruments Incorporated | Dual work function CMOS devices utilizing carbide based electrodes |
DE102009038674B4 (de) * | 2009-08-24 | 2012-02-09 | Epcos Ag | Trägervorrichtung, Anordnung mit einer solchen Trägervorrichtung sowie Verfahren zur Herstellung eines mindestens eine keramische Schicht umfassenden struktururierten Schichtstapels |
JP6030419B2 (ja) * | 2012-11-22 | 2016-11-24 | 京セラ株式会社 | 配線基板および電子装置 |
TW201446087A (zh) * | 2013-05-16 | 2014-12-01 | Kinsus Interconnect Tech Corp | 用於高頻信號的電路板結構 |
JP6210818B2 (ja) * | 2013-09-30 | 2017-10-11 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
CN109320255A (zh) * | 2018-11-09 | 2019-02-12 | 厦门钜瓷科技有限公司 | 芯片用高导热陶瓷散热器的制备方法 |
US11342256B2 (en) | 2019-01-24 | 2022-05-24 | Applied Materials, Inc. | Method of fine redistribution interconnect formation for advanced packaging applications |
CN111020559B (zh) * | 2019-10-18 | 2022-04-05 | 山东农业工程学院 | 钛合金表面耐高温自润滑涂层及其制备方法 |
CN111417256A (zh) * | 2020-03-18 | 2020-07-14 | 浙江万正电子科技有限公司 | 一种埋平面电阻线路板的平面电阻膜的蚀刻工艺 |
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US3775838A (en) * | 1972-04-24 | 1973-12-04 | Olivetti & Co Spa | Integrated circuit package and construction technique |
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US4699871A (en) * | 1986-02-10 | 1987-10-13 | General Microelectronics Corp. | Methods for developing high speed chip carriers with impedance matching packaging |
JPH02292893A (ja) * | 1989-05-08 | 1990-12-04 | Hitachi Ltd | プリント基板の製造方法 |
JPH0314286A (ja) * | 1989-06-13 | 1991-01-22 | Ibiden Co Ltd | プリント配線板における導体回路の形成方法 |
US5011580A (en) * | 1989-10-24 | 1991-04-30 | Microelectronics And Computer Technology Corporation | Method of reworking an electrical multilayer interconnect |
JPH04185693A (ja) * | 1990-11-21 | 1992-07-02 | Hitachi Ltd | 抵抗膜のエッチング液組成物及びそれを使用したエッチング方法 |
JPH0575258A (ja) * | 1991-09-11 | 1993-03-26 | Fujitsu Ltd | プリント配線板の製造方法 |
US5221639A (en) * | 1991-10-20 | 1993-06-22 | Motorola, Inc. | Method of fabricating resistive conductive patterns on aluminum nitride substrates |
JPH05160545A (ja) * | 1991-12-06 | 1993-06-25 | Hitachi Ltd | プリント配線板の製法 |
JP2726804B2 (ja) * | 1994-07-20 | 1998-03-11 | エイ・ティ・アンド・ティ・コーポレーション | 銅含有デバイスのエッチング方法 |
JPH08153949A (ja) * | 1994-11-28 | 1996-06-11 | Matsushita Electric Works Ltd | セラミック配線板の製造方法 |
US5545927A (en) * | 1995-05-12 | 1996-08-13 | International Business Machines Corporation | Capped copper electrical interconnects |
US6010966A (en) * | 1998-08-07 | 2000-01-04 | Applied Materials, Inc. | Hydrocarbon gases for anisotropic etching of metal-containing layers |
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