JP5454408B2 - センシング装置及び電子機器 - Google Patents

センシング装置及び電子機器 Download PDF

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Publication number
JP5454408B2
JP5454408B2 JP2010171616A JP2010171616A JP5454408B2 JP 5454408 B2 JP5454408 B2 JP 5454408B2 JP 2010171616 A JP2010171616 A JP 2010171616A JP 2010171616 A JP2010171616 A JP 2010171616A JP 5454408 B2 JP5454408 B2 JP 5454408B2
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Japan
Prior art keywords
refresh
memory
sensor
parameter
parameters
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Expired - Fee Related
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JP2010171616A
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English (en)
Japanese (ja)
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JP2012032262A (ja
JP2012032262A5 (enExample
Inventor
岳人 茅野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
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Seiko Epson Corp
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Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2010171616A priority Critical patent/JP5454408B2/ja
Priority to US13/159,782 priority patent/US9037789B2/en
Priority to CN201110212079.0A priority patent/CN102346050B/zh
Publication of JP2012032262A publication Critical patent/JP2012032262A/ja
Publication of JP2012032262A5 publication Critical patent/JP2012032262A5/ja
Application granted granted Critical
Publication of JP5454408B2 publication Critical patent/JP5454408B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/022—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation having an ideal characteristic, map or correction data stored in a digital memory

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  • Engineering & Computer Science (AREA)
  • Technology Law (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Gyroscopes (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
JP2010171616A 2010-07-30 2010-07-30 センシング装置及び電子機器 Expired - Fee Related JP5454408B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010171616A JP5454408B2 (ja) 2010-07-30 2010-07-30 センシング装置及び電子機器
US13/159,782 US9037789B2 (en) 2010-07-30 2011-06-14 Sensing device and electronic apparatus
CN201110212079.0A CN102346050B (zh) 2010-07-30 2011-07-27 感测装置以及电子设备

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010171616A JP5454408B2 (ja) 2010-07-30 2010-07-30 センシング装置及び電子機器

Publications (3)

Publication Number Publication Date
JP2012032262A JP2012032262A (ja) 2012-02-16
JP2012032262A5 JP2012032262A5 (enExample) 2013-08-22
JP5454408B2 true JP5454408B2 (ja) 2014-03-26

Family

ID=45527884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010171616A Expired - Fee Related JP5454408B2 (ja) 2010-07-30 2010-07-30 センシング装置及び電子機器

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US (1) US9037789B2 (enExample)
JP (1) JP5454408B2 (enExample)
CN (1) CN102346050B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5939459B2 (ja) * 2012-02-16 2016-06-22 株式会社リコー シート材搬送装置、画像読取装置および画像形成装置
JPWO2014030346A1 (ja) * 2012-08-22 2016-07-28 パナソニックＩｐマネジメント株式会社 物理量センサ
JP6232733B2 (ja) 2013-04-24 2017-11-22 セイコーエプソン株式会社 通信回路、物理量測定装置、電子機器、移動体、通信方法
US9410806B2 (en) * 2013-08-26 2016-08-09 Robert Bosch Gmbh System and method for gyroscope zero-rate-offset drift reduction through demodulation phase error correction
JP6299322B2 (ja) * 2014-03-25 2018-03-28 セイコーエプソン株式会社 物理量検出センサー、電子機器、移動体および電子回路
JP6697360B2 (ja) * 2016-09-20 2020-05-20 キオクシア株式会社 メモリシステムおよびプロセッサシステム
CN106647815A (zh) * 2017-01-23 2017-05-10 昆山市工研院智能制造技术有限公司 一种基于多传感器信息融合的智能跟随机器人及控制方法
CN106921384B (zh) * 2017-02-09 2021-04-13 刘珂 传感器读出电路
DE102017216955A1 (de) * 2017-09-25 2019-03-28 Robert Bosch Gmbh Sensorsystem zum Ausgeben von Sensordaten
FR3075951B1 (fr) * 2017-12-21 2020-05-22 Safran Aircraft Engines Detection de contact intermittent sur capteur moteur
JP2022152252A (ja) * 2021-03-29 2022-10-12 セイコーエプソン株式会社 センサーモジュールおよび計測システム

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0792018B2 (ja) * 1984-07-04 1995-10-09 日本電装株式会社 車両用制御装置
US5227981A (en) * 1989-04-20 1993-07-13 Sanyo Electric Co., Ltd. Initial process system after cutoff of power source and process system at the time of cutoff of power source
JP4201430B2 (ja) * 1999-04-16 2008-12-24 富士通株式会社 光加入者線終端装置
US6552965B2 (en) * 2000-07-31 2003-04-22 Clark Equipment Company Electronic clock
JP2003186739A (ja) * 2001-12-13 2003-07-04 Seiko Epson Corp 半導体記憶装置、制御装置及び半導体記憶装置の制御方法
US7107487B2 (en) * 2002-04-12 2006-09-12 Lenovo (Singapore) Pte Ltd. Fault tolerant sleep mode of operation
DE10235161A1 (de) * 2002-08-01 2004-02-19 Robert Bosch Gmbh Sensor, Steuergerät und Verfahren zur Überwachung wenigstens eines Sensors
JP2004154419A (ja) * 2002-11-07 2004-06-03 Sony Corp 信号処理装置および方法、記録媒体、並びにプログラム
DE10356629C5 (de) * 2003-12-01 2010-06-02 Krohne Meßtechnik GmbH & Co KG Verfahren zum Betreiben eines elektronischen Meßgeräts
DE10361465A1 (de) * 2003-12-23 2005-08-11 Endress + Hauser Gmbh + Co. Kg Prozessmessgerät mit erweiterter Hardwarefehlererkennung
JP2005327104A (ja) * 2004-05-14 2005-11-24 Oki Electric Ind Co Ltd 非接触データキャリア、質問器、非接触データキャリアシステム、非接触データキャリアのデータ取得方法、及び、非接触データキャリアのデータ取得用プログラム
JP2006235442A (ja) * 2005-02-28 2006-09-07 Seiko Epson Corp 表示制御装置、表示制御方法および電子機器
JP2007041735A (ja) * 2005-08-01 2007-02-15 Toyota Motor Corp ロボット制御システム
US7510110B2 (en) * 2005-09-08 2009-03-31 Rockwell Automation Technologies, Inc. RFID architecture in an industrial controller environment
JP4497098B2 (ja) 2006-02-02 2010-07-07 セイコーエプソン株式会社 発光装置および電子機器
KR100753983B1 (ko) * 2006-03-07 2007-08-31 김학선 차량의 주행안전거리 자동제어시스템과 그 방법
JP2009069730A (ja) 2007-09-18 2009-04-02 Seiko Epson Corp 電気光学装置、電子機器及び指示物体の検出方法
JP4982341B2 (ja) 2007-11-30 2012-07-25 オンセミコンダクター・トレーディング・リミテッド 撮像装置の防振制御回路
JP5079594B2 (ja) * 2008-05-16 2012-11-21 株式会社ジャパンディスプレイウェスト 電気光学装置、電子機器および接触検出方法
WO2010076828A1 (en) * 2008-12-30 2010-07-08 Emanuele Confalonieri Non-volatile memory with extended operating temperature range

Also Published As

Publication number Publication date
US9037789B2 (en) 2015-05-19
CN102346050A (zh) 2012-02-08
JP2012032262A (ja) 2012-02-16
CN102346050B (zh) 2015-07-01
US20120030419A1 (en) 2012-02-02

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