CN102549443B - 可编程协议发生器 - Google Patents

可编程协议发生器 Download PDF

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Publication number
CN102549443B
CN102549443B CN201080045103.XA CN201080045103A CN102549443B CN 102549443 B CN102549443 B CN 102549443B CN 201080045103 A CN201080045103 A CN 201080045103A CN 102549443 B CN102549443 B CN 102549443B
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CN
China
Prior art keywords
data
pattern generator
programme
semiconductor
patgen
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Active
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CN201080045103.XA
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English (en)
Chinese (zh)
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CN102549443A (zh
Inventor
乔治·W·康纳
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Teradyne Inc
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Teradyne Inc
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Publication of CN102549443A publication Critical patent/CN102549443A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
CN201080045103.XA 2009-10-08 2010-02-05 可编程协议发生器 Active CN102549443B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/575,800 US8269520B2 (en) 2009-10-08 2009-10-08 Using pattern generators to control flow of data to and from a semiconductor device under test
US12/575,800 2009-10-08
PCT/US2010/023280 WO2011043832A1 (en) 2009-10-08 2010-02-05 Programmable protocol generator

Publications (2)

Publication Number Publication Date
CN102549443A CN102549443A (zh) 2012-07-04
CN102549443B true CN102549443B (zh) 2015-04-01

Family

ID=43855798

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201080045103.XA Active CN102549443B (zh) 2009-10-08 2010-02-05 可编程协议发生器

Country Status (9)

Country Link
US (1) US8269520B2 (enExample)
EP (1) EP2449391B1 (enExample)
JP (1) JP5732464B2 (enExample)
KR (2) KR101933723B1 (enExample)
CN (1) CN102549443B (enExample)
MY (1) MY155209A (enExample)
SG (1) SG178186A1 (enExample)
TW (1) TWI470242B (enExample)
WO (1) WO2011043832A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107391322B (zh) * 2016-05-17 2021-11-23 三星电子株式会社 基于二进制向量的测试设备

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006002693A1 (en) * 2004-07-07 2006-01-12 Agilent Technologies, Inc. Evaluation of an output signal of a device under test
US8838406B2 (en) 2008-11-11 2014-09-16 Advantest (Singapore) Pte Ltd Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment
TW201314233A (zh) * 2011-09-21 2013-04-01 Hon Hai Prec Ind Co Ltd 測試卡
US9910086B2 (en) 2012-01-17 2018-03-06 Allen Czamara Test IP-based A.T.E. instrument architecture
US9952276B2 (en) * 2013-02-21 2018-04-24 Advantest Corporation Tester with mixed protocol engine in a FPGA block
US9411701B2 (en) * 2013-03-13 2016-08-09 Xilinx, Inc. Analog block and test blocks for testing thereof
US9195261B2 (en) 2013-09-03 2015-11-24 Teradyne, Inc. Synchronizing data from different clock domains by bridges one of the clock signals to appear to run an integer of cycles more than the other clock signal
WO2016018236A1 (en) * 2014-07-28 2016-02-04 Intel Corporation Semiconductor device tester with dut data streaming
US10914784B2 (en) * 2018-07-27 2021-02-09 Advantest Corporation Method and apparatus for providing UFS terminated and unterminated pulse width modulation support using dual channels
US10976361B2 (en) 2018-12-20 2021-04-13 Advantest Corporation Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
US11137910B2 (en) * 2019-03-04 2021-10-05 Advantest Corporation Fast address to sector number/offset translation to support odd sector size testing
US11237202B2 (en) 2019-03-12 2022-02-01 Advantest Corporation Non-standard sector size system support for SSD testing
US10884847B1 (en) 2019-08-20 2021-01-05 Advantest Corporation Fast parallel CRC determination to support SSD testing
US12140609B2 (en) * 2020-03-31 2024-11-12 Advantest Corporation Universal test interface systems and methods
US12140632B2 (en) * 2020-11-17 2024-11-12 Synopsys, Inc. Device under test synchronization with automated test equipment check cycle
JP2024014521A (ja) * 2022-07-22 2024-02-01 株式会社アドバンテスト 自動試験装置およびそのインタフェース装置
EP4415324A1 (en) * 2023-02-10 2024-08-14 Rohde & Schwarz GmbH & Co. KG Automated compliance testing of a dut with communication interfaces

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5694399A (en) * 1996-04-10 1997-12-02 Xilinix, Inc. Processing unit for generating signals for communication with a test access port
US6553527B1 (en) * 1999-11-08 2003-04-22 International Business Machines Corporation Programmable array built-in self test method and controller with programmable expect generator
CN101191819A (zh) * 2006-11-21 2008-06-04 国际商业机器公司 Fpga、fpga配置、调试系统和方法
CN101196557A (zh) * 2007-12-18 2008-06-11 上海华为技术有限公司 一种现场可编程门阵列测试的方法、装置和系统
US7479803B1 (en) * 2004-10-06 2009-01-20 Altera Corporation Techniques for debugging hard intellectual property blocks
CN100469020C (zh) * 2004-01-12 2009-03-11 安华高科技杰纳勒尔Ip（新加坡）私人有限公司 多功能样式发生器及用于测试串行通信信道通信质量的方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0481675A (ja) * 1990-07-25 1992-03-16 Mitsubishi Electric Corp 半導体デバイステスト装置
JPH0557678U (ja) * 1991-12-27 1993-07-30 株式会社アドバンテスト Ｉｃ試験装置
JPH09288153A (ja) * 1996-04-19 1997-11-04 Advantest Corp 半導体試験装置
JP3356205B2 (ja) * 1997-09-09 2002-12-16 横河電機株式会社 Ｌｓｉ試験装置
JPH11184678A (ja) * 1997-12-25 1999-07-09 Toshiba Corp パターン発生器
US6651203B1 (en) * 1999-05-17 2003-11-18 Infineon Technologies Ag On chip programmable data pattern generator for semiconductor memories
JP2002174661A (ja) * 2000-12-06 2002-06-21 Fuji Xerox Co Ltd 集積回路テスト制御装置
US20040193982A1 (en) * 2003-03-31 2004-09-30 Arraycomm, Inc. Built-in self-test for digital transmitters
JP2005315605A (ja) 2004-04-27 2005-11-10 Yamaha Corp 半導体装置の試験装置および試験方法
US7409618B2 (en) * 2004-10-06 2008-08-05 Lsi Corporation Self verifying communications testing
US7519891B2 (en) * 2005-09-28 2009-04-14 Intel Corporation IO self test method and apparatus for memory
WO2007122990A1 (ja) * 2006-04-19 2007-11-01 Advantest Corporation 信号出力装置、信号検出装置、試験装置、電子デバイスおよびプログラム
JP4967881B2 (ja) * 2006-07-31 2012-07-04 セイコーエプソン株式会社 更新データ送信方法、ファームウェア書き換えシステム及び更新データ送信プログラム
KR100736675B1 (ko) * 2006-08-01 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치
KR100736680B1 (ko) * 2006-08-10 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치의 캘리브레이션 방법
US7774669B2 (en) 2007-06-11 2010-08-10 Lsi Corporation Complex pattern generator for analysis of high speed serial streams
US20090112548A1 (en) * 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5694399A (en) * 1996-04-10 1997-12-02 Xilinix, Inc. Processing unit for generating signals for communication with a test access port
US6553527B1 (en) * 1999-11-08 2003-04-22 International Business Machines Corporation Programmable array built-in self test method and controller with programmable expect generator
CN100469020C (zh) * 2004-01-12 2009-03-11 安华高科技杰纳勒尔Ip（新加坡）私人有限公司 多功能样式发生器及用于测试串行通信信道通信质量的方法
US7479803B1 (en) * 2004-10-06 2009-01-20 Altera Corporation Techniques for debugging hard intellectual property blocks
CN101191819A (zh) * 2006-11-21 2008-06-04 国际商业机器公司 Fpga、fpga配置、调试系统和方法
CN101196557A (zh) * 2007-12-18 2008-06-11 上海华为技术有限公司 一种现场可编程门阵列测试的方法、装置和系统

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107391322B (zh) * 2016-05-17 2021-11-23 三星电子株式会社 基于二进制向量的测试设备

Also Published As

Publication number Publication date
WO2011043832A1 (en) 2011-04-14
TW201113536A (en) 2011-04-16
JP2013507610A (ja) 2013-03-04
KR101933723B1 (ko) 2018-12-28
CN102549443A (zh) 2012-07-04
US8269520B2 (en) 2012-09-18
EP2449391B1 (en) 2016-07-13
KR20160105984A (ko) 2016-09-08
MY155209A (en) 2015-09-30
EP2449391A1 (en) 2012-05-09
EP2449391A4 (en) 2015-02-25
KR20120093888A (ko) 2012-08-23
SG178186A1 (en) 2012-03-29
US20110087942A1 (en) 2011-04-14
JP5732464B2 (ja) 2015-06-10
TWI470242B (zh) 2015-01-21

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