CN104755914B - 自动化的矿物分类 - Google Patents

自动化的矿物分类 Download PDF

Info

Publication number
CN104755914B
CN104755914B CN201380055717.XA CN201380055717A CN104755914B CN 104755914 B CN104755914 B CN 104755914B CN 201380055717 A CN201380055717 A CN 201380055717A CN 104755914 B CN104755914 B CN 104755914B
Authority
CN
China
Prior art keywords
mineral
data point
ray spectrum
rules
library
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201380055717.XA
Other languages
English (en)
Chinese (zh)
Other versions
CN104755914A (zh
Inventor
M.J.欧文
M.布霍特
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FEI Co
Original Assignee
FEI Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FEI Co filed Critical FEI Co
Publication of CN104755914A publication Critical patent/CN104755914A/zh
Application granted granted Critical
Publication of CN104755914B publication Critical patent/CN104755914B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/418—Imaging electron microscope
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2441—Semiconductor detectors, e.g. diodes
    • H01J2237/24415—X-ray
    • H01J2237/2442—Energy-dispersive (Si-Li type) spectrometer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2441—Semiconductor detectors, e.g. diodes
    • H01J2237/24415—X-ray
    • H01J2237/24425—Wavelength-dispersive spectrometer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H01J2237/2803—Scanning microscopes characterised by the imaging method
    • H01J2237/2804—Scattered primary beam
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H01J2237/2803—Scanning microscopes characterised by the imaging method
    • H01J2237/2807—X-rays

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201380055717.XA 2012-10-26 2013-09-30 自动化的矿物分类 Expired - Fee Related CN104755914B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/662072 2012-10-26
US13/662,072 US9778215B2 (en) 2012-10-26 2012-10-26 Automated mineral classification
PCT/US2013/062637 WO2014065992A1 (en) 2012-10-26 2013-09-30 Automated mineral classification

Publications (2)

Publication Number Publication Date
CN104755914A CN104755914A (zh) 2015-07-01
CN104755914B true CN104755914B (zh) 2017-12-05

Family

ID=50545095

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380055717.XA Expired - Fee Related CN104755914B (zh) 2012-10-26 2013-09-30 自动化的矿物分类

Country Status (7)

Country Link
US (1) US9778215B2 (https=)
EP (1) EP2912443A4 (https=)
JP (1) JP6364150B2 (https=)
CN (1) CN104755914B (https=)
AU (1) AU2013335211B2 (https=)
WO (1) WO2014065992A1 (https=)
ZA (1) ZA201502427B (https=)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9048072B2 (en) * 2012-03-12 2015-06-02 Micromass Uk Limited Method of mass spectrometry and a mass spectrometer
BR112014029563B1 (pt) * 2012-05-11 2021-07-20 Lngrain, Inc Método para estimar propriedades físicas selecionadas de uma amostra de rocha
EP2835817B1 (en) * 2013-08-09 2017-12-20 Carl Zeiss Microscopy Ltd. Method for semi-automated particle analysis using a charged particle beam
US9714908B2 (en) 2013-11-06 2017-07-25 Fei Company Sub-pixel analysis and display of fine grained mineral samples
US9099276B1 (en) * 2014-01-24 2015-08-04 Keysight Technologies, Inc. High-voltage energy-dispersive spectroscopy using a low-voltage scanning electron microscope
JP6361871B2 (ja) * 2014-07-07 2018-07-25 住友金属鉱山株式会社 データ処理装置、データ処理プログラム、データ処理方法および処理条件決定方法
JP6379756B2 (ja) * 2014-07-07 2018-08-29 住友金属鉱山株式会社 データ処理装置、データ処理プログラム、データ処理方法および処理条件決定方法
EP2990783B1 (en) * 2014-08-29 2019-10-02 Carl Zeiss Microscopy Ltd. Method and system for performing EDS analysis
US9719950B2 (en) 2015-02-25 2017-08-01 Fei Company Sample-specific reference spectra library
JP2016178037A (ja) * 2015-03-20 2016-10-06 株式会社日立ハイテクノロジーズ 荷電粒子ビーム装置及び荷電粒子ビーム装置を用いた画像の生成方法並びに画像処理装置
WO2017011658A2 (en) 2015-07-14 2017-01-19 Conocophillips Company Enhanced oil recovery response prediction
JP6500752B2 (ja) * 2015-11-09 2019-04-17 住友金属鉱山株式会社 全自動鉱物分析装置と微小部ｘ線回折装置とを用いた、鉱石中に存在する鉱物粒子の同定方法
EP3548875B1 (en) 2016-12-02 2022-10-19 National Research Council of Canada Optical imaging of mineral species using hyperspectral modulation transfer techniques
US10388489B2 (en) 2017-02-07 2019-08-20 Kla-Tencor Corporation Electron source architecture for a scanning electron microscopy system
EP3635392B1 (en) * 2017-05-15 2022-07-06 Saudi Arabian Oil Company Analyzing a rock sample
CN108051440A (zh) * 2017-11-29 2018-05-18 赣州好朋友科技有限公司 一种矿石自动光学识别方法
CN108398447B (zh) * 2018-03-01 2019-05-24 武汉工程大学 一种金铜矿尾砂中锌元素的崁布特征分析方法
US12094684B1 (en) * 2018-08-03 2024-09-17 Mochii, Inc. Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectroscopy
EP3726206B1 (en) * 2019-03-26 2022-11-02 FEI Company Methods and systems for inclusion analysis
CN112924485B (zh) * 2021-01-25 2021-10-29 中国科学院地质与地球物理研究所 一种电子探针二次标样校正法测定尖晶石Fe3+/∑Fe的方法
DE102021117592B9 (de) 2021-07-07 2023-08-03 Carl Zeiss Microscopy Gmbh Verfahren zum Betreiben eines Teilchenstrahlmikroskops, Teilchenstrahlmikroskop und Computerprogrammprodukt
WO2026070737A1 (ja) * 2024-09-30 2026-04-02 住友金属鉱山株式会社 鉱石の分析方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4560275A (en) * 1980-04-08 1985-12-24 California Institute Of Technology Portable instant display and analysis reflectance spectrometer
GB2223842A (en) * 1988-09-06 1990-04-18 Shell Int Research Automated mineral identification and rock characterization
WO2000054035A1 (en) * 1999-03-09 2000-09-14 Exxonmobil Upstream Research Company Method for identification of unknown substances
US20040057040A1 (en) * 2000-05-26 2004-03-25 Konrad Beckenkamp Method and device for identifying chemical substances
US6996492B1 (en) * 2003-03-18 2006-02-07 Kla-Tencor Technologies Corporation Spectrum simulation for semiconductor feature inspection
EP1736759A1 (en) * 2005-06-24 2006-12-27 Oxford Instruments Analytical Limited Simulation of X-ray emission spectra for material identification
CN1945298A (zh) * 2006-10-30 2007-04-11 北京科技大学 一种高碱度烧结矿主要矿物自动识别与定量方法
CN101718721A (zh) * 2009-11-10 2010-06-02 天津出入境检验检疫局化矿金属材料检测中心 重金属精矿与重金属矿灰和残渣属性鉴别方法
AU2012201146A1 (en) * 2011-03-23 2012-10-11 Tescan Group, A.S. Method of material analysis by means of a focused electron beam using characteristic X-rays and back-scattered electrons and the equipment to perform it

Family Cites Families (88)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51119289A (en) 1974-11-29 1976-10-19 Agency Of Ind Science & Technol Method of determining the heterogenous sample of micro-particles
CA1052740A (en) 1976-04-23 1979-04-17 Baxter Travenol Laboratories Device for indexing an array of sample containers
US4242586A (en) 1978-08-08 1980-12-30 Commonwealth Scientific And Industrial Research Organization Specimen holder for electron microscopy and electron diffraction
CA1170375A (en) * 1980-06-11 1984-07-03 Alan F. Reid Method and apparatus for material analysis
SE445676B (sv) 1980-07-08 1986-07-07 Stenkvist Bjoern G Forfarande och anordning for beredning av cellprover
US4587424A (en) 1983-08-22 1986-05-06 Schlumberger Technology Corporation Method for investigating the composition of an earth formation traversed by a borehole
US4592082A (en) 1984-08-10 1986-05-27 The United States Of America As Represented By The United States Department Of Energy Quantitative determination of mineral composition by powder X-ray diffraction
JPH0640054B2 (ja) 1985-09-20 1994-05-25 株式会社千代田製作所 電子顕微鏡標本作成用包埋装置
US4807148A (en) 1987-05-29 1989-02-21 Hewlett-Packard Company Deconvolving chromatographic peaks
US4839516A (en) 1987-11-06 1989-06-13 Western Atlas International, Inc. Method for quantitative analysis of core samples
JP2634464B2 (ja) 1989-05-23 1997-07-23 株式会社島津製作所 自動定性分析装置
JPH0656748B2 (ja) 1989-11-08 1994-07-27 日本電子株式会社 電子顕微鏡のオートフォーカス方法
US5817462A (en) 1995-02-21 1998-10-06 Applied Spectral Imaging Method for simultaneous detection of multiple fluorophores for in situ hybridization and multicolor chromosome painting and banding
US6018587A (en) 1991-02-21 2000-01-25 Applied Spectral Imaging Ltd. Method for remote sensing analysis be decorrelation statistical analysis and hardware therefor
US5798262A (en) 1991-02-22 1998-08-25 Applied Spectral Imaging Ltd. Method for chromosomes classification
US5991028A (en) 1991-02-22 1999-11-23 Applied Spectral Imaging Ltd. Spectral bio-imaging methods for cell classification
US5157251A (en) 1991-03-13 1992-10-20 Park Scientific Instruments Scanning force microscope having aligning and adjusting means
JPH0587707A (ja) 1991-09-27 1993-04-06 Nikon Corp Ｘ線顕微鏡用の試料カプセル
JP3076118B2 (ja) 1991-11-27 2000-08-14 シスメックス株式会社 粒子計数方法
RU2054660C1 (ru) 1991-12-28 1996-02-20 Алексей Никифорович Никифоров Способ прецизионного экспрессного рентгеноспектрального анализа негомогенных материалов
US5741707A (en) 1992-12-31 1998-04-21 Schlumberger Technology Corporation Method for quantitative analysis of earth samples
US5569925A (en) * 1994-06-23 1996-10-29 Philips Electronics North America Corporation Mechanical shutter for protecting an x-ray detector against high-energy electron or x-ray damage
JP3452278B2 (ja) 1994-06-30 2003-09-29 理学電機株式会社 Ｘ線回折を用いた定性分析方法及び定性分析装置
AUPN226295A0 (en) 1995-04-07 1995-05-04 Technological Resources Pty Limited A method and an apparatus for analysing a material
US5557104A (en) * 1995-10-24 1996-09-17 Texsem Laboratories, Inc. Method and apparatus for determining crystallographic characteristics in response to confidence factors
JP3607023B2 (ja) 1996-05-10 2005-01-05 株式会社堀場製作所 Ｘ線定量分析装置および方法
US5798525A (en) 1996-06-26 1998-08-25 International Business Machines Corporation X-ray enhanced SEM critical dimension measurement
JP3500264B2 (ja) 1997-01-29 2004-02-23 株式会社日立製作所 試料分析装置
JPH10312763A (ja) 1997-05-14 1998-11-24 Hitachi Ltd 電子顕微鏡用試料ホールダ
US6058322A (en) 1997-07-25 2000-05-02 Arch Development Corporation Methods for improving the accuracy in differential diagnosis on radiologic examinations
JP3884551B2 (ja) 1997-12-13 2007-02-21 株式会社堀場製作所 Ｘ線スペクトル分析による物質名の検索方法及び検索システム
US6093930A (en) 1998-04-02 2000-07-25 International Business Machnines Corporation Automatic probe replacement in a scanning probe microscope
US6466929B1 (en) 1998-11-13 2002-10-15 University Of Delaware System for discovering implicit relationships in data and a method of using the same
JP2000249668A (ja) 1999-03-02 2000-09-14 Jeol Ltd 不均一複合組織試料の定量分析装置
US6341257B1 (en) 1999-03-04 2002-01-22 Sandia Corporation Hybrid least squares multivariate spectral analysis methods
US6282301B1 (en) 1999-04-08 2001-08-28 The United States Of America As Represented By The Secretary Of The Army Ares method of sub-pixel target detection
US6674894B1 (en) 1999-04-20 2004-01-06 University Of Utah Research Foundation Method and apparatus for enhancing an image using data optimization and segmentation
US6993170B2 (en) 1999-06-23 2006-01-31 Icoria, Inc. Method for quantitative analysis of blood vessel structure
JP2001006597A (ja) 1999-06-24 2001-01-12 Nec Eng Ltd 試料搭載装置
JP3527955B2 (ja) 1999-08-26 2004-05-17 理学電機工業株式会社 蛍光ｘ線分析装置
US6377652B1 (en) 2000-01-05 2002-04-23 Abb Automation Inc. Methods and apparatus for determining mineral components in sheet material
US20040252299A9 (en) 2000-01-07 2004-12-16 Lemmo Anthony V. Apparatus and method for high-throughput preparation and spectroscopic classification and characterization of compositions
US7108970B2 (en) 2000-01-07 2006-09-19 Transform Pharmaceuticals, Inc. Rapid identification of conditions, compounds, or compositions that inhibit, prevent, induce, modify, or reverse transitions of physical state
US6470335B1 (en) 2000-06-01 2002-10-22 Sas Institute Inc. System and method for optimizing the structure and display of complex data filters
JP2002189005A (ja) 2000-10-10 2002-07-05 Nippon Light Metal Co Ltd Ｅｐｍａ法による金属間化合物の厚さ測定方法及びこの方法を用いた金属間化合物の立体形状測定方法
US6724940B1 (en) 2000-11-24 2004-04-20 Canadian Space Agency System and method for encoding multidimensional data using hierarchical self-organizing cluster vector quantization
US7761270B2 (en) 2000-12-29 2010-07-20 Exxonmobil Upstream Research Co. Computer system and method having a facility management logic architecture
US20050037515A1 (en) 2001-04-23 2005-02-17 Nicholson Jeremy Kirk Methods for analysis of spectral data and their applications osteoporosis
JP4015450B2 (ja) 2001-05-18 2007-11-28 高砂香料工業株式会社 光学活性アルコールの製造方法
US6584413B1 (en) 2001-06-01 2003-06-24 Sandia Corporation Apparatus and system for multivariate spectral analysis
US6687620B1 (en) 2001-08-01 2004-02-03 Sandia Corporation Augmented classical least squares multivariate spectral analysis
JP4497923B2 (ja) 2001-12-05 2010-07-07 ザ ジェイ． デビッド グラッドストーン インスティテューツ ロボット顕微鏡検査システム
GB0201362D0 (en) 2002-01-22 2002-03-13 Renishaw Plc Reversible sample holder
US7244948B1 (en) 2003-03-06 2007-07-17 Princeton University Miniature multinuclide detection system and methods
US6658143B2 (en) 2002-04-29 2003-12-02 Amersham Biosciences Corp. Ray-based image analysis for biological specimens
US6835931B2 (en) 2002-05-15 2004-12-28 Edax Inc. Chemical prefiltering for phase differentiation via simultaneous energy dispersive spectrometry and electron backscatter diffraction
US20040027350A1 (en) 2002-08-08 2004-02-12 Robert Kincaid Methods and system for simultaneous visualization and manipulation of multiple data types
US6888920B2 (en) 2002-09-03 2005-05-03 Basil Eric Blank Low-cost, high precision goniometric stage for x-ray diffractography
WO2004040407A2 (en) 2002-10-25 2004-05-13 Liposcience, Inc. Methods, systems and computer programs for deconvolving the spectral contribution of chemical constituents with overlapping signals
JP2004151045A (ja) 2002-11-01 2004-05-27 Hitachi High-Technologies Corp 電子顕微鏡またはｘ線分析装置及び試料の分析方法
US7400770B2 (en) 2002-11-06 2008-07-15 Hrl Laboratories Method and apparatus for automatically extracting geospatial features from multispectral imagery suitable for fast and robust extraction of landmarks
US20040147830A1 (en) 2003-01-29 2004-07-29 Virtualscopics Method and system for use of biomarkers in diagnostic imaging
WO2005029016A2 (en) 2003-03-13 2005-03-31 University Of Florida Material identification employing a grating spectrometer
US7132652B1 (en) 2003-03-25 2006-11-07 Kla-Tencor Technologies Corporation Automatic classification of defects using pattern recognition applied to X-ray spectra
US7483554B2 (en) 2003-11-17 2009-01-27 Aureon Laboratories, Inc. Pathological tissue mapping
US8060173B2 (en) 2003-08-01 2011-11-15 Dexcom, Inc. System and methods for processing analyte sensor data
CN100498309C (zh) 2003-09-28 2009-06-10 中国石油化工股份有限公司 利用x-射线荧光法分析催化裂化催化剂中金属含量的方法
CA2542107A1 (en) 2003-10-23 2005-05-12 Liposcience, Inc. Methods, systems and computer programs for assessing chd risk using mathematical models that consider in vivo concentration gradients of ldl particle subclasses of discrete size
US20070279629A1 (en) 2004-01-07 2007-12-06 Jacob Grun Method and apparatus for identifying a substance using a spectral library database
JP4407337B2 (ja) 2004-03-25 2010-02-03 株式会社島津製作所 クロマトグラフ質量分析装置
US7490009B2 (en) * 2004-08-03 2009-02-10 Fei Company Method and system for spectroscopic data analysis
US7804059B2 (en) 2004-08-11 2010-09-28 Jordan Valley Semiconductors Ltd. Method and apparatus for accurate calibration of VUV reflectometer
US7597852B2 (en) 2004-09-03 2009-10-06 Symyx Solutions, Inc. Substrate for sample analyses
KR20060032047A (ko) 2004-10-11 2006-04-14 삼성전자주식회사 시료의 표면 분석 방법
US7711661B2 (en) 2004-12-20 2010-05-04 The Trustees Of Princeton University System and method for resolving gamma-ray spectra
EP1863066A1 (en) 2006-05-29 2007-12-05 FEI Company Sample carrier and sample holder
JP5247993B2 (ja) * 2006-07-06 2013-07-24 株式会社デンソー 点火コイル
US8804897B2 (en) 2006-07-21 2014-08-12 Areva Inc. Integrated method to analyze crystals in deposits
JP5277165B2 (ja) 2006-07-24 2013-08-28 ベクトン・ディキンソン・アンド・カンパニー 分析粒子凝集およびイメージング装置および方法
EP2102773B1 (en) 2006-11-30 2012-08-01 Gen-Probe Incorporated Quantitative method employing adjustment of pre-defined master calibration curves
WO2009100404A2 (en) 2008-02-06 2009-08-13 Fei Company A method and system for spectrum data analysis
DE102008041815A1 (de) * 2008-09-04 2010-04-15 Carl Zeiss Nts Gmbh Verfahren zur Analyse einer Probe
JP2011113640A (ja) 2009-11-24 2011-06-09 Fuji Electric Holdings Co Ltd 分析用試料の保持方法及び分析装置用試料ホルダー
EP2605005A1 (en) 2011-12-14 2013-06-19 FEI Company Clustering of multi-modal data
US8716673B2 (en) 2011-11-29 2014-05-06 Fei Company Inductively coupled plasma source as an electron beam source for spectroscopic analysis
US9048067B2 (en) * 2012-10-26 2015-06-02 Fei Company Mineral identification using sequential decomposition into elements from mineral definitions
US9696268B2 (en) * 2014-10-27 2017-07-04 Kla-Tencor Corporation Automated decision-based energy-dispersive x-ray methodology and apparatus
US9719950B2 (en) * 2015-02-25 2017-08-01 Fei Company Sample-specific reference spectra library

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4560275A (en) * 1980-04-08 1985-12-24 California Institute Of Technology Portable instant display and analysis reflectance spectrometer
GB2223842A (en) * 1988-09-06 1990-04-18 Shell Int Research Automated mineral identification and rock characterization
WO2000054035A1 (en) * 1999-03-09 2000-09-14 Exxonmobil Upstream Research Company Method for identification of unknown substances
US6140643A (en) * 1999-03-09 2000-10-31 Exxonmobil Upstream Research Company Method for identification of unknown substances
US20040057040A1 (en) * 2000-05-26 2004-03-25 Konrad Beckenkamp Method and device for identifying chemical substances
US6996492B1 (en) * 2003-03-18 2006-02-07 Kla-Tencor Technologies Corporation Spectrum simulation for semiconductor feature inspection
EP1736759A1 (en) * 2005-06-24 2006-12-27 Oxford Instruments Analytical Limited Simulation of X-ray emission spectra for material identification
CN1945298A (zh) * 2006-10-30 2007-04-11 北京科技大学 一种高碱度烧结矿主要矿物自动识别与定量方法
CN101718721A (zh) * 2009-11-10 2010-06-02 天津出入境检验检疫局化矿金属材料检测中心 重金属精矿与重金属矿灰和残渣属性鉴别方法
AU2012201146A1 (en) * 2011-03-23 2012-10-11 Tescan Group, A.S. Method of material analysis by means of a focused electron beam using characteristic X-rays and back-scattered electrons and the equipment to perform it

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
APPLICATION OF AUTOMATED QUANTITATIVE MINERALOGY IN MINERAL PROCESSING;D.N.SUTHERLAND et al.;《Minerals Engineering》;19911231;第4卷(第7-11期);第753-762页 *

Also Published As

Publication number Publication date
JP2015536457A (ja) 2015-12-21
US20140117231A1 (en) 2014-05-01
ZA201502427B (en) 2015-12-23
CN104755914A (zh) 2015-07-01
AU2013335211A1 (en) 2015-04-30
EP2912443A1 (en) 2015-09-02
EP2912443A4 (en) 2015-11-04
AU2013335211B2 (en) 2017-09-07
US9778215B2 (en) 2017-10-03
WO2014065992A1 (en) 2014-05-01
JP6364150B2 (ja) 2018-07-25

Similar Documents

Publication Publication Date Title
CN104755914B (zh) 自动化的矿物分类
CN104380088B (zh) 对sem-eds数据集中的未知物的聚类分析
CN104870986B (zh) 用于执行自动化矿物学的过程
EP2546638B1 (en) Clustering of multi-modal data
US8937282B2 (en) Mineral identification using mineral definitions including variability
US9734986B2 (en) Mineral identification using sequential decomposition into elements from mineral definitions
US9719950B2 (en) Sample-specific reference spectra library
EP3062096B1 (en) Sample-specific reference spectra library
EP3073253A1 (en) Sample-specific reference spectra library

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
EXSB Decision made by sipo to initiate substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20171205

Termination date: 20200930