JPWO2023119417A1 - - Google Patents

Info

Publication number
JPWO2023119417A1
JPWO2023119417A1 JP2023568820A JP2023568820A JPWO2023119417A1 JP WO2023119417 A1 JPWO2023119417 A1 JP WO2023119417A1 JP 2023568820 A JP2023568820 A JP 2023568820A JP 2023568820 A JP2023568820 A JP 2023568820A JP WO2023119417 A1 JPWO2023119417 A1 JP WO2023119417A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023568820A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023119417A1 publication Critical patent/JPWO2023119417A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP2023568820A 2021-12-21 2021-12-21 Pending JPWO2023119417A1 (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/047312 WO2023119417A1 (ja) 2021-12-21 2021-12-21 電気的特性取得装置

Publications (1)

Publication Number Publication Date
JPWO2023119417A1 true JPWO2023119417A1 (https=) 2023-06-29

Family

ID=86901620

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023568820A Pending JPWO2023119417A1 (https=) 2021-12-21 2021-12-21

Country Status (5)

Country Link
US (1) US20250052794A1 (https=)
JP (1) JPWO2023119417A1 (https=)
CN (1) CN118339464A (https=)
DE (1) DE112021008533T5 (https=)
WO (1) WO2023119417A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025052504A1 (ja) * 2023-09-04 2025-03-13 株式会社Fuji 測定装置、装着機

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57146068U (https=) * 1981-03-09 1982-09-13
JPS646568U (https=) * 1987-06-30 1989-01-13
JPH10260214A (ja) * 1997-03-17 1998-09-29 Taiyo Yuden Co Ltd チップ状回路部品の計測装置
JP2000105262A (ja) * 1998-09-30 2000-04-11 Hewlett Packard Japan Ltd 測定用治具
JP2000105263A (ja) * 1998-09-30 2000-04-11 Hewlett Packard Japan Ltd 校正用レバーを備えたｄｕｔ置き台及びそれらを用いた校正方法
JP2003315394A (ja) * 2002-04-18 2003-11-06 Tokyo Weld Co Ltd 交流インピーダンスのマルチ測定装置及びそのマルチ測定方法
JP2006300928A (ja) * 2005-03-22 2006-11-02 Murata Mfg Co Ltd 補正データ取得用試料、測定誤差補正方法及び電子部品特性測定装置
JP2009194193A (ja) * 2008-02-15 2009-08-27 Panasonic Corp コンデンサの検査装置及びこれを用いた検査方法
JP2016191601A (ja) * 2015-03-31 2016-11-10 日置電機株式会社 測定用治具
JP2016200583A (ja) * 2015-04-08 2016-12-01 日置電機株式会社 測定用治具、補正値測定方法および補正方法
WO2016203571A1 (ja) * 2015-06-17 2016-12-22 富士機械製造株式会社 実装システム
WO2019130411A1 (ja) * 2017-12-26 2019-07-04 株式会社Ｆｕｊｉ 測定装置
WO2020017019A1 (ja) * 2018-07-20 2020-01-23 株式会社Ｆｕｊｉ 測定装置
JP2020094824A (ja) * 2018-12-10 2020-06-18 矢崎総業株式会社 インピーダンス測定治具及びインピーダンス測定方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4621226A (en) * 1984-05-23 1986-11-04 Weinschel Engineering Co., Inc. Apparatus and method for determining an input electrical characteristic of a device under test
JP6144984B2 (ja) 2013-07-16 2017-06-07 日置電機株式会社 補正用治具
US9318173B2 (en) * 2013-07-19 2016-04-19 Micron Technology, Inc. Apparatuses and methods for measuring an electrical characteristic of a model signal line and providing measurement information
WO2018109831A1 (ja) * 2016-12-13 2018-06-21 株式会社Ｆｕｊｉ 作業機
WO2018150446A1 (ja) * 2017-02-14 2018-08-23 株式会社Ｆｕｊｉ 測定装置、測定方法
CN115932397A (zh) * 2023-01-05 2023-04-07 普源精电科技股份有限公司 阻抗分析探头和测量电特性参数的系统
JPWO2024232034A1 (https=) * 2023-05-10 2024-11-14
WO2025191764A1 (ja) * 2024-03-14 2025-09-18 株式会社Fuji 基板生産装置及びファン制御装置

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57146068U (https=) * 1981-03-09 1982-09-13
JPS646568U (https=) * 1987-06-30 1989-01-13
JPH10260214A (ja) * 1997-03-17 1998-09-29 Taiyo Yuden Co Ltd チップ状回路部品の計測装置
JP2000105262A (ja) * 1998-09-30 2000-04-11 Hewlett Packard Japan Ltd 測定用治具
JP2000105263A (ja) * 1998-09-30 2000-04-11 Hewlett Packard Japan Ltd 校正用レバーを備えたｄｕｔ置き台及びそれらを用いた校正方法
JP2003315394A (ja) * 2002-04-18 2003-11-06 Tokyo Weld Co Ltd 交流インピーダンスのマルチ測定装置及びそのマルチ測定方法
JP2006300928A (ja) * 2005-03-22 2006-11-02 Murata Mfg Co Ltd 補正データ取得用試料、測定誤差補正方法及び電子部品特性測定装置
JP2009194193A (ja) * 2008-02-15 2009-08-27 Panasonic Corp コンデンサの検査装置及びこれを用いた検査方法
JP2016191601A (ja) * 2015-03-31 2016-11-10 日置電機株式会社 測定用治具
JP2016200583A (ja) * 2015-04-08 2016-12-01 日置電機株式会社 測定用治具、補正値測定方法および補正方法
WO2016203571A1 (ja) * 2015-06-17 2016-12-22 富士機械製造株式会社 実装システム
WO2019130411A1 (ja) * 2017-12-26 2019-07-04 株式会社Ｆｕｊｉ 測定装置
WO2020017019A1 (ja) * 2018-07-20 2020-01-23 株式会社Ｆｕｊｉ 測定装置
JP2020094824A (ja) * 2018-12-10 2020-06-18 矢崎総業株式会社 インピーダンス測定治具及びインピーダンス測定方法

Also Published As

Publication number Publication date
DE112021008533T5 (de) 2024-10-17
CN118339464A (zh) 2024-07-12
US20250052794A1 (en) 2025-02-13
WO2023119417A1 (ja) 2023-06-29

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