CN102046838A - 用于膜沉积的碲前体 - Google Patents
用于膜沉积的碲前体 Download PDFInfo
- Publication number
- CN102046838A CN102046838A CN200980119838XA CN200980119838A CN102046838A CN 102046838 A CN102046838 A CN 102046838A CN 200980119838X A CN200980119838X A CN 200980119838XA CN 200980119838 A CN200980119838 A CN 200980119838A CN 102046838 A CN102046838 A CN 102046838A
- Authority
- CN
- China
- Prior art keywords
- tellurium
- precursor
- sime
- geme
- reactor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 0 CC(*)*(**(C)(*)*(C)(*)*(C)C)*(*)(*(C)(*)C(C)=C)N Chemical compound CC(*)*(**(C)(*)*(C)(*)*(C)C)*(*)(*(C)(*)C(C)=C)N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/305—Sulfides, selenides, or tellurides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/305—Sulfides, selenides, or tellurides
- C23C16/306—AII BVI compounds, where A is Zn, Cd or Hg and B is S, Se or Te
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/16—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metal carbonyl compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US5712808P | 2008-05-29 | 2008-05-29 | |
| US61/057,128 | 2008-05-29 | ||
| PCT/IB2009/008067 WO2010055423A2 (en) | 2008-05-29 | 2009-05-29 | Tellurium precursors for film deposition |
| US12/475,204 US8101237B2 (en) | 2008-05-29 | 2009-05-29 | Tellurium precursors for film deposition |
| US12/475,204 | 2009-05-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102046838A true CN102046838A (zh) | 2011-05-04 |
Family
ID=41380625
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200980119838XA Pending CN102046838A (zh) | 2008-05-29 | 2009-05-29 | 用于膜沉积的碲前体 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8101237B2 (https=) |
| JP (1) | JP2011522120A (https=) |
| KR (1) | KR20110014160A (https=) |
| CN (1) | CN102046838A (https=) |
| TW (1) | TWI480411B (https=) |
| WO (1) | WO2010055423A2 (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112789367A (zh) * | 2018-10-04 | 2021-05-11 | 株式会社Adeka | 用于原子层沉积法的薄膜形成用原料、薄膜形成用原料、薄膜的制造方法及化合物 |
| CN115216748A (zh) * | 2022-09-19 | 2022-10-21 | 中国科学院苏州纳米技术与纳米仿生研究所 | 碲薄膜的制备方法和半导体器件 |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SG171683A1 (en) | 2006-05-12 | 2011-06-29 | Advanced Tech Materials | Low temperature deposition of phase change memory materials |
| CN102352488B (zh) | 2006-11-02 | 2016-04-06 | 诚实公司 | 对于金属薄膜的cvd/ald有用的锑及锗复合物 |
| US8834968B2 (en) | 2007-10-11 | 2014-09-16 | Samsung Electronics Co., Ltd. | Method of forming phase change material layer using Ge(II) source, and method of fabricating phase change memory device |
| KR101458953B1 (ko) | 2007-10-11 | 2014-11-07 | 삼성전자주식회사 | Ge(Ⅱ)소오스를 사용한 상변화 물질막 형성 방법 및상변화 메모리 소자 제조 방법 |
| SG178736A1 (en) * | 2007-10-31 | 2012-03-29 | Advanced Tech Materials | Amorphous ge/te deposition process |
| US20090215225A1 (en) | 2008-02-24 | 2009-08-27 | Advanced Technology Materials, Inc. | Tellurium compounds useful for deposition of tellurium containing materials |
| US8101237B2 (en) | 2008-05-29 | 2012-01-24 | L'Air Liquide SociétéAnonyme pour I'Etude et I'Exploitation des Procédés Georges Claude | Tellurium precursors for film deposition |
| US8802194B2 (en) | 2008-05-29 | 2014-08-12 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Tellurium precursors for film deposition |
| US8636845B2 (en) | 2008-06-25 | 2014-01-28 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Metal heterocyclic compounds for deposition of thin films |
| US8691668B2 (en) | 2009-09-02 | 2014-04-08 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Dihalide germanium(II) precursors for germanium-containing film depositions |
| US9240319B2 (en) | 2010-02-03 | 2016-01-19 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Chalcogenide-containing precursors, methods of making, and methods of using the same for thin film deposition |
| KR101163046B1 (ko) * | 2010-07-08 | 2012-07-05 | 에스케이하이닉스 주식회사 | 상변화 메모리 소자의 제조 방법 |
| RU2440640C1 (ru) * | 2010-11-10 | 2012-01-20 | Государственное образовательное учреждение высшего профессионального образования Дагестанский государственный университет | Способ получения монокристаллических пленок и слоев теллура |
| KR102326396B1 (ko) | 2013-09-27 | 2021-11-12 | 레르 리키드 쏘시에떼 아노님 뿌르 레드 에렉스뿔라따시옹 데 프로세데 조르즈 클로드 | 아민 치환된 트리실릴아민 및 트리디실릴아민 화합물 |
| US9543144B2 (en) * | 2014-12-31 | 2017-01-10 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Vapor deposition of chalcogenide-containing films |
| US9777025B2 (en) | 2015-03-30 | 2017-10-03 | L'Air Liquide, Société pour l'Etude et l'Exploitation des Procédés Georges Claude | Si-containing film forming precursors and methods of using the same |
| US11124876B2 (en) | 2015-03-30 | 2021-09-21 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Si-containing film forming precursors and methods of using the same |
| US10192734B2 (en) | 2016-12-11 | 2019-01-29 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploration des Procédés Georges Claude | Short inorganic trisilylamine-based polysilazanes for thin film deposition |
| TWI889746B (zh) * | 2020-02-20 | 2025-07-11 | 美商應用材料股份有限公司 | 含碲薄膜之沉積 |
| KR102444266B1 (ko) * | 2020-05-18 | 2022-09-16 | 서울대학교산학협력단 | 원자층 증착 공정을 이용한 칼코게나이드계 박막의 형성 방법, 이를 적용한 상변화 물질층의 형성 방법 및 상변화 메모리 소자의 제조 방법 |
| US12356873B2 (en) | 2020-05-18 | 2025-07-08 | Seoul National University R&DBFoundation | Method of forming chalcogenide-based thin film using atomic layer deposition process, method of forming phase change material layer and switching device, and method of fabricating memory device using the same |
| KR102444272B1 (ko) * | 2020-05-18 | 2022-09-16 | 서울대학교산학협력단 | 원자층 증착 공정을 이용한 칼코게나이드계 박막의 형성 방법, 이를 이용한 스위칭 소자의 형성 방법 및 메모리 소자의 제조 방법 |
Family Cites Families (46)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3573958A (en) | 1968-05-31 | 1971-04-06 | Francis E Small | Heat sensitive recording sheet |
| SU570239A1 (ru) * | 1976-02-12 | 1979-02-10 | Институт химии АН СССР | "Способ получени кристаллических соединений а1у ву14 |
| US4377613A (en) | 1981-09-14 | 1983-03-22 | Gordon Roy G | Non-iridescent glass structures |
| US4419386A (en) | 1981-09-14 | 1983-12-06 | Gordon Roy G | Non-iridescent glass structures |
| DE4214281A1 (de) | 1992-04-30 | 1993-11-04 | Consortium Elektrochem Ind | Verfahren zur herstellung von germaniumdihalogenid-ether-addukten |
| DE4234998C2 (de) | 1992-10-16 | 2000-11-16 | Michael Denk | Cyclische Amide des Siliciums und des Germaniums |
| US5656338A (en) | 1994-12-13 | 1997-08-12 | Gordon; Roy G. | Liquid solution of TiBr4 in Br2 used as a precursor for the chemical vapor deposition of titanium or titanium nitride |
| JP2001502381A (ja) | 1996-10-16 | 2001-02-20 | ザ プレジデント アンド フェロウズ オブ ハーバード カレッジ | 酸化アルミニウムの化学蒸着法 |
| JP2002527528A (ja) | 1998-10-21 | 2002-08-27 | プレジデント・アンド・フェロウズ・オブ・ハーバード・カレッジ | アルカリ土類金属を含有する材料を形成するための液体化合物 |
| JP2003522827A (ja) | 1998-11-12 | 2003-07-29 | プレジデント・アンド・フェロウズ・オブ・ハーバード・カレッジ | 段差被覆率が改善された拡散バリア材料 |
| WO2001066816A1 (en) | 2000-03-03 | 2001-09-13 | President And Fellows Of Harvard College | Liquid sources for cvd of group 6 metals and metal compounds |
| US6984591B1 (en) | 2000-04-20 | 2006-01-10 | International Business Machines Corporation | Precursor source mixtures |
| EP1180553A1 (en) | 2000-08-15 | 2002-02-20 | Air Products And Chemicals, Inc. | CVD process for depositing copper on a barrier layer |
| JP5290488B2 (ja) | 2000-09-28 | 2013-09-18 | プレジデント アンド フェロウズ オブ ハーバード カレッジ | 酸化物、ケイ酸塩及びリン酸塩の気相成長 |
| KR100996816B1 (ko) | 2002-03-28 | 2010-11-25 | 프레지던트 앤드 펠로우즈 오브 하바드 칼리지 | 이산화규소 나노라미네이트의 증기증착 |
| JP4954448B2 (ja) | 2003-04-05 | 2012-06-13 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | 有機金属化合物 |
| JP4714422B2 (ja) | 2003-04-05 | 2011-06-29 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | ゲルマニウムを含有するフィルムを堆積させる方法、及び蒸気送達装置 |
| US7071125B2 (en) | 2004-09-22 | 2006-07-04 | Intel Corporation | Precursors for film formation |
| KR100618879B1 (ko) | 2004-12-27 | 2006-09-01 | 삼성전자주식회사 | 게르마늄 전구체, 이를 이용하여 형성된 gst 박막,상기 박막의 제조 방법 및 상변화 메모리 소자 |
| US20060172068A1 (en) | 2005-01-28 | 2006-08-03 | Ovshinsky Stanford R | Deposition of multilayer structures including layers of germanium and/or germanium alloys |
| US20060172067A1 (en) | 2005-01-28 | 2006-08-03 | Energy Conversion Devices, Inc | Chemical vapor deposition of chalcogenide materials |
| KR100688532B1 (ko) | 2005-02-14 | 2007-03-02 | 삼성전자주식회사 | 텔루르 전구체, 이를 이용하여 제조된 Te-함유 칼코게나이드(chalcogenide) 박막, 상기 박막의 제조방법 및 상변화 메모리 소자 |
| US7678420B2 (en) | 2005-06-22 | 2010-03-16 | Sandisk 3D Llc | Method of depositing germanium films |
| KR100962623B1 (ko) | 2005-09-03 | 2010-06-11 | 삼성전자주식회사 | 상변화 물질층 형성 방법, 이를 이용한 상변화 메모리 유닛및 상변화 메모리 장치의 제조 방법 |
| KR101014066B1 (ko) | 2005-11-23 | 2011-02-14 | 아리조나 보드 오브 리전트스, 아리조나주의 아리조나 주립대 대행법인 | 규소-게르마늄 수소화물 및 그의 제조 및 사용 방법 |
| WO2007067604A2 (en) | 2005-12-06 | 2007-06-14 | Structured Materials Inc. | Method of making undoped, alloyed and doped chalcogenide films by mocvd processes |
| KR100695168B1 (ko) | 2006-01-10 | 2007-03-14 | 삼성전자주식회사 | 상변화 물질 박막의 형성방법, 이를 이용한 상변화 메모리소자의 제조방법 |
| SG171683A1 (en) | 2006-05-12 | 2011-06-29 | Advanced Tech Materials | Low temperature deposition of phase change memory materials |
| CN102993050A (zh) | 2006-06-28 | 2013-03-27 | 哈佛学院院长等 | 四脒基金属(iv)化合物及其在气相沉积中的用途 |
| US7638645B2 (en) | 2006-06-28 | 2009-12-29 | President And Fellows Of Harvard University | Metal (IV) tetra-amidinate compounds and their use in vapor deposition |
| US20080032064A1 (en) | 2006-07-10 | 2008-02-07 | President And Fellows Of Harvard College | Selective sealing of porous dielectric materials |
| KR100757415B1 (ko) | 2006-07-13 | 2007-09-10 | 삼성전자주식회사 | 게르마늄 화합물 및 그 제조 방법, 상기 게르마늄 화합물을이용한 상변화 메모리 장치 및 그 형성 방법 |
| US7547631B2 (en) | 2006-07-31 | 2009-06-16 | Rohm And Haas Electronic Materials Llc | Organometallic compounds |
| US7630142B2 (en) * | 2006-10-20 | 2009-12-08 | Olympus Imaging Corp. | Bent type zoom optical system and imaging system using the same |
| KR100829602B1 (ko) | 2006-10-20 | 2008-05-14 | 삼성전자주식회사 | 상변화 물질층 형성 방법 및 상변화 메모리 장치의 제조방법 |
| CN102352488B (zh) * | 2006-11-02 | 2016-04-06 | 诚实公司 | 对于金属薄膜的cvd/ald有用的锑及锗复合物 |
| KR100871692B1 (ko) | 2006-11-07 | 2008-12-08 | 삼성전자주식회사 | 저온 증착용 금속 전구체, 그를 사용한 금속 박막 형성방법 및 상변화 메모리 소자 제조 방법 |
| KR101275799B1 (ko) | 2006-11-21 | 2013-06-18 | 삼성전자주식회사 | 저온 증착이 가능한 게르마늄 전구체를 이용한 상변화층형성방법 및 이 방법을 이용한 상변화 메모리 소자의 제조방법 |
| US8377341B2 (en) | 2007-04-24 | 2013-02-19 | Air Products And Chemicals, Inc. | Tellurium (Te) precursors for making phase change memory materials |
| US8454928B2 (en) | 2007-09-17 | 2013-06-04 | L'air Liquide Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Tellurium precursors for GST deposition |
| US7960205B2 (en) * | 2007-11-27 | 2011-06-14 | Air Products And Chemicals, Inc. | Tellurium precursors for GST films in an ALD or CVD process |
| US20090162973A1 (en) | 2007-12-21 | 2009-06-25 | Julien Gatineau | Germanium precursors for gst film deposition |
| JP5718808B2 (ja) | 2008-04-25 | 2015-05-13 | エーエスエム インターナショナル エヌ.ヴェー.Asm International N.V. | テルルおよびセレン薄膜のaldのための前駆体の合成および使用 |
| US8765223B2 (en) * | 2008-05-08 | 2014-07-01 | Air Products And Chemicals, Inc. | Binary and ternary metal chalcogenide materials and method of making and using same |
| US8101237B2 (en) | 2008-05-29 | 2012-01-24 | L'Air Liquide SociétéAnonyme pour I'Etude et I'Exploitation des Procédés Georges Claude | Tellurium precursors for film deposition |
| TWM372771U (en) * | 2009-05-20 | 2010-01-21 | Legend Lifestyle Products Corp | Torque detection display device for tool |
-
2009
- 2009-05-29 US US12/475,204 patent/US8101237B2/en active Active
- 2009-05-29 KR KR1020107026546A patent/KR20110014160A/ko not_active Ceased
- 2009-05-29 CN CN200980119838XA patent/CN102046838A/zh active Pending
- 2009-05-29 WO PCT/IB2009/008067 patent/WO2010055423A2/en not_active Ceased
- 2009-05-29 JP JP2011511113A patent/JP2011522120A/ja active Pending
- 2009-06-01 TW TW098118134A patent/TWI480411B/zh not_active IP Right Cessation
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112789367A (zh) * | 2018-10-04 | 2021-05-11 | 株式会社Adeka | 用于原子层沉积法的薄膜形成用原料、薄膜形成用原料、薄膜的制造方法及化合物 |
| CN115216748A (zh) * | 2022-09-19 | 2022-10-21 | 中国科学院苏州纳米技术与纳米仿生研究所 | 碲薄膜的制备方法和半导体器件 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011522120A (ja) | 2011-07-28 |
| WO2010055423A3 (en) | 2010-07-15 |
| WO2010055423A2 (en) | 2010-05-20 |
| TWI480411B (zh) | 2015-04-11 |
| KR20110014160A (ko) | 2011-02-10 |
| US8101237B2 (en) | 2012-01-24 |
| TW201016877A (en) | 2010-05-01 |
| US20090299084A1 (en) | 2009-12-03 |
| WO2010055423A8 (en) | 2010-09-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102046838A (zh) | 用于膜沉积的碲前体 | |
| KR100956210B1 (ko) | 금속 실리콘 질화물 박막의 플라즈마 강화 사이클릭증착방법 | |
| US20090162973A1 (en) | Germanium precursors for gst film deposition | |
| US8193388B2 (en) | Compounds for depositing tellurium-containing films | |
| KR102219147B1 (ko) | 5 족 전이 금속-함유 필름의 증착을 위한 5 족 전이 금속-함유 화합물 | |
| EP2242870B1 (en) | Method using new metal precursors containing beta-diketiminato ligands | |
| US9240319B2 (en) | Chalcogenide-containing precursors, methods of making, and methods of using the same for thin film deposition | |
| US20110262660A1 (en) | Chalcogenide-containing precursors, methods of making, and methods of using the same for thin film deposition | |
| US8802194B2 (en) | Tellurium precursors for film deposition | |
| US10023462B2 (en) | Niobium-Nitride film forming compositions and vapor deposition of Niobium-Nitride films | |
| JP7703820B2 (ja) | 蒸着用インジウム前駆体 | |
| KR20120092097A (ko) | 게르마늄 함유 막 침착을 위한 디할라이드 게르마늄(ⅱ) 전구체 | |
| WO2009039187A1 (en) | Tellurium precursors for gst film deposition | |
| CN109803974B (zh) | 含有烯丙基配体的金属复合物 | |
| CN114929937B (zh) | 硅前体化合物、包含该硅前体化合物的用于形成含硅膜的组合物以及用于形成含硅膜的方法 | |
| KR20140116852A (ko) | 니켈-함유 필름의 증착을 위한 니켈 알릴 아미디네이트 전구체 | |
| TW202330561A (zh) | 用於沈積含錫薄膜之含錫先質及其相應沈積方法 | |
| KR20110056461A (ko) | 금속 실리콘 질화물 박막의 플라즈마 강화 사이클릭 증착방법 | |
| EP2492273A1 (en) | Deposition of gallium containing thin films using gallium alkylamide precursor | |
| US12467134B2 (en) | Method for deposition of gallium-containing film with gallium precursors | |
| EP2492272A1 (en) | Deposition of indium containing thin films using indium alkylamide precursor | |
| US20250290202A1 (en) | Fluorination of ancillary ligands of group (iii) precursors and their applications in vapor depositions | |
| EP2540732A1 (en) | Deposition of gallium containing thin films using new gallium precursors. | |
| EP2540733A1 (en) | Deposition of indium containing thin films using new indium precursors | |
| IL292918B1 (en) | Compounds and methods for selectively forming metal-containing layers |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C53 | Correction of patent of invention or patent application | ||
| CB03 | Change of inventor or designer information |
Inventor after: Okubo Shingo Inventor after: Yanagita Kazutaka Inventor after: J. Gatineau Inventor after: M minola Inventor before: Okubo Shingo Inventor before: Yanagita Kazutaka Inventor before: J. Gatineau |
|
| COR | Change of bibliographic data |
Free format text: CORRECT: INVENTOR; FROM: OKUBO SHINGO KAZUTAKA YANAGITA GATINEAU JULIEN TO: OKUBO SHINGO KAZUTAKA YANAGITA GATINEAU JULIEN MINOLA M. |
|
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20110504 |