CN106928109A - 光酸产生剂 - Google Patents

光酸产生剂 Download PDF

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Publication number
CN106928109A
CN106928109A CN201611192232.7A CN201611192232A CN106928109A CN 106928109 A CN106928109 A CN 106928109A CN 201611192232 A CN201611192232 A CN 201611192232A CN 106928109 A CN106928109 A CN 106928109A
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CN
China
Prior art keywords
radical
group
polycyclic
formula
monocyclic
Prior art date
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Pending
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CN201611192232.7A
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English (en)
Chinese (zh)
Inventor
W·威廉姆斯三世
E·阿卡德
J·F·卡梅伦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DuPont Electronic Materials International LLC
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Rohm and Haas Electronic Materials LLC
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Application filed by Rohm and Haas Electronic Materials LLC filed Critical Rohm and Haas Electronic Materials LLC
Publication of CN106928109A publication Critical patent/CN106928109A/zh
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C25/00—Compounds containing at least one halogen atom bound to a six-membered aromatic ring
    • C07C25/18—Polycyclic aromatic halogenated hydrocarbons
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C255/00—Carboxylic acid nitriles
    • C07C255/01—Carboxylic acid nitriles having cyano groups bound to acyclic carbon atoms
    • C07C255/24—Carboxylic acid nitriles having cyano groups bound to acyclic carbon atoms containing cyano groups and singly-bound nitrogen atoms, not being further bound to other hetero atoms, bound to the same saturated acyclic carbon skeleton
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C255/00—Carboxylic acid nitriles
    • C07C255/01—Carboxylic acid nitriles having cyano groups bound to acyclic carbon atoms
    • C07C255/31—Carboxylic acid nitriles having cyano groups bound to acyclic carbon atoms having cyano groups bound to acyclic carbon atoms of a carbon skeleton containing rings other than six-membered aromatic rings
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C255/00—Carboxylic acid nitriles
    • C07C255/01—Carboxylic acid nitriles having cyano groups bound to acyclic carbon atoms
    • C07C255/32—Carboxylic acid nitriles having cyano groups bound to acyclic carbon atoms having cyano groups bound to acyclic carbon atoms of a carbon skeleton containing at least one six-membered aromatic ring
    • C07C255/34—Carboxylic acid nitriles having cyano groups bound to acyclic carbon atoms having cyano groups bound to acyclic carbon atoms of a carbon skeleton containing at least one six-membered aromatic ring with cyano groups linked to the six-membered aromatic ring, or to the condensed ring system containing that ring, by unsaturated carbon chains
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
    • C07C381/12—Sulfonium compounds
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07D—HETEROCYCLIC COMPOUNDS
    • C07D333/00—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom
    • C07D333/50—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom condensed with carbocyclic rings or ring systems
    • C07D333/76—Dibenzothiophenes
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07D—HETEROCYCLIC COMPOUNDS
    • C07D335/00—Heterocyclic compounds containing six-membered rings having one sulfur atom as the only ring hetero atom
    • C07D335/04—Heterocyclic compounds containing six-membered rings having one sulfur atom as the only ring hetero atom condensed with carbocyclic rings or ring systems
    • C07D335/10—Dibenzothiopyrans; Hydrogenated dibenzothiopyrans
    • C07D335/12—Thioxanthenes
    • C07D335/14—Thioxanthenes with hetero atoms or with carbon atoms having three bonds to hetero atoms with at the most one bond to halogen, e.g. ester or nitrile radicals, directly attached in position 9
    • C07D335/16—Oxygen atoms, e.g. thioxanthones
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L33/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides or nitriles thereof; Compositions of derivatives of such polymers
    • C08L33/04—Homopolymers or copolymers of esters
    • C08L33/06—Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, which oxygen atoms are present only as part of the carboxyl radical
    • C08L33/08—Homopolymers or copolymers of acrylic acid esters
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
    • H10P76/204—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C2602/00—Systems containing two condensed rings
    • C07C2602/02—Systems containing two condensed rings the rings having only two atoms in common
    • C07C2602/04—One of the condensed rings being a six-membered aromatic ring
    • C07C2602/08—One of the condensed rings being a six-membered aromatic ring the other ring being five-membered, e.g. indane
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C2603/00—Systems containing at least three condensed rings
    • C07C2603/56—Ring systems containing bridged rings
    • C07C2603/58—Ring systems containing bridged rings containing three rings
    • C07C2603/70—Ring systems containing bridged rings containing three rings containing only six-membered rings
    • C07C2603/74—Adamantanes

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Polymers & Plastics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Materials For Photolithography (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Engineering & Computer Science (AREA)
  • Architecture (AREA)
  • Structural Engineering (AREA)
CN201611192232.7A 2015-12-31 2016-12-21 光酸产生剂 Pending CN106928109A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201562273521P 2015-12-31 2015-12-31
US62/273521 2015-12-31

Publications (1)

Publication Number Publication Date
CN106928109A true CN106928109A (zh) 2017-07-07

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Family Applications (1)

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Country Status (5)

Country Link
US (2) US10317795B2 (enExample)
JP (1) JP6625962B2 (enExample)
KR (2) KR101941474B1 (enExample)
CN (1) CN106928109A (enExample)
TW (2) TWI619699B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110783462A (zh) * 2018-07-27 2020-02-11 诺瓦尔德股份有限公司 电子器件、显示装置、其制备方法和化合物

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI662364B (zh) * 2015-12-31 2019-06-11 Rohm And Haas Electronic Materials Llc 光致抗蝕劑組合物、包含光致抗蝕劑組合物的經塗佈基板及形成電子裝置的方法
US10831100B2 (en) * 2017-11-20 2020-11-10 Rohm And Haas Electronic Materials, Llc Iodine-containing photoacid generators and compositions comprising the same

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2766243A (en) * 1955-04-15 1956-10-09 Du Pont Acyclic, polynitrile-containing, unsaturated compound and its salts, and preparation thereof
JP2011046698A (ja) * 2009-07-31 2011-03-10 Tohoku Univ 変異タンパク質の製造方法
CN102161635A (zh) * 2005-11-16 2011-08-24 Az电子材料美国公司 光活性化合物
CN102186815A (zh) * 2008-10-20 2011-09-14 巴斯夫欧洲公司 锍衍生物及其作为潜酸的用途
CN104130172A (zh) * 2009-12-14 2014-11-05 罗门哈斯电子材料有限公司 磺酰光酸产生剂和包含该磺酰光酸产生剂的光刻胶

Family Cites Families (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0226635B1 (en) * 1985-07-26 1989-09-06 General Electric Company Method for neutralization of organophilic acidic compounds
US5273840A (en) 1990-08-01 1993-12-28 Covalent Associates Incorporated Methide salts, formulations, electrolytes and batteries formed therefrom
US5874616A (en) 1995-03-06 1999-02-23 Minnesota Mining And Manufacturing Company Preparation of bis (fluoroalkylenesulfonyl) imides and (fluoroalkysulfony) (fluorosulfonyl) imides
US5554664A (en) 1995-03-06 1996-09-10 Minnesota Mining And Manufacturing Company Energy-activatable salts with fluorocarbon anions
JP4124487B2 (ja) 1996-12-30 2008-07-23 イドロ―ケベック 五員環アニオン塩又はテトラアザペンタレン誘導体と、イオン伝導性物質としてのそれらの使用
JP4859264B2 (ja) * 1997-12-01 2012-01-25 アセップ・インク 過弗素化されたスルホン塩類、およびイオン性伝導材料としてのそれらの使用
JP4516425B2 (ja) * 2002-06-26 2010-08-04 フジフィルム・エレクトロニック・マテリアルズ・ユーエスエイ・インコーポレイテッド 放射線感受性組成物
US7304175B2 (en) 2005-02-16 2007-12-04 Sumitomo Chemical Company, Limited Salt suitable for an acid generator and a chemically amplified resist composition containing the same
US7960087B2 (en) 2005-03-11 2011-06-14 Fujifilm Corporation Positive photosensitive composition and pattern-forming method using the same
JP2006251466A (ja) * 2005-03-11 2006-09-21 Fuji Photo Film Co Ltd 感光性組成物及び該感光性組成物を用いたパターン形成方法
TWI394004B (zh) * 2005-03-30 2013-04-21 住友化學股份有限公司 適合作為酸產生劑之鹽及含有該鹽之化學放大型光阻組成物
EP2045661A1 (en) 2006-07-24 2009-04-08 Tokyo Ohka Kogyo Co., Ltd. Positive resist composition and method of forming resist pattern
JP2008026725A (ja) 2006-07-24 2008-02-07 Tokyo Ohka Kogyo Co Ltd ポジ型レジスト組成物およびレジストパターン形成方法
JP5491197B2 (ja) 2007-12-10 2014-05-14 株式会社カネカ アルカリ現像性を有する硬化性組成物およびそれを用いた絶縁性薄膜および薄膜トランジスタ
US7655379B2 (en) 2008-01-08 2010-02-02 International Business Machines Corporation Ionic, organic photoacid generators for DUV, MUV and optical lithography based on peraceptor-substituted aromatic anions
US8039194B2 (en) 2008-01-08 2011-10-18 Internatinal Business Machines Corporation Photoacid generators for extreme ultraviolet lithography
US8034533B2 (en) 2008-01-16 2011-10-11 International Business Machines Corporation Fluorine-free heteroaromatic photoacid generators and photoresist compositions containing the same
US20090181319A1 (en) 2008-01-16 2009-07-16 International Business Machines Corporation Aromatic fluorine-free photoacid generators and photoresist compositions containing the same
KR100973033B1 (ko) 2008-05-21 2010-07-30 금호석유화학 주식회사 화학증폭형 레지스트 조성물용 산발생제
JP5481944B2 (ja) * 2008-06-12 2014-04-23 セントラル硝子株式会社 含フッ素重合体およびそれを用いた帯電防止剤
US8338076B2 (en) * 2008-11-28 2012-12-25 Tokyo Ohka Kogyo Co., Ltd. Resist composition, method of forming resist pattern, novel compound, and acid generator
TWI407252B (zh) 2009-06-22 2013-09-01 羅門哈斯電子材料有限公司 光酸產生劑及包含該光酸產生劑的光阻組成物
JP5645459B2 (ja) 2009-07-10 2014-12-24 富士フイルム株式会社 感活性光線性または感放射線性樹脂組成物およびこれを用いたパターン形成方法
JP2011046696A (ja) * 2009-07-30 2011-03-10 Sumitomo Chemical Co Ltd 塩、レジスト組成物及びレジストパターンの製造方法
JP5699080B2 (ja) * 2009-08-03 2015-04-08 サンアプロ株式会社 光酸発生剤,光硬化性組成物,及びその硬化体
JP5244740B2 (ja) 2009-08-26 2013-07-24 富士フイルム株式会社 感活性光線性又は感放射線性樹脂組成物、及びそれを用いたパターン形成方法
JP5448651B2 (ja) 2009-08-31 2014-03-19 富士フイルム株式会社 感活性光線性または感放射線性樹脂組成物、及びそれを用いたパターン形成方法
KR101831685B1 (ko) 2010-01-25 2018-02-23 롬 앤드 하스 일렉트로닉 머트어리얼즈 엘엘씨 질소-함유 화합물을 포함하는 포토레지스트
JP5782283B2 (ja) 2010-03-31 2015-09-24 ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC 新規のポリマーおよびフォトレジスト組成物
EP2562839A4 (en) * 2010-04-22 2015-07-22 Hitachi Chemical Co Ltd ORGANIC ELECTRONIC MATERIAL, POLYMERIZATION INITIATOR AND THERMAL POLYMERIZATION INITIATOR, INK COMPOSITION, ORGANIC THIN FILM AND METHOD FOR PRODUCING THE SAME, ORGANIC ELECTRONIC ELEMENT, ORGANIC ELECTROLUMINESCENT ELEMENT, ILLUMINATION DEVICE, DISPLAY ELEMENT, AND DISPLAY DEVICE
EP2383611A3 (en) * 2010-04-27 2012-01-25 Rohm and Haas Electronic Materials LLC Photoacid generators and photoresists comprising same
JP5470189B2 (ja) 2010-07-30 2014-04-16 富士フイルム株式会社 感活性光線性又は感放射線性樹脂組成物、並びにそれを用いたレジスト膜及びパターン形成方法
JP6049250B2 (ja) 2010-11-30 2016-12-21 ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC 光酸発生剤
KR101332316B1 (ko) * 2011-02-07 2013-11-22 금호석유화학 주식회사 광산발생제, 이의 제조 방법 및 이를 포함하는 레지스트 조성물
JP2012185871A (ja) 2011-03-03 2012-09-27 Fujifilm Corp 締結補助具及びリールの締結方法並びにリールアセンブリ
JP5651636B2 (ja) 2011-07-28 2015-01-14 富士フイルム株式会社 パターン形成方法、感活性光線性又は感放射線性樹脂組成物、レジスト膜、電子デバイスの製造方法、及び、電子デバイス
JP6089389B2 (ja) * 2011-10-18 2017-03-08 日立化成株式会社 電子受容性化合物及びその製造方法、該化合物を含む重合開始剤、有機エレクトロニクス材料及びこれらを用いた有機薄膜、有機エレクトロニクス素子、有機エレクトロルミネセンス素子、表示素子、照明装置、並びに表示装置
JP2014156585A (ja) * 2013-01-16 2014-08-28 Cemedine Co Ltd 光硬化性組成物
KR20150127077A (ko) * 2013-03-08 2015-11-16 히타치가세이가부시끼가이샤 이온성 화합물을 함유하는 처리액, 유기 일렉트로닉스 소자, 및 유기 일렉트로닉스 소자의 제조 방법
US9067909B2 (en) * 2013-08-28 2015-06-30 Rohm And Haas Electronic Materials Llc Photoacid generator, photoresist, coated substrate, and method of forming an electronic device
TWI662364B (zh) 2015-12-31 2019-06-11 Rohm And Haas Electronic Materials Llc 光致抗蝕劑組合物、包含光致抗蝕劑組合物的經塗佈基板及形成電子裝置的方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2766243A (en) * 1955-04-15 1956-10-09 Du Pont Acyclic, polynitrile-containing, unsaturated compound and its salts, and preparation thereof
CN102161635A (zh) * 2005-11-16 2011-08-24 Az电子材料美国公司 光活性化合物
CN102186815A (zh) * 2008-10-20 2011-09-14 巴斯夫欧洲公司 锍衍生物及其作为潜酸的用途
JP2011046698A (ja) * 2009-07-31 2011-03-10 Tohoku Univ 変異タンパク質の製造方法
CN104130172A (zh) * 2009-12-14 2014-11-05 罗门哈斯电子材料有限公司 磺酰光酸产生剂和包含该磺酰光酸产生剂的光刻胶

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
JAMES V. CRIVELLO: "The Discovery and Development of Onium Salt Cationic Photoinitiators", 《POLYMER CHEMISTRY》 *
SOFIA TELITE ET AL.: "The 1,3-bis(dicyanomethylidene)indane skeleton as a (photo) initiator in thermal ring opening polymerization at RT and radical or cationic photopolymerization.", 《RSC ADVANCES》 *
王美丽等: "新型锍盐类光生酸剂的合成及产酸性能研究", 《影像科学与光化学》 *
韩元利: "高效光生酸剂的设计合成及性能研究", 《中国优秀硕士学位论文全文数据库 工程科技I辑》 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110783462A (zh) * 2018-07-27 2020-02-11 诺瓦尔德股份有限公司 电子器件、显示装置、其制备方法和化合物
CN110783462B (zh) * 2018-07-27 2024-05-24 诺瓦尔德股份有限公司 电子器件、显示装置、其制备方法和化合物

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TW201811738A (zh) 2018-04-01
TW201725195A (zh) 2017-07-16
KR20170080479A (ko) 2017-07-10
KR20190008394A (ko) 2019-01-23
KR101941474B1 (ko) 2019-04-12
TWI619699B (zh) 2018-04-01
US20170192352A1 (en) 2017-07-06
KR102062559B1 (ko) 2020-01-06
JP6625962B2 (ja) 2019-12-25
US20190243239A1 (en) 2019-08-08
US10317795B2 (en) 2019-06-11
JP2017125007A (ja) 2017-07-20
TWI656111B (zh) 2019-04-11
US10509315B2 (en) 2019-12-17

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