CN114062979A - 磁传感器电路 - Google Patents

磁传感器电路 Download PDF

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Publication number
CN114062979A
CN114062979A CN202110836083.8A CN202110836083A CN114062979A CN 114062979 A CN114062979 A CN 114062979A CN 202110836083 A CN202110836083 A CN 202110836083A CN 114062979 A CN114062979 A CN 114062979A
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CN
China
Prior art keywords
signal
output voltage
circuit
voltage
mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202110836083.8A
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English (en)
Chinese (zh)
Inventor
挽地友生
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ablic Inc
Original Assignee
Ablic Inc
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Application filed by Ablic Inc filed Critical Ablic Inc
Publication of CN114062979A publication Critical patent/CN114062979A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/0206—Three-component magnetometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0005—Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measuring Magnetic Variables (AREA)
CN202110836083.8A 2020-08-03 2021-07-23 磁传感器电路 Pending CN114062979A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020131417A JP7465173B2 (ja) 2020-08-03 2020-08-03 磁気センサ回路
JP2020-131417 2020-08-03

Publications (1)

Publication Number Publication Date
CN114062979A true CN114062979A (zh) 2022-02-18

Family

ID=80002834

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202110836083.8A Pending CN114062979A (zh) 2020-08-03 2021-07-23 磁传感器电路

Country Status (3)

Country Link
US (1) US11408946B2 (enExample)
JP (1) JP7465173B2 (enExample)
CN (1) CN114062979A (enExample)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009031225A (ja) * 2007-07-30 2009-02-12 Panasonic Corp 磁界検出装置
US20120062222A1 (en) * 2010-09-15 2012-03-15 Kabushiki Kaisha Toshiba Magnetic detection device
US20150185293A1 (en) * 2013-12-26 2015-07-02 Allegro Microsystems, Llc Methods and Apparatus for Sensor Diagnostics
JP2019078714A (ja) * 2017-10-27 2019-05-23 協立電機株式会社 フラックスゲートセンサ

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003025757A (ja) 2001-07-16 2003-01-29 Toppan Printing Co Ltd 上製本用表紙の製造方法及び上製本の製造方法
US9851416B2 (en) 2014-07-22 2017-12-26 Allegro Microsystems, Llc Systems and methods for magnetic field sensors with self-test
JP6883482B2 (ja) 2016-08-26 2021-06-09 エイブリック株式会社 センサ回路
US10191124B2 (en) * 2016-08-26 2019-01-29 Sii Semiconductor Corporation Sensor circuit

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009031225A (ja) * 2007-07-30 2009-02-12 Panasonic Corp 磁界検出装置
US20120062222A1 (en) * 2010-09-15 2012-03-15 Kabushiki Kaisha Toshiba Magnetic detection device
US20150185293A1 (en) * 2013-12-26 2015-07-02 Allegro Microsystems, Llc Methods and Apparatus for Sensor Diagnostics
JP2019078714A (ja) * 2017-10-27 2019-05-23 協立電機株式会社 フラックスゲートセンサ

Also Published As

Publication number Publication date
JP7465173B2 (ja) 2024-04-10
JP2022028179A (ja) 2022-02-16
US20220034979A1 (en) 2022-02-03
US11408946B2 (en) 2022-08-09

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Address after: Udaida 4106-73, Daizi, Udaida cho, Kitakyuku, Nagano Prefecture, Japan (postcode: 389-0293)

Applicant after: ABLIC Inc.

Address before: 9-6, 3-dingmu, Mita, Tokyo, Japan

Applicant before: ABLIC Inc.

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