CN105470182B - 输送方法和检查系统 - Google Patents

输送方法和检查系统 Download PDF

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Publication number
CN105470182B
CN105470182B CN201510633761.5A CN201510633761A CN105470182B CN 105470182 B CN105470182 B CN 105470182B CN 201510633761 A CN201510633761 A CN 201510633761A CN 105470182 B CN105470182 B CN 105470182B
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CN
China
Prior art keywords
conveying arm
rotation position
substrate
inspection
conveying
Prior art date
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Active
Application number
CN201510633761.5A
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English (en)
Chinese (zh)
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CN105470182A (zh
Inventor
保坂广树
秋山雅彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Publication of CN105470182A publication Critical patent/CN105470182A/zh
Application granted granted Critical
Publication of CN105470182B publication Critical patent/CN105470182B/zh
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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/20—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by the properties tested or measured, e.g. structural or electrical properties
    • H10P74/207—Electrical properties, e.g. testing or measuring of resistance, deep levels or capacitance-voltage characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Manufacturing & Machinery (AREA)
  • Robotics (AREA)
CN201510633761.5A 2014-09-29 2015-09-29 输送方法和检查系统 Active CN105470182B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014198444A JP6400412B2 (ja) 2014-09-29 2014-09-29 搬送方法及び検査システム
JP2014-198444 2014-09-29

Publications (2)

Publication Number Publication Date
CN105470182A CN105470182A (zh) 2016-04-06
CN105470182B true CN105470182B (zh) 2018-07-27

Family

ID=55584124

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510633761.5A Active CN105470182B (zh) 2014-09-29 2015-09-29 输送方法和检查系统

Country Status (5)

Country Link
US (1) US10006961B2 (https=)
JP (1) JP6400412B2 (https=)
KR (1) KR101813326B1 (https=)
CN (1) CN105470182B (https=)
TW (1) TWI673505B (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6615698B2 (ja) * 2016-06-20 2019-12-04 東京エレクトロン株式会社 搬送装置および搬送方法、ならびに検査システム
JP6655516B2 (ja) * 2016-09-23 2020-02-26 東京エレクトロン株式会社 基板検査装置
WO2019012978A1 (ja) * 2017-07-10 2019-01-17 東京エレクトロン株式会社 基板搬送装置および基板搬送方法
JP6813816B2 (ja) * 2018-04-05 2021-01-13 東京エレクトロン株式会社 接合システムおよび接合方法
JP7349240B2 (ja) * 2018-10-05 2023-09-22 東京エレクトロン株式会社 基板倉庫及び基板検査方法
JP7390934B2 (ja) * 2020-03-03 2023-12-04 東京エレクトロン株式会社 検査装置
CN114073832B (zh) * 2020-08-17 2023-02-03 锥能机器人嘉兴有限公司 封锁装置
JP2024126928A (ja) * 2023-03-08 2024-09-20 株式会社村田製作所 検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101276771A (zh) * 2007-03-29 2008-10-01 东京毅力科创株式会社 被检查体的搬送装置和检查装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07254635A (ja) * 1994-03-15 1995-10-03 Hitachi Ltd 半導体製造装置
JP3783075B2 (ja) 2001-12-13 2006-06-07 東京エレクトロン株式会社 プローブ装置及びローダ装置
JP4832151B2 (ja) * 2006-04-25 2011-12-07 株式会社東京精密 プローブカード受け渡し方法、プローバ及びプローブカード供給・回収システム
JP4789821B2 (ja) * 2007-02-05 2011-10-12 東京エレクトロン株式会社 基板処理装置の検査方法
JP4959457B2 (ja) * 2007-07-26 2012-06-20 東京エレクトロン株式会社 基板搬送モジュール及び基板処理システム
JP5952645B2 (ja) * 2012-06-06 2016-07-13 東京エレクトロン株式会社 ウエハ検査用インターフェース及びウエハ検査装置
JP2015115517A (ja) * 2013-12-13 2015-06-22 シンフォニアテクノロジー株式会社 基板搬送装置及びｅｆｅｍ

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101276771A (zh) * 2007-03-29 2008-10-01 东京毅力科创株式会社 被检查体的搬送装置和检查装置

Also Published As

Publication number Publication date
KR20160037773A (ko) 2016-04-06
JP2016072356A (ja) 2016-05-09
JP6400412B2 (ja) 2018-10-03
TW201625970A (zh) 2016-07-16
US10006961B2 (en) 2018-06-26
CN105470182A (zh) 2016-04-06
US20160091562A1 (en) 2016-03-31
TWI673505B (zh) 2019-10-01
KR101813326B1 (ko) 2017-12-28

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