CN102224412A - 成形片材的缺陷检查装置 - Google Patents

成形片材的缺陷检查装置 Download PDF

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Publication number
CN102224412A
CN102224412A CN2009801464034A CN200980146403A CN102224412A CN 102224412 A CN102224412 A CN 102224412A CN 2009801464034 A CN2009801464034 A CN 2009801464034A CN 200980146403 A CN200980146403 A CN 200980146403A CN 102224412 A CN102224412 A CN 102224412A
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China
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light source
sheet material
linear light
defect
point
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CN2009801464034A
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English (en)
Chinese (zh)
Inventor
广濑修
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Sumitomo Chemical Co Ltd
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Sumitomo Chemical Co Ltd
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Publication of CN102224412A publication Critical patent/CN102224412A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN2009801464034A 2008-11-21 2009-11-17 成形片材的缺陷检查装置 Pending CN102224412A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008-298680 2008-11-21
JP2008298680A JP5619348B2 (ja) 2008-11-21 2008-11-21 成形シートの欠陥検査装置
PCT/JP2009/006163 WO2010058557A1 (ja) 2008-11-21 2009-11-17 成形シートの欠陥検査装置

Publications (1)

Publication Number Publication Date
CN102224412A true CN102224412A (zh) 2011-10-19

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CN2009801464034A Pending CN102224412A (zh) 2008-11-21 2009-11-17 成形片材的缺陷检查装置

Country Status (8)

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JP (1) JP5619348B2 (sk)
KR (1) KR20110095344A (sk)
CN (1) CN102224412A (sk)
CZ (1) CZ2011295A3 (sk)
PL (1) PL396135A1 (sk)
SK (1) SK50342011A3 (sk)
TW (1) TW201033602A (sk)
WO (1) WO2010058557A1 (sk)

Cited By (14)

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CN102854193A (zh) * 2012-08-30 2013-01-02 苏州天准精密技术有限公司 一种用于图像瑕疵检测的检测方法和检测系统
CN104280405A (zh) * 2013-07-08 2015-01-14 住友化学株式会社 缺陷检查方法
CN104583761A (zh) * 2012-08-28 2015-04-29 住友化学株式会社 缺陷检查装置以及缺陷检查方法
CN104956210A (zh) * 2013-01-30 2015-09-30 住友化学株式会社 图像生成装置、缺陷检查装置以及缺陷检查方法
CN105637338A (zh) * 2013-11-05 2016-06-01 米其林集团总公司 用于轮胎异常的非破坏性检测的方法和装置
CN105785604A (zh) * 2014-12-24 2016-07-20 台湾动力检测科技股份有限公司 显示设备的光学层件的缺陷检测方法
CN104919305B (zh) * 2013-01-16 2017-05-10 住友化学株式会社 图像生成装置、缺陷检查装置以及缺陷检查方法
CN107003251A (zh) * 2014-11-18 2017-08-01 三菱化学株式会社 金属板的修补方法和铸模的制造方法
CN107462580A (zh) * 2016-06-02 2017-12-12 住友化学株式会社 缺陷检查系统、膜制造装置以及缺陷检查方法
CN110161050A (zh) * 2018-02-15 2019-08-23 株式会社岛精机制作所 拉布方法及拉布系统
CN110857920A (zh) * 2018-08-24 2020-03-03 东华大学 一种卷装长丝的成型不良缺陷检测方法
CN110998298A (zh) * 2017-08-24 2020-04-10 日本电气硝子株式会社 板状玻璃的制造方法
CN112889087A (zh) * 2018-10-15 2021-06-01 3M创新有限公司 对制膜中任意形状的片材部件的自动检查
CN113507847A (zh) * 2019-03-05 2021-10-15 菲利普莫里斯生产公司 检查台和用于检查片材材料的方法

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KR101939206B1 (ko) * 2010-12-23 2019-01-16 피렐리 타이어 소시에떼 퍼 아찌오니 타이어 성형 공정에서 생산 제어 및 반제품들의 이송을 위한 방법 및 기구
CN104919306B (zh) * 2013-01-16 2017-11-21 住友化学株式会社 图像生成装置、缺陷检查装置以及缺陷检查方法
TWI451076B (zh) * 2013-02-08 2014-09-01 Benq Materials Corp 光學鏡片髒汙檢測方法
TWI493177B (zh) * 2013-10-15 2015-07-21 Benq Materials Corp 一種檢測具週期性結構光學薄膜的瑕疵檢測方法及其檢測裝置
JP6590653B2 (ja) * 2014-11-19 2019-10-16 首都高技術株式会社 点群データ利用システム
KR102670599B1 (ko) 2015-06-26 2024-05-29 이이쟈 가부시키가이샤 전해 경질 금 도금액용 치환 방지제 및 그것을 포함하는 전해 경질 금 도금액
JP6628185B2 (ja) * 2016-03-11 2020-01-08 パナソニックＩｐマネジメント株式会社 透明体の検査方法
JP2017211325A (ja) * 2016-05-27 2017-11-30 株式会社ニレコ 欠点検査方法及び欠点検査装置
JP2017217649A (ja) * 2016-06-02 2017-12-14 国立大学法人九州大学 キャッピングシートの破損被疑箇所検出装置、キャッピングシートの破損被疑箇所検出方法、コンピュータプログラム
JP6622679B2 (ja) * 2016-10-26 2019-12-18 川崎重工業株式会社 サークルスクラッチ検査装置
KR102438892B1 (ko) * 2017-03-03 2022-08-31 스미또모 가가꾸 가부시키가이샤 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법
JP7389321B2 (ja) * 2018-07-31 2023-11-30 住友金属鉱山株式会社 基板の検査装置、基板の検査方法
JP2020190441A (ja) * 2019-05-20 2020-11-26 セーレン株式会社 皺検査装置、皺判定装置及び皺検査方法
CN116993719A (zh) * 2023-09-25 2023-11-03 惠州艺都宇正数码科技有限公司 一种oca光学薄膜表面缺陷视觉检测方法及系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09159622A (ja) * 1995-12-05 1997-06-20 Kawasaki Steel Corp 表面欠陥検査装置
JP4507533B2 (ja) * 2003-08-29 2010-07-21 凸版印刷株式会社 周期性パターンにおけるスジ状ムラの検査方法
JP4882204B2 (ja) * 2004-03-05 2012-02-22 凸版印刷株式会社 周期性パターンにおけるスジ状ムラの検査方法
JP5006551B2 (ja) * 2006-02-14 2012-08-22 住友化学株式会社 欠陥検査装置及び欠陥検査方法
JP5367292B2 (ja) * 2008-03-31 2013-12-11 古河電気工業株式会社 表面検査装置および表面検査方法

Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104583761A (zh) * 2012-08-28 2015-04-29 住友化学株式会社 缺陷检查装置以及缺陷检查方法
CN104583761B (zh) * 2012-08-28 2016-12-21 住友化学株式会社 缺陷检查装置以及缺陷检查方法
TWI588472B (zh) * 2012-08-28 2017-06-21 Sumitomo Chemical Co Defect inspection device and defect inspection method
CN102854193A (zh) * 2012-08-30 2013-01-02 苏州天准精密技术有限公司 一种用于图像瑕疵检测的检测方法和检测系统
CN104919305B (zh) * 2013-01-16 2017-05-10 住友化学株式会社 图像生成装置、缺陷检查装置以及缺陷检查方法
TWI608230B (zh) * 2013-01-30 2017-12-11 住友化學股份有限公司 圖像產生裝置、缺陷檢查裝置及缺陷檢查方法
CN104956210A (zh) * 2013-01-30 2015-09-30 住友化学株式会社 图像生成装置、缺陷检查装置以及缺陷检查方法
KR20150114464A (ko) * 2013-01-30 2015-10-12 스미또모 가가꾸 가부시키가이샤 화상 생성 장치, 결함 검사 장치 및 결함 검사 방법
KR102168143B1 (ko) * 2013-01-30 2020-10-20 스미또모 가가꾸 가부시키가이샤 화상 생성 장치, 결함 검사 장치 및 결함 검사 방법
CN104956210B (zh) * 2013-01-30 2017-04-19 住友化学株式会社 图像生成装置、缺陷检查装置以及缺陷检查方法
CN104280405A (zh) * 2013-07-08 2015-01-14 住友化学株式会社 缺陷检查方法
CN105637338A (zh) * 2013-11-05 2016-06-01 米其林集团总公司 用于轮胎异常的非破坏性检测的方法和装置
CN107003251A (zh) * 2014-11-18 2017-08-01 三菱化学株式会社 金属板的修补方法和铸模的制造方法
CN105785604A (zh) * 2014-12-24 2016-07-20 台湾动力检测科技股份有限公司 显示设备的光学层件的缺陷检测方法
CN107462580A (zh) * 2016-06-02 2017-12-12 住友化学株式会社 缺陷检查系统、膜制造装置以及缺陷检查方法
CN110998298A (zh) * 2017-08-24 2020-04-10 日本电气硝子株式会社 板状玻璃的制造方法
CN110161050A (zh) * 2018-02-15 2019-08-23 株式会社岛精机制作所 拉布方法及拉布系统
CN110161050B (zh) * 2018-02-15 2022-02-15 株式会社岛精机制作所 拉布方法及拉布系统
CN110857920A (zh) * 2018-08-24 2020-03-03 东华大学 一种卷装长丝的成型不良缺陷检测方法
CN112889087A (zh) * 2018-10-15 2021-06-01 3M创新有限公司 对制膜中任意形状的片材部件的自动检查
CN113507847A (zh) * 2019-03-05 2021-10-15 菲利普莫里斯生产公司 检查台和用于检查片材材料的方法

Also Published As

Publication number Publication date
TW201033602A (en) 2010-09-16
KR20110095344A (ko) 2011-08-24
WO2010058557A1 (ja) 2010-05-27
JP5619348B2 (ja) 2014-11-05
PL396135A1 (pl) 2011-12-05
JP2010122192A (ja) 2010-06-03
SK50342011A3 (sk) 2011-09-05
CZ2011295A3 (cs) 2011-11-09

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Application publication date: 20111019