JP7465173B2 - 磁気センサ回路 - Google Patents

磁気センサ回路 Download PDF

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Publication number
JP7465173B2
JP7465173B2 JP2020131417A JP2020131417A JP7465173B2 JP 7465173 B2 JP7465173 B2 JP 7465173B2 JP 2020131417 A JP2020131417 A JP 2020131417A JP 2020131417 A JP2020131417 A JP 2020131417A JP 7465173 B2 JP7465173 B2 JP 7465173B2
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JP
Japan
Prior art keywords
signal
output voltage
circuit
mode
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2020131417A
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English (en)
Japanese (ja)
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JP2022028179A5 (enExample
JP2022028179A (ja
Inventor
友生 挽地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ablic Inc
Original Assignee
Ablic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ablic Inc filed Critical Ablic Inc
Priority to JP2020131417A priority Critical patent/JP7465173B2/ja
Priority to CN202110836083.8A priority patent/CN114062979A/zh
Priority to US17/387,933 priority patent/US11408946B2/en
Publication of JP2022028179A publication Critical patent/JP2022028179A/ja
Publication of JP2022028179A5 publication Critical patent/JP2022028179A5/ja
Application granted granted Critical
Publication of JP7465173B2 publication Critical patent/JP7465173B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/0206—Three-component magnetometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0005—Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measuring Magnetic Variables (AREA)
JP2020131417A 2020-08-03 2020-08-03 磁気センサ回路 Active JP7465173B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2020131417A JP7465173B2 (ja) 2020-08-03 2020-08-03 磁気センサ回路
CN202110836083.8A CN114062979A (zh) 2020-08-03 2021-07-23 磁传感器电路
US17/387,933 US11408946B2 (en) 2020-08-03 2021-07-28 Magnetic sensor circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020131417A JP7465173B2 (ja) 2020-08-03 2020-08-03 磁気センサ回路

Publications (3)

Publication Number Publication Date
JP2022028179A JP2022028179A (ja) 2022-02-16
JP2022028179A5 JP2022028179A5 (enExample) 2023-05-25
JP7465173B2 true JP7465173B2 (ja) 2024-04-10

Family

ID=80002834

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020131417A Active JP7465173B2 (ja) 2020-08-03 2020-08-03 磁気センサ回路

Country Status (3)

Country Link
US (1) US11408946B2 (enExample)
JP (1) JP7465173B2 (enExample)
CN (1) CN114062979A (enExample)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003025757A (ja) 2001-07-16 2003-01-29 Toppan Printing Co Ltd 上製本用表紙の製造方法及び上製本の製造方法
JP2009031225A (ja) 2007-07-30 2009-02-12 Panasonic Corp 磁界検出装置
US20160025820A1 (en) 2014-07-22 2016-01-28 Allegro Microsystems, Llc Systems and Methods for Magnetic Field Sensors with Self-Test
JP2018036252A (ja) 2016-08-26 2018-03-08 エイブリック株式会社 センサ回路

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012063211A (ja) * 2010-09-15 2012-03-29 Toshiba Corp 磁気検出装置
US9910088B2 (en) * 2013-12-26 2018-03-06 Allegro Microsystems, Llc Methods and apparatus for sensor diagnostics including programmable self-test signals
US10191124B2 (en) * 2016-08-26 2019-01-29 Sii Semiconductor Corporation Sensor circuit
JP2019078714A (ja) * 2017-10-27 2019-05-23 協立電機株式会社 フラックスゲートセンサ

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003025757A (ja) 2001-07-16 2003-01-29 Toppan Printing Co Ltd 上製本用表紙の製造方法及び上製本の製造方法
JP2009031225A (ja) 2007-07-30 2009-02-12 Panasonic Corp 磁界検出装置
US20160025820A1 (en) 2014-07-22 2016-01-28 Allegro Microsystems, Llc Systems and Methods for Magnetic Field Sensors with Self-Test
JP2018036252A (ja) 2016-08-26 2018-03-08 エイブリック株式会社 センサ回路

Also Published As

Publication number Publication date
JP2022028179A (ja) 2022-02-16
CN114062979A (zh) 2022-02-18
US20220034979A1 (en) 2022-02-03
US11408946B2 (en) 2022-08-09

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