CN110226288B - 用于晶体管电源开关的电流感测和控制 - Google Patents

用于晶体管电源开关的电流感测和控制

Info

Publication number
CN110226288B
CN110226288B CN201780067303.7A CN201780067303A CN110226288B CN 110226288 B CN110226288 B CN 110226288B CN 201780067303 A CN201780067303 A CN 201780067303A CN 110226288 B CN110226288 B CN 110226288B
Authority
CN
China
Prior art keywords
current
transistor
fet
coupled
sense
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201780067303.7A
Other languages
English (en)
Chinese (zh)
Other versions
CN110226288A (zh
Inventor
安科尔·查乌汉
苏迪尔·普拉萨德
穆迪·艾比迪尔·拉赫曼
叙布拉投·罗伊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of CN110226288A publication Critical patent/CN110226288A/zh
Application granted granted Critical
Publication of CN110226288B publication Critical patent/CN110226288B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
    • H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Measuring current only
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00—Interconnections in chips, wafers or substrates
    • H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
    • H10W20/49—Adaptable interconnections, e.g. fuses or antifuses
    • H10W20/493—Fuses, i.e. interconnections changeable from conductive to non-conductive
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0009—AC switches, i.e. delivering AC power to a load
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0027—Measuring means of, e.g. currents through or voltages across the switch
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0054—Gating switches, e.g. pass gates

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Electronic Switches (AREA)
CN201780067303.7A 2016-11-02 2017-11-02 用于晶体管电源开关的电流感测和控制 Active CN110226288B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/341,205 2016-11-02
US15/341,205 US10014851B2 (en) 2016-11-02 2016-11-02 Current sensing and control for a transistor power switch
PCT/US2017/059801 WO2018085596A1 (en) 2016-11-02 2017-11-02 Current sensing and control for a transistor power switch

Publications (2)

Publication Number Publication Date
CN110226288A CN110226288A (zh) 2019-09-10
CN110226288B true CN110226288B (zh) 2026-01-23

Family

ID=62022688

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780067303.7A Active CN110226288B (zh) 2016-11-02 2017-11-02 用于晶体管电源开关的电流感测和控制

Country Status (6)

Country Link
US (2) US10014851B2 (https=)
EP (1) EP3535845B1 (https=)
JP (2) JP7121236B2 (https=)
KR (1) KR102380611B1 (https=)
CN (1) CN110226288B (https=)
WO (1) WO2018085596A1 (https=)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10014851B2 (en) * 2016-11-02 2018-07-03 Texas Instruments Incorporated Current sensing and control for a transistor power switch
CN108075750B (zh) * 2016-11-14 2023-06-30 恩智浦有限公司 电流钳位电路
US10312899B2 (en) * 2017-03-09 2019-06-04 Texas Instruments Incorporated Over-voltage clamp circuit
US10396777B2 (en) * 2017-12-13 2019-08-27 Delta Electronics (Thailand) Public Company Limited ORing circuit
US10422818B2 (en) * 2017-12-30 2019-09-24 Texas Instruments Incorporated Power transistors with a resistor coupled to a sense transistor
TWI657249B (zh) * 2018-03-02 2019-04-21 茂達電子股份有限公司 電流感測電路
US10879686B2 (en) * 2018-04-12 2020-12-29 Cypress Semiconductor Corporation Overcurrent protection for universal serial bus Type-C (USB-C) connector systems
US10509426B2 (en) * 2018-05-02 2019-12-17 Analog Devices Global Unlimited Company Methods and circuits for controlling and/or reducing current leakage during a low-power or inactive mode
US10381787B1 (en) 2018-05-21 2019-08-13 Cypress Semiconductor Corporation Voltage protection for universal serial bus type-C (USB-C) connector systems
DE102018209214A1 (de) * 2018-06-11 2019-12-12 Zf Friedrichshafen Ag Strommessverfahren für ein Steuergerät
US12125811B2 (en) 2018-06-15 2024-10-22 Texas Instruments Incorporated Semiconductor structure and method for wafer scale chip package
KR102545174B1 (ko) 2018-10-05 2023-06-19 삼성전자주식회사 차지 펌프 회로를 포함하는 메모리 장치
US11069415B2 (en) 2018-10-05 2021-07-20 Samsung Electronics Co., Ltd. Memory device including charge pump circuit
US11935961B2 (en) * 2018-10-18 2024-03-19 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, semiconductor wafer, and electronic device
US11268990B2 (en) * 2018-12-20 2022-03-08 Qorvo Us, Inc. Current measurement circuit for optimization of power consumption in electronic devices
CN111351973B (zh) * 2018-12-20 2023-07-28 Qorvo美国公司 电流测量电路
US11063146B2 (en) 2019-01-10 2021-07-13 Texas Instruments Incorporated Back-to-back power field-effect transistors with associated current sensors
JP6935437B2 (ja) * 2019-01-23 2021-09-15 矢崎総業株式会社 電源装置
US11469223B2 (en) * 2019-05-31 2022-10-11 Analog Devices International Unlimited Company High precision switched capacitor MOSFET current measurement technique
JP2021002731A (ja) * 2019-06-21 2021-01-07 ソニーセミコンダクタソリューションズ株式会社 電子回路
US11476760B2 (en) * 2019-07-11 2022-10-18 Texas Instruments Incorporated Semiconductor process variation detector
US11411562B2 (en) * 2019-07-18 2022-08-09 Infineon Technologies Ag Robust current sensing during inverse current load conditions
US11239656B2 (en) * 2019-07-19 2022-02-01 Texas Instruments Incorporated Methods and apparatus for current sensing and current limiting
US11303210B2 (en) * 2019-12-09 2022-04-12 Texas Instruments Incorporated Current sense circuit topology
US11892864B2 (en) * 2020-01-14 2024-02-06 Texas Instruments Incorporated Voltage supervisor with low quiescent current
US11095254B1 (en) * 2020-01-23 2021-08-17 Analog Devices International Unlimited Company Circuits and methods to reduce distortion in an amplifier
US11281248B2 (en) * 2020-02-12 2022-03-22 Nuvoton Technology Corporation Audio microphone detection using auto-tracking current comparator
US11716023B2 (en) * 2020-06-18 2023-08-01 Texas Instruments Incorporated Closed loop control for piezoelectric-based power converters
US11362504B2 (en) * 2020-07-20 2022-06-14 Analog Devices International Unlimited Company Over current sensing scheme for switch applications
FR3115426B1 (fr) * 2020-08-31 2023-10-27 St Microelectronics Grenoble 2 Amplificateur opérationnel
GB2603448A (en) 2020-10-02 2022-08-10 Nordic Semiconductor Asa Energy supply circuit
JP7511459B2 (ja) * 2020-12-15 2024-07-05 エイブリック株式会社 過電流保護回路及び負荷駆動装置
US11211928B1 (en) * 2021-02-01 2021-12-28 Infineon Technologies Ag Apparatus and method for power switch status check
US11876490B2 (en) 2021-04-12 2024-01-16 Texas Instruments Incorporated Compensation of thermally induced voltage errors
CN113992230B (zh) * 2021-04-16 2023-03-14 江苏慧易芯科技有限公司 电子器件的信号拟合方法、模块以及系统
US12348202B2 (en) 2021-05-14 2025-07-01 Samsung Electronics Co., Ltd. Operational amplifier circuit and operational amplifier compensation circuit for amplifying input signal at high slew rate
WO2023147234A1 (en) * 2022-01-26 2023-08-03 Texas Instruments Incorporated Output current detection in high-side switch
US12261429B2 (en) * 2022-06-29 2025-03-25 Texas Instruments Incorporated Short detection circuit
CN119156751A (zh) * 2022-06-29 2024-12-17 德州仪器公司 短路检测电路
US12413064B2 (en) 2022-08-30 2025-09-09 Semiconductor Components Industries, Llc Short-circuit detector for electronic fuse circuit
US12160196B2 (en) * 2022-10-26 2024-12-03 Alpha And Omega Semiconductor International Lp SENSEFET for motor control
US20240297230A1 (en) * 2023-03-02 2024-09-05 Gan Systems Inc. Selective gate overdrive of transistor
US12489351B2 (en) * 2023-03-16 2025-12-02 Infineon Technologies Canada Inc. Power current signal generation using sense transistors
US12385953B2 (en) * 2023-05-23 2025-08-12 Infineon Technologies Canada Inc. Current sensing by using aging sense transistor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006129275A1 (en) * 2005-06-01 2006-12-07 Nxp B.V. Circuit and method for determining current in a load

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19520735C2 (de) 1995-06-07 1999-07-01 Siemens Ag Schaltungsanordnung zum Erfassen des Laststroms eines Leistungs-Halbleiterbauelementes mit sourceseitiger Last
DE19706946C2 (de) * 1997-02-21 2000-06-21 Daimler Chrysler Ag Battierüberwachungseinheit
US6271712B1 (en) 1999-04-07 2001-08-07 Semiconductor Components Industries Llc Synchronous rectifier and method of operation
US6600239B2 (en) * 2001-03-22 2003-07-29 Hewlett-Packard Development Company, L.P. Active circuit protection for switched power supply system
TWI249090B (en) * 2003-01-16 2006-02-11 Shindengen Electric Mfg Switching circuit
JP2005304210A (ja) 2004-04-14 2005-10-27 Renesas Technology Corp 電源ドライバ装置及びスイッチング電源装置
US7689950B2 (en) * 2007-01-12 2010-03-30 International Business Machines Corporation Implementing Efuse sense amplifier testing without blowing the Efuse
US7960997B2 (en) * 2007-08-08 2011-06-14 Advanced Analogic Technologies, Inc. Cascode current sensor for discrete power semiconductor devices
JP4773411B2 (ja) * 2007-09-26 2011-09-14 ルネサスエレクトロニクス株式会社 電流検出回路および電流検出方法
WO2009114006A1 (en) * 2008-03-10 2009-09-17 Semiconductor Components Industries, Llc Method for limiting an un-mirrored current and circuit therefor
US7683693B2 (en) 2008-04-10 2010-03-23 Fairchild Semiconductor Corporation Hot swap controller with zero loaded charge pump
JP2009277930A (ja) * 2008-05-15 2009-11-26 Nec Electronics Corp 半導体装置
US8816669B2 (en) * 2008-09-15 2014-08-26 Texas Instruments Inc. Short circuit monitor for current set resistor
US8841897B2 (en) 2011-01-25 2014-09-23 Microchip Technology Incorporated Voltage regulator having current and voltage foldback based upon load impedance
US8351291B2 (en) * 2011-05-06 2013-01-08 Freescale Semiconductor, Inc Electrically programmable fuse module in semiconductor device
US10041982B2 (en) * 2012-08-15 2018-08-07 Texas Instruments Incorporated Switch mode power converter current sensing apparatus and method
US9058049B2 (en) * 2012-09-11 2015-06-16 St-Ericsson Sa Modular low-power unit with analog synchronization loop usable with a low-dropout regulator
US8736316B2 (en) 2012-10-12 2014-05-27 Allegro Microsystems, Llc Current driver with output current clamping
JP6110133B2 (ja) * 2012-12-27 2017-04-05 ルネサスエレクトロニクス株式会社 半導体装置および電子制御装置
CN103973267B (zh) 2013-01-25 2018-04-10 恩智浦美国有限公司 具有电源模式控制缓冲器的电子器件
US9671465B2 (en) 2013-07-12 2017-06-06 Linear Technology Corporation Detecting faults in hot-swap applications
EP2843496A1 (en) * 2013-08-30 2015-03-04 Nxp B.V. Current control circuit with current sense FETs in parallel
JP6330655B2 (ja) * 2014-12-25 2018-05-30 株式会社デンソー 過電流検出回路
US10394259B2 (en) * 2015-08-28 2019-08-27 Stmicroelectronics S.R.L. Current limiting electronic fuse circuit
US9838003B1 (en) * 2016-07-14 2017-12-05 Texas Instruments Incorporated Correcting high voltage source follower level shift
US10014851B2 (en) * 2016-11-02 2018-07-03 Texas Instruments Incorporated Current sensing and control for a transistor power switch

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006129275A1 (en) * 2005-06-01 2006-12-07 Nxp B.V. Circuit and method for determining current in a load

Also Published As

Publication number Publication date
KR20190087414A (ko) 2019-07-24
KR102380611B1 (ko) 2022-03-30
US10361695B2 (en) 2019-07-23
JP7121236B2 (ja) 2022-08-18
JP2019533961A (ja) 2019-11-21
US20180123578A1 (en) 2018-05-03
EP3535845A1 (en) 2019-09-11
CN110226288A (zh) 2019-09-10
JP7488438B2 (ja) 2024-05-22
US10014851B2 (en) 2018-07-03
JP2022107018A (ja) 2022-07-20
WO2018085596A1 (en) 2018-05-11
EP3535845B1 (en) 2024-03-20
EP3535845A4 (en) 2019-11-06
US20180287602A1 (en) 2018-10-04

Similar Documents

Publication Publication Date Title
CN110226288B (zh) 用于晶体管电源开关的电流感测和控制
CN101295928B (zh) 稳压器
US7602162B2 (en) Voltage regulator with over-current protection
US10281941B2 (en) Voltage generating circuit and overcurrent detecting circuit
US7573689B2 (en) Overcurrent detecting circuit and regulator having the same
CN109039328B (zh) 支持压力测试的具有栅极钳位的驱动器电路
US10715132B2 (en) Gate driver circuit of power transistor, and motor driver circuit
KR101240910B1 (ko) 정전압 전원 회로
KR20070051319A (ko) 회로의 보호 방법, 보호 회로 및 그것을 이용한 전원 장치
US9063558B2 (en) Current limiting circuit configured to limit output current of driver circuit
CN100466253C (zh) 具有过热保护电路的半导体装置及使用该半导体装置的电子电路
US9354648B2 (en) Constant-voltage circuit
US8018213B2 (en) Measuring the current through a load transistor
CN108693916B (zh) 过电流保护电路以及电压调节器
US11114880B2 (en) Current regulating circuit and power supply management circuit including the same
CN118174530B (zh) 一种利用运放失配特性的软启动电路
US9772647B2 (en) Powering of a charge with a floating node
US7301745B2 (en) Temperature dependent switching circuit
KR101089896B1 (ko) 저전압 강하 레귤레이터
JP2010165071A (ja) 定電圧電源
HK1125501A (zh) 稳压器

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant