JPWO2024232034A1 - - Google Patents
Info
- Publication number
- JPWO2024232034A1 JPWO2024232034A1 JP2025519243A JP2025519243A JPWO2024232034A1 JP WO2024232034 A1 JPWO2024232034 A1 JP WO2024232034A1 JP 2025519243 A JP2025519243 A JP 2025519243A JP 2025519243 A JP2025519243 A JP 2025519243A JP WO2024232034 A1 JPWO2024232034 A1 JP WO2024232034A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/017524 WO2024232034A1 (ja) | 2023-05-10 | 2023-05-10 | 測定装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024232034A1 true JPWO2024232034A1 (https=) | 2024-11-14 |
Family
ID=93431497
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025519243A Pending JPWO2024232034A1 (https=) | 2023-05-10 | 2023-05-10 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2024232034A1 (https=) |
| WO (1) | WO2024232034A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2023119417A1 (https=) * | 2021-12-21 | 2023-06-29 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03227544A (ja) * | 1990-02-01 | 1991-10-08 | Nippon Telegr & Teleph Corp <Ntt> | ウエハプローバ装置 |
| JP3111942B2 (ja) * | 1997-10-14 | 2000-11-27 | 日本電気株式会社 | Ｉｃ試験装置 |
| JP3407192B2 (ja) * | 1998-12-31 | 2003-05-19 | 株式会社ダイトー | テストハンドの制御方法及び計測制御システム |
| JP2000266810A (ja) * | 1999-03-16 | 2000-09-29 | Fukuoka Nippon Denki Kk | Ｉｃハンドラ |
| JP2008224586A (ja) * | 2007-03-15 | 2008-09-25 | Yokogawa Electric Corp | 検査装置 |
| KR101016184B1 (ko) * | 2009-02-19 | 2011-02-24 | 성균관대학교산학협력단 | 점진적 하중 변화방식의 스크래치 시험장치 |
| JP2019211407A (ja) * | 2018-06-08 | 2019-12-12 | 日置電機株式会社 | 移動装置、基板検査装置および制御方法 |
| JP7389130B2 (ja) * | 2019-10-14 | 2023-11-29 | 株式会社Fuji | 測定装置、実装機、クランプ状態取得装置 |
-
2023
- 2023-05-10 JP JP2025519243A patent/JPWO2024232034A1/ja active Pending
- 2023-05-10 WO PCT/JP2023/017524 patent/WO2024232034A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024232034A1 (ja) | 2024-11-14 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260311 |