CN102145327B - 用于涂敷功能层的设备和方法 - Google Patents
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Abstract
本发明公开了一种用于在具有活性材料层的集流体上涂敷功能层的设备和方法,所述设备包括:第一辊和第二辊,第一辊和第二辊用于使集流体前进;凹印辊,凹印辊被构造为将功能层涂敷在活性材料层上;厚度测量器,厚度测量器被构造为测量活性材料层的厚度以及活性材料层和功能层的总厚度中的至少一个厚度;控制器,控制器与厚度测量器通信并被构造为控制凹印辊的旋转速度。
Description
技术领域
实施例涉及一种用于涂敷功能层的设备和方法。
背景技术
二次电池可包括通过将不同种类的功能层涂敷在集流体上的活性材料层上来形成的电极板,以增强热稳定性。用于形成功能层的材料在被供应到涂敷设备时可保持浆料状态。
例如,为了将功能材料形成为薄膜,涂敷设备可通过应用微凹印涂敷法(通过使凹印辊直接接触集流体来涂敷)对在集流体上形成为图案的活性材料层执行功能层的图案涂敷。
因此,电极板可包括具有集流体、活性材料层和功能层的多层结构。功能层在湿的状态下的涂敷厚度可为大约10μm至大约15μm。在可充电电池中,最好将功能层材料以精确的尺寸涂敷在活性材料层上,从而形成厚度均匀的功能层。
背景技术部分公开的上述信息仅仅是为了加深对所描述的技术的背景的理解,因此,它可包括未形成对本领域普通技术人员在本国内已知的现有技术的信息。
发明内容
实施例涉及一种用于涂敷功能层的设备和方法,该设备和方法表现出相对于现有及技术的优点。
实施例的特征在于提供一种用于涂敷功能层的设备和方法,该设备和方法均匀地形成活性材料层和功能层的总厚度而没有厚度偏差。
上述和其它特征和优点中的至少一种可通过提供一种用于在具有活性材料层的集流体上涂敷功能层的设备来实现,所述设备包括:第一辊和第二辊,第一辊和第二辊用于使集流体前进;凹印辊,凹印辊被构造为将功能层涂敷在活性材料层上;厚度测量器,厚度测量器被构造为测量活性材料层的厚度以及活性材料层和功能层的总厚度中的至少一个厚度;控制器,控制器与厚度测量器通信并被构造为控制凹印辊的旋转速度。
控制器可被构造为基于活性材料层和预定的期望厚度之间的差值来控制凹印辊的旋转速度。
控制器可被构造为基于所述总厚度与预定的期望厚度之间的差值来控制凹印辊的旋转速度。
所述设备还可包括被构造为从凹印辊刮除多余的功能层材料的刮墨刀单元,其中,控制器还被构造为控制刮墨刀单元的位置。
上述和其它特征和优点中的至少一种还可通过提供一种在具有活性材料层的集流体上涂敷功能层的方法来实现,所述方法包括以下步骤:使具有活性材料层的集流体沿第一辊和第二辊前进;利用凹印辊在活性材料层上涂敷功能层;控制凹印辊的旋转速度,使得功能层和活性材料层的总厚度沿功能层的长度方向均匀。
涂敷功能层的步骤可包括:利用测量器测量活性材料层的厚度;比较活性材料层的厚度与预定的期望厚度;在活性材料层上形成功能层,使得活性材料层和功能层的总厚度等于预定的期望厚度。
控制旋转速度的步骤可包括:利用测量器测量活性材料层和功能层的总厚度;比较总厚度与预定的期望厚度;基于总厚度与预定的期望厚度之间的差值来控制凹印辊的旋转速度。
测量活性材料层和功能层的总厚度的步骤可在凹印辊的下游进行,基于总厚度与预定的期望厚度之间的差值来控制凹印辊的旋转速度的步骤可包括控制活性材料层和功能层的总厚度,并且基于总厚度与预定的期望厚度之间的差来控制凹印辊的旋转速度的步骤是可基于在凹印辊的下游利用测量器测量的总厚度在测量器的上游进行。
上述和其它特征和优点中的至少一种还可通过提供一种用于在具有活性材料层的集流体上涂敷功能层的设备来实现,所述设备包括:凹印辊,凹印辊被构造为在活性材料层上涂敷功能层;刮墨刀单元,刮墨刀单元包括刮墨刀和至少一个应变片,刮墨刀单元被构造为利用刮墨刀从凹印辊刮除多余的功能层材料,并且所述至少一个应变片被构造为测量刮墨刀的应变;控制器,控制器与所述至少一个应变片通信并被构造为控制刮墨刀单元的位置。
控制器可被构造为基于刮墨刀的应变控制刮墨刀单元的位置。
刮墨刀单元可包括:支撑件,在刮墨刀和所述至少一个应变片之间;容纳件,容纳件容纳支撑件和刮墨刀;至少一个伺服电机,所述至少一个伺服电机由控制器控制并且被构造为使容纳件相对于容纳件移动并改变刮墨刀和凹印辊之间的压力。
控制器还可被构造为控制凹印辊的旋转速度。
上述和其它特征和优点中的至少一种还可通过提供一种在具有活性材料层的集流体上涂敷功能层的方法来实现,所述方法包括以下步骤:检测刮墨刀上的测量应变;比较测量应变与刮墨刀上的应变的最佳值;基于检测的测量应变和测量应变与应变的最佳值的比较结果来将刮墨刀保持在最佳刮除状态,从而从凹印辊去除多余的功能层材料;使具有活性材料层的集流体前进;利用凹印辊将功能层涂敷在活性材料层上,使得功能层和活性材料层的总厚度在功能层的长度上均匀。
将刮墨刀保持在最佳刮除状态的步骤可包括通过利用至少一个伺服电机基于测量应变和应变的最佳值之间的差相对于凹印辊移动刮墨刀来改变刮墨刀和凹印辊之间的压力。
将刮墨刀保持在最佳刮除状态的步骤可包括利用所述至少一个应变片检测测量应变。
所述至少一个应变片可设置在支撑件上,支撑件在应变片和刮墨刀之间。
支撑件和刮墨刀可由容纳件容纳,伺服电机可使容纳件相对于凹印辊移动以改变刮墨刀和凹印辊之间的压力。
将刮墨刀保持在最佳刮除状态的步骤可包括:将刮墨刀设定为相对于凹印辊的最佳刮除状态;在刮墨刀在最佳刮除状态的同时利用应变片测量应变的最佳值;将应变的最佳值输入到控制器;利用应变片连续地测量刮墨刀上的测量应变;比较测量应变与应变的最佳值;当测量应变不等于应变的最佳值时,通过使刮墨刀相对于凹印辊移动来使刮墨刀和凹印辊之间的压力最优化。
将刮墨刀保持在最佳刮除状态的步骤还可包括在刮墨刀相对于凹印辊移动的距离大于预定的上限距离时发出警报。
附图说明
通过参照附图对示例性实施例进行的详细描述,上述和其他特征和优点将对本领域普通技术人员变得更加清楚,在附图中:
图1示出了根据实施例的功能层涂敷设备的示意图;
图2示出了控制图1的功能层涂敷设备的构造的框图;
图3示出了图1中的刮墨刀单元的俯视图;
图4示出了应变片的操作原理的示意图;
图5示出了控制刮墨刀的过程的流程图;
图6示出了根据实施例的涂敷功能层的方法的流程;
图7示出了在涂敷功能层前后测量厚度的第一厚度测量装置和第二厚度测量装置的波形图;
图8示出了在涂敷功能层前后的电极板的剖视图;
图9示出了用根据实施例的设备形成的可充电电池中的电极组件的分解透视图;
图10示出了沿图9的线X-X截取的电极组件的剖视图。
具体实施方式
现在将在下文中参照附图更充分地描述示例实施例;然而,示例实施例可以以不同的形式来实施,而不应理解为局限于在此阐述的实施例。相反,提供这些实施例,使得本公开将是彻底的和完全的,并将把本发明的范围充分地传达给本领域技术人员。
在附图中,为了示出的清楚起见,可夸大层和区域的尺寸。还应理解的是,当层或元件被称为“在”另一元件“上”时,该层或元件可直接在另一元件上,或者也可存在中间元件。另外,还应理解的是,当元件被称为“在”两个元件“之间”时,该元件可为这两个元件之间的唯一元件,或者也可存在一个或多个中间元件。相同的标号始终表示相同的元件。
图1示出了根据实施例的功能层涂敷设备的构造的示意图。图2示出了控制图1的功能层涂敷设备的构造的框图。参照图1和图2,功能层涂敷设备(在下文中,称作“涂敷设备”)可利用微凹印涂敷法在基件上形成薄的功能层。例如,微凹印涂敷法可在基件(base member)上形成大约0.1μm至大约200μm的薄膜。
根据本实施例的涂敷设备可使用在可充电电池中形成电极板2(见图8)的集流体21作为基件。可在集流体21上形成活性材料层22。如图1所示,活性材料层22可在集流体21上形成为预定图案。在一种实施方案中,活性材料层22可形成为连续地连接到集流体21的一体结构(未示出)。
涂敷设备可包括:第一辊31和第二辊32,使集流体21沿一个方向(即,从上游侧到下游侧)前进;凹印辊33,在活性材料层22上涂敷功能层23;储存箱34,容纳功能层材料;刮墨刀单元40,包括从凹印辊33刮除多余的功能层材料的刮墨刀42;第一厚度测量装置51,测量活性材料层22的厚度T1;第二厚度测量装置52,测量活性材料层22和功能层23的总厚度T2。功能层材料可形成为具有电绝缘特性的陶瓷浆料,以增强可充电电池的热稳定性。
具体地说,在涂敷设备中,第一辊31和第二辊32可在沿相同的方向(图1中的顺时针方向)旋转的同时使集流体21沿一个方向前进;凹印辊33相对于集流体21安装在第一辊31和第二辊32的相对侧,并可沿顺时针方向旋转(参见图1)。第一辊31和第二辊32可通过沿竖直方向提升/下降来在集流体21中形成功能层23的图案。也就是说,第一辊31和第二辊32可下降以在集流体21上涂敷功能层23,并可提升以暂时停止涂敷,从而在活性材料层22上形成功能层23的图案。凹印辊33可以以下面的状态安装并旋转,即,凹印辊33在存储箱34的上部部分地浸入到功能层材料中。因此,凹印辊33可将功能层材料装载到凹印辊33中的微小凹槽(未示出)中并装载到凹印辊33的表面上。然后,凹印辊33可通过继续旋转将装载在微小凹槽中的功能层材料涂敷到集流体21的活性材料层22上。因此,经过凹印辊33的集流体21可形成包括活性材料层22和功能层23的电极板2。当涂敷功能层材料时,凹印辊33可挤压在第一辊31和第二辊32的作用下前进的集流体21。
为了在活性材料层22的图案上涂敷功能层材料,可以以预定的时间间隔提升和/或下降第一辊31和第二辊32。此外,集流体21在第一辊31和第二辊32处于下降状态时的前进长度L1(即,功能层23的长度L1)可以等于或大于沿集流体21的前进方向设定的活性材料层22的长度L2。因此,功能层23的侧端部L3和L4还可在活性材料层22的两端处由功能层材料形成(见图8和图10)。
刮墨刀42可被设置为接近凹印辊33,以在集流体21的流入侧利用刮墨刀42的端部挤压凹印辊33。因此,刮墨刀42可将功能层材料从凹印辊33刮除。通过这种刮除操作,在微小凹槽外部和凹印辊33的表面上残留的多余功能层材料可被去除;并且功能层材料可被填充到(即,装载到)微小凹槽中。
为了测量活性材料层22的厚度T1,可在凹印辊33之前(即,在集流体21的前进方向M的流入侧)设置第一厚度测量装置51。即,第一厚度测量装置51可在将功能层材料涂敷到活性材料层22上之前测量活性材料层22的厚度T1。为了测量活性材料层22和功能层23的总厚度T2,可在凹印辊33后部(即,在后面或经过其之后)设置第二厚度测量装置52,所述凹印辊33后部是集流体21的前进方向M的流出侧。
优选地,不管活性材料层22的厚度T1的偏差,在电极板2中均匀地保持活性材料层22和功能层23的总厚度T2。第一厚度测量装置51和第二厚度测量装置52可测量包括集流体21的厚度的厚度。由于集流体21的厚度是恒定的,所以第一厚度测量装置51和第二厚度测量装置52可等量地忽略集流体21的厚度,为了便于解释,在本实施例的描述中,可忽略集流体21的厚度。
为了均匀地保持总厚度T2,即使当刮墨刀42被涂敷工艺磨损时,最好也可在均匀地保持刮墨刀42作用于凹印辊33的压力的状态下刮除功能层材料。即,即使在长时间驱动涂敷设备时,最好也可均匀地执行刮除并使刮墨刀42的磨损最小化。
图3示出了刮墨刀单元的俯视图。参照图3,刮墨刀单元40可保持刮墨刀40和凹印辊33之间的压力均匀。当由于例如刮墨刀42的磨损而导致压力减小时,可通过将刮墨刀42朝凹印辊33移动来将刮墨刀单元40的压力调整到预定水平。因此,如图1所示,刮墨刀42可一直保持对凹印辊33的恒定的压力(即,挤压状态)。因此,可有助于从凹印辊33均匀地刮除功能层材料。
在一个实施方案中,刮墨刀单元40可包括:支撑件43,附着到刮墨刀42的一侧;应变片44,附着到支撑件43以检测刮墨刀42的应变;容纳件45,固定支撑件43和刮墨刀42;伺服电机46,通过移动容纳件45来将刮墨刀42挤压到凹印辊33。
容纳件45可包括被构造为打开和关闭的上板451和下板452。支撑件43可附着到容纳件45的上板451。由于应变片44、支撑件43和刮墨刀42可以是柔性的,所以可降低凹印辊33和刮墨刀42之间的因刮墨刀43的磨损导致的压力。在这种情况下,刮墨刀42可从弯曲状态沿伸展或弯曲的方向变形。当刮墨刀42由于压力增大或减小而沿伸展或弯曲的方向变形时,刮除状态(即,刮墨刀42和凹印辊33之间的应变)可改变。支撑件43和应变片44可与刮墨刀42一起变形。也就是说,利用通过应变片44测量的应变值变化可观察到刮墨刀42的状态变化(即,应变)。
通过将应变片44安装在支撑件43上并使支撑件43附着到刮墨刀42的一侧,当由于磨损而更换刮墨刀42时,可消除由于移动应变片44和将应变片44安装到新的刮墨刀42而带来的不便。此外,支撑件43可通过将支撑件43附着到新的刮墨刀42的相对简单的操作来使应变片44安装到新的刮墨刀42。在这种情况下,应变片44和新的刮墨刀42的相对状态可与应变片44与旧的刮墨刀42的相对状态相同。即,应变片44可以以相同的状态检测刮墨刀42的应变。
刮墨刀42沿与集流体21的前进方向M相交的方向可具有足够的宽度W,以利于沿凹印辊33的整个宽度刮除功能层材料。刮墨刀42可具有比容纳件45到凹印辊33的距离D(见图1)相对大的宽度W。因此,可在支撑件43上设置多个应变片44,多个应变片44之间具有预定间隙。所述多个应变片44可以在刮墨刀42的整个宽度W上检测刮墨刀42的应变。此外,可在容纳件45的每侧处将伺服电机46设置为对应于刮墨刀42的宽度W的两侧,从而通过容纳件45控制刮墨刀42的位置。
图4示出了应变片的操作原理的示意图。参照图4,利用一个应变片44和由两个固定电阻器Rf和一个可变电阻器Rv形成的惠斯登电桥电路(Wheatstone bridge circuit)来描述应变片44的操作原理。
应变片44是具有根据弯曲或伸展变形而改变的电阻值的元件。即,应变片44可利用支撑件43作为媒介与刮墨刀42一起根据刮墨刀42和凹印辊33之间的压力变化来弯曲或伸展。因此,实时测量应变片44中的电阻值(即,应变片44的应变)的变化使得能够实时了解刮墨刀42的应变(即,刮墨刀42离开最佳刮除状态的程度)的变化。运算放大器(OP AMP)和模数转换器(ADC)可连接在应变片44和控制器47之间。
即,在最佳刮除状态下,应变片44可变形并且因此应变片44的电阻值可改变。因此,从惠斯登电桥电路分配到应变片44的电压或电流可根据应变片44的电阻值而改变。以这种方式,在OP AMP中将微小变化的电压或电流放大之后,可在ADC中将电压或电流转换为数字值,并将刮墨刀42的被实时检测的测量的应变值N2储存在控制器47中。在设定控制器47时,存储了刮墨刀42的状态的初始应变值N1。为了维持刮墨刀42的最佳刮除状态,控制器47可控制刮墨刀42来使刮墨刀42的被实时检测的测量的应变值N2与初始应变值N1相等。
图5示出了控制刮墨刀的过程的流程图。参照图5,将描述根据刮墨刀42的应变(即,刮除状态)控制刮墨刀42的过程。控制刮墨刀42的过程可包括:第一步骤ST1,将刮墨刀42设定到最佳刮除状态;第二步骤ST2,输入应变片44在最佳刮除状态下的应变值;第三步骤ST3,设定通过应变片44测量的刮墨刀42的初始应变值N1。
控制刮墨刀42的过程还可包括利用实时输入的应变片44的应变值来实时检测刮墨刀42的应变N2的第四步骤ST4。该过程还可包括第五步骤ST5,第五步骤ST5确定刮墨刀42的实时应变值N2是否等于初始(即,最佳)应变N1,然后,如果N2等于N1,则再次执行第四步骤ST4。如果N2不等于N1,则第六步骤ST6可确定刮墨刀42的移动距离是否超过预设的上限值。如果刮墨刀42的移动距离超过预设的上限值,则在第八步骤ST8,可发出警报来通知用户。如果刮墨刀42的移动距离未超过预设的上限值,则在第七步骤ST7中通过驱动伺服电机46来使刮墨刀42前进。
在第一步骤ST1,可由用户直接设定容纳件45和刮墨刀42的前进速度和移动距离的上限值。
在第一步骤ST1,可将刮墨刀42设定到最佳刮除状态。在第二步骤ST2,可将由应变片44测量的应变输入到控制器47。在第三步骤ST3,可设定刮墨刀42的初始应变值N1。当设定初始应变值N1时,固定电阻器Rf可具有固定的电阻值,并且可变电阻器Rv可被设定为具有独立的电阻值。在将刮墨刀42安装到容纳件45中之后,如果刮墨刀42与凹印辊33接触,则应变片44会变形。在变形的状态下,刮墨刀42可具有恒定的电阻值,并且该恒定的电阻值可被设定为可变电阻器Rv的电阻值。因此,在惠斯登电桥电路的第一点A和第二点B检测到的电压为0,该值可被设定为刮墨刀42的应变的初始值N1。
在第四步骤ST4,可以实时测量刮墨刀42的应变值N2。在第五步骤ST5,可将测量的应变值N2与初始应变值N1比较。当初始应变值N1被设定为电流时,可将电流的第一值设定为初始应变值N1;并可将初始应变值N1与实时检测的刮墨刀42的应变值N2进行比较。
在第五步骤ST5,控制器47可将在涂敷时实时检测的刮墨刀42的应变值N2与初始应变值N1进行比较。控制器47可利用应变值N2与初始应变值N1之间的差值来确定刮墨刀42偏离最佳刮除状态的程度。例如,如果N2不等于N1,则控制器47可确定刮墨刀42被磨损并可在第七步骤ST7通过驱动伺服电机46来使容纳件45和刮墨刀42朝凹印辊33前进。控制器47可在同时执行第五步骤ST5至第七步骤ST7时,使刮墨刀42微小地前进,直到刮墨刀42的通过分配到应变片44的电压或电流实时地检测的应变值N2达到初始应变值N1为止,从而将刮墨刀42在涂覆同时重新设定到最佳刮除状态。
在第六步骤ST6,如果刮墨刀42的移动距离超过预设的上限值(即,刮墨刀42过度接近集流体21的状态),则控制器47可在结束控制之前产生警报(ST8)。在第六步骤ST6,控制器47可通过来自限位开关48的检测信号来确定刮墨刀42是否达到移动距离的上限值。限位开关48可被安装在容纳件45或刮墨刀42的移动路径中的与预设的移动上限对应的位置处。因此,当容纳件45或刮墨刀42接触限位开关48时,限位开关48可将指示已经达到预定的上限值的信号发送到控制器。在可选实施例中,可利用转数的编码器值来确定刮墨刀42的移动距离的上限值。
再参照图3,在第六步骤ST6,当容纳件45在伺服电机46的作用下前进时,如果刮墨刀42的右侧被磨损至比刮墨刀42的左侧的磨损更严重的程度,或者相反,则从例如三个应变片44中的每个测量的电阻值(即,刮墨刀42的应变值)会不同。因此,控制器47可以选择性地实时控制在容纳件45的左侧和右侧中的每侧的伺服电机46,以使刮墨刀42的压力沿刮墨刀42的整个宽度W均匀地施加到凹印辊33。即,当刮墨刀42的右侧被磨损得比刮墨刀42的左侧严重时,控制器47可使位于容纳件45的右侧的(而不是左侧的)伺服电机46进一步前进。因此,可沿刮墨刀42的整个宽度W执行均匀的刮除。
图6示出了根据实施例的涂敷功能层的方法的流程图。参照图6,根据本实施例的涂敷功能层的方法(在下文中,称作“涂敷方法”)可包括图1的涂敷设备和图5的控制刮墨刀的过程。即,根据本实施例的涂敷方法可包括通过实时检测用于刮除凹印辊33上的功能材料的刮墨刀42的应变以及将实时检测的刮墨刀42的测量的应变与最佳刮除状态的应变进行比较来将刮墨刀42保持在最佳刮除状态(见图5)。此外,所述涂敷方法可包括通过测量形成在沿一个方向前进的集流体21上的活性材料层22的厚度T1并将测量值与设定值比较来控制凹印辊33的旋转速度来使测量值与设定值对应(见图6)的步骤。
这里,将描述第一厚度测量装置51、第二厚度测量装置52和凹印辊33。图5的刮墨刀的控制方法可与图6的涂敷方法一起执行。
图7示出了在涂敷功能层前后测量厚度的第一厚度测量装置和第二厚度测量装置的波形图。图8示出了在涂敷功能层之前和之后的电极板的剖视图。参照图7和图8,第一厚度测量装置51可在在活性材料层22上涂敷功能层23之前测量活性材料层22的厚度T1。第一厚度测量装置51可形成与活性材料层22的表面形状对应的第一波形W1。第二厚度测量装置52可在涂敷功能层23之后测量活性材料层22和功能层23的总厚度T2。第二厚度测量装置52可形成均匀的第二波形W2,而与活性材料层22的表面形状无关,如图7所示。
再参照图6,根据实施例的涂敷方法可在活性材料层22上形成功能层23,如图8所示。然后,第二厚度测量装置52可输出如图7所示的第二波形W2。例如,涂敷方法可控制凹印辊33的容纳功能层材料的微小凹槽的容量,并可控制凹印辊33的旋转速度和集流体21的前进速度。为了便于解释,在本实施例中,可均匀地保持集流体21的前进速度并可控制凹印辊33的旋转速度。当集流体21的前进速度恒定时,如果凹印辊33的旋转速度增大,则功能层23的涂敷厚度T2-T1会变薄。如果凹印辊33的旋转速度减小,则功能层23的涂敷厚度T2-T1会变厚。
本实施例的涂敷方法可包括第十一步骤ST11,第十一步骤ST11输入在涂敷之后的活性材料层22和功能层23的总厚度T2的设定值(即,预定的期望值)S2,并输入基于设定值S2与活性材料层22的厚度T1的第一测量值M1之间的差S2-M1的凹印辊33的旋转速度变化率ΔV。涂敷方法还可包括确定设定值S2与活性材料层22和功能层23的总厚度T2的第二测量值M2之间的差S2-M2。涂敷方法还可包括利用第一厚度测量装置51测量活性材料层22的厚度T1并输入第一测量值M1的第十二步骤ST12。涂敷方法还可包括将设定值S2与输入的第一测量值M1进行比较的第十三步骤ST13。涂敷方法还可包括基于厚度之间的差值(即,设定值S2和第一测量值M1之间的差值S2-M1)来调节旋转速度变化率ΔV并最初设定凹印辊33的旋转速度的第十四步骤ST14。涂敷方法还可包括确定活性材料层22的次序(n)是否为1的第十五步骤ST15。当涂敷工艺的次序(n)为1时(即,当对一个集流体上21的多个活性材料层22中被首个涂敷的活性材料层22执行涂敷工艺时),可在第十九步骤ST19中利用设定的旋转速度涂敷功能层23。
在第十九步骤ST19中,功能层23可形成在活性材料层上,使得功能层23的侧端部L3和L4由功能层材料形成在活性材料层22的两端。侧端部L3和L4可在活性材料层22和未涂敷部分的边界处消除总厚度T2的偏差。
在第十二步骤ST12,当活性材料层22连续地提供时(未示出),可以连续地测量第一测量值M1。当活性材料层22被形成为图案时(见图8),可以以预定的时间周期的切分状态对第一测量值M1进行测量。
在本实施例的涂敷方法中,可基于第一厚度测量装置51的第一波形W1均匀地形成活性材料层22和功能层23的总厚度T2。然而,可基于第二厚度测量装置52的第二波形W2更均匀地形成总厚度T2。在这种情况下,在第十一步骤ST11,还可输入基于设定值S2和总厚度T2的第二测量值M2之间的差值S2-M2的凹印辊33的旋转速度变化率ΔV。
具体地说,涂敷方法可包括第十六步骤ST16,利用在凹印辊33下游的第二厚度测量装置52测量总厚度T2并在第十九步骤ST19中的首个涂敷之后(即,次序(n)不为1,例如至少为2)反馈第二测量值M2。涂敷方法还可包括随后比较设定值S2和反馈的第二测量值M2的第十七步骤ST17。涂敷方法还可包括根据厚度差值(即,设定值S2和反馈的第二测量值M2之间的差值S2-M2)调节第二厚度测量装置52的上游的旋转速度变化率ΔV并通过例如提高或降低凹印辊33的旋转速度控制旋转速度来获得在第十四步骤ST14设定的旋转速度的第十八步骤ST18。最后,涂敷方法可包括在该状态下涂敷的第十九步骤ST19。在第十六步骤ST16至第十八步骤ST18,可通过第二厚度测量装置52来测量活性材料层22和在前面的涂敷工艺中涂敷的功能层23的总厚度T2。换言之,第二厚度测量装置52可测量多个功能层23/活性材料层22结构中的一个的总厚度T2并确定整体总厚度T2是否偏离预定的期望总厚度S2。如果已经形成的功能层23/活性材料层22结构的整体总厚度T2偏离了期望的总厚度S2,则可将凹印辊33的旋转速度调节为使稍后形成的功能层23/活性材料层22结构的整体总厚度T2可等于预定的期望总厚度S2。因此,在后续的第十九步骤ST19中可使总厚度T2更均匀。
图9示出了根据实施例制备的可充电电池中的电极组件的分解透视图。图10示出了沿图9的线X-X截取的电极组件的剖视图。参照图9和图10,将基于电极组件200描述根据实施例制备的可充电电池。将电极组件200容纳在其中的壳体和电连接到电极组件200的盖组件可使用公知的技术,因此将省略对它们的详细描述。
电极组件200可包括分别形成正极和负极的第一电极板102和第二电极板202。电极组件200还可包括设置在第一电极板102和第二电极板202之间的隔膜302。可通过将隔膜302设置在第一电极板102和第二电极板202之间并卷绕来形成电极组件200。第一电极板102可具有在第一集流体121上的第一活性材料层122和第一功能层123。第二电极板202可具有在第二集流体221上的第二活性材料层222和第二功能层223。在卷绕状态下,第二活性材料层222和第二功能层223的堆叠结构可与第一活性材料层122和第一功能层123的堆叠结构相对,并且隔膜302设置在这两个堆叠结构之间。
第一电极板102和第二电极板202可具有相同的结构,因此将仅描述第一电极板102。在第一电极板102中,第一活性材料层122可沿第一集流体121的长度方向(x轴方向)具有不规则的厚度T1;第一功能层123与第一活性材料层122一起可具有均匀的总厚度T2,总厚度T2与厚度T1的偏差无关。即,总厚度T2可对应于设定值S2。
此外,第一功能层123可具有比第一活性材料层122的长度L2长的长度L1,以进一步形成第一功能层123的由功能层材料形成在第一活性材料层122的两端的侧端部L3和L4。由于侧端部L3和L4可消除在第一活性材料层122和未涂敷部分的边界处的总厚度T2的偏差,所以侧端部L3和L4可防止以不均匀形状的电池芯形状形成。具体地说,侧端部L3和L4可防止在卷绕过程中不均匀的压力施加到电极组件200。因此,可防止由于不均匀的形状和不均匀的压力而导致的电解质溶液不能注入。
综上,利用涂敷设备供应到集流体的活性材料层可具有从集流体突出的厚度。根据实施例,活性材料层和功能层的沿集流体的行进方向的总厚度可以是均匀的,即,活性材料层和功能层的总厚度沿其长度方向可不具有厚度偏差。因此,当在具有厚度偏差的活性材料层上以均匀的厚度涂敷功能材料时,活性材料层和功能层的总厚度不会传递活性材料层的厚度偏差。在不存在活性材料层的未涂敷部分和活性材料层的边界处会形成阶梯差。然而,根据实施例的设备和方法,功能涂敷层在未涂敷部分的厚度可以不形成为与活性材料层的厚度那样薄。
在根据实施例在活性材料层上涂敷功能层之后,包括具有厚度偏差的层的电极板在执行卷绕工艺过程中不会受到不均匀的压力的影响。在卷绕之后,均匀的电极板会导致均匀的电池芯的形状。因此,电解质溶液可以均匀地注入,并且因此离子可以在正极板和负极板之间稳定地移动。
根据实施例的功能层涂敷设备,通过在涂敷功能层材料的同时利用应变片实时测量刮墨刀的应变(即,刮墨刀和凹印辊之间的压力),能够均匀地执行凹印辊的功能层材料的刮除并且可以有利地使刮墨刀的磨损最小化。
根据实施例的涂敷功能层的方法,通过比较设定值与活性材料层和功能层的总厚度及比较设定值与第一测量值(活性材料层的在流入侧测量的厚度,集流体在流入侧前进至涂敷设备),并根据设定值和第一测量值之间的差值来改变凹印辊的旋转速度并涂敷功能层,可将功能层涂敷为使活性材料层和功能层的总厚度可与设定值对应。即,可均匀地形成活性材料层和功能层的总厚度而不管活性材料层的厚度偏差。
根据实施例的涂覆功能层的方法,通过利用第一测量值改变凹印辊的旋转速度,可均匀地形成活性材料层和功能层的总厚度。然而,通过额外地比较第二测量值(在涂敷设备的流出侧测量的总厚度)与设定值并根据设定值和第二测量值之间的差进一步改变凹印辊的旋转速度并涂敷功能层,可将功能层涂敷为使后续涂敷的层的活性材料层和功能层的总厚度可与设定值进一步地对应。
根据按照实施例形成的可充电电池,通过在电极板中将功能层的厚度设置为与活性材料层的厚度成反比,可均匀地形成活性材料层和功能层的总厚度。因此,在卷绕电极板时,可利用均匀的压力均匀地形成电池芯形状,并可防止电解液注入失败。
已经在此公开了示例性实施例,虽然使用了特定的术语,但是使用的这些术语应当仅以一般的和描述性的意思来解释,而不是出于限制性的目的。因此,本领域普通技术人员应该理解,在不脱离如权利要求中阐述的本发明的精神和范围的情况下,可以进行形式和细节上的各种改变。
Claims (4)
1.一种用于在具有活性材料层的集流体上涂敷功能层的设备,所述设备包括:
第一辊和第二辊,所述第一辊和所述第二辊用于使所述集流体前进;
凹印辊,所述凹印辊被构造为将所述功能层涂敷在所述活性材料层上;
厚度测量器,所述厚度测量器被构造为测量所述活性材料层的厚度以及所述活性材料层和所述功能层的总厚度中的至少一个厚度;和
控制器,所述控制器与所述厚度测量器通信并被构造为控制所述凹印辊的旋转速度,
其中,所述控制器被构造为基于所述活性材料层的厚度和预定的期望厚度之间的差值以及所述总厚度与预定的期望厚度之间的差值中的至少一个来控制所述凹印辊的所述旋转速度。
2.如权利要求1所述的设备,所述设备还包括刮墨刀单元,所述刮墨刀单元被构造为从所述凹印辊刮除多余的功能层材料,其中,所述控制器还被构造为控制所述刮墨刀单元的位置。
3.一种在具有活性材料层的集流体上涂敷功能层的方法,该方法包括以下步骤:
使所述具有活性材料层的集流体沿第一辊和第二辊前进;
利用凹印辊在所述活性材料层上涂敷功能层;和
控制所述凹印辊的旋转速度,使得所述功能层和所述活性材料层的总厚度沿所述功能层的长度方向是均匀的,
其中,涂敷功能层的步骤包括:
利用测量器测量活性材料层的厚度;
比较所述活性材料层的所述厚度与预定的期望厚度;
在所述活性材料层上形成功能层,使得所述活性材料层和所述功能层的所述总厚度等于预定的期望厚度,
控制旋转速度的步骤包括:
利用测量器测量所述活性材料层和所述功能层的总厚度;
比较所述总厚度与预定的期望厚度;
基于所述总厚度与所述预定的期望厚度之间的差值来控制所述凹印辊的旋转速度。
4.如权利要求3所述的方法,其中:
测量所述活性材料层和所述功能层的总厚度的步骤在所述凹印辊的下游进行,
基于所述总厚度与所述预定的期望厚度之间的差值来控制所述凹印辊的所述旋转速度的步骤包括控制活性材料层和功能层的总厚度,并且基于所述总厚度与所述预定的期望厚度之间的差值来控制所述凹印辊的所述旋转速度的步骤是基于在所述凹印辊的下游利用所述测量器测量的所述总厚度在所述测量器的上游进行。
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CN102145327A (zh) | 2011-08-10 |
JP2011165663A (ja) | 2011-08-25 |
EP2355224B1 (en) | 2013-07-31 |
KR20110090807A (ko) | 2011-08-10 |
US20110189378A1 (en) | 2011-08-04 |
KR101256068B1 (ko) | 2013-04-18 |
JP5517358B2 (ja) | 2014-06-11 |
US20130017319A1 (en) | 2013-01-17 |
US9088043B2 (en) | 2015-07-21 |
EP2355224A1 (en) | 2011-08-10 |
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