CN1115225C - 无铅焊料和焊接制品 - Google Patents

无铅焊料和焊接制品 Download PDF

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CN1115225C
CN1115225C CN99105132A CN99105132A CN1115225C CN 1115225 C CN1115225 C CN 1115225C CN 99105132 A CN99105132 A CN 99105132A CN 99105132 A CN99105132 A CN 99105132A CN 1115225 C CN1115225 C CN 1115225C
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lead
weight
free solder
scolder
tin
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高冈英清
前川清隆
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Murata Manufacturing Co Ltd
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    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C13/00Alloys based on tin
    • C22C13/02Alloys based on tin with antimony or bismuth as the next major constituent
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/22Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/22Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
    • B23K35/24Selection of soldering or welding materials proper
    • B23K35/26Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
    • B23K35/262Sn as the principal constituent
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C13/00Alloys based on tin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/001Interlayers, transition pieces for metallurgical bonding of workpieces
    • B23K35/007Interlayers, transition pieces for metallurgical bonding of workpieces at least one of the workpieces being of copper or another noble metal
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12493Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
    • Y10T428/12687Pb- and Sn-base components: alternative to or next to each other
    • Y10T428/12694Pb- and Sn-base components: alternative to or next to each other and next to Cu- or Fe-base component
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12493Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
    • Y10T428/12708Sn-base component
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12493Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
    • Y10T428/12708Sn-base component
    • Y10T428/12715Next to Group IB metal-base component
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12493Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
    • Y10T428/12708Sn-base component
    • Y10T428/12722Next to Group VIII metal-base component

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Abstract

本发明提供了一种无铅焊料,它含有0.01-0.5%(重量)的镍;0.5-3.39%(重量)的银;和96.6%(重量)或更多的锡。本发明还提供了一种焊接制品,它包括:包含易于扩散到熔融的锡中的过渡金属导体的工件;和本发明的的无铅焊料;所述的无铅焊料施用于该工件并与其结合,在电的方面和机械方面结合于所述的过渡金属导体。上述的无铅焊料和焊接制品在焊接过程和焊接后的时效过程中基本上不引起电极腐蚀,并且具有高的拉伸强度和抗热冲击性。

Description

无铅焊料和焊接制品
本发明涉及无铅焊料和焊接制品。
人们广泛地用焊料在电子器件和电子元件上建立电的和机械的结合。一般使用以锡和铅为主要成分的焊料。另外,考虑到环境问题,人们正在使用不含铅的焊料(所谓的“无铅焊料”),这些焊料以锡为主要成分,并包含银、铋、铜、铟和锑等其它组分。近年来,已用这类无铅焊料制得了具有焊接特性令人满意的电接头的焊接制品。
但是,含有锡作为主要组分的焊料,尤其是无铅焊料,在焊接时或焊接后的热老化期间,容易在电接头处形成电极腐蚀。当被焊接的电极组合物中含有易扩散到锡中间的组分时,就会进一步加速电极腐蚀。
以锡和银作为主要组分的无铅焊料也已有人提出;但是,为了提高在焊接时的抗电极腐蚀性能而加入镍,将使坚硬的锡银合金进一步硬化,从而使其塑性变形性能显著降低。
本发明的目的是提供一种无铅焊料和焊接制品,在焊接过程或焊接后的时效期间,这种焊料不会引起电极腐蚀,而且具有高拉伸强度和抗热冲击性能。
为了达到上述的目的,本发明一个较佳的实施例提供的无铅焊料包含0.01-0.5%(重量)的镍;0.5-3.39%(重量)的银;和96.6%(重量)或更多的锡。
上述的无铅焊料在上述的各种组分之外,可含有痕量的偶然的杂质。偶然的杂质的例子为铅、铋、铜和钠。
本发明另一个较佳实施例提供的无铅焊料包含0.01-0.5%(重量)的镍;0.5-2.0%(重量)的铜;0.5-2.89%(重量)的银;和96.6%(重量)或更多的锡。
上述的无铅焊料在上述的各种组分之外,可含有痕量的偶然的杂质。偶然的杂质的例子为铅、铋、和钠。
本发明再一个较佳实施例提供的无铅焊料包含0.01-0.5%(重量)的镍;选自0.5-2.0%(重量)的铜和0.5-5.0%(重量)的锑中的至少一种组分;其余为锡。
上述的无铅焊料在上述的各种组分之外,可含有痕量的偶然的杂质。偶然的杂质的例子为铅、铋、和钠。
本发明还有一个较佳实施例提供了一种焊接制品,它包括:一个工件,该工件包含易于扩散至熔融的锡中间的过渡金属导体;上述任一个较佳实施例中的无铅焊料;所述的焊料施用于工件并与其结合,在电性方面和机械方面结合于所述的过渡金属导体。
在上述焊接制品中,所述的过渡金属导体可以是选自铜、银、镍、金、钯、铂、锌、以及它们的合金中的至少一种组分。
如上所述,本发明的无铅焊料可防止电极腐蚀并具有优良的抗热冲击性能,同时仍保持所需的焊接特性、结合强度、焊料拉伸强度和焊料收缩率,即使用以焊接易于腐蚀的含有过渡金属导体的部件也是这样。
本发明的焊接制品包括一个工件和无铅焊料,该工件包含易于扩散至熔融的锡中间的过渡金属导体,所述的焊料施用于工件并与其结合,在电性方面和机械方面结合于所述的过渡金属导体。因此,本发明的无铅焊料对于易于扩散至熔融的锡中间的过渡金属导体,可防止电极腐蚀并具有优良的抗热冲击性能,同时仍保持所需的焊接特性、结合强度、焊料拉伸强度和焊料收缩率。
本发明的焊接制品中,所述的过渡金属导体是选自铜、银、镍、金、钯、铂、锌、以及它们的合金中的至少一种组分。因此,本发明的无铅焊料对于易于扩散至熔融的锡中间的过渡金属导体,可防止电极腐蚀并具有优良的抗热冲击性能,同时仍保持所需的焊接特性、结合强度、焊料拉伸强度和焊料收缩率。
焊接一般在N2气氛下进行,以提高焊接特性。由于本发明的无铅焊料的镍含量低,因而可方便地在空气中进行。因此该焊料具有优越的焊接加工性能。
本发明的无铅焊料只含有少量昂贵的抑制腐蚀的元素如银,因此与常规的无铅焊料相比,焊接成本可以降低。
在本发明的无铅焊料中,以总重量为100%计,镍的含量较好在0.01-0.5%(重量)的范围。当镍含量低于0.01%(重量)时,抗电极腐蚀性能下降,焊接时电极的剩余面积减少。另一方面,当镍的含量大于0.5%(重量)时,无铅焊料的液线提高,导致在相同温度焊接时,会不能桥接或外观不良。为了避免这些问题而在较高温度焊接,则会使电子元件因受到高热而性能产生缺陷。
在本发明的Sn-Ni-Cu三元或Si-Ni-Ag-Cu四元无铅焊料中,以总重量为100%计,铜的含量较好在0.5-2.0%(重量)的范围。当铜的含量小于0.5%(重量)时,不能有效地提高结合强度。另一方面,当铜的含量大于2.0%(重量)时,由于Cu6Sn5和Cu3Sn之类硬而脆的金属化合物的过度沉淀,使结合强度降低。此外,无铅焊料的液线提高,导致在相同温度焊接时,会不能桥接或外观不良。为了避免这些问题而在较高温度焊接,则会使电子元件因受到高热而性能产生缺陷。而由于锡和镍的含量降低,还会引起其它一些问题。
在本发明的Sn-Ni-Ag三元无铅焊料中,以总重量为100%计,银的含量较好在0.5-3.39%(重量)的范围。当银的含量小于0.5%(重量)时,不能有效地提高结合强度。另一方面,当银的含量大于3.39%(重量)时,由于Ag3Sn之类硬的金属化合物的过度沉淀,使结合强度降低。此外,无铅焊料的液线提高,导致在相同温度焊接时,会不能桥接或外观不良。为了避免这些问题而在较高温度焊接,则会使电子元件因受到高热而性能产生缺陷。而由于锡和镍的含量降低,还会引起其它一些问题。
在本发明的Sn-Ni-Ag-Cu四元无铅焊料中,以总重量为100%计,银的含量较好在0.5-2.89%(重量)的范围。当银的含量小于0.5%(重量)时,不能有效地提高结合强度。另一方面,当银的含量大于2.89%(重量),银和铜的总含量大于3.39%(重量)时,由于Ag3Sn,Cu6Sn5和Cu3Sn之类硬的金属化合物的共沉淀,使结合强度降低。而由于锡和镍的含量降低,还会引起其它一些问题。
在本发明的Sn-Ni-Cu三元无铅焊料中,以总重量为100%计,锑的含量较好在0.5-5.0%(重量)的范围。当锑的含量小于0.5%(重量)时,不能有效地提高结合强度。另一方面,当锑的含量大于5.0%(重量)时,焊料的拉伸强度下降,导致抗热冲击性和加工性下降。而由于锡和镍的含量降低,还会引起其它一些问题。
在本发明的焊接制品中,过渡金属导体是选自铜、银、镍、金、钯、铂、锌、以及它们的合金中的至少一种组分。所述的合金的例子为金-银和金-铂。更好的是,所述的导体包括铜、银、镍或其合金。
本发明的焊接制品包括被焊接的元件以及在电性方面和机械方面结合于该元件的过渡金属导体的无铅焊料。这些制品的例子为:形成在板上用以安装元件的导体以及元件构成的导体的组合,这两种导体互相电结合和机械结合;电子部件与电结合和机械结合于其上的终端的组和;和电子部件电连接和机械连接的终端的组合。
本发明的焊接制品的制造方法为:将本发明的无铅焊料熔融,形成焊料球,把焊料球放在部件上,在其上施加助熔剂,然后在大气中将其加热至预定的温度,以将部件的导体焊接。另一种制造方法是:在焊接容器中将本发明无铅焊料加热至液相温度以上而使其熔融,再将涂覆了助熔剂的部件浸入静态熔融的焊料中,通过浸焊结合部件的导体。还有一种制造方法是:在喷气焊接容器中将本发明无铅焊料加热至液相温度以上而使其熔融,再使涂覆了助熔剂的部件与熔融的焊料接触,通过流焊(flow soldering)结合部件的导体。当部件浸在无铅的焊料中时,部件可在熔融的焊料中摆动。部件与熔融焊料的接触的数目没有限制。
用本发明无铅焊料结合的部件的例子为玻璃-环氧树脂或酚醛树脂印刷电路板,氧化铝或莫来石制成的陶瓷板,以及其上装有绝缘膜的金属板。电结合和机械结合于无铅焊料的过渡金属导体的例子为印刷电路板上的布线回路,电子部件的终端电极,以及引线终端。
以下参照实施例详细说明本发明的无铅焊料和焊接制品。
按照表1所示的配方混合锡、铅、镍、银、铜和锑,制备实施例1-12和对比例1-7各种焊料。
制备多个装有烧结的铜电极和烧结的银电极的单片电容器,用以测量静态电容量。将各电容器浸入在260℃熔融的实施例1-12和对比例1-7的每种焊料中。用电容律方法测量单片电容器在浸焊料前后的静电容量之差,并计算浸焊料后电极的剩余面积率。对于铜电极,是在浸焊料后10秒钟测量电容量的变化,对于银电极,则在浸焊料后3秒钟测量电容量的变化,它们都很容易被腐蚀。
实施例1-12和对比例1-7的焊料膨胀率按日本工业标准(JIS)Z3197测定。考虑到可操作性,测量温度是液线温度加30℃。
将铜片夹在铜引线之间(其表面镀过锡),浸在实施例1-12和对比例1-7各种焊料中,焊料事先在250℃熔融,制得实施例1-12和对比例1-7的各试样。用拉伸机拉伸铜引线,以测定这些试样的拉伸强度。
将实施例1-12和对比例1-7的焊料加热至液相温度加100℃的温度使其熔融,浇铸在石墨模具中,使其固化,然后在常温下时效148小时,制得实施例1-12和对比例1-7的各试样。以5毫米/秒的拉伸率拉伸这些试样,以测定焊料的拉伸强度。各个试样是平片状的,被测量部分的截面是没有凹口的8×3毫米的矩形。
在对实施例1-12和对比例1-7的个试样进行拉伸测量后,测量各个试样的截面积,以便按JIS Z2241(6.11节)确定焊料收缩率。
在Al2O3基片上形成厚的银电极。将基片夹在镀过锡的铜引线之间,浸在实施例1-12和对比例1-7的各个焊料中,焊料事先在260℃熔融。将焊接后的基片放在热冲击容器中,使其经受500个循环的热冲击,每个循环是在-30℃保持30分钟和在+125℃保持30分钟。用肉眼观察实施例1-12和对比例1-7的各个样品的角焊缝的表面裂纹,以确定其抗热冲击性能。引线的侧面焊接在玻璃-环氧树脂基片上,并评价在该基片上形成的角焊逢的侧面。在评价抗热冲击性能时,符号○表示没有裂纹形成。
表1列出了所得的电极剩余面积率、膨胀率、结合强度、焊料的拉伸强度、焊料的收缩率和抗热冲击性。在本发明范围内的无铅焊料和焊接制品显示令人满意的结果,其总评分用符号○表示。
                                                                                  表1
  样  品                         金属导体 电极的剩余面积率(%)    膨胀率(%)   结合强度(N)   焊料拉伸强度(N·mm-2)  收缩率(%)   抗热冲击性  总评分
Sn Pb Ni Ag Cu Sb     Cu电极     Ag电极
实施例   1   99.35   0.15   0.50     99.5     60.0     71   18.8     32   82   ○  ○
  2   99.15   0.15   0.70     99.6     62.0     71   19.0     38   80   ○  ○
  3   97.85   0.15   2.00     99.2     59.8     73   17.4     52   68   ○  ○
  4   99.35   0.15   0.50     97.9     58.5     71   20.0     34   74   ○  ○
  5   96.85   0.15   3.00     98.8     59.0     71   21.3     44   70   ○  ○
  6   94.85   0.15   5.00     98.9     60.0     71   21.0     52   66   ○  ○
  7   99.49   0.01   0.50     98.5     71.0     71   18.8     34   80   ○  ○
  8   96.11   0.50   3.39     99.8     84.0     68   19.8     49   59   ○  ○
  9   98.35   0.15   1.00   0.50     99.4     80.0     73   21.0     50   77   ○  ○
  10   97.15   0.15   2.00   0.70     99.5     78.2     72   19.5     46   75   ○  ○
  11   96.60   0.15   1.75   1.50     99.4     77.9     71   18.2     48   72   ○  ○
  12   96.60   0.40   0.50   2.50     99.9     68.4     69   17.0     50   65   ○  ○
对比例   1   96.50   3.50     89.2     31.7     72   21.1     44   78   ○  ×
  2   97.00   3.00     7.0     0.0     70   21.4     40   80   ○  ×
  3   60.00   40.00     98.6     70.8     84   17.3     53   71   ×  ×
  4   90.85   0.15   9.00     97.6     82.1     74   17.5     67   42   ×  ×
  5   90.70   0.30   9.00     98.0     83.0     70   17.4     70   37   ×  ×
  6   94.85   0.15   5.00     98.7     81.3     71   20.2     55   51   ×  ×
  7   94.70   0.30   5.00     99.0     82.5     70   20.0     57   48   ×  ×
注:符号○表示满意的结果,符号×表示不满意的结果。
由表1可见,实施例1-12的各个含Sn-Ni的焊料具有满意的结果,即电极剩余面积率为95%或更大,膨胀率为65%或更大,结合强度为17N或更大,焊料拉伸强度为30或更大,焊料收缩率为55%或更大,以及优良的抗热冲击性。
虽然对比例3-7的各焊料的电极剩余面积率为95%或更大,但在热冲击实验中出现裂纹,因为对比例4-7的焊料收缩率在42-51%的范围或更低。所以它们是在本发明的范围之外。
对比例3含有40%(重量)的铅,所以它是在本发明的范围之外。
对比例1和2的焊料具有满意的焊料收缩率和抗热冲击性;但铜电极的剩余面积率分别为89.2%和7.0%,银电极的剩余面积率分别为31.7%和0%。因此,这些焊料是在本发明的范围之外。
以上参照较佳的实施例具体说明了本发明,但本领域的技术人员会理解,可以在不偏离本发明实质的条件下在形式和细节上作出各种变化。

Claims (5)

1.一种无铅焊料,它含有0.01-0.5%重量的镍;0.5-3.39%重量的银;和96.6%重量或更多的锡。
2.一种无铅焊料,它含有0.01-0.5%重量的镍;0.5-2.0%重量的铜;0.5-2.89%重量的银;和96.6%重量或更多的锡。
3.一种无铅焊料,它含有0.01-0.5%重量的镍;选自0.5-2.0%重量的铜和0.5-5.0%重量的锑中的至少一种组分;其余为锡。
4.一种焊接制品,它包括:
包含易于扩散到熔融的锡中的过渡金属导体的工件;和
如权利要求1-3中任一项所述的无铅焊料,所述的无铅焊料施用于该工件并与其结合,在电的方面和机械方面结合于所述的过渡金属导体。
5.如权利要求4所述的焊接制品,其特征在于所述的过渡金属导体是选自铜、银、镍、金、钯、铂、锌、以及它们的合金中的至少一种组分。
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