CN107112253B - 凸点形成用膜、半导体装置及其制造方法以及连接构造体 - Google Patents

凸点形成用膜、半导体装置及其制造方法以及连接构造体 Download PDF

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CN107112253B
CN107112253B CN201680004710.9A CN201680004710A CN107112253B CN 107112253 B CN107112253 B CN 107112253B CN 201680004710 A CN201680004710 A CN 201680004710A CN 107112253 B CN107112253 B CN 107112253B
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bump
film
forming
base electrode
conductive filler
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CN107112253A (zh
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阿久津恭志
石松朋之
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Dexerials Corp
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Dexerials Corp
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    • HELECTRICITY
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    • H10W72/01204Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using temporary auxiliary members, e.g. using sacrificial coatings or handle substrates
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    • H10W72/01212Manufacture or treatment of bump connectors, dummy bumps or thermal bumps at a different location than on the final device, e.g. forming as prepeg
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    • H10W72/221Structures or relative sizes
    • H10W72/222Multilayered bumps, e.g. a coating on top and side surfaces of a bump core
    • H10W72/223Multilayered bumps, e.g. a coating on top and side surfaces of a bump core characterised by the structure of the outermost layers, e.g. multilayered coatings
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  • Wire Bonding (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Laminated Bodies (AREA)
CN201680004710.9A 2015-01-13 2016-01-13 凸点形成用膜、半导体装置及其制造方法以及连接构造体 Active CN107112253B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015-004591 2015-01-13
JP2015004591 2015-01-13
PCT/JP2016/050805 WO2016114293A1 (ja) 2015-01-13 2016-01-13 バンプ形成用フィルム、半導体装置及びその製造方法、並びに接続構造体

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CN107112253A CN107112253A (zh) 2017-08-29
CN107112253B true CN107112253B (zh) 2021-04-20

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US (1) US10943879B2 (https=)
JP (1) JP6750228B2 (https=)
KR (2) KR102182945B1 (https=)
CN (1) CN107112253B (https=)
TW (2) TWI774640B (https=)
WO (1) WO2016114293A1 (https=)

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JP7000685B2 (ja) * 2017-02-07 2022-01-20 昭和電工マテリアルズ株式会社 接続構造体の製造方法、及び、端子付き電極の製造方法並びにこれに用いられる導電粒子
CN112166529A (zh) * 2018-06-06 2021-01-01 迪睿合株式会社 连接体、连接体的制造方法、连接方法
WO2019235596A1 (ja) * 2018-06-06 2019-12-12 デクセリアルズ株式会社 接続体、接続体の製造方法、接続方法
KR20250046348A (ko) * 2018-06-26 2025-04-02 가부시끼가이샤 레조낙 땜납 입자 및 땜납 입자의 제조 방법
CN112313032A (zh) * 2018-06-26 2021-02-02 昭和电工材料株式会社 各向异性导电膜及其制造方法以及连接结构体的制造方法
US12172240B2 (en) 2018-06-26 2024-12-24 Resonac Corporation Solder particles
JP7661892B2 (ja) * 2019-12-27 2025-04-15 株式会社レゾナック はんだバンプ形成用部材、及びはんだバンプ付き電極基板の製造方法
KR20260033631A (ko) * 2019-12-27 2026-03-10 가부시끼가이샤 레조낙 땜납 범프 형성용 부재, 땜납 범프 형성용 부재의 제조 방법, 및 땜납 범프 부착 전극 기판의 제조 방법
CN115868015A (zh) * 2020-07-27 2023-03-28 索尼半导体解决方案公司 电子设备
KR20220155139A (ko) 2021-05-14 2022-11-22 삼성전자주식회사 반도체 패키지
JP7697292B2 (ja) * 2021-06-30 2025-06-24 株式会社レゾナック はんだバンプ形成装置

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JP2012190871A (ja) * 2011-03-09 2012-10-04 Teramikros Inc 半導体装置およびその製造方法
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JPH0574512A (ja) 1991-09-12 1993-03-26 Japan Aviation Electron Ind Ltd 電気接続用コネクタ
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