CN104246996A - 焊料凸块及其形成方法、以及具备有焊料凸块的基板及其制造方法 - Google Patents
焊料凸块及其形成方法、以及具备有焊料凸块的基板及其制造方法 Download PDFInfo
- Publication number
- CN104246996A CN104246996A CN201280072463.8A CN201280072463A CN104246996A CN 104246996 A CN104246996 A CN 104246996A CN 201280072463 A CN201280072463 A CN 201280072463A CN 104246996 A CN104246996 A CN 104246996A
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- Prior art keywords
- solder
- fusion welding
- mask
- solder projection
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
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- H01L24/11—Manufacturing methods
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K37/00—Auxiliary devices or processes, not specially adapted to a procedure covered by only one of the preceding main groups
- B23K37/06—Auxiliary devices or processes, not specially adapted to a procedure covered by only one of the preceding main groups for positioning the molten material, e.g. confining it to a desired area
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
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- H01L2224/11—Manufacturing methods
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Abstract
本发明提供一种能够在具有微细的铜电极的印刷基板等安装基板上形成具有所期望的一定厚度的焊料凸块而不产生铜溶蚀等不良情况的焊料凸块的形成方法。为了解决上述课题,本发明的焊料凸块的形成方法具有:在将所准备的基板(1)和所准备的掩模(5)叠合后,喷射熔融焊料的喷流,在掩模(5)的开口部堆积熔融焊料(11a)直至其厚度比所述掩模的厚度更厚的工序;将超出掩模(5)的厚度的熔融焊料(11a)除去而形成给定厚度的焊料凸块(11)的工序;以及取下掩模(5)的工序,其中,熔融焊料(11a)是熔融无铅焊料,该熔融无铅焊料以锡为主成分,并至少包含镍作为副成分,还任选含有银、铜、锗等,将超出掩模(5)的厚度的熔融焊料(11a)的除去如下进行:利用刮板或气刀来进行,或者利用喷雾含有碳原子数12~20的有机脂肪酸的溶液(18)来进行。
Description
技术领域
本发明涉及焊料凸块及其形成方法、以及具备焊料凸块的基板及其制造方法。更详细地,涉及在印刷基板、晶片及挠性基板等基板所具备的铜电极上的能够防止构成该铜电极的铜溶蚀的一定厚度的焊料凸块及其形成方法、以及具备这样的焊料凸块的基板及其制造方法。
背景技术
近年来,印刷基板、晶片及挠性基板等基板(以下,有时将它们称为“安装基板”)的布线密度及安装密度越发提高。作为用于将电子部件焊接于安装基板上的焊料凸块,要求其细微且形状及尺寸等一致。作为满足这样的要求的焊料凸块的形成方法,专利文献1提出了一种使用网版来容易地形成致密且具有一定形状的焊料的方法等,所述网版是具备用于用浆料形成浆料凸块的开口的网版,其特征在于,由刚性的第一金属层、树脂类的粘接剂层及第二金属层构成,且相对于第一金属层的开口,粘接剂层及第二金属层的开口的口径缩小。
可是,连接器、QFP(方型扁平式封装,Quad Flat Package)、SOP(小引出线封装,Small Out line Package)、BGA(球栅阵列封装,Ball Grid Array)等电子部件有时引线端子等连接端子的尺寸上存在不均。为了将连接端子的尺寸不均的电子部件没有焊接不良地进行焊接,需要通过增厚设置于安装基板上的焊料凸块来减小电子部件的尺寸不均的影响。因此,在专利文献l中所使用的网版金属掩模需要具有能够在安装基板上设置相当量焊料的程度的厚度。
另一方面,在CSP(芯片级封装,Chip Size Package)等小型的电子部件混合存在于用于安装在安装基板上的电子部件中的情况下,这样的小型电子部件用焊料凸块的尺寸是极微细的。因此,用于在安装基板上设置该焊料凸块的金属掩模具备用于小型电子部件的小的开口。但是,用于设置上述的相当量焊料的金属掩模具有仅用来吸收连接端子的尺寸不均的厚度。设置于这样的较厚的金属掩模上的用于小型电子部件的开口的长宽比(厚度/开口宽度)变大,在使用金属掩模将焊料糊进行网版印刷时,在金属掩模上会残留焊料糊,从而会产生导致焊料糊的厚度变得不稳定的问题。为了解决该问题,需要适当地形成高度方向(厚度)不同的多个焊料凸块,使得能够将具有较大的尺寸不均的连接端子的电子部件和小型的电子部件同时安装在同一安装基板上。然而,厚度不同的多个焊料凸块的制造较为繁杂,并且从制造成本方面来看也不优选。
专利文献2提出了一种即使连接器、QFP、SOP、BGA等电子部件与CSP等小型电子部件混合存在的情况下,也能够形成对于两种电于部件而言均合适的焊料凸块的方法。该方法为:在具有电极的印刷基板(安装基板)上配置焊料印刷用掩模,该焊料印刷用掩模由具有开口部的金属制第一层和另一具有开口部的第二层构成,并使得第二层与印刷基板密合,并且,从第一层侧供给焊料糊,利用压浆夹具来实施挤压,从而形成高度不同的焊料凸块。
另外,作为焊料凸块的其它形成方法,已知有将设置了铜电极的安装基板直接浸渍(浸泡)在熔融焊料中的方法。但是,在将安装基板直接浸渍在熔融焊料中的情况下,焊料中所包含的锡会溶蚀铜电极的铜而发生所谓的“铜溶蚀”,存在使铜图案消失的问题。因此,为了缩短安装基板在熔融焊料中的浸渍时间来抑制铜溶蚀,对于在安装基板的铜电极上形成预焊料层、然后将安装基板浸渍在熔融焊料中的方法(浸渍方法)进行了研究。
现有技术文献
专利文献
专利文献1:日本特开平10-286936号公报
专利文献2:日本特开2006-66811号公报
发明内容
发明要解决的问题
但是,专利文献2的方法由于是用压浆夹具对所供给的焊料糊进行挤压来形成高度不同的焊料凸块的方法,因此,存在生产性差的难点。另外,对于上述的浸渍方法而言,存在铜溶蚀的问题依然无法解决的问题。
本发明是为了解决上述课题而进行的,其目的在于提供一种焊料凸块及其形成方法,所述焊料凸块能够在具有微细电极的印刷基板、晶片及挠性基板等基板上形成具有所期望的一定厚度的焊料凸块,且不会产生铜溶蚀等问题。另外,本发明的另一目的在于提供具有这样的焊料凸块的基板及其制造方法。
解决问题的方法
用于解决上述课题的本发明的焊料凸块的形成方法具有:准备形成有铜电极的基板的工序;准备形成有开口部的掩模的工序,所述开口部用于在所述铜电极上的必要位置形成焊料凸块;将所述基板和所述掩模叠合后,从所述掩模的表面侧喷射熔融焊料的喷流,在所述掩模的开口部堆积熔融焊料直至其厚度比所述掩模的厚度更厚的工序;将超出所述掩模的厚度的熔融焊料除去而形成给定厚度的焊料凸块的工序;以及取下所述掩模的工序,其中,所述熔融焊料是熔融无铅焊料,该熔融无铅焊料以锡为主成分,并至少包含镍作为副成分,还包含选自银、铜、锌、铋、锑及锗中的1种或2种以上作为任选的副成分,超出所述掩模厚度的熔融焊料的除去如下进行:利用刮板或气刀等除去机构来进行,或者利用喷雾含有碳原子数12~20的有机脂肪酸的溶液的除去方法来进行。
按照本发明,由于向开口部喷射以锡为主成分且至少含有镍作为副成分的熔融焊料的喷流,因此,在铜电极的表面形成铜电极中的铜与熔融焊料所含的镍进行合金化而成的CuNiSn金属间化合物层。形成在铜电极表面的金属间化合物层成为铜溶蚀的阻挡层,该阻挡层由于防止铜电极的铜溶蚀,因此能够防止由于铜溶蚀而导致的铜电极的缺损或消失。其结果,能够确保安装基板的铜垫等铜电极的可靠性,在将电子部件焊接于安装基板时,能够抑制以往的焊接时产生的铜溶蚀。另外,按照本发明,由于利用刮板或气刀等除去机构或者喷雾碳原子数12~20的含有有机脂肪酸的溶液的除去方法这样的简便的方法来进行超出掩模厚度的熔融焊料的除去,因此,能够在具有微细铜电极的安装基板上容易且尺寸精度良好地形成所期望的一定厚度的焊料凸块。其结果,不需要以往那样的高成本的工序,因此,能够提高将电子部件与焊料凸块进行焊接的接合部的可靠性和成品率,对于制造低成本的安装基板是有利的。
在本发明的焊料凸块的形成方法中,在上述焊料凸块上形成了所述含有有机脂肪酸的溶液所包含的有机脂肪酸的涂敷膜。
在本发明的焊料凸块的形成方法中,具有如下工序:在将所述熔融焊料的喷流喷射到所述铜电极上之前,使有机脂肪酸溶液与所述铜电极接触。
在本发明的焊料凸块的形成方法中,所述含有有机脂肪酸的溶液是含有碳原子数16的棕榈酸的溶液。
用于解决上述课题的本发明的安装基板的制造方法的特征在于,利用上述本发明的焊料凸块的形成方法在待安装电子部件的铜电极上形成焊料凸块,在所形成的所述焊料凸块上焊接安装电子部件。
按照本发明,由于利用上述的焊料凸块的形成方法形成焊料凸块,因此,能够确保安装基板的铜垫等铜电极的可靠性,在将电子部件焊接于安装基板上时,能够抑制以往的焊接时产生的铜溶蚀。另外,能够在具有微细铜电极的安装基板上容易且尺寸精度良好地形成所期望的一定厚度的焊料凸块。按照这样的本发明,由于不需要以往那样的高成本的工序,因此,能够提高将电子部件与焊料凸块进行焊接的接合部的可靠性和成品率,能够制造低成本的安装基板。
发明的效果
按照本发明的焊料凸块的形成方法,由于在铜电极的表面形成铜电极中的铜与熔融焊料所包含的镍进行了合金化而成的CuNiSn金属间化合物层,因此,该金属间化合物层成为铜溶蚀的阻挡层,该阻挡层防止铜电极的铜溶蚀,从而能够防止由于铜溶蚀而导致的铜电极的缺损或消失。其结果,能够确保安装基板的铜垫等铜电极的可靠性,在将电子部件焊接于安装基板上时,能够抑制以往的焊接时产生的铜溶蚀。另外,根据本发明,由于能够在具有微细铜电极的安装基板上容易且尺寸精度良好地形成所期望的一定厚度的焊料凸块,因此,不需要以往那样的高成本的工序,从而能够提高将电子部件与焊料凸块进行焊接的接合部的可靠性和成品率,对于制造低成本的安装基板是有利的。
按照本发明的安装基板的制造方法,能够确保安装基板的铜垫等铜电极的可靠性,在将电子部件焊接于安装基板上时,能够抑制以往的焊接时产生的铜溶蚀。另外,能够在具有微细铜电极的安装基板上容易且尺寸精度良好地形成所期望的一定厚度的焊料凸块。其结果,不需要以往那样的高成本的工序,因此,能够提高将电子部件与焊料凸块进行焊接的接合部的可靠性和成品率,从而能够制造低成本的安装基板。
附图说明
图1是示出在本发明的焊料凸块的形成方法中使用的基板和掩模的示意立体图。
图2(A)~(D)是示出本发明的焊料凸块的形成方法的一例的工序图(其一)。
图3(A)~(C)是示出发明的焊料凸块的形成方法的一例的工序图(其二)。
图4(A)~(C)是示出本发明的焊料凸块的形成方法的另一例的工序图的一部分。
图5(A)~(B)是使用了形状不同的掩模的例子。
图6是形成在铜电极上的金属间化合物层的例子,图6(A)是比较例所形成的焊料连接部的剖面形态的示意图,图6(B)是实施例所形成的焊料连接部的剖面形态的示意图。
图7是用含有有机脂肪酸的溶液进行了清洁化处理后的熔融焊料的润湿性试验(meniscograph)结果。
图8是未处理的熔融焊料的润湿性试验(meniscograph)结果。
图9是示出焊料层深度方向的氧量的图。
图10(A)~(D)是对焊料连接部进行了加热后的微孔的产生形态的例子,其中(A)、(B)为比较例的结果,(C)、(D)为实施例的结果。
图11(A)~(B)是实施例中得到的焊料连接部的剖面的元素映射像(element mapping image)。
符号说明
1 基板
2 铜电极
5、5A、5B 掩模
6 开口部
11 焊料凸块
11a 熔融焊料
11’ 熔融焊料的喷流
12 喷流喷嘴
13a CuNiSn金属间化合物层
13b CuSn金属间化合物层
15 刮浆板
17 喷射喷嘴
18 含有有机脂肪酸的溶液
19 涂敷膜
S1 表面
S2 倾斜面
具体实施方式
以下,参照附图对本发明的焊料凸块的形成方法及安装基板的制造方法进行说明。需要说明的是,在本申请中,可以将“本发明”又称为“本申请的实施方式”。
[焊料凸块的形成方法]
本发明的焊料凸块11的形成方法具有如下工序:准备形成有铜电极2的基板1的工序;准备形成有开口部6的掩模5的工序,所述开口部6用于在铜电极2上的必要位置形成焊料凸块11;将基板1和掩模5叠合后,从掩模的表面S1侧喷射熔融焊料的喷流11’,在掩模5的开口部6堆积熔融焊料11a直至其厚度比所述掩模5的厚度更厚的工序;将超出掩模5的厚度的熔融焊料11a除去而形成给定厚度的焊料凸块11a的工序;以及取下掩模5的工序。
以下,对于各工序进行详细说明。
(基板的准备工序)
如图1所示,所准备的基板1是印刷基板、晶片及挠性基板等基板。这些基板1形成有给定的铜电极2。作为铜电极2,可以优选举出图案宽度为5μm以上或10μm以上、且为500μm以下的窄间距的铜电极。铜电极2的厚度没有特别限定,通常为5μm以上且30μm以下左右。基板1的大小及外形形状也没有特别限定,本发明可使用各种大小及外形形状的基板。
需要说明的是,设置于基板1上的铜电极2中,通常,仅安装电子部件的部分(焊料连接部)露出,焊料连接部以外的部分被绝缘层或绝缘膜覆盖。通过后述的方法在该露出的焊料连接部形成焊料凸块11,设置于该焊料连接部的焊料凸块11以将电子部件焊接、或将连接端子(连接器)接合的方式起作用。
(掩模的准备工序)
如图1所示,所准备的掩模5形成有开口部6,以用来在铜电极2上的必要位置形成焊料凸块11。掩模5的材质没有特别限定,但由于喷射熔融焊料11a的喷流11’,并与该熔融焊料11a接触一定时间,因此,可以为耐热性的材质。通常使用金属制掩模或耐热性塑料等。设置于掩模5上的开口部6在基板1的铜电极2中需要设置焊料凸块11的位置(焊料连接部)被开空。
掩模5的厚度可根据所形成的焊料凸块11的厚度任意选择。因此,掩模5的开口部6的边缘的厚度对焊料凸块11的高度(厚度)有限制。作为掩模5的边缘的厚度,例如可以从20μm以上且500μm以下的范围任意选择。在本发明中,通过使用这样厚度范围内的掩模5,能够以不存在不均的均一厚度得到与掩模5的厚度相同或基本相同厚度的焊料凸块11。
对于掩模5的厚度而言,通常如图3(B)、(C)所示那样,使用与所形成的焊料凸块11的高度相同或基本相同厚度的掩模5来形成不存在尺寸不均的给定厚度的焊料凸块11。另一方面,也可以使用如图5(A)所示那样的开口部6的边缘的厚度较薄但开口部6的边缘以外的部分增厚的掩模5A。这样的掩模5A具有下述优点:能够不存在尺寸不均地形成作为掩模整体具有刚性、且与开口部6边缘的较薄厚度相同厚度的焊料凸块11。另外,也可以使用如图5(B)所示那样的将开口部6的边缘厚度进一步减薄的掩模5B。这样的掩模5B具有下述优点:能够不存在尺寸不均地形成作为掩模整体具有刚性、且与开口部6的边缘的更薄厚度相同厚度的焊料凸块11。
需要说明的是,掩模5A、5B的较薄部分与较厚部分之间的边界优选如图5所示那样形成为平缓的倾斜面S2。掩模5A、5B通过具有这样的倾斜面S2,能够容易地进行后述的剩余焊料的除去工序中的熔融焊料11a的除去。这样的平缓的倾斜面S2可以是不妨碍熔融焊料11a的除去的程度的直线状的倾斜面,也可以是弯曲的曲线状的倾斜面。
(焊料堆积工序)
焊料堆积工序为如下工序:如图1及图2(B)所示那样将基板1和掩模5叠合后,如图2(C)所示那样从掩模5的表面S1侧喷射熔融焊料的喷流11’,再如图2(D)所示那样在掩模5的开口部6堆积熔融焊料11a直至其厚度比掩模5的厚度更厚为止。将基板1和掩模5叠合时的定位根据设置于基板1和掩模5的定位标记或定位突起等来进行,两者可精度良好地进行定位。
作为熔融焊料11a,使用的是将焊料加热并使其熔融、而使其流动化以能够作为喷流11’来喷射程度的焊料。其加热温度可根据焊料组成任意选择,但通常从150℃以上且300℃以下程度的范围内设定良好的温度。在本发明中,使用熔融无铅焊料,该熔融无铅焊料以锡为主成分,并至少包含镍作为副成分,还任选含有选自银、铜、锌、铋、锑及锗中的1种或2种以上作为副成分。
优选的焊料组成是Sn-Ni-Ag-Cu-Ge合金,具体而言,为了形成可稳定地防止铜腐蚀的CuNiSn金属间化合物13a(参照图6(B)),优选使用含有0.01质量%以上且0.5质量%以下的镍、2质量%以上且4质量%以下的银、0.1质量%以上且1质量%以下的铜、0.001质量%以上且0.02质量%以下的锗且剩余部分为锡的焊料合金。用于形成这样的CuNiSn金属间化合物13a的特别优选的组成为镍0.01质量%以上且0.07质量%以下、银0.1质量%以上且4质量%以下、铜0.1质量%以上且1质量%以下、锗0.001质量%以上且0.01质量%以下、剩余部分为锡的焊料合金。在用这样的Sn-Ni-Ag-Cu-Ge合金进行焊接的情况下,优选以240℃以上且260℃以下温度的熔融焊料11a的形式使用。
另外,含有铋的焊料可以将熔融焊料11a的加热温度进一步低温化,通过对其成分组成进行调整,可以使其低温化至例如150℃附近。含有铋的焊料组成也优选与上述同样地含有0.01质量%以上且0.5质量%以下的镍,更优选含有0.01质量%以上且0.07质量%以下的镍。由此,可以制成能够容易地形成CuSn金属间化合物层13a的低温型的熔融焊料11a。
另外,还可以根据需要配合其它的锌、锑。在任何情况下,焊料组成均优选至少含有0.01质量%以上且0.5质量%以下的镍,更优选含有0.01质量%以上且0.07质量%以下的镍。
上述组成的熔融焊料11a是不含铅的无铅焊料,并且必须含有上述含量的镍,因此,如图6(B)所示,熔融焊料11a中所含的镍与铜电极2的铜进行化合,进而,也与熔融焊料11a的锡进行化合,可以容易地在铜电极2的表面形成GuNiSn金属间化合物层13a。形成的CuNiSn金属间化含物层13a作为铜电极2的铜溶蚀防止层起作用,起到防止铜电极2的缺损或消失的作用。因此,具有CuNiSn金属间化合物层13a的焊料凸块11也可以在之后容易地耐受如将形成有该焊料凸块11的基板投入到浸渍在焊料槽中的浸渍工序的情况那样的对铜电极2而言可以说是苛刻的处理。因此,即使使用低成本的焊料浸渍工序,也可以成品率良好地形成可靠性高的焊料凸块11。进而,可以成品率良好地得到能够以低成本且可靠性高地进行利用该焊料凸块11的电子部件的安装的安装基板。
如后述的实施例所示,熔融焊料11a中所含的镍含量会对CuNiSn金属间化合物层13a的厚度造成影响。具体而言,在镍含量为0.01质量%以上且0.5质量%以下(优选为0.07质量%以下)的范围时,可以生成1μm以上且3μm以下程度的厚度基本均匀的CuNiSn金属间化合物层13a。该范围内的厚度的CuNiSn金属间化合物层13a可以防止铜电极2中的铜熔融在熔入到焊料11a中或在焊料凸块中而被溶蚀。
镍含量为0.01质量%时,CuNiSn金属间化合物层13a的厚度为大约1μm以上且1.5μm以下程度,镍含量例如为0.07质量%时,CuNiSn金属间化合物层13a的厚度为大约2μm左右,镍含量为0.5质量%时,CuNiSn金属间化合物层13a的厚度为大约3μm左右。
镍含量低于0.01质量%时,CuNiSn金属间化合物层13a的厚度低于1μm,产生该CuNiSn金属间化合物层13a未完全覆盖铜电极2的部位,有时容易从该部位引起铜的溶蚀。镍含量超过0.5质量%时,较硬的CuNiSn金属间化合物层13a超过厚度3μm且进一步变厚,有时在该CuNiSn金属间化合物层13a中产生龟裂。其结果,容易从该龟裂部分引起铜的溶蚀。需要说明的是,优选的镍含量为0.01质量%以上且0.07质量%以下,与镍含量超过0.07质量%且为0.5质量%以下的情况相比,具有该范围的镍含量的熔融焊料11a可以形成平滑的均匀层且不会引起CuNiSn金属间化合物层13a的龟裂。
对于用作熔融焊料11a的焊料,优选进行精制处理。具体而言,将含有5质量%以上且25质量%以下碳原子数12~20的有机脂肪酸的溶液加热至180℃以上且350℃以下,使该加热后的溶液和熔融焊料11a进行接触并剧烈地进行搅拌混合。通过如上操作,可以将被氧化铜和焊剂成分等污染的精制处理前的熔融焊料11a进行清洁化,从而可以得到除去了氧化铜及焊剂成分等的熔融焊料11a。然后,将含有除去了氧化铜及焊剂成分等的熔融焊料11a的混合液导入到含有有机脂肪酸的溶液贮槽,将在该含有有机脂肪酸的溶液贮槽中按照比重差分离的清洁化后的熔融焊料11a通过泵从该含有有机脂肪酸的溶液贮槽的底部返回至无铅焊料液贮槽中。通过进行这样的精制处理,可以抑制作为喷流使用的熔融焊料11a中的铜浓度及杂质浓度的经时上升,且不会使氧化铜及焊剂残渣等杂质带入到无铅焊料液贮槽中。其结果,由于可以抑制无铅焊料液贮槽内的熔融焊料11a的经时的组成变化,因此,可以连续地形成稳定且接合可靠性高的使用熔融焊料11a的焊料凸块11。另外,可以连续地制造具备这样的焊料凸块11的安装基板。
精制后的熔融焊料11a不含影响焊料凸块11的接合品质的氧化铜及焊剂残渣等杂质。其结果,能够消除焊料凸块11和电子部件的接合品质的批次间不均,有助于经时的品质稳定性。
另外,利用含有有机脂肪酸的溶液精制后的熔融焊料11a与未利用含有有机脂肪酸的溶液精制的熔融焊料11a相比,得到了润湿性差的结果。具体而言,如由后述的实施例和比较例得到的图7和图8的焊料润湿性试验(meniscograph)的结果可知,进行了精制的熔融焊料11a的零交叉时间(zerocross time)为0.4秒钟,而未精制的熔融焊料的零交叉时间为5秒钟。另外,利用含有有机脂肪酸的溶液进行了精制的熔融焊料11a与未利用含有有机脂肪酸的溶液精制的熔融焊料相比,得到了粘度明显更小的结果。具体而言,如由后述的实施例和比较例得到的结果可知,进行了精制的熔融焊料11a的粘度为0.003Pa·S以上且0.004Pa·s以下,与此相对,未精制的熔融焊料的粘度为0.005Pa·S以上且0.006Pa·s以下,在两者之间存在显著的差异。另外,粘度是用振动片式粘度计进行测定的。
精制后的熔融焊料11a和未精制的熔融焊料的上述特性差意味着熔融焊料11a的喷流11’以良好的焊料润湿性遍布扩展至铜电极2上的所有地方。特别是,在将熔融焊料11a喷射到铜电极2上之前,通过使精制时使用的含有有机脂肪酸的溶液与该铜电极2接触(喷射、浸渍),该含有有机脂肪酸的溶液除去存在于铜表面的氧化物及杂质等而清洁化。通过在这样经过清洁化的铜表面喷射附着同样用含有有机脂肪酸的溶液精制后的熔融焊料11a,能够在铜表面2上以良好的焊料润湿性将熔融焊料11a浸润扩展。另一方面,在经过了清洁化的铜表面上喷射附着未精制的熔融焊料的情况下,并不会如上述那样以良好的润湿性浸润扩展,熔融焊料有时会无法在铜表面上遍布浸润扩展。这些结果表明,在利用含有有机脂肪酸的溶液清洁化的铜表面上喷射附着用含有有机脂肪酸的溶液精制后的熔融焊料11a会获得显著的效果。
精制所使用的含有有机脂肪酸的溶液中所含的有机脂肪酸虽然也可以使用碳原子数为11以下的有机脂肪酸,但这样的有机脂肪酸为吸水性,在上述的180℃以上且350℃以下的高温区域使用的情况下,并不理想。另外,碳原子数为21以上的有机脂肪酸存在熔点高、浸透性差、难以处理等缺点,并且经过了精制处理后的熔融焊料11a的表面的防锈效果也不充分。作为代表性的有机脂肪酸,优选碳原子数16的棕榈酸。作为有机脂肪酸,特别优选只使用碳原子数16的棕榈酸,根据需要,也可以含有碳原子数12以上且20以下的有机脂肪酸,例如含有碳原子数18的硬脂酸。
精制所使用的含有有机脂肪酸的溶液优选使用包含有5质量%以上且25质量%以下的棕榈酸且剩余部分由酯合成油构成的溶液。通过将这样的含有有机脂肪酸的溶液加热至180℃以上且350℃以下使用,该含有有机脂肪酸的溶液可以选择性地捕获存在于熔融焊料11a中的氧化物及焊剂成分等杂质,从而对熔融焊料11a进行精制。特别优选含有10质量%左右(例如,5质量%以上且15质量%以下)的碳原子数16的棕榈酸的含有有机脂肪酸的溶液。另外,在含有有机脂肪酸的溶液中未含有镍盐或钴盐等金属盐或抗氧剂等添加剂。
有机脂肪酸的浓度低于5质量%时,有时选择性地捕获存在于熔融焊料11a中的氧化物及焊剂成分等杂质来进行精制的效果低,进而在低浓度下的控制变得繁琐。另一方面,有机脂肪酸的浓度超过25质量%时,存在如下问题:含有有机脂肪酸的溶液的粘度变高、在300℃以上的高温区域中产生发烟和恶臭的问题;以及与熔融焊料11a的搅拌混合性会变得不充分;等等。因此,有机脂肪酸的含量优选为5质量%以上且25质量%以下,特别是仅使用碳原子数16的棕榈酸的情况下,优选为10质量%左右(例如,5质量%以上且15质量%以下)的含量。
精制所使用的含有有机脂肪酸的溶液的温度由待精制的熔融焊料11a的熔点来决定,含有有机脂肪酸的溶液和熔融焊料11a在至少为熔融焊料11a的熔点以上的高温区域(作为一例,为240℃~260℃)中剧烈地搅拌接触。另外,从发烟的问题及节能的观点考虑,含有有机脂肪酸溶液的上限温度为350℃左右,优选为进行精制处理的熔融焊料11a的熔点以上的温度~300℃的范围。例如,镍0.01质量%以上且0.07质量%以下、银0.1质量%以上且4质量%以下、铜0.1质量%以上且1质量%以下、锗0.001质量%以上且0.01质量%以下、余量为锡的焊料合金在240℃以上且260℃以下的温度下作为熔融焊料11a来使用,因此,含有有机脂肪酸的溶液的温度也为与其相同的240℃以上且260℃以下的程度。
在含有有机脂肪酸的溶液中混合酯合成油的理由如下:降低含有有机脂肪酸的溶液的粘度而容易进行含有有机脂肪酸的溶液与熔融焊料11a的均一的搅拌混合处理,以及抑制所含有的有机脂肪酸的高温发烟性。
这样的利用含有有机脂肪酸的溶液进行了精制的熔融焊料11a如图2(C)所示那样由喷雾喷嘴向掩模5的开口部6以喷流11’的形式喷雾。这样一来,如图2(D)所示,设置了隆起的熔融焊料11a。
进行喷雾时的氛围没有特别限定,但是,由于之后要利用刮浆板、液体喷淋或气体喷淋来除去剩余的熔融焊料11a,因此,在“焊料堆积工序”和“剩余焊料的除去工序”这两个工序中进行处理的期间,需要将氛围温度保持在能够保持作为熔融焊料11a的熔融状态的温度(在上述的例子中,为240℃以上且260℃以下的温度)。作为这样的氛围温度,具体而言,优选与待焊接的熔融焊料11a的温度相同或者与其接近的温度。虽然也可以为相同的温度,但优选设定为较熔融焊料11a的温度稍高的温度。例如,优选设定为比熔融焊料11a的喷流温度高出2℃以上且10℃以下的温度,更优选设定为比熔融焊料11a的喷流温度高出2℃以上且5℃以下的氛围温度。通过设定为该温度范围内,能够使喷射至铜电极2表面之后的熔融焊料11a的喷流11’在该铜电极2的整个表面流动,特别是能够使熔融焊料11a扩展至掩模5内的所有地方。当氛围温度比较熔融焊料11a的喷流温度低的情况下,熔融焊料11a的流动性有时会下降,另一方面,如果氛围温度被设定为高出了超过10℃,则温度过高而有可能会对基板带来热损伤。
(剩余焊料的除去工序)
如图3(A)、(B)所示,剩余焊料的除去工序是将从掩模5的表面沿厚度方向渗出(也可以说是超出掩模5的厚度)的熔融焊料11a除去并形成给定厚度的焊料凸块11的工序。超出掩模5的厚度的熔融焊料11a的除去利用刮板15或气刀等的除去机构来进行,或者利用喷雾含有碳原子数12~20的有机脂肪酸的溶液18的除去方法来进行。由此,能够将从掩模5的表面沿厚度方向溢出的焊料11除去。
如图3(A)、(B)所示,刮板15可使用通常用于刮落用途的板状刮刀。另外,气刀(未图示)可使用能够从空气喷雾喷嘴的前端将空气、非活性气体(氮气、氩气等)强力地喷射的喷嘴,采用该气刀,能够将从掩模5的表面沿厚度方向上溢出的熔融焊料11a吹飞而除去。
另外,在本发明中,优选采用从喷嘴17喷雾含有碳原子数12~20的有机脂肪酸的溶液18、从而将从掩模5的表面沿厚度方向溢出的熔融焊料11a吹飞的除去机构。此外,通过这样的利用喷雾的熔融焊料11a的除去机构,能够在焊料凸块11上形成含有有机脂肪酸的溶液18所包含的有机脂肪酸的涂敷膜19。
从喷嘴17喷射的熔融焊料11’的流速和喷射处理时间可考虑熔融焊料11a的种类及涂敷膜19的厚度等任意设定。另外,对于喷嘴17的形状及喷射角度等条件而言,也可考虑熔融焊料11a的种类及涂敷膜19的厚度等任意采用或设定。喷射角度没有特别限定,但优选将喷嘴17的中心轴与掩模面之间的假想角设为例如30°~45°的范围内。另外,根据熔融焊料的喷流11’的流速和喷射处理时间,有时不仅将从掩模5的表面沿厚度方向溢出的熔融焊料11a除去,而且还将掩模5表面以下的熔融焊料除去,从而还存在喷射后的熔融焊料11a的表面产生若干凹陷的情况。除去了该剩余的熔融焊料11a后的形态也包括这样的除去后的形态。
在喷射的含有有机脂肪酸的溶液18中,也可以混入部分氮气等非活性气体。另一方面,从熔融焊料11a的氧化及与含有有机脂肪酸的溶液的相容性的观点考虑,不使含有氧的空气、水等混入。
在该除去工序中进行处理的期间的氛围温度被保持在能够将被堆积于开口部6的熔融焊料11a保持在熔融状态的温度。这样的温度根据所使用的熔融焊料11a的种类而有所不同,在上述的例子中,需要保持在240℃以上且260℃以下的温度。
在通过喷雾来喷射含有有机脂肪酸的溶液18而除去剩余的熔融焊料11a的情况下,所使用的含有有机脂肪酸的溶液18优选使用与上述的精制处理中所使用的溶液相同的含有有机脂肪酸的溶液。即,优选使用含有5质量%以上且25质量%以下的含有碳原子数12~20的有机脂肪酸的含有有机脂肪酸的溶液。特别优选含有5质量%以上且15质量%以下的碳原子数16的棕榈酸的含有有机脂肪酸的溶液,根据需要,也可以含有碳原子数12以上且20以下的有机脂肪酸,例如含有碳原子数18的硬脂酸。需要说明的是,在含有有机脂肪酸的溶液中未包含镍盐或钴盐等金属盐或抗氧剂等添加剂。
含有有机脂肪酸的溶液优选被加温至与熔融焊料11a的温度同样的温度范围,例如,使用加温至180℃以上且350℃以下的含有有机脂肪酸的溶液。当将熔融焊料11a与上述同样地设为240℃~260℃的范围而形成喷流11’的情况下,优选喷射与该熔融焊料11a相同的温度为240℃~260℃的含有有机脂肪酸的溶液来除去剩余的熔融焊料11a。需要说明的是,进行了喷雾喷射的含有有机脂肪酸的溶液与随着该含有有机脂肪酸的溶液一同被除去的熔融焊料11a因比重差而被分离,取出沉至含有有机脂肪酸的溶液的底部的熔融焊料11a,从而能够与含有有机脂肪酸的溶液分离。分离后的熔融焊料11a和含有有机脂肪酸的溶液能够再利用。
与上述同样,含有有机脂肪酸的溶液中所包含的有机脂肪酸也可以使用碳原子数为11以下的有机脂肪酸,但这样的有机脂肪酸为吸水性,在上述的180℃以上且350℃以下的高温区域中使用的情况下,并不理想。另外,碳原子数21为以上的有机脂肪酸存在熔点高、浸透性差、难以处理等缺点,并且在熔融焊料11a的表面成膜的涂敷膜19的防锈效果也不充分。优选使用碳原子数16的棕榈酸,特别优选仅使用该棕榈酸,根据需要,还可以含有碳原子数12以上且20以下的有机脂肪酸,例如含有碳原子数18的硬脂酸。
含有有机脂肪酸的溶液的温度优选与要除去的熔融焊料11a的温度相同或基本相同。由此,能够在不进行冷却的情况下将熔融焊料11a吹飞。
需要说明的是,在对熔融焊料11a喷射含有有机脂肪酸的溶液来除去剩余的熔融焊料11a后,在熔融焊料11a的表面形成构成含有有机脂肪酸的溶液的有机脂肪酸的涂敷膜19。该涂敷膜19对熔融焊料11a的表面进行了清洁,进而能够抑制熔融焊料11a的氧化从而防止氧化被膜的产生。
(掩模的取下工序)
最后,如图3(c)所示,将掩模5取下。通过取下掩模5,能够形成给定厚度的焊料凸块11。由熔融焊料11a对焊料凸块11的冷却可以在取下掩模5之前进行,也可以在取下掩模5之后进行。冷却可以为自然冷却,也可以为强制冷却。在强制冷却的情况下,可以喷吹空气或非活性气体(氮气或氩气等)来进行冷却。
焊料凸块11的厚度与掩模5的厚度相同或基本相同,所形成的多个焊料凸块11基本上全部为相同的厚度。需要说明的是,在当利用使用了刮板15或气刀等构件的除去机构来除去将熔融焊料11a的情况下,焊料凸块11的表面未设置如上述图4(B)、(C)所示那样的有机脂肪酸的涂敷膜19。另一方面,在喷雾含有有机脂肪酸的溶液来除去剩余焊料的情况下,焊料凸块11的表面设置了如上述图4(B)、(C)所示那样的有机脂肪酸的涂敷膜19。
特别是,由于棕榈酸与熔融焊料11a或焊料凸块11相接触而更有效地对熔融焊料11a或焊料凸块11的表面进行清洁化,因此优选。并且,吸附有该棕榈酸的涂敷膜19由于形成于熔融焊料11a或焊料凸块11的表面,因此,该涂敷膜19能够将熔融焊料11a或焊料凸块11的表面保持在其后也抑制了氧化物的产生的清洁状态。其结果,即使是在电子部件的安装时通过多个加热炉的情况下,也能够抑制焊料凸块11的表面在该热的作用下而氧化或者变化为会阻碍焊接的表面状态。因此,能够没有焊接不良地将电子部件焊接于焊料凸块11上。
而且,如图10所示,利用本发明的焊料凸块11的形成方法形成的焊料凸块11能够极力地抑制微孔的产生,因此,可以形成即使是在安装了电子部件之后而施加多次热历程的情况、或者是将安装基板安装于电子机器内而被消费者长时间使用的情况下其可靠性也极高的接合部。构成这样的高可靠性的焊料接合部的焊料凸块11只能通过本发明的方法获得。
如以上所说明,按照本发明的焊料凸块的形成方法,由于向开口部6喷射以锡为主成分且至少含有镍作为副成分的熔融焊料的喷流11’,因此,在铜电极2的表面形成铜电极2的铜与熔融焊料11a所包含的镍进行了合金化而成的CuNiSn金属间化合物层13a。形成在铜电极2表面的CuNiSn金属间化合物层13a成为铜溶蚀的阻挡层,该阻挡层防止铜电极2的铜溶蚀,因此,能够防止因铜溶蚀所导致的铜电极2的缺损或消失。其结果,能够确保安装基板的铜垫等铜电极2的可靠性,在将电子部件焊接于安装基板上时,能够抑制以往的焊接时产生的铜溶蚀。
另外,按照本发明的焊料凸块11的形成方法,由于利用刮板15或气刀等除去机构或者喷雾含有碳原子数12~20的有机脂肪酸的溶液18的除去方法这样的简便的方法来进行超出掩模5的厚度的熔融焊料11a的除去,因此,能够在具有微细铜电极2的安装基板上容易且尺寸精度良好地形成所期望的一定厚度的焊料凸块11。其结果,由于不需要以往那样的高成本的工序,因此,能够提高将电子部件与焊料凸块11进行接合的接合部的可靠性和成品率,对于制造低成本的安装基板是有利的。
特别是,近年来,铜电极2的布线密度及电子部件的安装密度不断提高。因此,为了能够在基板1上成品率良好地焊接电子部件,焊料凸块11日益微细化,并且要求在厚度上不存在不均。本发明是能够适应这样要求的焊料凸块11的形成方法,即使是在连接器、QFP(方型扁平式封装,Quad FlatPackage)、SOP(小引出线封装,Small Out line Package)、BGA(球栅阵列封装,Ball Grid Array)等的连接端子的尺寸存在不均的情况下,也能够在基板1上形成一定厚度的焊料凸块11,因此,具有能够实现稳定且可靠性高的焊接的优点。其结果,即使是存在不均的电子部件或混合存在大小不一的电子部件的情况下,也能够实现稳定的焊接。
[安装基板的制造方法]
本发明的安装基板的制造方法的特征在于,利用上述的本发明的焊料凸块的形成方法在待安装电子部件的铜电极2的接合部形成焊料凸块11,在所形成的焊料凸块11上焊接安装电子部件。由此,能够确保安装基板的铜垫等铜电极2的可靠性,在将电子部件焊接于安装基板上时,能够抑制以往的焊接时产生的铜溶蚀。另外,能够在具有微细铜电极2的安装基板上容易且尺寸精度良好地形成所期望的一定厚度的焊料凸块11。按照这样的本发明,由于不需要以往的高成本的工序,因此,能够提高将电子部件与焊料凸块进行接合的接合部的可靠性和成品率,从而能够制造低成本的安装基板。
作为基板,可以举出印刷基板、晶片及挠性基板等各种基板。特别是晶片,由于铜电极的宽度及窄间距,因此,优选使用本发明的方法,能够在窄间距的微细电极上以良好的精度设置焊料凸块11。另外,即使是设置较大的电子部件的印刷基板及挠性基板的情况下,也能够使焊料凸块11的厚度均匀,并且能够将该焊料凸块11的表面保持为清洁化的状态,因此,即使是存在尺寸不均的电子部件,也不会发生焊接不良,并且,能够如图10所示那样不存在产生微孔的担心地进行安装,从而能够发挥极大的效果。
作为电子部件,可以举出半导体芯片、半导体模块、IC芯片、IC模块、电介质芯片、介电质模块、电阻芯片、电阻模块等。
实施例
以下,列举实施例和比较例来对于本发明进行更具体的说明。
[实施例1]
作为一例,准备了形成有宽度例如为200μm、厚度为例如10μm的铜布线图案的基板1。该基板1仅使铜布线图案中的成为电子部件的安装部分的宽度例如200μm、长度例如50μm的连接部露出,其它的铜电极2被绝缘层覆盖。准备了具有开口部6的掩模5,所述开口部6用于在上述连接部上形成焊料凸块11。将基板1上露出了铜电极2的连接部与掩模5的开口部6进行对位并叠合后,使用Ni:0.05质量%、Ge:0.005质量%、Ag:3质量%、Cu:0.5质量%、余量由Sn构成的5元体系无铅焊料,加热至250℃而制成熔融焊料11a,向开口部6喷射该熔融焊料的喷流11’。熔融焊料的喷流11’在使喷嘴12倾斜了例如45°的状态下、利用将氛围温度设为250℃左右的喷射装置来进行,使得不使250℃的熔融焊料11a的温度冷却。喷射了熔融焊料的喷流11’后的开口部6的形态是熔融焊料11a在表面张力的作用下发生隆起的状态。该熔融焊料11a在蒸气氛围温度作用下而保持在熔融状态。
接着,使不含镍盐及钴盐等金属盐、以及抗氧剂的酯类合成油中以10质量%含有棕榈酸,制备了含有有机脂肪酸的溶液。将该含有有机脂肪酸的溶液加温至250℃,向熔融焊料11a隆起的开口部6喷射该含有有机脂肪酸的溶液18。此时的熔融焊料11a被保持在熔融状态。含有有机脂防酸的溶液18的喷射在使喷嘴17倾斜了例如30°的状态下、且加温至不使250℃的含有有机脂肪酸的溶液18的温度被冷却的喷雾装置来进行。喷射了含有有机脂肪酸的溶液18之后的开口部6的形态被设置成熔融焊料11a与掩模5的表面相同的高度。
然后,将熔融焊料11a自然冷却而形成了焊料凸块11,然后取下掩模5,形成了实施例1的焊料凸块11。图10示出了所得到的焊料凸块11的剖面的扫描型电子显微镜照片形态,图11示出了其剖面的元素映射像。由图10所示的剖面照片可知,以1.5μm的厚度均匀地形成了CuNiSn金属间化合物层13a。
[实施例2]
在实施例1中,作为焊料材料,使用了Ni:0.03质量%、Ge:0.005质量%、Ag:3质量%、Cu:0.5质量%、余量由Sn构成的5元体系无铅焊料,除此之外,与实施例1同样地形成了实施例2的焊料凸块11。与实施例1同样,由剖面的扫描型电子显微镜照片可知,虽然稍有凹凸,但以1μm的厚度形成了CuNiSn金属间化合物层13a。
[实施例3]
在实施例1中,作为焊料材料,使用了Ni:0.07质量%、Ge:0.005质量%、Ag:3质量%、Cu:0.5质量%、余量由Sn构成的5元体系无铅焊料,除此之外,与实施例1同样地形成了实施例3的焊料凸块11。与实施例1同样,由剖面的扫描型电子显微镜照片可知,以2μm的厚度均匀地形成了CuNiSn金属间化合物层13a。
[实施例4]
在实施例1中,将含有有机脂肪酸的溶液中的棕榈酸含量设为7质量%,除此之外,与实施例1同样地形成了实施例4的焊料凸块11。与实施例1同样,由剖面的扫描型电于显微镜照片可知,以1.5μm的厚度均匀地形成了CuNiSn金属间化合物层13a。
[实施例5]
在实施例1中,将含有有机脂肪酸的溶液中的棕榈酸含量设为12质量%,除此之外,与实施例1同样地形成了实施例5的焊料凸块11。与实施例1同样,由剖面的扫描型电子显微镜照片可知,以1.5μm的厚度均匀地形成了CuNiSn金属间化合物层13a。
[比较例1]
在实施例1中,作为焊料材料,使用了Ag:3质量%、Cu:0.5质量%、余量由Sn构成的3元体系无铅焊料,除此之外,与实施例1同样地形成了比较例1的焊料凸块11。与实施例1同样,由剖面的扫描型电子显微镜照片可知,在铜电极2上形成了CuSn金属间化合物层13b,而不存在CuNiSn金属间化合物层(参照图6(A))。
[比较例2]
在实施例1中,作为焊料材料,使用了Ni:0.005质量%、Ge:0.005质量%、Ag:3质量%、Cu:0.5质量%、余量由Sn构成的5元体系无铅焊料,除此之外,与实施例1同样地形成了比较例2的焊料凸块11。与实施例1同样,由剖面的扫描型电子显微镜照片可知,CuNiSn金属间化合物层13a的凹凸明显,作为膜不连续。
[比较例3]
在实施例1中,作为焊料材料,使用了Ni:1质量%、Ge:0.005质量%、Ag:3质量%、Cu:0.5质量%、余量由Sn构成的5元体系无铅焊料,’除此之外,与实施例1同样地形成了比较例3的焊料凸块11。与实施例1同样,由剖面的扫描型电子显微镜照片可知,以5μm的厚度形成了CuNiSn金属间化合物层13a,并且确认到产生了龟裂。
[比较例4]
在实施例1中,将含有有机脂肪酸的溶液中的棕榈酸含量设为1质量%,除此之外,与实施例1同样地形成了比较例4的焊料凸块11。与实施例1同样,由剖面的扫描型电子显微镜照片可知,以1.5μm的厚度均匀地形成了CuNiSn金属间化合物层13a,但其表面产生了被认为发生了氧化的变色。
[比较例5]
在实施例1中,将含有有机脂肪酸的溶液中的棕榈酸含量设为30质量%,除此之外,与实施例1同样地形成了比较例5的焊料凸块11。与实施例1同样,由剖面的扫描型电子显微镜照片可知,以1.5μm的厚度均匀地形成了CuNiSn金属间化合物层13a。
[测定和结果]
(对于产生空孔的评价)
CuNiSn金属间化合物层13a的厚度是由剖面的扫描型电子显微镜照片测定的。另外,铜电极2与焊料凸块11的接合界面附近有无空孔由在150℃下进行了240小时熟化(aging)后的剖面的扫描型电子显微镜照片进行了评价。图10(A)、(B)是比较例1的结果,图10(C)、(D)是实施例1的结果。如图10所示,比较例1的焊料凸块11在与铜电极2的界面处产生了空孔,与此相对,实施例1的焊料凸块11在与铜电极2的界面处未产生空孔。
(元素映射像)
图11是实施例1的焊料凸块11与铜电极2的接合界面附近的扫描型电子显微镜的剖面照片、和X射线微区分析仪(EPMA)的元素映射像。如图11所示,能够确认到在铜电极2上分布有镍元素,可得形成了CuNiSn金属间化合物层13a。
(润湿性和含氧量)
图7是利用含有有机脂肪酸的溶液进行了清洁化处理的熔融焊料的润湿性试验(meniscograph)的结果,图8是未处理的熔融焊料的润湿性试验(meniscograph)的结果。如图7和图8的焊料润湿性试验(meniscograph)的结果可知,图7所示经过精制的熔融焊料11a的零交叉时间为0.4秒钟,而图8所示的未精制的熔融焊料的零交叉时间为5秒钟。由此可知,利用含有有机脂肪酸的溶液进行了精制的熔融焊料11a与未利用含有有机脂肪酸的溶液进行精制的熔融焊料相比,其润湿性差。
通过振动片式粘度计对于利用含有有机脂肪酸的溶液进行了精制的熔融焊料11a、和未利用含有有机脂肪酸的溶液进行精制的熔融焊料测定了粘度。进行了精制的熔融焊料11a的粘度为0.003Pa·S以上且0.004Pa·s以下,更详细而言,在220℃下为0.0038Pa·S,在240℃下为0.0036Pa·S,在260℃下为0.0035Pa·S,在280℃下为0.0034Pa·S。另一方面,未精制的熔融焊料的粘度为0.005Pa·S以上且0.006Pa·s以下,更详细而言,在220℃下为0.0060Pa·s,在240℃下为0.0058Pa·S,在260℃下为0.0056Pa·S,在280℃下为0.0054Pa·S。两者存在明显的差异。
另外,图9是示出焊料层的深度方向的氧量的图。焊料层中的含氧量是通过飞行时间二次离子质谱法(Time-of-flight secondary ion massspectrometer:TOF-SIMS)测定的结果。由图9可知,使用经过精制的熔融焊料得到的焊料层的氧量a与使用未精制的熔融焊料得到的焊料层的氧量b相比,明显较少。对此时的氧量进行了定量。定量是针对在厚度方向上从距离焊料层的表面1μm的位置到距离表面10μm的位置的氧量进行的,并且用其平均值进行了评价。其结果,使用经过精制的熔融焊料得到的焊料层的氧量为10ppm以下,具体为3~4ppm,但使用未精制的熔融焊料得到的焊料层的氧量约为200ppm。
上述经过精制的熔融焊料与未精制的熔融焊料的上述特性差成为熔融焊料的喷流11’以良好的焊料润湿性遍布扩展至铜电极2上的所有地方的理由。即,经过精制的熔融焊料的粘度小,润湿性好,因此,在铜表面2上良好地润湿扩展,而未精制的熔融焊料未在铜表面上遍布地润湿扩展。对于利用含有有机脂肪酸的溶液进行了清洁化的焊料凸块也相同。
可认为图9所示的焊料层中的氧量与图10所示的空孔的产生存在密切的关系,并且认为与图7和图8的润湿性也存在密切的关系。即,焊料层中的氧量之差可以说表示的是经过精制的熔融焊料中的氧量和未精制的熔融焊料中的氧量之差,因此可认为,通过上述的氧量的影响,在产生空孔方面产生差异,另外,在焊料润湿性和粘度方面也产生了差异。
Claims (4)
1.一种焊料凸块的形成方法,该方法具有:
准备形成有铜电极的基板的工序;
准备形成有开口部的掩模的工序,所述开口部用于在所述铜电极上的必要位置形成焊料凸块;
将所述基板和所述掩模叠合后,从所述掩模的表面侧喷射熔融焊料的喷流,在所述掩模的开口部堆积熔融焊料直至其厚度比所述掩模的厚度更厚的工序;
将超出所述掩模的厚度的熔融焊料除去而形成给定厚度的焊料凸块的工序;以及
取下所述掩模的工序,
其中,所述熔融焊料是熔融无铅焊料,该熔融无铅焊料以锡为主成分,并至少包含镍作为副成分,还包含选自银、铜、锌、铋、锑及锗中的1种或2种以上作为任选的副成分,
超出所述掩模厚度的熔融焊料的除去如下进行:利用刮板或气刀等除去机构来进行,或者利用喷雾含有碳原子数12~20的有机脂肪酸的溶液的除去方法来进行。
2.根据权利要求1所述的焊料凸块的形成方法,其中,在所述焊料凸块上形成有所述含有有机脂肪酸的溶液所包含的有机脂肪酸的涂敷膜。
3.根据权利要求1或2所述的焊料凸块的形成方法,其中,所述含有有机脂肪酸的溶液是含有碳原子数16的棕榈酸的溶液。
4.一种安装基板的制造方法,该方法包括:
利用权利要求1~3中任一项所述的焊料凸块的形成方法在待安装电子部件的铜电极上形成焊料凸块,在所形成的所述焊料凸块上焊接安装电子部件。
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CN104246996A true CN104246996A (zh) | 2014-12-24 |
CN104246996B CN104246996B (zh) | 2017-09-29 |
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EP (1) | EP2840596B1 (zh) |
JP (1) | JP5191616B1 (zh) |
KR (1) | KR101686312B1 (zh) |
CN (1) | CN104246996B (zh) |
TW (1) | TWI569340B (zh) |
WO (1) | WO2013157075A1 (zh) |
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CN106252278A (zh) * | 2016-09-14 | 2016-12-21 | 河南大学 | 金属氧化物薄膜晶体管阵列的制备方法 |
CN106920495A (zh) * | 2016-12-30 | 2017-07-04 | 友达光电股份有限公司 | 集成电路、液晶显示器及其检测方法 |
CN108847396A (zh) * | 2018-06-14 | 2018-11-20 | 通富微电子股份有限公司 | 倒装方法 |
CN109564915A (zh) * | 2016-09-15 | 2019-04-02 | 英特尔公司 | 锡-锌微凸块结构及其制作方法 |
CN111370320A (zh) * | 2018-12-26 | 2020-07-03 | 中芯集成电路(宁波)有限公司 | 封装方法 |
CN116511752A (zh) * | 2023-01-31 | 2023-08-01 | 度亘激光技术(苏州)有限公司 | 一种铜表面结构、制备方法及其焊接方法 |
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CN103492112B (zh) * | 2012-04-16 | 2016-08-17 | 株式会社谷黑组 | 焊接装置、焊接方法以及所制造的基板及电子部件 |
US20170183783A1 (en) * | 2015-12-29 | 2017-06-29 | Rohm And Haas Electronic Materials Llc | Method for forming organic coating on copper surface |
US10453817B1 (en) * | 2018-06-18 | 2019-10-22 | Texas Instruments Incorporated | Zinc-cobalt barrier for interface in solder bond applications |
JP7026907B2 (ja) | 2020-04-08 | 2022-03-01 | 石川技研株式会社 | はんだ製品の製造方法、プリント回路板、線材、フレキシブルプリント基板および電子部品 |
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CN106252278A (zh) * | 2016-09-14 | 2016-12-21 | 河南大学 | 金属氧化物薄膜晶体管阵列的制备方法 |
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CN111370320A (zh) * | 2018-12-26 | 2020-07-03 | 中芯集成电路(宁波)有限公司 | 封装方法 |
CN116511752A (zh) * | 2023-01-31 | 2023-08-01 | 度亘激光技术(苏州)有限公司 | 一种铜表面结构、制备方法及其焊接方法 |
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Also Published As
Publication number | Publication date |
---|---|
KR101686312B1 (ko) | 2016-12-13 |
EP2840596A4 (en) | 2016-04-27 |
EP2840596B1 (en) | 2017-11-22 |
EP2840596A1 (en) | 2015-02-25 |
JP5191616B1 (ja) | 2013-05-08 |
WO2013157075A1 (ja) | 2013-10-24 |
US20150115020A1 (en) | 2015-04-30 |
JPWO2013157075A1 (ja) | 2015-12-21 |
TWI569340B (zh) | 2017-02-01 |
CN104246996B (zh) | 2017-09-29 |
KR20140147103A (ko) | 2014-12-29 |
TW201344820A (zh) | 2013-11-01 |
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