CN103831254B - 用于测试分选机的拾取与放置装置 - Google Patents

用于测试分选机的拾取与放置装置 Download PDF

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Publication number
CN103831254B
CN103831254B CN201310573224.7A CN201310573224A CN103831254B CN 103831254 B CN103831254 B CN 103831254B CN 201310573224 A CN201310573224 A CN 201310573224A CN 103831254 B CN103831254 B CN 103831254B
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China
Prior art keywords
pick
axis
module
guide member
driving wheel
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CN201310573224.7A
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Chinese (zh)
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CN103831254A (zh
Inventor
成耆炷
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Techwing Co Ltd
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Techwing Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/67333—Trays for chips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
CN201310573224.7A 2012-11-21 2013-11-15 用于测试分选机的拾取与放置装置 Active CN103831254B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020120132177A KR101942062B1 (ko) 2012-11-21 2012-11-21 테스트핸들러용 픽앤플레이스장치
KR10-2012-0132177 2012-11-21

Publications (2)

Publication Number Publication Date
CN103831254A CN103831254A (zh) 2014-06-04
CN103831254B true CN103831254B (zh) 2016-06-29

Family

ID=50795328

Family Applications (1)

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CN201310573224.7A Active CN103831254B (zh) 2012-11-21 2013-11-15 用于测试分选机的拾取与放置装置

Country Status (3)

Country Link
KR (1) KR101942062B1 (ko)
CN (1) CN103831254B (ko)
TW (1) TWI506285B (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160011948A (ko) * 2014-07-23 2016-02-02 한화테크윈 주식회사 부품 검사 장치, 검사 부품 분류 장치 및 방법
TWI614432B (zh) * 2016-12-09 2018-02-11 線性運動之驅動裝置及其應用之取放器單元、移載作業設備
PL3488651T3 (pl) 2017-05-02 2020-11-16 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Sposoby i aparaty do wykrywania kanałów kontrolnych w systemach komunikacji bezprzewodowej
TWI615343B (zh) * 2017-05-26 2018-02-21 電子元件移料裝置及其應用之作業分類設備
TWI658967B (zh) * 2017-12-15 2019-05-11 均華精密工業股份有限公司 全自動高速填盤機
KR101987028B1 (ko) * 2018-02-21 2019-09-30 (주)디이엔티 프로브 카드 이송모듈 및 프로브 카드 이송시스템

Citations (4)

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CN101373727A (zh) * 2007-08-22 2009-02-25 赛科隆股份有限公司 测试分选机中缓冲盘间距的调节方法及装置
CN201464031U (zh) * 2009-04-09 2010-05-12 张九六 一种贴片led全自动高速分光分色设备
CN101836286A (zh) * 2007-08-22 2010-09-15 赛科隆股份有限公司 缓冲盘间距调节装置及用该缓冲盘传送半导体器件的装置
CN201756346U (zh) * 2010-08-13 2011-03-09 深圳市捷佳伟创微电子设备有限公司 一种自动装卸舟装置

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KR100238967B1 (ko) * 1997-02-25 2000-01-15 김문식 반도체 인서트 픽업 헤드
US6439631B1 (en) * 2000-03-03 2002-08-27 Micron Technology, Inc. Variable-pitch pick and place device
KR20040096409A (ko) * 2003-05-09 2004-11-16 디엔씨엔지니어링 주식회사 피치가변 이송장치
KR100648919B1 (ko) * 2005-11-15 2006-11-24 (주)테크윙 픽앤플레이스 장치
TW200837353A (en) * 2007-03-05 2008-09-16 Chroma Ate Inc Rotation-press cover inspection/test apparatus and the tester having the apparatus
KR100822995B1 (ko) * 2007-06-27 2008-04-16 윤점채 반도체 자재 분류이송장치
KR100862654B1 (ko) * 2007-10-29 2008-10-09 (주)엔에스 제품 분류이송장치
CN101604645B (zh) * 2008-06-12 2011-04-13 京元电子股份有限公司 往复式取放设备
KR101304274B1 (ko) 2008-12-31 2013-09-26 (주)테크윙 테스트 핸들러의 픽앤플레이스장치
KR101361493B1 (ko) 2009-11-27 2014-02-14 (주)테크윙 테스트핸들러용 픽앤플레이스장치
TWI399543B (zh) * 2010-03-05 2013-06-21 Hon Tech Inc 電子元件測試分類機
KR20120085964A (ko) * 2011-01-25 2012-08-02 삼성테크윈 주식회사 부품 실장기

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101373727A (zh) * 2007-08-22 2009-02-25 赛科隆股份有限公司 测试分选机中缓冲盘间距的调节方法及装置
CN101836286A (zh) * 2007-08-22 2010-09-15 赛科隆股份有限公司 缓冲盘间距调节装置及用该缓冲盘传送半导体器件的装置
CN201464031U (zh) * 2009-04-09 2010-05-12 张九六 一种贴片led全自动高速分光分色设备
CN201756346U (zh) * 2010-08-13 2011-03-09 深圳市捷佳伟创微电子设备有限公司 一种自动装卸舟装置

Also Published As

Publication number Publication date
TWI506285B (zh) 2015-11-01
KR20140066275A (ko) 2014-06-02
TW201421046A (zh) 2014-06-01
KR101942062B1 (ko) 2019-01-24
CN103831254A (zh) 2014-06-04

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