CN118339464A - 电特性取得装置 - Google Patents

电特性取得装置 Download PDF

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Publication number
CN118339464A
CN118339464A CN202180105002.5A CN202180105002A CN118339464A CN 118339464 A CN118339464 A CN 118339464A CN 202180105002 A CN202180105002 A CN 202180105002A CN 118339464 A CN118339464 A CN 118339464A
Authority
CN
China
Prior art keywords
measuring
pair
electrical characteristics
correction value
acquisition device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202180105002.5A
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English (en)
Chinese (zh)
Inventor
水越刚
木村将士
水谷周平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Corp
Original Assignee
Fuji Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Corp filed Critical Fuji Corp
Publication of CN118339464A publication Critical patent/CN118339464A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
CN202180105002.5A 2021-12-21 2021-12-21 电特性取得装置 Pending CN118339464A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/047312 WO2023119417A1 (ja) 2021-12-21 2021-12-21 電気的特性取得装置

Publications (1)

Publication Number Publication Date
CN118339464A true CN118339464A (zh) 2024-07-12

Family

ID=86901620

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180105002.5A Pending CN118339464A (zh) 2021-12-21 2021-12-21 电特性取得装置

Country Status (5)

Country Link
US (1) US20250052794A1 (https=)
JP (1) JPWO2023119417A1 (https=)
CN (1) CN118339464A (https=)
DE (1) DE112021008533T5 (https=)
WO (1) WO2023119417A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025052504A1 (ja) * 2023-09-04 2025-03-13 株式会社Fuji 測定装置、装着機

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57146068U (https=) * 1981-03-09 1982-09-13
US4621226A (en) * 1984-05-23 1986-11-04 Weinschel Engineering Co., Inc. Apparatus and method for determining an input electrical characteristic of a device under test
JPH0720620Y2 (ja) * 1987-06-30 1995-05-15 横河・ヒューレット・パッカード株式会社 テストフィクスチュアの校正治具
JP3896186B2 (ja) * 1997-03-17 2007-03-22 太陽誘電株式会社 チップ状回路部品の計測装置
JP2000105263A (ja) * 1998-09-30 2000-04-11 Hewlett Packard Japan Ltd 校正用レバーを備えたｄｕｔ置き台及びそれらを用いた校正方法
JP2000105262A (ja) * 1998-09-30 2000-04-11 Hewlett Packard Japan Ltd 測定用治具
JP2003315394A (ja) * 2002-04-18 2003-11-06 Tokyo Weld Co Ltd 交流インピーダンスのマルチ測定装置及びそのマルチ測定方法
JP4816173B2 (ja) * 2005-03-22 2011-11-16 株式会社村田製作所 測定誤差補正方法及び電子部品特性測定装置
JP5338084B2 (ja) * 2008-02-15 2013-11-13 パナソニック株式会社 コンデンサの検査装置及びこれを用いた検査方法
JP6144984B2 (ja) 2013-07-16 2017-06-07 日置電機株式会社 補正用治具
US9318173B2 (en) * 2013-07-19 2016-04-19 Micron Technology, Inc. Apparatuses and methods for measuring an electrical characteristic of a model signal line and providing measurement information
JP2016191601A (ja) * 2015-03-31 2016-11-10 日置電機株式会社 測定用治具
JP6783062B2 (ja) * 2015-04-08 2020-11-11 日置電機株式会社 測定用治具および補正値測定方法
WO2016203571A1 (ja) * 2015-06-17 2016-12-22 富士機械製造株式会社 実装システム
WO2018109831A1 (ja) * 2016-12-13 2018-06-21 株式会社Ｆｕｊｉ 作業機
WO2018150446A1 (ja) * 2017-02-14 2018-08-23 株式会社Ｆｕｊｉ 測定装置、測定方法
WO2019130411A1 (ja) * 2017-12-26 2019-07-04 株式会社Ｆｕｊｉ 測定装置
JP7326277B2 (ja) * 2018-07-20 2023-08-15 株式会社Fuji 測定装置
JP7221670B2 (ja) * 2018-12-10 2023-02-14 矢崎総業株式会社 インピーダンス測定治具及びインピーダンス測定方法
CN115932397A (zh) * 2023-01-05 2023-04-07 普源精电科技股份有限公司 阻抗分析探头和测量电特性参数的系统
JPWO2024232034A1 (https=) * 2023-05-10 2024-11-14
WO2025191764A1 (ja) * 2024-03-14 2025-09-18 株式会社Fuji 基板生産装置及びファン制御装置

Also Published As

Publication number Publication date
DE112021008533T5 (de) 2024-10-17
US20250052794A1 (en) 2025-02-13
WO2023119417A1 (ja) 2023-06-29
JPWO2023119417A1 (https=) 2023-06-29

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