CN111293167A - 抗辐照器件及制备方法 - Google Patents
抗辐照器件及制备方法 Download PDFInfo
- Publication number
- CN111293167A CN111293167A CN202010240884.3A CN202010240884A CN111293167A CN 111293167 A CN111293167 A CN 111293167A CN 202010240884 A CN202010240884 A CN 202010240884A CN 111293167 A CN111293167 A CN 111293167A
- Authority
- CN
- China
- Prior art keywords
- oxide layer
- radiation
- layer
- positive charge
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000002360 preparation method Methods 0.000 title claims abstract description 10
- 230000003471 anti-radiation Effects 0.000 title claims abstract description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 30
- 230000005855 radiation Effects 0.000 claims abstract description 24
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 20
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 16
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 16
- 239000010703 silicon Substances 0.000 claims abstract description 16
- 230000005764 inhibitory process Effects 0.000 claims abstract description 11
- 239000000758 substrate Substances 0.000 claims abstract description 11
- 229910052681 coesite Inorganic materials 0.000 claims description 12
- 229910052906 cristobalite Inorganic materials 0.000 claims description 12
- 229910052682 stishovite Inorganic materials 0.000 claims description 12
- 229910052905 tridymite Inorganic materials 0.000 claims description 12
- 238000000137 annealing Methods 0.000 claims description 7
- 230000002401 inhibitory effect Effects 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 6
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 4
- 229910052593 corundum Inorganic materials 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 4
- 238000002161 passivation Methods 0.000 claims description 4
- 229910001845 yogo sapphire Inorganic materials 0.000 claims description 4
- 238000004140 cleaning Methods 0.000 claims description 3
- 235000012239 silicon dioxide Nutrition 0.000 abstract description 8
- 230000005684 electric field Effects 0.000 abstract description 7
- 230000000694 effects Effects 0.000 abstract description 5
- 238000011982 device technology Methods 0.000 abstract description 2
- 230000003313 weakening effect Effects 0.000 abstract description 2
- 239000010410 layer Substances 0.000 description 37
- 238000010586 diagram Methods 0.000 description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 230000005865 ionizing radiation Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 229910018516 Al—O Inorganic materials 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- -1 hydrogen ions Chemical class 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 230000006798 recombination Effects 0.000 description 2
- 238000005215 recombination Methods 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 229910021641 deionized water Inorganic materials 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 230000000191 radiation effect Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0603—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions
- H01L29/0607—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Formation Of Insulating Films (AREA)
Abstract
抗辐照器件及制备方法,涉及电子器件技术。本发明的抗辐照器件包括辐照敏感氧化层及硅衬底,其特征在于,所述硅衬底和辐照敏感氧化层之间设置有超薄氧化层和正电荷抑制层,且按照硅衬底、超薄氧化层、正电荷抑制层、辐照敏感氧化层的顺序重叠设置。本发明通过削弱二氧化硅与硅界面处捕获的正电荷的电场,从而降低二氧化硅的表面态Dit,达到抗电离辐照的效果。
Description
技术领域
本发明涉及电子器件技术。
背景技术
空间带电辐射粒子主要包括重离子、电子、质子及X射线等。这些带电粒子与晶体管器件发生相互作用,产生电离辐射效应、单粒子效应和位移辐射效应等。对于采用SiO2作为绝缘材料和钝化层的晶体管器件,在不同类型辐射粒子的作用下,会在氧化物层中产生大量电子—空穴对,因在氧化物中电子的迁移率远高于空穴。在电场的作用下,电子以很快的速度向电极终端漂移,而迁移率较低的正电荷被氧化物陷阱所捕获,形成正氧化物电荷。另外,空穴在二氧化硅层迁移过程中,会与含氢缺陷发生反应,释放氢离子。氢离子会逐渐输运到Si/SiO2界面,与Si-H键发生反应,H++Si-H→Si悬挂键+H2↑,进而造成界面态缺陷。氧化物俘获正电荷和界面态均会改变载流子的复合速率,对于双极型晶体管,氧化物俘获正电荷和界面态会增加双极晶体管基区的空间电荷区复合速率,导致基极电流增加,双极晶体管电流增益降低;而对于NMOS场效应晶体管,电离辐射导致的氧化物俘获正电荷和界面态会使其开启电压降低,使晶体管器件的性能发生退化。
发明内容
本发明所要解决的技术问题是,提供一种抗辐照器件及制备方法,能够在空间辐照下保持良好的器件性能。
本发明解决所述技术问题采用的技术方案是,抗辐照器件,包括辐照敏感氧化层及硅衬底,其特征在于,所述硅衬底和辐照敏感氧化层之间设置有超薄氧化层和正电荷抑制层,且按照硅衬底、超薄氧化层、正电荷抑制层、辐照敏感氧化层的顺序重叠设置。
本发明还提供一种抗辐照器件的制备方法,包括辐照敏感氧化层部分的制备工艺,其特征在于,所述辐照敏感氧化层部分的制备工艺包括下述步骤:
1)清洗衬底硅片,并在硅衬底上生长超薄氧化层,所述超薄氧化层材料为SiO2,厚度为2~20nm;
3)在正电荷抑制层上生长氧化层,所述氧化层材料为SiO2,厚度为15~50nm;
4)在纯Ar气氛中快速退火,使Al形成受主态。
进一步的,所述步骤4)为:在纯Ar气氛中900摄氏度快速退火30s,使Al形成受主态,然后在纯H2气氛中400摄氏度退火1小时,形成H钝化层。
本发明的有益效果是,通过削弱二氧化硅与硅界面处捕获的正电荷的电场,从而降低二氧化硅的表面态Dit,达到抗电离辐照的效果。
附图说明
图1是本发明的抗辐射原理示意图。其中,(a)为铝(Al)键未被电子占据的受主态示意图;(b)为铝(Al)键被电子占据的受主态示意图,其中圆形阴影为Al受主电场示意图。
图2是本发明的制备流程中的生长超薄氧化层的示意图。
图3是本发明的制备流程中的生长正电荷抑制层的示意图。
图4是本发明的制备流程中的生长氧化层的示意图。
具体实施方式
附图中示出了根据本发明实施例的各种结构示意图。这些图并非是按比例绘制的,其中为了清楚表达的目的,放大了某些细节,并且可能省略了某些细节。图中所示出的各种区域、层的形状以及它们之间的相对大小、位置关系仅是示例性的,实际中可能由于制造公差或技术限制而有所偏差,并且本领域技术人员根据实际所需可以另外设计具有不同形状、大小、相对位置的区域/层。
图1(a)-1(b)示出了根据本发明的一种抗辐射加固的氧化层结构原理示意图,其中,(a)为铝(Al)键未被电子占据的受主态示意图;(b)为铝(Al)键被电子占据的受主态示意图,其中圆形阴影为Al受主电场。具体地为,位于非常薄的SiO2表面的单层Al-O键会引入受主态(Al-induced acceptor states),捕获电子,从而在界面处产生负的固定电荷,Al-O键倾向于作为受主接受电子,在二氧化硅表面的Al键接受电子后产生电场,削弱二氧化硅与硅界面处捕获的正电荷的电场,从而降低二氧化硅的表面态Dit,达到了抗电离辐照的效果。
图2~4以截面图的形式示出了本发明的辐照敏感氧化层部分的制备工艺,包括下述步骤:
(1)参见图2,采用RCA清洗硅片101后,在HF清洗液中快速漂洗一下,去离子水冲洗,甩干,快速热氧化方法生长超薄氧化层102,材料为SiO2(厚度2~20nm);
(3)参见图4,在正电荷抑制层103上生长氧化层104,材料为SiO2,具体地采用PECVD方法生长SiO2(厚度15~50nm)。然后在纯Ar气氛中900摄氏度快速退火30s,使Al形成受主态。在纯H2气氛中400摄氏度退火1小时,形成H钝化层。最终形成的结构为抗辐照氧化层结构115。
Claims (5)
1.抗辐照器件,包括辐照敏感氧化层及硅衬底,其特征在于,所述硅衬底和辐照敏感氧化层之间设置有超薄氧化层和正电荷抑制层,且按照硅衬底、超薄氧化层、正电荷抑制层、辐照敏感氧化层的顺序重叠设置。
3.如权利要求1所述的抗辐照器件,其特征在于,氧化层材料为SiO2,厚度为15~50nm。
5.如权利要求4所述的抗辐照器件的制备方法,其特征在于,所述步骤4)为:在纯Ar气氛中900℃快速退火30s,使Al形成受主态,然后在纯H2气氛中400摄氏度退火1小时,形成H钝化层。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910840776.7A CN110610983A (zh) | 2019-09-06 | 2019-09-06 | 抗辐照器件及制备方法 |
CN2019108407767 | 2019-09-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN111293167A true CN111293167A (zh) | 2020-06-16 |
Family
ID=68892504
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910840776.7A Pending CN110610983A (zh) | 2019-09-06 | 2019-09-06 | 抗辐照器件及制备方法 |
CN202010240884.3A Pending CN111293167A (zh) | 2019-09-06 | 2020-03-31 | 抗辐照器件及制备方法 |
CN202010241064.6A Pending CN111384154A (zh) | 2019-09-06 | 2020-03-31 | 抗辐照双极器件 |
CN202010240885.8A Pending CN111627980A (zh) | 2019-09-06 | 2020-03-31 | 抗辐照双极器件的制备方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910840776.7A Pending CN110610983A (zh) | 2019-09-06 | 2019-09-06 | 抗辐照器件及制备方法 |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010241064.6A Pending CN111384154A (zh) | 2019-09-06 | 2020-03-31 | 抗辐照双极器件 |
CN202010240885.8A Pending CN111627980A (zh) | 2019-09-06 | 2020-03-31 | 抗辐照双极器件的制备方法 |
Country Status (1)
Country | Link |
---|---|
CN (4) | CN110610983A (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110610983A (zh) * | 2019-09-06 | 2019-12-24 | 电子科技大学 | 抗辐照器件及制备方法 |
CN112599529A (zh) * | 2020-12-10 | 2021-04-02 | 电子科技大学 | 一种铪基铁电抗重离子辐照的多层加固电容结构 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1656596A (zh) * | 2002-05-20 | 2005-08-17 | 先进微装置公司 | 以减少远处散射的栅极氧化制造高性能金属氧化物半导体晶体管的方法 |
CN101950757A (zh) * | 2010-07-13 | 2011-01-19 | 中国科学院上海微系统与信息技术研究所 | 基于soi衬底的高介电常数材料栅结构及其制备方法 |
US8551691B2 (en) * | 2011-02-08 | 2013-10-08 | Tokyo Electron Limited | Method of forming mask pattern |
CN104576398A (zh) * | 2014-12-12 | 2015-04-29 | 北京时代民芯科技有限公司 | 一种具有抗辐照性能的vdmos器件制造方法 |
CN104646985A (zh) * | 2013-11-25 | 2015-05-27 | 辽宁益盛达机电设备制造有限公司 | 背光机下料气缸带旋转电机机构 |
CN205752146U (zh) * | 2016-07-04 | 2016-11-30 | 北京思众电子科技有限公司 | 半导体芯片的钝化膜结构及电路板 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7029981B2 (en) * | 2004-06-25 | 2006-04-18 | Intersil Americas, Inc. | Radiation hardened bipolar junction transistor |
EP3422415B1 (en) * | 2014-02-28 | 2023-08-02 | LFoundry S.r.l. | Semiconductor device comprising a laterally diffused mos transistor |
CN106653601B (zh) * | 2016-11-14 | 2019-10-25 | 北京时代民芯科技有限公司 | 一种抗低剂量率辐照的双极器件制造方法 |
CN108039320A (zh) * | 2017-11-13 | 2018-05-15 | 北京时代民芯科技有限公司 | 一种纳秒级抗辐照npn型双极晶体管制造方法 |
CN108417615A (zh) * | 2018-02-13 | 2018-08-17 | 重庆中科渝芯电子有限公司 | 一种高压衬底pnp双极结型晶体管及其制造方法 |
CN110610983A (zh) * | 2019-09-06 | 2019-12-24 | 电子科技大学 | 抗辐照器件及制备方法 |
-
2019
- 2019-09-06 CN CN201910840776.7A patent/CN110610983A/zh active Pending
-
2020
- 2020-03-31 CN CN202010240884.3A patent/CN111293167A/zh active Pending
- 2020-03-31 CN CN202010241064.6A patent/CN111384154A/zh active Pending
- 2020-03-31 CN CN202010240885.8A patent/CN111627980A/zh active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1656596A (zh) * | 2002-05-20 | 2005-08-17 | 先进微装置公司 | 以减少远处散射的栅极氧化制造高性能金属氧化物半导体晶体管的方法 |
CN101950757A (zh) * | 2010-07-13 | 2011-01-19 | 中国科学院上海微系统与信息技术研究所 | 基于soi衬底的高介电常数材料栅结构及其制备方法 |
US8551691B2 (en) * | 2011-02-08 | 2013-10-08 | Tokyo Electron Limited | Method of forming mask pattern |
CN104646985A (zh) * | 2013-11-25 | 2015-05-27 | 辽宁益盛达机电设备制造有限公司 | 背光机下料气缸带旋转电机机构 |
CN104576398A (zh) * | 2014-12-12 | 2015-04-29 | 北京时代民芯科技有限公司 | 一种具有抗辐照性能的vdmos器件制造方法 |
CN205752146U (zh) * | 2016-07-04 | 2016-11-30 | 北京思众电子科技有限公司 | 半导体芯片的钝化膜结构及电路板 |
Non-Patent Citations (2)
Title |
---|
林理彬 等: "Si—(SiO2)—Al2O3结构的电子束辐照效应", 《四川大学学报》 * |
林理彬 等: "Si-SiO2-Al2O3结构的电子束辐照效应", 《半导体学报》 * |
Also Published As
Publication number | Publication date |
---|---|
CN111627980A (zh) | 2020-09-04 |
CN111384154A (zh) | 2020-07-07 |
CN110610983A (zh) | 2019-12-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6321861B2 (ja) | ワイドバンドギャップ半導体材料含有のエミッタ領域を有する太陽電池 | |
CN105789047B (zh) | 一种增强型AlGaN/GaN高电子迁移率晶体管的制备方法 | |
JP5594336B2 (ja) | 半導体装置およびその製造方法 | |
CN102227000B (zh) | 基于超级结的碳化硅mosfet器件及制备方法 | |
WO2013056556A1 (zh) | I层钒掺杂的pin型核电池及其制作方法 | |
JP2011517119A (ja) | 太陽電池用窒化障壁層 | |
CN111293167A (zh) | 抗辐照器件及制备方法 | |
CN103928320A (zh) | 沟槽栅碳化硅绝缘栅双极型晶体管的制备方法 | |
TWI557930B (zh) | 量子井結構太陽能電池及其製造方法 | |
CN102376874B (zh) | 基于二维电子气材料的半导体磁敏型传感器及其制作方法 | |
CN103928309B (zh) | N沟道碳化硅绝缘栅双极型晶体管的制备方法 | |
CN103928321A (zh) | 碳化硅绝缘栅双极型晶体管的制备方法 | |
CN115148819A (zh) | 抗单粒子栅极损伤的功率mosfet栅极结构及制备方法 | |
CN103280409A (zh) | 一种结型场效应晶体管的制造方法 | |
JP4609026B2 (ja) | Soiウェーハの製造方法 | |
CN104037240A (zh) | SiC MOS电容及制造方法 | |
CN103928322A (zh) | 穿通型碳化硅绝缘栅双极型晶体管的制备方法 | |
JP2001339084A (ja) | 半導体装置及びその製造方法 | |
JP2014041987A (ja) | n+型Ge半導体層形成方法およびオーミック接触構造 | |
CN110729353B (zh) | 一种碳化硅功率器件堆叠栅介质及制造方法 | |
CN110459340A (zh) | 一种h-3碳化硅pn型同位素电池及其制造方法 | |
CN219959011U (zh) | 一种含透明电极的碳化硅探测器芯片 | |
JP2707555B2 (ja) | 半導体放射線検出器 | |
TW201244143A (en) | Method of manufacturing photoelectric conversion device | |
KR102118905B1 (ko) | 터널 산화막을 포함하는 태양 전지 및 이의 제조 방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20200616 |
|
WD01 | Invention patent application deemed withdrawn after publication |