CN102346050B - 感测装置以及电子设备 - Google Patents

感测装置以及电子设备 Download PDF

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Publication number
CN102346050B
CN102346050B CN201110212079.0A CN201110212079A CN102346050B CN 102346050 B CN102346050 B CN 102346050B CN 201110212079 A CN201110212079 A CN 201110212079A CN 102346050 B CN102346050 B CN 102346050B
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China
Prior art keywords
refresh
sensor
parameter
processing
sensing apparatus
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Expired - Fee Related
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CN201110212079.0A
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English (en)
Chinese (zh)
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CN102346050A (zh
Inventor
茅野岳人
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Seiko Epson Corp
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Seiko Epson Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/022—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation having an ideal characteristic, map or correction data stored in a digital memory

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  • Engineering & Computer Science (AREA)
  • Technology Law (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Gyroscopes (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
CN201110212079.0A 2010-07-30 2011-07-27 感测装置以及电子设备 Expired - Fee Related CN102346050B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010171616A JP5454408B2 (ja) 2010-07-30 2010-07-30 センシング装置及び電子機器
JP2010-171616 2010-07-30

Publications (2)

Publication Number Publication Date
CN102346050A CN102346050A (zh) 2012-02-08
CN102346050B true CN102346050B (zh) 2015-07-01

Family

ID=45527884

Family Applications (1)

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CN201110212079.0A Expired - Fee Related CN102346050B (zh) 2010-07-30 2011-07-27 感测装置以及电子设备

Country Status (3)

Country Link
US (1) US9037789B2 (enExample)
JP (1) JP5454408B2 (enExample)
CN (1) CN102346050B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5939459B2 (ja) * 2012-02-16 2016-06-22 株式会社リコー シート材搬送装置、画像読取装置および画像形成装置
JPWO2014030346A1 (ja) * 2012-08-22 2016-07-28 パナソニックＩｐマネジメント株式会社 物理量センサ
JP6232733B2 (ja) 2013-04-24 2017-11-22 セイコーエプソン株式会社 通信回路、物理量測定装置、電子機器、移動体、通信方法
US9410806B2 (en) * 2013-08-26 2016-08-09 Robert Bosch Gmbh System and method for gyroscope zero-rate-offset drift reduction through demodulation phase error correction
JP6299322B2 (ja) * 2014-03-25 2018-03-28 セイコーエプソン株式会社 物理量検出センサー、電子機器、移動体および電子回路
JP6697360B2 (ja) * 2016-09-20 2020-05-20 キオクシア株式会社 メモリシステムおよびプロセッサシステム
CN106647815A (zh) * 2017-01-23 2017-05-10 昆山市工研院智能制造技术有限公司 一种基于多传感器信息融合的智能跟随机器人及控制方法
CN106921384B (zh) * 2017-02-09 2021-04-13 刘珂 传感器读出电路
DE102017216955A1 (de) * 2017-09-25 2019-03-28 Robert Bosch Gmbh Sensorsystem zum Ausgeben von Sensordaten
FR3075951B1 (fr) * 2017-12-21 2020-05-22 Safran Aircraft Engines Detection de contact intermittent sur capteur moteur
JP2022152252A (ja) * 2021-03-29 2022-10-12 セイコーエプソン株式会社 センサーモジュールおよび計測システム

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CN1624428A (zh) * 2003-12-01 2005-06-08 克洛纳测量技术公司 电子测量设备和使电子测量设备工作的方法
CN1647057A (zh) * 2002-08-01 2005-07-27 罗伯特-博希股份公司 传感器,控制器和用于监控至少一个传感器的方法
CN1898616A (zh) * 2003-12-23 2007-01-17 恩德莱斯和豪瑟尔两合公司 具有扩展的硬件故障识别的过程测量仪表
CN101300609A (zh) * 2005-09-08 2008-11-05 洛克威尔自动控制技术股份有限公司 工业控制器环境中的rfid体系结构

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JPH0792018B2 (ja) * 1984-07-04 1995-10-09 日本電装株式会社 車両用制御装置
US5227981A (en) * 1989-04-20 1993-07-13 Sanyo Electric Co., Ltd. Initial process system after cutoff of power source and process system at the time of cutoff of power source
JP4201430B2 (ja) * 1999-04-16 2008-12-24 富士通株式会社 光加入者線終端装置
US6552965B2 (en) * 2000-07-31 2003-04-22 Clark Equipment Company Electronic clock
JP2003186739A (ja) * 2001-12-13 2003-07-04 Seiko Epson Corp 半導体記憶装置、制御装置及び半導体記憶装置の制御方法
US7107487B2 (en) * 2002-04-12 2006-09-12 Lenovo (Singapore) Pte Ltd. Fault tolerant sleep mode of operation
JP2004154419A (ja) * 2002-11-07 2004-06-03 Sony Corp 信号処理装置および方法、記録媒体、並びにプログラム
JP2005327104A (ja) * 2004-05-14 2005-11-24 Oki Electric Ind Co Ltd 非接触データキャリア、質問器、非接触データキャリアシステム、非接触データキャリアのデータ取得方法、及び、非接触データキャリアのデータ取得用プログラム
JP2006235442A (ja) * 2005-02-28 2006-09-07 Seiko Epson Corp 表示制御装置、表示制御方法および電子機器
JP2007041735A (ja) * 2005-08-01 2007-02-15 Toyota Motor Corp ロボット制御システム
JP4497098B2 (ja) 2006-02-02 2010-07-07 セイコーエプソン株式会社 発光装置および電子機器
KR100753983B1 (ko) * 2006-03-07 2007-08-31 김학선 차량의 주행안전거리 자동제어시스템과 그 방법
JP2009069730A (ja) 2007-09-18 2009-04-02 Seiko Epson Corp 電気光学装置、電子機器及び指示物体の検出方法
JP4982341B2 (ja) 2007-11-30 2012-07-25 オンセミコンダクター・トレーディング・リミテッド 撮像装置の防振制御回路
JP5079594B2 (ja) * 2008-05-16 2012-11-21 株式会社ジャパンディスプレイウェスト 電気光学装置、電子機器および接触検出方法
WO2010076828A1 (en) * 2008-12-30 2010-07-08 Emanuele Confalonieri Non-volatile memory with extended operating temperature range

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1647057A (zh) * 2002-08-01 2005-07-27 罗伯特-博希股份公司 传感器,控制器和用于监控至少一个传感器的方法
CN1624428A (zh) * 2003-12-01 2005-06-08 克洛纳测量技术公司 电子测量设备和使电子测量设备工作的方法
CN1898616A (zh) * 2003-12-23 2007-01-17 恩德莱斯和豪瑟尔两合公司 具有扩展的硬件故障识别的过程测量仪表
CN101300609A (zh) * 2005-09-08 2008-11-05 洛克威尔自动控制技术股份有限公司 工业控制器环境中的rfid体系结构

Also Published As

Publication number Publication date
US9037789B2 (en) 2015-05-19
CN102346050A (zh) 2012-02-08
JP5454408B2 (ja) 2014-03-26
JP2012032262A (ja) 2012-02-16
US20120030419A1 (en) 2012-02-02

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