KR102380611B1 - 트랜지스터 파워 스위치를 위한 전류 감지 및 제어 - Google Patents
트랜지스터 파워 스위치를 위한 전류 감지 및 제어 Download PDFInfo
- Publication number
- KR102380611B1 KR102380611B1 KR1020197012406A KR20197012406A KR102380611B1 KR 102380611 B1 KR102380611 B1 KR 102380611B1 KR 1020197012406 A KR1020197012406 A KR 1020197012406A KR 20197012406 A KR20197012406 A KR 20197012406A KR 102380611 B1 KR102380611 B1 KR 102380611B1
- Authority
- KR
- South Korea
- Prior art keywords
- current
- transistor
- terminal
- coupled
- sense
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
- H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Measuring current only
-
- H01L23/5256—
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/49—Adaptable interconnections, e.g. fuses or antifuses
- H10W20/493—Fuses, i.e. interconnections changeable from conductive to non-conductive
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0009—AC switches, i.e. delivering AC power to a load
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0027—Measuring means of, e.g. currents through or voltages across the switch
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0054—Gating switches, e.g. pass gates
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
- Electronic Switches (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/341,205 | 2016-11-02 | ||
| US15/341,205 US10014851B2 (en) | 2016-11-02 | 2016-11-02 | Current sensing and control for a transistor power switch |
| PCT/US2017/059801 WO2018085596A1 (en) | 2016-11-02 | 2017-11-02 | Current sensing and control for a transistor power switch |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20190087414A KR20190087414A (ko) | 2019-07-24 |
| KR102380611B1 true KR102380611B1 (ko) | 2022-03-30 |
Family
ID=62022688
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020197012406A Active KR102380611B1 (ko) | 2016-11-02 | 2017-11-02 | 트랜지스터 파워 스위치를 위한 전류 감지 및 제어 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US10014851B2 (https=) |
| EP (1) | EP3535845B1 (https=) |
| JP (2) | JP7121236B2 (https=) |
| KR (1) | KR102380611B1 (https=) |
| CN (1) | CN110226288B (https=) |
| WO (1) | WO2018085596A1 (https=) |
Families Citing this family (44)
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| US10014851B2 (en) * | 2016-11-02 | 2018-07-03 | Texas Instruments Incorporated | Current sensing and control for a transistor power switch |
| CN108075750B (zh) * | 2016-11-14 | 2023-06-30 | 恩智浦有限公司 | 电流钳位电路 |
| US10312899B2 (en) * | 2017-03-09 | 2019-06-04 | Texas Instruments Incorporated | Over-voltage clamp circuit |
| US10396777B2 (en) * | 2017-12-13 | 2019-08-27 | Delta Electronics (Thailand) Public Company Limited | ORing circuit |
| US10422818B2 (en) * | 2017-12-30 | 2019-09-24 | Texas Instruments Incorporated | Power transistors with a resistor coupled to a sense transistor |
| TWI657249B (zh) * | 2018-03-02 | 2019-04-21 | 茂達電子股份有限公司 | 電流感測電路 |
| US10879686B2 (en) * | 2018-04-12 | 2020-12-29 | Cypress Semiconductor Corporation | Overcurrent protection for universal serial bus Type-C (USB-C) connector systems |
| US10509426B2 (en) * | 2018-05-02 | 2019-12-17 | Analog Devices Global Unlimited Company | Methods and circuits for controlling and/or reducing current leakage during a low-power or inactive mode |
| US10381787B1 (en) | 2018-05-21 | 2019-08-13 | Cypress Semiconductor Corporation | Voltage protection for universal serial bus type-C (USB-C) connector systems |
| DE102018209214A1 (de) * | 2018-06-11 | 2019-12-12 | Zf Friedrichshafen Ag | Strommessverfahren für ein Steuergerät |
| US12125811B2 (en) | 2018-06-15 | 2024-10-22 | Texas Instruments Incorporated | Semiconductor structure and method for wafer scale chip package |
| KR102545174B1 (ko) | 2018-10-05 | 2023-06-19 | 삼성전자주식회사 | 차지 펌프 회로를 포함하는 메모리 장치 |
| US11069415B2 (en) | 2018-10-05 | 2021-07-20 | Samsung Electronics Co., Ltd. | Memory device including charge pump circuit |
| US11935961B2 (en) * | 2018-10-18 | 2024-03-19 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, semiconductor wafer, and electronic device |
| US11268990B2 (en) * | 2018-12-20 | 2022-03-08 | Qorvo Us, Inc. | Current measurement circuit for optimization of power consumption in electronic devices |
| CN111351973B (zh) * | 2018-12-20 | 2023-07-28 | Qorvo美国公司 | 电流测量电路 |
| US11063146B2 (en) | 2019-01-10 | 2021-07-13 | Texas Instruments Incorporated | Back-to-back power field-effect transistors with associated current sensors |
| JP6935437B2 (ja) * | 2019-01-23 | 2021-09-15 | 矢崎総業株式会社 | 電源装置 |
| US11469223B2 (en) * | 2019-05-31 | 2022-10-11 | Analog Devices International Unlimited Company | High precision switched capacitor MOSFET current measurement technique |
| JP2021002731A (ja) * | 2019-06-21 | 2021-01-07 | ソニーセミコンダクタソリューションズ株式会社 | 電子回路 |
| US11476760B2 (en) * | 2019-07-11 | 2022-10-18 | Texas Instruments Incorporated | Semiconductor process variation detector |
| US11411562B2 (en) * | 2019-07-18 | 2022-08-09 | Infineon Technologies Ag | Robust current sensing during inverse current load conditions |
| US11239656B2 (en) * | 2019-07-19 | 2022-02-01 | Texas Instruments Incorporated | Methods and apparatus for current sensing and current limiting |
| US11303210B2 (en) * | 2019-12-09 | 2022-04-12 | Texas Instruments Incorporated | Current sense circuit topology |
| US11892864B2 (en) * | 2020-01-14 | 2024-02-06 | Texas Instruments Incorporated | Voltage supervisor with low quiescent current |
| US11095254B1 (en) * | 2020-01-23 | 2021-08-17 | Analog Devices International Unlimited Company | Circuits and methods to reduce distortion in an amplifier |
| US11281248B2 (en) * | 2020-02-12 | 2022-03-22 | Nuvoton Technology Corporation | Audio microphone detection using auto-tracking current comparator |
| US11716023B2 (en) * | 2020-06-18 | 2023-08-01 | Texas Instruments Incorporated | Closed loop control for piezoelectric-based power converters |
| US11362504B2 (en) * | 2020-07-20 | 2022-06-14 | Analog Devices International Unlimited Company | Over current sensing scheme for switch applications |
| FR3115426B1 (fr) * | 2020-08-31 | 2023-10-27 | St Microelectronics Grenoble 2 | Amplificateur opérationnel |
| GB2603448A (en) | 2020-10-02 | 2022-08-10 | Nordic Semiconductor Asa | Energy supply circuit |
| JP7511459B2 (ja) * | 2020-12-15 | 2024-07-05 | エイブリック株式会社 | 過電流保護回路及び負荷駆動装置 |
| US11211928B1 (en) * | 2021-02-01 | 2021-12-28 | Infineon Technologies Ag | Apparatus and method for power switch status check |
| US11876490B2 (en) | 2021-04-12 | 2024-01-16 | Texas Instruments Incorporated | Compensation of thermally induced voltage errors |
| CN113992230B (zh) * | 2021-04-16 | 2023-03-14 | 江苏慧易芯科技有限公司 | 电子器件的信号拟合方法、模块以及系统 |
| US12348202B2 (en) | 2021-05-14 | 2025-07-01 | Samsung Electronics Co., Ltd. | Operational amplifier circuit and operational amplifier compensation circuit for amplifying input signal at high slew rate |
| WO2023147234A1 (en) * | 2022-01-26 | 2023-08-03 | Texas Instruments Incorporated | Output current detection in high-side switch |
| US12261429B2 (en) * | 2022-06-29 | 2025-03-25 | Texas Instruments Incorporated | Short detection circuit |
| CN119156751A (zh) * | 2022-06-29 | 2024-12-17 | 德州仪器公司 | 短路检测电路 |
| US12413064B2 (en) | 2022-08-30 | 2025-09-09 | Semiconductor Components Industries, Llc | Short-circuit detector for electronic fuse circuit |
| US12160196B2 (en) * | 2022-10-26 | 2024-12-03 | Alpha And Omega Semiconductor International Lp | SENSEFET for motor control |
| US20240297230A1 (en) * | 2023-03-02 | 2024-09-05 | Gan Systems Inc. | Selective gate overdrive of transistor |
| US12489351B2 (en) * | 2023-03-16 | 2025-12-02 | Infineon Technologies Canada Inc. | Power current signal generation using sense transistors |
| US12385953B2 (en) * | 2023-05-23 | 2025-08-12 | Infineon Technologies Canada Inc. | Current sensing by using aging sense transistor |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090267587A1 (en) | 2004-04-14 | 2009-10-29 | Reneas Technology Corp. | Power supply device and switching power supply device |
| JP2009277930A (ja) | 2008-05-15 | 2009-11-26 | Nec Electronics Corp | 半導体装置 |
| JP2010536032A (ja) | 2007-08-08 | 2010-11-25 | アドバンスト・アナロジック・テクノロジーズ・インコーポレイテッド | ディスクリートパワー半導体デバイスのカスコード電流センサ |
| JP2014128005A (ja) | 2012-12-27 | 2014-07-07 | Renesas Electronics Corp | 半導体装置および電子制御装置 |
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| DE19520735C2 (de) | 1995-06-07 | 1999-07-01 | Siemens Ag | Schaltungsanordnung zum Erfassen des Laststroms eines Leistungs-Halbleiterbauelementes mit sourceseitiger Last |
| DE19706946C2 (de) * | 1997-02-21 | 2000-06-21 | Daimler Chrysler Ag | Battierüberwachungseinheit |
| US6271712B1 (en) | 1999-04-07 | 2001-08-07 | Semiconductor Components Industries Llc | Synchronous rectifier and method of operation |
| US6600239B2 (en) * | 2001-03-22 | 2003-07-29 | Hewlett-Packard Development Company, L.P. | Active circuit protection for switched power supply system |
| TWI249090B (en) * | 2003-01-16 | 2006-02-11 | Shindengen Electric Mfg | Switching circuit |
| CN101189796A (zh) * | 2005-06-01 | 2008-05-28 | Nxp股份有限公司 | 确定负载电流的电路和方法 |
| US7689950B2 (en) * | 2007-01-12 | 2010-03-30 | International Business Machines Corporation | Implementing Efuse sense amplifier testing without blowing the Efuse |
| JP4773411B2 (ja) * | 2007-09-26 | 2011-09-14 | ルネサスエレクトロニクス株式会社 | 電流検出回路および電流検出方法 |
| WO2009114006A1 (en) * | 2008-03-10 | 2009-09-17 | Semiconductor Components Industries, Llc | Method for limiting an un-mirrored current and circuit therefor |
| US7683693B2 (en) | 2008-04-10 | 2010-03-23 | Fairchild Semiconductor Corporation | Hot swap controller with zero loaded charge pump |
| US8816669B2 (en) * | 2008-09-15 | 2014-08-26 | Texas Instruments Inc. | Short circuit monitor for current set resistor |
| US8841897B2 (en) | 2011-01-25 | 2014-09-23 | Microchip Technology Incorporated | Voltage regulator having current and voltage foldback based upon load impedance |
| US8351291B2 (en) * | 2011-05-06 | 2013-01-08 | Freescale Semiconductor, Inc | Electrically programmable fuse module in semiconductor device |
| US10041982B2 (en) * | 2012-08-15 | 2018-08-07 | Texas Instruments Incorporated | Switch mode power converter current sensing apparatus and method |
| US9058049B2 (en) * | 2012-09-11 | 2015-06-16 | St-Ericsson Sa | Modular low-power unit with analog synchronization loop usable with a low-dropout regulator |
| US8736316B2 (en) | 2012-10-12 | 2014-05-27 | Allegro Microsystems, Llc | Current driver with output current clamping |
| CN103973267B (zh) | 2013-01-25 | 2018-04-10 | 恩智浦美国有限公司 | 具有电源模式控制缓冲器的电子器件 |
| US9671465B2 (en) | 2013-07-12 | 2017-06-06 | Linear Technology Corporation | Detecting faults in hot-swap applications |
| EP2843496A1 (en) * | 2013-08-30 | 2015-03-04 | Nxp B.V. | Current control circuit with current sense FETs in parallel |
| JP6330655B2 (ja) * | 2014-12-25 | 2018-05-30 | 株式会社デンソー | 過電流検出回路 |
| US10394259B2 (en) * | 2015-08-28 | 2019-08-27 | Stmicroelectronics S.R.L. | Current limiting electronic fuse circuit |
| US9838003B1 (en) * | 2016-07-14 | 2017-12-05 | Texas Instruments Incorporated | Correcting high voltage source follower level shift |
| US10014851B2 (en) * | 2016-11-02 | 2018-07-03 | Texas Instruments Incorporated | Current sensing and control for a transistor power switch |
-
2016
- 2016-11-02 US US15/341,205 patent/US10014851B2/en active Active
-
2017
- 2017-11-02 WO PCT/US2017/059801 patent/WO2018085596A1/en not_active Ceased
- 2017-11-02 EP EP17868166.4A patent/EP3535845B1/en active Active
- 2017-11-02 JP JP2019523750A patent/JP7121236B2/ja active Active
- 2017-11-02 CN CN201780067303.7A patent/CN110226288B/zh active Active
- 2017-11-02 KR KR1020197012406A patent/KR102380611B1/ko active Active
-
2018
- 2018-06-06 US US16/001,518 patent/US10361695B2/en active Active
-
2022
- 2022-05-16 JP JP2022080311A patent/JP7488438B2/ja active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090267587A1 (en) | 2004-04-14 | 2009-10-29 | Reneas Technology Corp. | Power supply device and switching power supply device |
| JP2010536032A (ja) | 2007-08-08 | 2010-11-25 | アドバンスト・アナロジック・テクノロジーズ・インコーポレイテッド | ディスクリートパワー半導体デバイスのカスコード電流センサ |
| JP2009277930A (ja) | 2008-05-15 | 2009-11-26 | Nec Electronics Corp | 半導体装置 |
| JP2014128005A (ja) | 2012-12-27 | 2014-07-07 | Renesas Electronics Corp | 半導体装置および電子制御装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20190087414A (ko) | 2019-07-24 |
| US10361695B2 (en) | 2019-07-23 |
| CN110226288B (zh) | 2026-01-23 |
| JP7121236B2 (ja) | 2022-08-18 |
| JP2019533961A (ja) | 2019-11-21 |
| US20180123578A1 (en) | 2018-05-03 |
| EP3535845A1 (en) | 2019-09-11 |
| CN110226288A (zh) | 2019-09-10 |
| JP7488438B2 (ja) | 2024-05-22 |
| US10014851B2 (en) | 2018-07-03 |
| JP2022107018A (ja) | 2022-07-20 |
| WO2018085596A1 (en) | 2018-05-11 |
| EP3535845B1 (en) | 2024-03-20 |
| EP3535845A4 (en) | 2019-11-06 |
| US20180287602A1 (en) | 2018-10-04 |
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