CN102313821B - 物理量传感器以及电子设备 - Google Patents

物理量传感器以及电子设备 Download PDF

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Publication number
CN102313821B
CN102313821B CN2011101410029A CN201110141002A CN102313821B CN 102313821 B CN102313821 B CN 102313821B CN 2011101410029 A CN2011101410029 A CN 2011101410029A CN 201110141002 A CN201110141002 A CN 201110141002A CN 102313821 B CN102313821 B CN 102313821B
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support portion
movable electrode
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CN102313821A (zh
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金本启
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Seiko Epson Corp
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Seiko Epson Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
    • B81B7/02—Microstructural systems; Auxiliary parts of microstructural devices or systems containing distinct electrical or optical devices of particular relevance for their function, e.g. microelectro-mechanical systems [MEMS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/0802—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/18—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration in two or more dimensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
    • G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
    • G01P2015/0825—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass
    • G01P2015/0831—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass the mass being of the paddle type having the pivot axis between the longitudinal ends of the mass, e.g. see-saw configuration

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Pressure Sensors (AREA)
  • Micromachines (AREA)
CN2011101410029A 2010-05-28 2011-05-27 物理量传感器以及电子设备 Active CN102313821B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010-122959 2010-05-28
JP2010122959A JP5527019B2 (ja) 2010-05-28 2010-05-28 物理量センサーおよび電子機器

Publications (2)

Publication Number Publication Date
CN102313821A CN102313821A (zh) 2012-01-11
CN102313821B true CN102313821B (zh) 2013-03-20

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US (2) US8736254B2 (enExample)
EP (1) EP2390671A3 (enExample)
JP (1) JP5527019B2 (enExample)
KR (1) KR101300576B1 (enExample)
CN (1) CN102313821B (enExample)
TW (2) TWI471567B (enExample)

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JP5527019B2 (ja) * 2010-05-28 2014-06-18 セイコーエプソン株式会社 物理量センサーおよび電子機器
US8539836B2 (en) * 2011-01-24 2013-09-24 Freescale Semiconductor, Inc. MEMS sensor with dual proof masses
TWI616395B (zh) * 2012-01-12 2018-03-01 村田電子公司 加速度感測器結構和其之使用
JP5999302B2 (ja) 2012-02-09 2016-09-28 セイコーエプソン株式会社 電子デバイスおよびその製造方法、並びに電子機器
JP5983912B2 (ja) 2012-02-09 2016-09-06 セイコーエプソン株式会社 電子デバイスおよびその製造方法、並びに電子機器
JP2013181855A (ja) * 2012-03-02 2013-09-12 Seiko Epson Corp 物理量センサーおよび電子機器
TWI547808B (zh) 2012-04-20 2016-09-01 緯創資通股份有限公司 資訊交換方法及資訊交換系統
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JP5799929B2 (ja) * 2012-10-02 2015-10-28 株式会社村田製作所 加速度センサ
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US10046964B2 (en) 2013-03-07 2018-08-14 MCube Inc. MEMS structure with improved shielding and method
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JP6146566B2 (ja) * 2013-08-06 2017-06-14 セイコーエプソン株式会社 物理量センサー、電子機器、および移動体
US9695515B2 (en) * 2013-08-30 2017-07-04 Hewlett-Packard Development Company, L.P. Substrate etch
US9551730B2 (en) 2014-07-02 2017-01-24 Merlin Technology, Inc. Mechanical shock resistant MEMS accelerometer arrangement, associated method, apparatus and system
RU2580637C1 (ru) * 2014-12-16 2016-04-10 Открытое акционерное общество Арзамасское научно-производственное предприятие "ТЕМП-АВИА" (ОАО АНПП "ТЕМП-АВИА") Емкостный датчик перемещений
JP2016176834A (ja) * 2015-03-20 2016-10-06 セイコーエプソン株式会社 ジャイロセンサー、電子機器、および移動体
US10234476B2 (en) 2015-05-20 2019-03-19 Google Llc Extracting inertial information from nonlinear periodic signals
US9797921B2 (en) * 2015-09-03 2017-10-24 Nxp Usa, Inc. Compensation and calibration of multiple mass MEMS sensor
CN108450010B (zh) * 2015-09-25 2021-01-05 株式会社村田制作所 改进的微机电加速计装置
JP6468167B2 (ja) * 2015-11-03 2019-02-13 株式会社デンソー 力学量センサ
JP6705168B2 (ja) * 2015-12-28 2020-06-03 セイコーエプソン株式会社 センサー用基板、物理量検出センサー、加速度センサー、電子機器、および移動体
DE102016207866B4 (de) * 2016-05-09 2025-02-27 Robert Bosch Gmbh Mikromechanischer Sensor und Verfahren zum Herstellen eines mikromechanischen Sensors
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JP6897224B2 (ja) * 2017-03-27 2021-06-30 セイコーエプソン株式会社 物理量センサー、電子機器、および移動体
CN107421526B (zh) * 2017-07-04 2020-05-05 东南大学 一种仿生双轴毛发传感器装置
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RU204922U1 (ru) * 2019-03-19 2021-06-17 Российская Федерация, От Имени Которой Выступает Министерство Промышленности И Торговли Российской Федерации Чувствительный элемент трехосевого микромеханического акселерометра
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JP2023146375A (ja) 2022-03-29 2023-10-12 セイコーエプソン株式会社 物理量センサー及び慣性計測装置
CN115453146B (zh) * 2022-09-23 2025-12-19 瑞声开泰科技(武汉)有限公司 电容式微机械加速度计

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Publication number Publication date
US20140224017A1 (en) 2014-08-14
US8736254B2 (en) 2014-05-27
KR101300576B1 (ko) 2013-08-27
TW201514498A (zh) 2015-04-16
US20110291644A1 (en) 2011-12-01
TWI524071B (zh) 2016-03-01
US9157927B2 (en) 2015-10-13
JP2011247812A (ja) 2011-12-08
JP5527019B2 (ja) 2014-06-18
TW201200876A (en) 2012-01-01
EP2390671A2 (en) 2011-11-30
KR20110131106A (ko) 2011-12-06
CN102313821A (zh) 2012-01-11
EP2390671A3 (en) 2011-12-28
TWI471567B (zh) 2015-02-01

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