TWI470242B - 協定認知之序列型樣產生器 - Google Patents

協定認知之序列型樣產生器 Download PDF

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Publication number
TWI470242B
TWI470242B TW99103446A TW99103446A TWI470242B TW I470242 B TWI470242 B TW I470242B TW 99103446 A TW99103446 A TW 99103446A TW 99103446 A TW99103446 A TW 99103446A TW I470242 B TWI470242 B TW I470242B
Authority
TW
Taiwan
Prior art keywords
pattern generator
data
semiconductor device
receiving
tested
Prior art date
Application number
TW99103446A
Other languages
English (en)
Chinese (zh)
Other versions
TW201113536A (en
Inventor
George W Conner
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of TW201113536A publication Critical patent/TW201113536A/zh
Application granted granted Critical
Publication of TWI470242B publication Critical patent/TWI470242B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
TW99103446A 2009-10-08 2010-02-05 協定認知之序列型樣產生器 TWI470242B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/575,800 US8269520B2 (en) 2009-10-08 2009-10-08 Using pattern generators to control flow of data to and from a semiconductor device under test

Publications (2)

Publication Number Publication Date
TW201113536A TW201113536A (en) 2011-04-16
TWI470242B true TWI470242B (zh) 2015-01-21

Family

ID=43855798

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99103446A TWI470242B (zh) 2009-10-08 2010-02-05 協定認知之序列型樣產生器

Country Status (9)

Country Link
US (1) US8269520B2 (enExample)
EP (1) EP2449391B1 (enExample)
JP (1) JP5732464B2 (enExample)
KR (2) KR101933723B1 (enExample)
CN (1) CN102549443B (enExample)
MY (1) MY155209A (enExample)
SG (1) SG178186A1 (enExample)
TW (1) TWI470242B (enExample)
WO (1) WO2011043832A1 (enExample)

Cited By (1)

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TWI861937B (zh) * 2022-07-22 2024-11-11 日商愛德萬測試股份有限公司 自動試驗裝置及其介面裝置

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ATE441120T1 (de) * 2004-07-07 2009-09-15 Verigy Pte Ltd Singapore Auswertung eines ausgangssignals eines gerade geprüften bausteins
WO2010054669A1 (en) 2008-11-11 2010-05-20 Verigy (Singapore) Pte.Ltd. Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment
TW201314233A (zh) * 2011-09-21 2013-04-01 Hon Hai Prec Ind Co Ltd 測試卡
US9910086B2 (en) 2012-01-17 2018-03-06 Allen Czamara Test IP-based A.T.E. instrument architecture
US9952276B2 (en) * 2013-02-21 2018-04-24 Advantest Corporation Tester with mixed protocol engine in a FPGA block
US9411701B2 (en) * 2013-03-13 2016-08-09 Xilinx, Inc. Analog block and test blocks for testing thereof
US9195261B2 (en) 2013-09-03 2015-11-24 Teradyne, Inc. Synchronizing data from different clock domains by bridges one of the clock signals to appear to run an integer of cycles more than the other clock signal
CN106561085A (zh) * 2014-07-28 2017-04-12 英特尔公司 具有dut数据流送的半导体器件测试器
KR102675841B1 (ko) * 2016-05-17 2024-06-18 삼성전자주식회사 바이너리 벡터 기반의 테스트 장치
US10914784B2 (en) * 2018-07-27 2021-02-09 Advantest Corporation Method and apparatus for providing UFS terminated and unterminated pulse width modulation support using dual channels
US10976361B2 (en) 2018-12-20 2021-04-13 Advantest Corporation Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
US11137910B2 (en) * 2019-03-04 2021-10-05 Advantest Corporation Fast address to sector number/offset translation to support odd sector size testing
US11237202B2 (en) 2019-03-12 2022-02-01 Advantest Corporation Non-standard sector size system support for SSD testing
US10884847B1 (en) 2019-08-20 2021-01-05 Advantest Corporation Fast parallel CRC determination to support SSD testing
US12140609B2 (en) * 2020-03-31 2024-11-12 Advantest Corporation Universal test interface systems and methods
US12140632B2 (en) * 2020-11-17 2024-11-12 Synopsys, Inc. Device under test synchronization with automated test equipment check cycle
EP4415324A1 (en) * 2023-02-10 2024-08-14 Rohde & Schwarz GmbH & Co. KG Automated compliance testing of a dut with communication interfaces

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US5107205A (en) * 1990-07-25 1992-04-21 Mitsubishi Denki Kabushiki Kaisha Semiconductor device tester with a test waveform monitoring circuit
US6021515A (en) * 1996-04-19 2000-02-01 Advantest Corp. Pattern generator for semiconductor test system
CN1642118A (zh) * 2004-01-12 2005-07-20 安捷伦科技有限公司 具有自播种测试功能的多功能样式发生器和比较器
TW200729222A (en) * 2005-09-28 2007-08-01 Intel Corp An IO self test method and apparatus for memory
US20080231297A1 (en) * 2006-08-10 2008-09-25 Unitest Inc. Method for calibrating semiconductor device tester

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JPH0557678U (ja) * 1991-12-27 1993-07-30 株式会社アドバンテスト Ｉｃ試験装置
US5694399A (en) * 1996-04-10 1997-12-02 Xilinix, Inc. Processing unit for generating signals for communication with a test access port
JP3356205B2 (ja) * 1997-09-09 2002-12-16 横河電機株式会社 Ｌｓｉ試験装置
JPH11184678A (ja) * 1997-12-25 1999-07-09 Toshiba Corp パターン発生器
US6651203B1 (en) * 1999-05-17 2003-11-18 Infineon Technologies Ag On chip programmable data pattern generator for semiconductor memories
US6553527B1 (en) * 1999-11-08 2003-04-22 International Business Machines Corporation Programmable array built-in self test method and controller with programmable expect generator
JP2002174661A (ja) * 2000-12-06 2002-06-21 Fuji Xerox Co Ltd 集積回路テスト制御装置
US20040193982A1 (en) * 2003-03-31 2004-09-30 Arraycomm, Inc. Built-in self-test for digital transmitters
JP2005315605A (ja) 2004-04-27 2005-11-10 Yamaha Corp 半導体装置の試験装置および試験方法
US7409618B2 (en) * 2004-10-06 2008-08-05 Lsi Corporation Self verifying communications testing
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JP4967881B2 (ja) * 2006-07-31 2012-07-04 セイコーエプソン株式会社 更新データ送信方法、ファームウェア書き換えシステム及び更新データ送信プログラム
KR100736675B1 (ko) * 2006-08-01 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치
CN101191819B (zh) * 2006-11-21 2012-05-23 国际商业机器公司 Fpga、fpga配置、调试系统和方法
US7774669B2 (en) 2007-06-11 2010-08-10 Lsi Corporation Complex pattern generator for analysis of high speed serial streams
US20090112548A1 (en) * 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
CN101196557A (zh) * 2007-12-18 2008-06-11 上海华为技术有限公司 一种现场可编程门阵列测试的方法、装置和系统

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5107205A (en) * 1990-07-25 1992-04-21 Mitsubishi Denki Kabushiki Kaisha Semiconductor device tester with a test waveform monitoring circuit
US6021515A (en) * 1996-04-19 2000-02-01 Advantest Corp. Pattern generator for semiconductor test system
CN1642118A (zh) * 2004-01-12 2005-07-20 安捷伦科技有限公司 具有自播种测试功能的多功能样式发生器和比较器
TW200729222A (en) * 2005-09-28 2007-08-01 Intel Corp An IO self test method and apparatus for memory
US20080231297A1 (en) * 2006-08-10 2008-09-25 Unitest Inc. Method for calibrating semiconductor device tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI861937B (zh) * 2022-07-22 2024-11-11 日商愛德萬測試股份有限公司 自動試驗裝置及其介面裝置

Also Published As

Publication number Publication date
KR20120093888A (ko) 2012-08-23
KR20160105984A (ko) 2016-09-08
CN102549443A (zh) 2012-07-04
WO2011043832A1 (en) 2011-04-14
SG178186A1 (en) 2012-03-29
JP5732464B2 (ja) 2015-06-10
JP2013507610A (ja) 2013-03-04
EP2449391A1 (en) 2012-05-09
EP2449391B1 (en) 2016-07-13
EP2449391A4 (en) 2015-02-25
TW201113536A (en) 2011-04-16
US8269520B2 (en) 2012-09-18
MY155209A (en) 2015-09-30
CN102549443B (zh) 2015-04-01
KR101933723B1 (ko) 2018-12-28
US20110087942A1 (en) 2011-04-14

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