CN106489191A - 包括同轴互连的集成器件 - Google Patents
包括同轴互连的集成器件 Download PDFInfo
- Publication number
- CN106489191A CN106489191A CN201580036954.0A CN201580036954A CN106489191A CN 106489191 A CN106489191 A CN 106489191A CN 201580036954 A CN201580036954 A CN 201580036954A CN 106489191 A CN106489191 A CN 106489191A
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- China
- Prior art keywords
- interconnect
- substrate
- integrated device
- interconnects
- ground
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49838—Geometry or layout
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4853—Connection or disconnection of other leads to or from a metallisation, e.g. pins, wires, bumps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49833—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers the chip support structure consisting of a plurality of insulating substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5389—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/10—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L25/105—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0296—Conductive pattern lay-out details not covered by sub groups H05K1/02 - H05K1/0295
- H05K1/0298—Multilayer circuits
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
- H05K3/284—Applying non-metallic protective coatings for encapsulating mounted components
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/10—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L2225/1005—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10
- H01L2225/1011—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10 the containers being in a stacked arrangement
- H01L2225/1017—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10 the containers being in a stacked arrangement the lowermost container comprising a device support
- H01L2225/1023—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10 the containers being in a stacked arrangement the lowermost container comprising a device support the support being an insulating substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/10—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L2225/1005—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10
- H01L2225/1011—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10 the containers being in a stacked arrangement
- H01L2225/1041—Special adaptations for top connections of the lowermost container, e.g. redistribution layer, integral interposer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/10—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L2225/1005—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10
- H01L2225/1011—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10 the containers being in a stacked arrangement
- H01L2225/1047—Details of electrical connections between containers
- H01L2225/1052—Wire or wire-like electrical connections
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49822—Multilayer substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19107—Disposition of discrete passive components off-chip wires
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/13—Moulding and encapsulation; Deposition techniques; Protective layers
- H05K2203/1305—Moulding and encapsulation
- H05K2203/1316—Moulded encapsulation of mounted components
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Geometry (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Combinations Of Printed Boards (AREA)
- Wire Bonding (AREA)
- Structure Of Printed Boards (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210862033.1A CN115036287A (zh) | 2014-07-11 | 2015-07-09 | 包括同轴互连的集成器件 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/329,646 US9385077B2 (en) | 2014-07-11 | 2014-07-11 | Integrated device comprising coaxial interconnect |
| US14/329,646 | 2014-07-11 | ||
| PCT/US2015/039678 WO2016007706A1 (en) | 2014-07-11 | 2015-07-09 | Integrated device comprising coaxial interconnect |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210862033.1A Division CN115036287A (zh) | 2014-07-11 | 2015-07-09 | 包括同轴互连的集成器件 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106489191A true CN106489191A (zh) | 2017-03-08 |
Family
ID=53719982
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210862033.1A Pending CN115036287A (zh) | 2014-07-11 | 2015-07-09 | 包括同轴互连的集成器件 |
| CN201580036954.0A Pending CN106489191A (zh) | 2014-07-11 | 2015-07-09 | 包括同轴互连的集成器件 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210862033.1A Pending CN115036287A (zh) | 2014-07-11 | 2015-07-09 | 包括同轴互连的集成器件 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9385077B2 (enExample) |
| EP (1) | EP3167483A1 (enExample) |
| JP (1) | JP6802146B2 (enExample) |
| KR (1) | KR102411667B1 (enExample) |
| CN (2) | CN115036287A (enExample) |
| AU (1) | AU2015287804B2 (enExample) |
| BR (1) | BR112017000154B1 (enExample) |
| WO (1) | WO2016007706A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110098164A (zh) * | 2018-01-29 | 2019-08-06 | 马维尔国际贸易有限公司 | 用于半导体部件的同轴互连结构 |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10381303B2 (en) * | 2016-07-01 | 2019-08-13 | Vanguard International Semiconductor Corporation | Semiconductor device structures |
| TWI594338B (zh) * | 2016-08-09 | 2017-08-01 | 矽品精密工業股份有限公司 | 電子堆疊結構及其製法 |
| US10070525B2 (en) | 2016-12-28 | 2018-09-04 | Intel Corporation | Internal to internal coaxial via transition structures in package substrates |
| US11244912B2 (en) | 2017-03-30 | 2022-02-08 | Intel Corporation | Semiconductor package having a coaxial first layer interconnect |
| KR102740257B1 (ko) * | 2019-12-17 | 2024-12-10 | 삼성전자주식회사 | 반도체 패키지 |
| KR20220124583A (ko) * | 2021-03-03 | 2022-09-14 | 삼성전자주식회사 | 인터포저를 포함하는 전자 장치 |
| US20230036650A1 (en) * | 2021-07-27 | 2023-02-02 | Qualcomm Incorporated | Sense lines for high-speed application packages |
| CN115023038A (zh) * | 2022-04-29 | 2022-09-06 | 清华大学 | 微系统集成电路的叠装结构和叠装方法 |
| US20240047319A1 (en) * | 2022-08-04 | 2024-02-08 | Samsung Electronics Co., Ltd. | Semiconductor package and method of fabricating the same |
| US20240196525A1 (en) * | 2022-12-12 | 2024-06-13 | Rolls-Royce North American Technologies Inc. | Circuit board assembly having a security shield |
| US20250273612A1 (en) * | 2024-02-28 | 2025-08-28 | Qualcomm Incorporated | Package comprising a substrate including an inter substrate interconnect structure comprising an inner interconnect |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7045893B1 (en) * | 2004-07-15 | 2006-05-16 | Amkor Technology, Inc. | Semiconductor package and method for manufacturing the same |
| US20070126091A1 (en) * | 2005-12-07 | 2007-06-07 | Wood Alan G | Semiconductor components having through wire interconnects (TWI) |
| US20080158842A1 (en) * | 2006-12-29 | 2008-07-03 | Texas Instruments Incorporated | Stress and collapse resistant interconnect for mounting an integrated circuit package to a substrate |
| US20110147901A1 (en) * | 2009-12-17 | 2011-06-23 | Rui Huang | Integrated circuit packaging system with package stacking and method of manufacture thereof |
| US20130026649A1 (en) * | 2011-07-28 | 2013-01-31 | Fujitsu Semiconductor Limited | Semiconductor device and manufacturing method therefor |
| US20130105987A1 (en) * | 2011-11-02 | 2013-05-02 | Avago Technologies Enterprise IP (Singapore) Pte. Ltd. | Laminate interconnect having a coaxial via structure |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6623279B2 (en) | 1999-07-15 | 2003-09-23 | Incep Technologies, Inc. | Separable power delivery connector |
| JP3601462B2 (ja) * | 2001-03-05 | 2004-12-15 | オムロン株式会社 | 電子部品のパッケージ構造 |
| US6476476B1 (en) | 2001-08-16 | 2002-11-05 | Amkor Technology, Inc. | Integrated circuit package including pin and barrel interconnects |
| DE102005002707B4 (de) | 2005-01-19 | 2007-07-26 | Infineon Technologies Ag | Verfahren zur Herstellung elektrischer Verbindungen in einem Halbleiterbauteil mittels koaxialer Mikroverbindungselemente |
| KR100663265B1 (ko) | 2005-05-10 | 2007-01-02 | 삼성전기주식회사 | 다층 기판 및 그 제조 방법 |
| US7884483B2 (en) | 2005-06-14 | 2011-02-08 | Cufer Asset Ltd. L.L.C. | Chip connector |
| US7608921B2 (en) * | 2006-12-07 | 2009-10-27 | Stats Chippac, Inc. | Multi-layer semiconductor package |
| US7952196B1 (en) | 2008-04-21 | 2011-05-31 | Lockheed Martin Corporation | Affordable high performance high frequency multichip module fabrication and apparatus |
| KR20100075204A (ko) * | 2008-12-24 | 2010-07-02 | 삼성전자주식회사 | 스터드 범프를 이용한 적층형 반도체 패키지, 반도체 패키지 모듈, 및 그 제조방법 |
| TWI366890B (en) * | 2008-12-31 | 2012-06-21 | Ind Tech Res Inst | Method of manufacturing through-silicon-via and through-silicon-via structure |
| JP4833307B2 (ja) * | 2009-02-24 | 2011-12-07 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 半導体モジュール、端子板、端子板の製造方法および半導体モジュールの製造方法 |
| EP2244291A1 (en) | 2009-04-20 | 2010-10-27 | Nxp B.V. | Multilevel interconnection system |
| US8736065B2 (en) * | 2010-12-22 | 2014-05-27 | Intel Corporation | Multi-chip package having a substrate with a plurality of vertically embedded die and a process of forming the same |
| JP2012256675A (ja) | 2011-06-08 | 2012-12-27 | Shinko Electric Ind Co Ltd | 配線基板、半導体装置及びその製造方法 |
| JP5775789B2 (ja) * | 2011-10-18 | 2015-09-09 | 新光電気工業株式会社 | 積層型半導体パッケージ |
-
2014
- 2014-07-11 US US14/329,646 patent/US9385077B2/en active Active
-
2015
- 2015-07-09 CN CN202210862033.1A patent/CN115036287A/zh active Pending
- 2015-07-09 WO PCT/US2015/039678 patent/WO2016007706A1/en not_active Ceased
- 2015-07-09 JP JP2017500013A patent/JP6802146B2/ja active Active
- 2015-07-09 AU AU2015287804A patent/AU2015287804B2/en active Active
- 2015-07-09 CN CN201580036954.0A patent/CN106489191A/zh active Pending
- 2015-07-09 BR BR112017000154-3A patent/BR112017000154B1/pt not_active IP Right Cessation
- 2015-07-09 KR KR1020167036601A patent/KR102411667B1/ko active Active
- 2015-07-09 EP EP15741706.4A patent/EP3167483A1/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7045893B1 (en) * | 2004-07-15 | 2006-05-16 | Amkor Technology, Inc. | Semiconductor package and method for manufacturing the same |
| US20070126091A1 (en) * | 2005-12-07 | 2007-06-07 | Wood Alan G | Semiconductor components having through wire interconnects (TWI) |
| US20080158842A1 (en) * | 2006-12-29 | 2008-07-03 | Texas Instruments Incorporated | Stress and collapse resistant interconnect for mounting an integrated circuit package to a substrate |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110098164A (zh) * | 2018-01-29 | 2019-08-06 | 马维尔国际贸易有限公司 | 用于半导体部件的同轴互连结构 |
| CN110098164B (zh) * | 2018-01-29 | 2025-02-07 | 马维尔亚洲私人有限公司 | 用于半导体部件的同轴互连结构 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6802146B2 (ja) | 2020-12-16 |
| KR20170028901A (ko) | 2017-03-14 |
| AU2015287804B2 (en) | 2020-02-27 |
| JP2017520929A (ja) | 2017-07-27 |
| US9385077B2 (en) | 2016-07-05 |
| WO2016007706A1 (en) | 2016-01-14 |
| CN115036287A (zh) | 2022-09-09 |
| US20160013125A1 (en) | 2016-01-14 |
| BR112017000154A2 (pt) | 2017-11-07 |
| KR102411667B1 (ko) | 2022-06-20 |
| AU2015287804A1 (en) | 2017-01-05 |
| EP3167483A1 (en) | 2017-05-17 |
| BR112017000154B1 (pt) | 2022-05-17 |
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