DE112021008533T5 - Elektrische-Charakteristik-Erfassungsvorrichtung - Google Patents
Elektrische-Charakteristik-Erfassungsvorrichtung Download PDFInfo
- Publication number
- DE112021008533T5 DE112021008533T5 DE112021008533.6T DE112021008533T DE112021008533T5 DE 112021008533 T5 DE112021008533 T5 DE 112021008533T5 DE 112021008533 T DE112021008533 T DE 112021008533T DE 112021008533 T5 DE112021008533 T5 DE 112021008533T5
- Authority
- DE
- Germany
- Prior art keywords
- component
- electrical characteristic
- pair
- probes
- correction value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims description 6
- 239000000523 sample Substances 0.000 claims abstract description 77
- 238000012937 correction Methods 0.000 claims abstract description 49
- 238000013459 approach Methods 0.000 claims description 14
- 238000000926 separation method Methods 0.000 claims description 6
- 239000012530 fluid Substances 0.000 claims description 5
- 238000012545 processing Methods 0.000 claims description 5
- 239000004020 conductor Substances 0.000 description 34
- 238000000034 method Methods 0.000 description 11
- 230000005611 electricity Effects 0.000 description 7
- 230000003068 static effect Effects 0.000 description 7
- 238000005259 measurement Methods 0.000 description 5
- 230000001681 protective effect Effects 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 4
- 239000002699 waste material Substances 0.000 description 4
- 230000008030 elimination Effects 0.000 description 3
- 238000003379 elimination reaction Methods 0.000 description 3
- 239000012212 insulator Substances 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- BUHVIAUBTBOHAG-FOYDDCNASA-N (2r,3r,4s,5r)-2-[6-[[2-(3,5-dimethoxyphenyl)-2-(2-methylphenyl)ethyl]amino]purin-9-yl]-5-(hydroxymethyl)oxolane-3,4-diol Chemical compound COC1=CC(OC)=CC(C(CNC=2C=3N=CN(C=3N=CN=2)[C@H]2[C@@H]([C@H](O)[C@@H](CO)O2)O)C=2C(=CC=CC=2)C)=C1 BUHVIAUBTBOHAG-FOYDDCNASA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2021/047312 WO2023119417A1 (ja) | 2021-12-21 | 2021-12-21 | 電気的特性取得装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE112021008533T5 true DE112021008533T5 (de) | 2024-10-17 |
Family
ID=86901620
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112021008533.6T Pending DE112021008533T5 (de) | 2021-12-21 | 2021-12-21 | Elektrische-Charakteristik-Erfassungsvorrichtung |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20250052794A1 (https=) |
| JP (1) | JPWO2023119417A1 (https=) |
| CN (1) | CN118339464A (https=) |
| DE (1) | DE112021008533T5 (https=) |
| WO (1) | WO2023119417A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025052504A1 (ja) * | 2023-09-04 | 2025-03-13 | 株式会社Fuji | 測定装置、装着機 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015021728A (ja) | 2013-07-16 | 2015-02-02 | 日置電機株式会社 | 補正用治具 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57146068U (https=) * | 1981-03-09 | 1982-09-13 | ||
| US4621226A (en) * | 1984-05-23 | 1986-11-04 | Weinschel Engineering Co., Inc. | Apparatus and method for determining an input electrical characteristic of a device under test |
| JPH0720620Y2 (ja) * | 1987-06-30 | 1995-05-15 | 横河・ヒューレット・パッカード株式会社 | テストフィクスチュアの校正治具 |
| JP3896186B2 (ja) * | 1997-03-17 | 2007-03-22 | 太陽誘電株式会社 | チップ状回路部品の計測装置 |
| JP2000105263A (ja) * | 1998-09-30 | 2000-04-11 | Hewlett Packard Japan Ltd | 校正用レバーを備えたｄｕｔ置き台及びそれらを用いた校正方法 |
| JP2000105262A (ja) * | 1998-09-30 | 2000-04-11 | Hewlett Packard Japan Ltd | 測定用治具 |
| JP2003315394A (ja) * | 2002-04-18 | 2003-11-06 | Tokyo Weld Co Ltd | 交流インピーダンスのマルチ測定装置及びそのマルチ測定方法 |
| JP4816173B2 (ja) * | 2005-03-22 | 2011-11-16 | 株式会社村田製作所 | 測定誤差補正方法及び電子部品特性測定装置 |
| JP5338084B2 (ja) * | 2008-02-15 | 2013-11-13 | パナソニック株式会社 | コンデンサの検査装置及びこれを用いた検査方法 |
| US9318173B2 (en) * | 2013-07-19 | 2016-04-19 | Micron Technology, Inc. | Apparatuses and methods for measuring an electrical characteristic of a model signal line and providing measurement information |
| JP2016191601A (ja) * | 2015-03-31 | 2016-11-10 | 日置電機株式会社 | 測定用治具 |
| JP6783062B2 (ja) * | 2015-04-08 | 2020-11-11 | 日置電機株式会社 | 測定用治具および補正値測定方法 |
| WO2016203571A1 (ja) * | 2015-06-17 | 2016-12-22 | 富士機械製造株式会社 | 実装システム |
| WO2018109831A1 (ja) * | 2016-12-13 | 2018-06-21 | 株式会社Ｆｕｊｉ | 作業機 |
| WO2018150446A1 (ja) * | 2017-02-14 | 2018-08-23 | 株式会社Ｆｕｊｉ | 測定装置、測定方法 |
| WO2019130411A1 (ja) * | 2017-12-26 | 2019-07-04 | 株式会社Ｆｕｊｉ | 測定装置 |
| JP7326277B2 (ja) * | 2018-07-20 | 2023-08-15 | 株式会社Fuji | 測定装置 |
| JP7221670B2 (ja) * | 2018-12-10 | 2023-02-14 | 矢崎総業株式会社 | インピーダンス測定治具及びインピーダンス測定方法 |
| CN115932397A (zh) * | 2023-01-05 | 2023-04-07 | 普源精电科技股份有限公司 | 阻抗分析探头和测量电特性参数的系统 |
| JPWO2024232034A1 (https=) * | 2023-05-10 | 2024-11-14 | ||
| WO2025191764A1 (ja) * | 2024-03-14 | 2025-09-18 | 株式会社Fuji | 基板生産装置及びファン制御装置 |
-
2021
- 2021-12-21 JP JP2023568820A patent/JPWO2023119417A1/ja active Pending
- 2021-12-21 CN CN202180105002.5A patent/CN118339464A/zh active Pending
- 2021-12-21 WO PCT/JP2021/047312 patent/WO2023119417A1/ja not_active Ceased
- 2021-12-21 DE DE112021008533.6T patent/DE112021008533T5/de active Pending
- 2021-12-21 US US18/718,257 patent/US20250052794A1/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015021728A (ja) | 2013-07-16 | 2015-02-02 | 日置電機株式会社 | 補正用治具 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN118339464A (zh) | 2024-07-12 |
| US20250052794A1 (en) | 2025-02-13 |
| WO2023119417A1 (ja) | 2023-06-29 |
| JPWO2023119417A1 (https=) | 2023-06-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed |