CN106129122A - 氧化物薄膜晶体管及其制备方法、阵列基板、显示装置 - Google Patents

氧化物薄膜晶体管及其制备方法、阵列基板、显示装置 Download PDF

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CN106129122A
CN106129122A CN201610798600.6A CN201610798600A CN106129122A CN 106129122 A CN106129122 A CN 106129122A CN 201610798600 A CN201610798600 A CN 201610798600A CN 106129122 A CN106129122 A CN 106129122A
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thin film
layer
active layer
film transistor
oxide
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CN106129122B (zh
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刘威
方金钢
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BOE Technology Group Co Ltd
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Priority to US15/571,553 priority patent/US10192991B2/en
Priority to PCT/CN2017/083197 priority patent/WO2018040608A1/zh
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Abstract

一种氧化物薄膜晶体管及其制备方法、阵列基板、显示装置。该氧化物薄膜晶体管包括：衬底基板；依次设置在所述衬底基板上的有源层、栅绝缘层、栅极金属层、绝缘层和源漏电极层，其中，所述绝缘层在第一温度下沉积得到以使所述有源层未与所述栅极金属层重叠的部分被导体化，所述有源层的被导体化的部分与所述源漏电极层电连接。在第一温度下沉积绝缘层薄膜的过程可使有源层进一步失氧，从而使其导电性能增强，进而可提高薄膜晶体管的电学性能。

Description

氧化物薄膜晶体管及其制备方法、阵列基板、显示装置
技术领域
本发明的实施例涉及一种氧化物薄膜晶体管及其制备方法、阵列基板、显示装置。
背景技术
氧化物薄膜晶体管具有高迁移率、稳定性好、制作工艺简单等优点，以铟镓锌氧化物(IGZO)为代表的氧化物半导体材料在薄膜晶体管液晶显示器(TFT-LCD)、有源矩阵有机发光二极体面板(AMOLED)、电子纸显示面板以及集成电路等领域的应用非常广泛。
氧化物薄膜晶体管中栅极和源极之间产生的电容较小，使得显示面板可以具有高分辨率、低功耗等优点。顶栅型氧化物薄膜晶体管在大尺寸显示面板的应用中起着至关重要的作用，能够很大程度地提高薄膜晶体管的电学性能，例如，提高薄膜晶体管的稳定性和均匀性。
发明内容
本发明至少一实施例提供一种氧化物薄膜晶体管及其制备方法、阵列基板、显示装置，在氧化物薄膜晶体管的制备过程中，在高温下沉积绝缘层薄膜可使有源层的结构进一步发生变化，使其电学特性增强，从而可以提高薄膜晶体管的电学性能。
本发明至少一实施例提供一种氧化物薄膜晶体管，包括：衬底基板；依次设置在所述衬底基板上的有源层、栅绝缘层、栅极金属层、绝缘层和源漏电极层，其中，所述绝缘层在第一温度下沉积得到，以使所述有源层的未与所述栅极金属层重叠的部分被导体化，所述有源层的被导体化的部分与所述源漏电极层电连接。
例如，在本发明实施例提供的氧化物薄膜晶体管中，所述第一温度为290℃及以上。
例如，在本发明实施例提供的氧化物薄膜晶体管中，所述第一温度为290℃-400℃。
例如，在本发明实施例提供的氧化物薄膜晶体管中，所述有源层未与所述栅极金属层重叠的部分被等离子体处理以被导体化。
例如，在本发明实施例提供的氧化物薄膜晶体管中，形成所述等离子体的气体包括氮气、氩气、氦气。
例如，在本发明实施例提供的氧化物薄膜晶体管中，所述有源层的材料包括氧化铟镓锌(IGZO)、氧化铟锌(IZO)、氧化锌(ZnO)、氧化镓锌(GZO)。
例如，本发明实施例提供的氧化物薄膜晶体管，还包括设置于所述衬底基板和所述有源层之间的缓冲层。
例如，在本发明实施例提供的氧化物薄膜晶体管中，所述缓冲层的材料包括硅的氧化物或硅的氮化物。
本发明至少一实施例还提供一种阵列基板，包括上述任一的氧化物薄膜晶体管。
本发明至少一实施例还提供一种显示装置，包括上述阵列基板。
本发明至少一实施例还提供一种氧化物薄膜晶体管的制备方法，该方法包括：提供衬底基板；在所述衬底基板上依次沉积有源层薄膜、栅绝缘层薄膜和栅极金属层薄膜，并对所述有源层薄膜、所述栅绝缘层薄膜和所述栅极金属层薄膜进行构图工艺分别形成有源层、栅绝缘层和栅极金属层；对所述有源层未与所述栅极金属层重叠的部分进行等离子体处理；在第一温度下沉积绝缘层薄膜并对其进行构图工艺以形成绝缘层；其中，在沉积所述绝缘层薄膜的过程中所述有源层的未与所述栅极金属层重叠的部分被导体化。
例如，本发明实施例提供的制备方法，还包括：在所述绝缘层上沉积源漏电极层薄膜，并对其进行图案化处理形成源漏电极层。
例如，本发明实施例提供的制备方法，还包括：在所述绝缘层上形成过孔，所述有源层的被导体化的部分与所述源漏电极层通过所述过孔电连接。
例如，本发明实施例提供的制备方法，还包括：在所述衬底基板和所述有源层之间形成缓冲层。
例如，在本发明实施例提供的制备方法中，所述有源层的材料包括氧化铟镓锌(IGZO)、氧化铟锌(IZO)、氧化锌(ZnO)、氧化镓锌(GZO)。
例如，在本发明实施例提供的制备方法中，所述第一温度为290℃及以上。
例如，在本发明实施例提供的制备方法中，所述第一温度为290℃-400℃。
附图说明
图1为一种顶栅型氧化物薄膜晶体管的结构示意图；
图2为本发明一实施例提供的一种顶栅型氧化物薄膜晶体管的结构示意图；
图3为本发明一实施例提供的一种阵列基板的结构示意图；
图4为本发明一实施例提供的一种顶栅型氧化物薄膜晶体管的制备方法的流程图；
图5a-5h为本发明一实施例提供的一种顶栅型氧化物薄膜晶体管的制备方法的过程图。
附图标记：
1-衬底基板；2-缓冲层；3-有源层；4-栅绝缘层；5-栅极金属层；6-绝缘层；7-漏极；8-源极；9-有源层被导体化的部分；10-过孔；11-等离子体；12-像素电极；13-第二绝缘层；14-钝化层。
具体实施方式
为使本发明实施例的目的、技术方案和优点更加清楚，下面将结合本发明实施例的附图，对本发明实施例的技术方案进行清楚、完整地描述。显然，所描述的实施例是本发明的一部分实施例，而不是全部的实施例。基于所描述的本发明的实施例，本领域普通技术人员在无需创造性劳动的前提下所获得的所有其他实施例，都属于本发明保护的范围。
除非另外定义，本公开使用的技术术语或者科学术语应当为本发明所属领域内具有一般技能的人士所理解的通常意义。本公开中使用的“第一”、“第二”以及类似的词语并不表示任何顺序、数量或者重要性，而只是用来区分不同的组成部分。“包括”或者“包含”等类似的词语意指出现该词前面的元件或者物件涵盖出现在该词后面列举的元件或者物件及其等同，而不排除其他元件或者物件。“连接”或者“相连”等类似的词语并非限定于物理的或者机械的连接，而是可以包括电性的连接，不管是直接的还是间接的。“上”、“下”、“左”、“右”等仅用于表示相对位置关系，当被描述对象的绝对位置改变后，则该相对位置关系也可能相应地改变。
在顶栅型氧化物薄膜晶体管的制备过程中，可以将源极区域和漏极区域的氧化物有源层进行导体化处理，使薄膜晶体管具有较好的开关特性。常用的导体化处理的方法是利用等离子体轰击有源层的表面，使有源层表层的结构发生变化，从而增强其导电性能。但是在后续的绝缘层沉积时，通常采用在较低温度下制备氧化硅薄膜或者氮化硅薄膜，由于温度低，所得到的氧化硅薄膜或氮化硅薄膜的膜质不好，且温度低也不能使得有源层表层的结构进一步发生变化，例如失去氧元素而使其电学特性增强，因此导致最后的薄膜晶体管开关特性不尽如人意。
例如，图1为当前的一种顶栅型氧化物薄膜晶体管的结构示意图，该顶栅型氧化物薄膜晶体管包括衬底基板1以及依次设置在所述衬底基板1上的缓冲层2、有源层3、栅绝缘层4、栅极金属层5、绝缘层6和源漏电极层(包括漏极7和源极8)。在栅极金属层5与栅绝缘层4刻蚀完成后，对暴露出的有源层3进行等离子体处理，将有源层3未与栅极金属层5和栅绝缘层4重叠的部分进行导体化；在形成绝缘层6的过程中，采用常规的低温氧化硅工艺(例如化学气相沉积工艺)沉积绝缘层薄膜，但是，采用低温沉积绝缘层薄膜制备的绝缘层的膜质不好，并且在较低的温度(250℃以下)下也不能有效促进有源层3未与栅极金属层5和栅绝缘层4重叠的部分表面进一步失去氧元素，从而不能使此部分进一步被导体化。
表一为对图1所示的顶栅型氧化物薄膜晶体管的一个示例的源极8和漏极7施加不同电压进行测试得到的开态电流(Ion)和关态电流(Ioff)的数据。从表一中可以看出，对源极8和漏极7施加不同电压时，当图1所示的顶栅型氧化物薄膜晶体管处于开启状态时的电流较小。
表一
Vds Ion Ioff Ion/Ioff
0.1 1.1E-9 9.0E-15 1.2E+5
5.1 5.6E-8 4.0E-15 1.4E+7
10.1 1.1E-7 5.0E-15 2.3E+7
15.1 1.8E-7 1.0E-15 1.8E+8
20.1 2.7E-7 2.0E-15 1.4E+8
为解决上述问题，本发明的实施例提供了一种顶栅型氧化物薄膜晶体管，该顶栅型氧化物薄膜晶体管，包括：衬底基板；依次设置在衬底基板上的有源层、栅绝缘层、栅极金属层、绝缘层和源漏电极层。在第一温度下沉积绝缘层薄膜，并使有源层的未与栅极金属层重叠的部分被导体化，有源层的被导体化的部分与源漏电极层电连接。在该顶栅型氧化物薄膜晶体管的制备过程中，在高温下沉积绝缘层薄膜可使有源层的结构进一步发生变化，使其电学特性增强，从而可以提高薄膜晶体管的电学性能。
下面通过几个实施例进行说明。
实施例一
本实施例提供一种顶栅型氧化物薄膜晶体管，图2为本发明一实施例提供的一种顶栅型氧化物薄膜晶体管的结构示意图。例如，如图2所示，该顶栅型氧化物薄膜晶体管包括：衬底基板1；依次设置在衬底基板上的有源层3、栅绝缘层4、栅极金属层5、绝缘层6和源漏电极层(包括漏极7、源极8)。该绝缘层在第一温度下沉积(未示出)以使有源层3未与栅极金属层5重叠的部分被导体化，有源层3的被导体化的部分(即有源层被导体化的部分9)与源漏电极层(包括漏极7、源极8)电连接。
有源层3采用氧化物半导体材料制备，并且有源层3的未与栅极金属层5重叠的部分(源极区域和漏极区域)可以通过例如等离子体处理工艺而导体化，以增加其导电性，降低其与例如金属导电薄膜接触时导致的欧姆接触电阻。在绝缘层6的形成过程中，采用高温沉积绝缘层薄膜的方式，且该顶栅型氧化物薄膜晶体管处于真空高温状态中，有源层3未与栅极金属层5重叠的部分(即有源层被导体化的部分9)会进一步失氧，使得有源层被导体化的部分9的导电性进一步增强，从而使该薄膜晶体管的电学特性提高，甚至在350℃以上沉积的这层绝缘薄膜时，并不需要单独的等离子体处理即可达到导体化处理效果，例如，使得其开态电流提高，关态电流降低。
表二为对图2所示的顶栅型氧化物薄膜晶体管的一个示例的源极8和漏极7施加不同的电压进行测试得到的开态电流(Ion)和关态电流(Ioff)的数据。
表二
Vds Ion Ioff Ion/Ioff
0.1 5.9E-7 4.0E-16 1.5E+09
5.1 2.8E-5 4.0E-16 7.1E+10
10.1 5.4E-5 1.2E-15 4.5E+10
15.1 8.0E-5 4.0E-16 2.0E+11
与对图1所示的顶栅型氧化物薄膜晶体管测试得到的数据相比，在同样的条件(除了绝缘层的制备条件以外)下，图2所示的顶栅型氧化物薄膜晶体管的开态电流变大，并且其关态电流变小。例如，当电压为5.1V时，图1所示的顶栅型氧化物薄膜晶体管的开态电流为5.6E-8，关态电流为4.0E-15；图2所示的顶栅型氧化物薄膜晶体管的开态电流为2.8E-5，关态电流为4.0E-16。从上述数据可以得出：图2中所示的薄膜晶体管的开态电流为图1中所示的薄膜晶体管的开态电流的500倍，图2中所示的薄膜晶体管的关态电流为图1中所示的薄膜晶体管的关态电流的1/10。与图1中的顶栅型氧化物薄膜晶体管相比，本实施例中的顶栅型氧化物薄膜晶体管的开态电流显著提高，关态电流明显降低。
例如，在形成绝缘层6的过程中，沉积绝缘层薄膜的第一温度为290℃及以上，例如，该第一温度为290℃-400℃，例如290℃、300℃、350℃、400℃。该第一温度范围比图1所示的薄膜晶体管的制备过程沉积绝缘层薄膜的温度要更高，属于高温工艺。在该第一温度下，在沉积绝缘层薄膜(例如氧化硅薄膜、氮化硅薄膜)的过程中，有源层3的未与栅极金属层5重叠的部分会进一步失氧，有源层被导体化的部分9会被进一步导体化，以形成电学特性满足需求的薄膜晶体管。
例如，有源层3通过等离子体进行处理，使有源层3未与栅极金属层5重叠的部分被导体化(即形成有源层被导体化的部分9)。
例如，在衬底基板1上依次设置有源层3、栅绝缘层4、栅极金属层5之后，用等离子体轰击氧化物有源层3的表面使其未与栅极金属层5重叠的部分的表层结构发生变化，使该部分的导电性增强，即形成有源层被导体化的部分9。在高温沉积绝缘层薄膜的过程中，顶栅型氧化物薄膜晶体管处于真空高温状态，有源层被导体化的部分9会进一步失氧，表现出更强更稳定的导电性，从而提高薄膜晶体管的电学特性。
用等离子体对有源层3的未与栅极金属层5重叠的部分进行处理的过程中，例如，可以采用功率为10W～5000W的射频管产生等离子体，且等离子体处理的持续时间为30秒至30分钟。
例如，形成等离子体的气体包括保护性气氛或者反应性气氛，例如，保护性气氛可以为氮气、氩气、氦气、氖气中的一种或者混合气体。反应性气氛可以为空气、氧气、氢气、氨气、二氧化碳中的一种或者混合气体。
例如，有源层3的材料为氧化铟镓锌(IGZO)、氧化铟锌(IZO)、氧化锌(ZnO)、氧化镓锌(GZO)等金属氧化物。该有源层3可以利用磁控溅射的方式沉积，然后通过构图工艺形成，其厚度可以为30-50nm，例如，可以为30nm、40nm以及50nm。
例如，该栅极金属层5的材料可以为铜基金属，例如，铜(Cu)、铜钼合金(Cu/Mo)、铜钛合金(Cu/Ti)、铜钼钛合金(Cu/Mo/Ti)、铜钼钨合金(Cu/Mo/W)、铜钼铌合金(Cu/Mo/Nb)等；该栅金属层的材料也可以为铬基金属，例如，铬钼合金(Cr/Mo)、铬钛合金(Cr/Ti)、铬钼钛合金(Cr/Mo/Ti)等。
例如，被用作栅绝缘层薄膜的材料包括氮化硅(SiNx)、氧化硅(SiOx)、氧化铝(Al2O3)、氮化铝(AlN)或其他适合的材料。
例如，该顶栅型氧化物薄膜晶体管还可以包括设置于衬底基板1和有源层3之间的缓冲层2，缓冲层2在有源层3与衬底基板1之间充当一个过渡膜层，使有源层3与衬底基板1之间结合得更稳固，且可以防止衬底基板1中的有害杂质、离子等扩散到有源层3。
例如，缓冲层2的材料包括硅的氧化物(SiOx)或硅的氮化物(SiNx)、氧化硅。例如，该缓冲层2可以为由氮化硅或者氧化硅构成的单层结构，或者由氮化硅和氧化硅构成的双层结构。
实施例二
本实施例提供一种阵列基板，图3为本发明一实施例提供的一种阵列基板的结构示意图。例如，如图3所示，该阵列基板包括实施例一中的顶栅型氧化物薄膜晶体管，例如，如图3所示该阵列基板还包括像素电极12、第二绝缘层13和钝化层14。
像素电极12通过形成在第二绝缘层13和钝化层14中的过孔例如与薄膜晶体管的漏极7电连接。薄膜晶体管的源极8与数据线(未示出)电连接或一体形成，薄膜晶体管的栅极金属层5与栅线(未示出)电连接或一体形成。通常，数据线和栅线彼此交叉界定了阵列基板上的子像素，而该薄膜晶体管作为该子像素的开关元件。
例如，像素电极12采用透明导电材料形成或金属材料形成，例如，形成该像素电极12的材料包括氧化铟锡(ITO)、氧化铟锌(IZO)、氧化铟镓(IGO)、氧化镓锌(GZO)氧化锌(ZnO)、氧化铟(In2O3)、氧化铝锌(AZO)和碳纳米管等。
例如，该钝化层14的材料可以为氮化硅(SiNx)、氧化硅(SiOx)、丙烯酸类树脂等。
例如，第二绝缘层13的材料可以为有机绝缘材料或者无机绝缘材料或者有机绝缘材料和无机绝缘材料形成的叠层结构。例如，形成该绝缘层的材料为氮化硅(SiNx)、氧化硅(SiOx)、丙烯酸类树脂等。
例如，该阵列基板可应用于例如液晶显示面板、有机发光二极管显示面板、电子纸显示面板等。
实施例三
本公开的实施例还提供了一种显示装置，其包括上述实施例的阵列基板。
该显示装置的一个示例为液晶显示装置，其中，阵列基板与对置基板彼此对置以形成液晶盒，在液晶盒中填充有液晶材料。该对置基板例如为彩膜基板。阵列基板的每个子像素的像素电极用于施加电场对液晶材料的旋转的程度进行控制从而进行显示操作。在一些示例中，该液晶显示装置还包括为阵列基板提供背光的背光源。
该显示装置的另一个示例为有机发光二极管显示装置(OLED)，其中，阵列基板上形成有有机发光材料叠层，每个像素单元的像素电极作为阳极或阴极用于驱动有机发光材料发光以进行显示操作。
该显示装置的再一个示例为电子纸显示装置，其中，阵列基板上形成有电子墨水层，每个像素单元的像素电极作为用于施加驱动电子墨水中的带电微颗粒移动以进行显示操作的电压。
实施例四
本实施例提供一种顶栅型氧化物薄膜晶体管的制备方法，例如，图4为本发明一实施例提供的一种顶栅型氧化物薄膜晶体管的制备方法的流程图。例如，制备顶栅型氧化物薄膜晶体管的过程包括：提供衬底基板；在衬底基板上依次沉积有源层薄膜、栅绝缘层薄膜和栅极金属层薄膜，并对有源层薄膜、栅绝缘层薄膜和栅极金属层薄膜进行构图工艺分别形成有源层、栅绝缘层和栅极金属层；对有源层的未与栅极金属层重叠的部分进行等离子体处理；在第一温度下沉积绝缘层薄膜并对其进行构图工艺以形成绝缘层。在沉积绝缘层薄膜的过程中有源层的未与栅极金属层重叠的部分被导体化。
例如，在制备该顶栅型氧化物薄膜晶体管的过程中，还包括：在绝缘层薄膜上沉积源漏电极层薄膜，并对其进行图案化处理形成源漏电极层。
例如，在制备该顶栅型氧化物薄膜晶体管的过程中，还包括：在所述绝缘层上形成过孔，有源层的被导体化的部分与源漏电极层通过过孔电连接。
例如，在制备该顶栅型氧化物薄膜晶体管的过程中，还包括在衬底基板和有源层之间形成缓冲层。
图5a-5h为本实施例中的顶栅型氧化物薄膜晶体管制备的过程图。参照图5a-5h，本实施例提供的顶栅型氧化物薄膜晶体管的制备过程的一个示例包括如下所述的步骤。
如图5a所示，提供一衬底基板1并在该衬底基板上形成缓冲层2。例如，该衬底基板1可以为玻璃基板。例如，缓冲层2的材料包括硅氧化物(SiOx)或硅氮化物(SiNx)、硅氮氧化物(SiOxNy)。例如，该缓冲层2可以为由氮化硅或者氧化硅构成的单层结构，或者由氮化硅和氧化硅构成的双层结构。
如图5b所示，在缓冲层2上沉积一层有源层薄膜并对该有源层薄膜进行构图工艺以形成有源层3。例如，该有源层3的材料为氧化铟镓锌(IGZO)、氧化铟锌(IZO)、氧化锌(ZnO)、氧化镓锌(GZO)等金属氧化物。该有源层3可以利用磁控溅射的方式沉积，然后通过构图工艺形成，其厚度可以为30-50nm，例如，可以为30nm、40nm或50nm。
在本实施例中，构图工艺例如为光刻构图工艺，其例如包括：在需要被构图的结构层上涂覆光刻胶层，使用掩膜板对光刻胶层进行曝光，对曝光的光刻胶层进行显影以得到光刻胶图案，使用光刻胶图案对结构层进行蚀刻，然后可选地去除光刻胶图案。根据需要，构图工艺还可以是丝网印刷、喷墨打印方法等。
如图5c所示，在有源层3上沉积一层栅绝缘层薄膜，并对该栅绝缘层薄膜进行构图工艺以形成栅绝缘层4。例如，被用作栅绝缘层薄膜的材料包括氮化硅(SiNx)、氧化硅(SiOx)、氧化铝(Al2O3)、氮化铝(AlN)或其他适合的材料。
如图5d所示，在栅绝缘层4上沉积一层栅极金属层薄膜，并对该栅极金属层薄膜进行构图工艺以形成栅极金属层5。例如，栅极金属层5与栅绝缘层4重叠。例如，该栅极金属层5的材料可以为铜基金属，例如，铜(Cu)、铜钼合金(Cu/Mo)、铜钛合金(Cu/Ti)、铜钼钛合金(Cu/Mo/Ti)、铜钼钨合金(Cu/Mo/W)、铜钼铌合金(Cu/Mo/Nb)等；该栅金属层的材料也可以为铬基金属，例如，铬钼合金(Cr/Mo)、铬钛合金(Cr/Ti)、铬钼钛合金(Cr/Mo/Ti)等。
如图5e所示，对有源层3未与栅极金属层5重叠的部分进行等离子体处理，用等离子体轰击氧化物有源层3的同时其表面未与栅极金属层5重叠的部分的表层结构发生变化，使该部分的导电性增强，即形成有源层被导体化的部分9。例如，形成等离子体的气体包括保护性气氛或者反应性气氛，例如，保护性气氛可以为氮气、氩气、氦气、氖气中的一种或者混合气体。反应性气氛可以为空气、氧气、氢气、氨气、二氧化碳中的一种或者混合气体。
如图5f所示，采用第一温度在缓冲层2上沉积绝缘层薄膜，在沉积绝缘层薄膜(例如氧化硅薄膜、氮化硅薄膜)的过程中，有源层3的未与栅极金属层5重叠的部分会进一步失氧，即有源层被导体化的部分9会被进一步导体化，以形成电学特性满足需求的薄膜晶体管。例如，沉积绝缘层时采用的第一温度为290℃及以上。进一步地，沉积绝缘层时采用的第一温度为290℃-400℃，例如，290℃、300℃、350℃或400℃。例如，该绝缘层的材料为氮化硅(SiNx)或者氧化硅(SiOx)。
如图5g所示，在绝缘层上形成过孔10。例如，该过孔10与有源层被导体化的部分9连接，即暴露出该有源层被导体化的部分9。
如图5h所示，在绝缘层6上沉积源漏电极层薄膜，并通过构图工艺对其进行图案化处理形成源漏电极层(包括漏极7和源极8)。
例如，源漏电极层与有源层被导体化的部分9通过过孔10(参见图5g)电连接。
在本实施例的另一个示例中，例如，图5c和5d所示的形成栅绝缘层4和栅极金属层5的步骤合并，也即，连续沉积栅绝缘层薄膜和栅极金属层薄膜，然后通过同一构图工艺得到栅绝缘层4和栅极金属层5。
本发明的实施例提供一种氧化物薄膜晶体管及其制备方法、阵列基板、显示装置，并且具有以下至少一项有益效果：
(1)在沉积绝缘层薄膜的过程中采用高温(即第一温度)沉积，形成的绝缘层的膜质好；
(2)有源层未被栅极金属层覆盖的部分进一步地被导体化，使其电学特性增强，从而显著提高薄膜晶体管的电学特性。
对于本公开，还有以下几点需要说明：
(1)本发明实施例附图只涉及到与本发明实施例涉及到的结构，其他结构可参考通常设计。
(2)为了清晰起见，在用于描述本发明的实施例的附图中，层或区域的厚度被放大或缩小，即这些附图并非按照实际的比例绘制。
(3)在不冲突的情况下，本发明的实施例及实施例中的特征可以相互组合以得到新的实施例。
以上所述，仅为本发明的具体实施方式，但本发明的保护范围并不局限于此，本发明的保护范围应以所述权利要求的保护范围为准。

Claims (17)

1.一种氧化物薄膜晶体管，包括：
衬底基板；
依次设置在所述衬底基板上的有源层、栅绝缘层、栅极金属层、绝缘层和源漏电极层，其中，所述绝缘层在第一温度下沉积得到以使所述有源层未与所述栅极金属层重叠的部分被导体化，所述有源层的被导体化的部分与所述源漏电极层电连接。
2.根据权利要求1所述的氧化物薄膜晶体管，其中，所述第一温度为290℃及以上。
3.根据权利要求2所述的氧化物薄膜晶体管，其中，所述第一温度为290℃-400℃。
4.根据权利要求1所述的氧化物薄膜晶体管，其中，所述有源层未与所述栅极金属层重叠的部分被等离子体处理以被导体化。
5.根据权利要求4所述的氧化物薄膜晶体管，其中，形成所述等离子体的气体包括氮气、氩气、氦气。
6.根据权利要求1-5中任一项所述的氧化物薄膜晶体管，其中，所述有源层的材料包括氧化铟镓锌(IGZO)、氧化铟锌(IZO)、氧化锌(ZnO)、氧化镓锌(GZO)。
7.根据权利要求6所述的氧化物薄膜晶体管，还包括设置于所述衬底基板和所述有源层之间的缓冲层。
8.根据权利要求7所述的氧化物薄膜晶体管，其中，所述缓冲层的材料包括硅的氧化物或硅的氮化物。
9.一种阵列基板，包括权利要求1-8中任一项所述的氧化物薄膜晶体管。
10.一种显示装置，包括如权利要求9所述的阵列基板。
11.一种氧化物薄膜晶体管的制备方法，包括：
提供衬底基板；
在所述衬底基板上依次沉积有源层薄膜、栅绝缘层薄膜和栅极金属层薄膜，并对所述有源层薄膜、所述栅绝缘层薄膜和所述栅极金属层薄膜进行构图工艺分别形成有源层、栅绝缘层和栅极金属层；
对所述有源层未与所述栅极金属层重叠的部分进行等离子体处理；
在第一温度下沉积绝缘层薄膜并对其进行构图工艺以形成绝缘层；
其中，在沉积所述绝缘层薄膜的过程中所述有源层未与所述栅极金属层重叠的部分被导体化。
12.根据权利要求11所述的制备方法，还包括：在所述绝缘层上沉积源漏电极层薄膜，并对其进行图案化处理形成源漏电极层。
13.根据权利要求12所述的制备方法，还包括：在所述绝缘层上形成过孔，所述有源层的被导体化的部分与所述源漏电极层通过所述过孔电连接。
14.根据权利要求11所述的制备方法，还包括：在所述衬底基板和所述有源层之间形成缓冲层。
15.根据权利要求11-14中任一项所述的制备方法，其中，所述有源层的材料包括氧化铟镓锌(IGZO)、氧化铟锌(IZO)、氧化锌(ZnO)、氧化镓锌(GZO)。
16.根据权利要求15所述的制备方法，其中，所述第一温度为290℃及以上。
17.根据权利要求16所述的制备方法，其中，所述第一温度为290℃-400℃。
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