CN104215612B - 激光扫描显微镜系统 - Google Patents

激光扫描显微镜系统 Download PDF

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Publication number
CN104215612B
CN104215612B CN201410223168.9A CN201410223168A CN104215612B CN 104215612 B CN104215612 B CN 104215612B CN 201410223168 A CN201410223168 A CN 201410223168A CN 104215612 B CN104215612 B CN 104215612B
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China
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laser
unit
sampling
laser beam
intermittent
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Expired - Fee Related
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CN201410223168.9A
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Chinese (zh)
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CN104215612A (zh
Inventor
藤田五郎
原雅明
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Sony Corp
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Sony Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy

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  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Semiconductor Lasers (AREA)
  • Mechanical Optical Scanning Systems (AREA)
CN201410223168.9A 2013-05-30 2014-05-23 激光扫描显微镜系统 Expired - Fee Related CN104215612B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013-113572 2013-05-30
JP2013113572A JP6281193B2 (ja) 2013-05-30 2013-05-30 レーザー走査型顕微鏡システム

Publications (2)

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CN104215612A CN104215612A (zh) 2014-12-17
CN104215612B true CN104215612B (zh) 2018-07-31

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CN201410223168.9A Expired - Fee Related CN104215612B (zh) 2013-05-30 2014-05-23 激光扫描显微镜系统

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US (1) US9551664B2 (enExample)
JP (1) JP6281193B2 (enExample)
CN (1) CN104215612B (enExample)

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US8236574B2 (en) * 2010-03-01 2012-08-07 Quanterix Corporation Ultra-sensitive detection of molecules or particles using beads or other capture objects
JP2015161719A (ja) * 2014-02-26 2015-09-07 ソニー株式会社 レーザー走査型顕微鏡システム及びサンプリング装置
JP6550673B2 (ja) * 2015-04-03 2019-07-31 国立大学法人 東京大学 フォトルミネセンス寿命測定装置及び測定方法
JP2017049447A (ja) * 2015-09-02 2017-03-09 オリンパス株式会社 レーザ顕微鏡および顕微鏡観察方法
JP6651768B2 (ja) * 2015-09-28 2020-02-19 株式会社ニコン パターン描画装置
US10473908B2 (en) * 2017-04-21 2019-11-12 Shimadzu Corporation Optical observation device
TWI714378B (zh) * 2019-12-04 2020-12-21 國立臺灣大學 一種用於高速深組織成像的大角度光域掃描系統
CN112987273B (zh) * 2021-04-15 2023-08-29 南方科技大学 一种荧光激发块光源和荧光显微镜
WO2025225294A1 (ja) * 2024-04-24 2025-10-30 パナソニックＩｐマネジメント株式会社 計測装置

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CN102376318A (zh) * 2010-08-20 2012-03-14 索尼公司 记录装置
CN102402993A (zh) * 2010-09-13 2012-04-04 索尼公司 记录设备
CN102830097A (zh) * 2011-06-17 2012-12-19 徕卡显微系统复合显微镜有限公司 用于成像式荧光显微术的显微镜及其使用方法
CN202814861U (zh) * 2012-07-31 2013-03-20 苏州微清医疗器械有限公司 一种多功能生物医学显微镜

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US5252834A (en) * 1990-11-13 1993-10-12 Union Oil Company Of California Pulsed and gated multi-mode microspectrophotometry device and method
US5982535A (en) * 1997-08-07 1999-11-09 Marine Biological Laboratory Centrifuge microscope capable of realizing polarized light observation
JP4667571B2 (ja) * 1999-09-24 2011-04-13 オリンパス株式会社 レーザ走査顕微鏡
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JP2001188902A (ja) * 2000-01-04 2001-07-10 Konica Corp 放射線画像読取装置
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JP4175833B2 (ja) * 2002-05-23 2008-11-05 オリンパス株式会社 レーザ顕微鏡
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DE102005047884A1 (de) * 2005-10-06 2007-04-26 Leica Microsystems Cms Gmbh Scanmikroskop und Scanverfahren mit einem Scanmikroskop
JP2009229715A (ja) * 2008-03-21 2009-10-08 Olympus Corp 顕微鏡
DE102009055993B4 (de) * 2009-11-26 2016-06-02 Leica Microsystems Cms Gmbh Verfahren zum Untersuchen eines Objekts mit Hilfe eines Mikroskops und Vorrichtung nach Art eines Mikroskops zum Untersuchen eines Objekts
US8630322B2 (en) * 2010-03-01 2014-01-14 Board Of Trustees Of Michigan State University Laser system for output manipulation
JP5771371B2 (ja) * 2010-07-22 2015-08-26 オリンパス株式会社 レーザ走査型顕微鏡
JP2012185888A (ja) * 2011-03-07 2012-09-27 Sony Corp 記録装置
JP5602817B2 (ja) * 2012-11-07 2014-10-08 住友大阪セメント株式会社 光パルスレーザー装置及び光パルスレーザー発生方法
US10180402B2 (en) * 2012-12-14 2019-01-15 Sri International Method and apparatus for conducting automated integrated circuit analysis
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Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101122610A (zh) * 2006-08-11 2008-02-13 中国科学院力学研究所 一种微流道速度分布的测量装置和测量方法
CN102376318A (zh) * 2010-08-20 2012-03-14 索尼公司 记录装置
CN102402993A (zh) * 2010-09-13 2012-04-04 索尼公司 记录设备
CN102830097A (zh) * 2011-06-17 2012-12-19 徕卡显微系统复合显微镜有限公司 用于成像式荧光显微术的显微镜及其使用方法
CN202814861U (zh) * 2012-07-31 2013-03-20 苏州微清医疗器械有限公司 一种多功能生物医学显微镜

Also Published As

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US20140353521A1 (en) 2014-12-04
US9551664B2 (en) 2017-01-24
CN104215612A (zh) 2014-12-17
JP6281193B2 (ja) 2018-02-21
JP2014232241A (ja) 2014-12-11

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