CN101802923A - 用于非易失性存储器的增强型写中断机制 - Google Patents
用于非易失性存储器的增强型写中断机制 Download PDFInfo
- Publication number
- CN101802923A CN101802923A CN200880102322A CN200880102322A CN101802923A CN 101802923 A CN101802923 A CN 101802923A CN 200880102322 A CN200880102322 A CN 200880102322A CN 200880102322 A CN200880102322 A CN 200880102322A CN 101802923 A CN101802923 A CN 101802923A
- Authority
- CN
- China
- Prior art keywords
- voltage
- low
- memory array
- nonvolatile memory
- management device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5628—Programming or writing circuits; Data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
- G11C16/225—Preventing erasure, programming or reading when power supply voltages are outside the required ranges
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/021—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in voltage or current generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0409—Online test
Abstract
Description
Claims (18)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/890,734 | 2007-08-06 | ||
US11/890,708 | 2007-08-06 | ||
US11/890,708 US20090040842A1 (en) | 2007-08-06 | 2007-08-06 | Enhanced write abort mechanism for non-volatile memory |
US11/890,734 US7599241B2 (en) | 2007-08-06 | 2007-08-06 | Enhanced write abort mechanism for non-volatile memory |
PCT/US2008/071865 WO2009020845A1 (en) | 2007-08-06 | 2008-08-01 | Enhanced write abort mechanism for non-volatile memory |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101802923A true CN101802923A (zh) | 2010-08-11 |
CN101802923B CN101802923B (zh) | 2014-09-03 |
Family
ID=40341657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200880102322.XA Active CN101802923B (zh) | 2007-08-06 | 2008-08-01 | 用于非易失性存储器的增强型写中断机制 |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP2183749B1 (zh) |
JP (1) | JP4938893B2 (zh) |
KR (1) | KR101070601B1 (zh) |
CN (1) | CN101802923B (zh) |
WO (1) | WO2009020845A1 (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104050107A (zh) * | 2013-03-12 | 2014-09-17 | 光宝科技股份有限公司 | 固态储存装置及遭遇低电压时的数据处理方法 |
CN106683703A (zh) * | 2017-03-15 | 2017-05-17 | 珠海格力电器股份有限公司 | 一种数据读取方法、集成电路及芯片 |
CN108536622A (zh) * | 2017-03-06 | 2018-09-14 | 爱思开海力士有限公司 | 存储装置、数据处理系统以及操作存储装置的方法 |
CN109117391A (zh) * | 2017-06-22 | 2019-01-01 | 旺宏电子股份有限公司 | 用于存储器系统的控制器 |
CN109192234A (zh) * | 2018-07-13 | 2019-01-11 | 上海移远通信技术股份有限公司 | 一种保护电路及通信模块 |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4863865B2 (ja) * | 2006-12-28 | 2012-01-25 | 富士通株式会社 | 情報処理装置,記憶部誤書込み防止方法,および情報処理システム |
US8832353B2 (en) | 2009-04-07 | 2014-09-09 | Sandisk Technologies Inc. | Host stop-transmission handling |
JP5348541B2 (ja) * | 2009-05-20 | 2013-11-20 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
KR101624354B1 (ko) * | 2009-12-15 | 2016-06-07 | 엘지이노텍 주식회사 | 마이크로 컨트롤러의 데이터 기록 방법 |
JP5085744B2 (ja) * | 2011-01-05 | 2012-11-28 | 株式会社東芝 | 半導体記憶装置 |
US9202577B2 (en) | 2012-03-30 | 2015-12-01 | Intel Corporation | Solid state drive management in power loss recovery |
WO2013147894A1 (en) * | 2012-03-30 | 2013-10-03 | Intel Corporation | Solid state drive management in power loss recovery |
US9037902B2 (en) | 2013-03-15 | 2015-05-19 | Sandisk Technologies Inc. | Flash memory techniques for recovering from write interrupt resulting from voltage fault |
KR20150054206A (ko) * | 2013-11-11 | 2015-05-20 | 삼성전자주식회사 | 플래시 메모리의 데이터 보호 방법 및 장치 |
JP6541998B2 (ja) * | 2015-03-24 | 2019-07-10 | 東芝メモリ株式会社 | メモリデバイス、半導体装置および情報処理装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6246626B1 (en) * | 2000-07-28 | 2001-06-12 | Micron Technology, Inc. | Protection after brown out in a synchronous memory |
CN1639799A (zh) * | 2002-03-05 | 2005-07-13 | 皇家飞利浦电子股份有限公司 | 用于防止错误的数据存储的产品和方法 |
US20060034120A1 (en) * | 2004-08-13 | 2006-02-16 | Kabushiki Kaisha Toshiba | Non-volatile semiconductor memory device |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1063442A (ja) * | 1996-08-22 | 1998-03-06 | Toshiba Corp | 半導体ディスク装置 |
JP4299890B2 (ja) * | 1996-10-30 | 2009-07-22 | 株式会社東芝 | 半導体メモリ応用装置の電源供給回路 |
US5943263A (en) * | 1997-01-08 | 1999-08-24 | Micron Technology, Inc. | Apparatus and method for programming voltage protection in a non-volatile memory system |
KR100255956B1 (ko) * | 1997-07-16 | 2000-05-01 | 윤종용 | 강유전체 메모리 장치 및 그것의 데이터 보호 방법 |
JP3763192B2 (ja) * | 1997-08-04 | 2006-04-05 | 富士電機システムズ株式会社 | 瞬停電時積算値保存回路 |
JP2000122813A (ja) * | 1998-10-13 | 2000-04-28 | Toshiba Corp | ディスクアレイ装置 |
JP2002014947A (ja) * | 2000-06-29 | 2002-01-18 | Toshiba Corp | マイクロコンピュータ |
US6711701B1 (en) * | 2000-08-25 | 2004-03-23 | Micron Technology, Inc. | Write and erase protection in a synchronous memory |
KR100399365B1 (ko) * | 2000-12-04 | 2003-09-26 | 삼성전자주식회사 | 페일 비트 검출 스킴을 구비한 불휘발성 반도체 메모리장치 및 그것의 페일 비트 카운트 방법 |
JP2003002132A (ja) * | 2001-06-19 | 2003-01-08 | Koyo Seiko Co Ltd | 車両用制御装置 |
JP2003330627A (ja) * | 2002-05-16 | 2003-11-21 | Mitsubishi Electric Corp | 記憶装置 |
KR100471182B1 (ko) * | 2002-09-03 | 2005-03-10 | 삼성전자주식회사 | 레디/비지 핀을 이용하여 내부 전압 레벨을 알리는 반도체메모리 장치 |
US6822899B1 (en) * | 2002-12-23 | 2004-11-23 | Cypress Semiconductor Corporation | Method of protecting flash memory from data corruption during fast power down events |
JP2005286502A (ja) * | 2004-03-29 | 2005-10-13 | Casio Comput Co Ltd | 携帯情報機器、プログラム書き換え方法、及びプログラム |
JP4863865B2 (ja) * | 2006-12-28 | 2012-01-25 | 富士通株式会社 | 情報処理装置,記憶部誤書込み防止方法,および情報処理システム |
-
2008
- 2008-08-01 WO PCT/US2008/071865 patent/WO2009020845A1/en active Application Filing
- 2008-08-01 KR KR1020107002553A patent/KR101070601B1/ko active IP Right Grant
- 2008-08-01 EP EP08782581.6A patent/EP2183749B1/en not_active Not-in-force
- 2008-08-01 JP JP2010520210A patent/JP4938893B2/ja not_active Expired - Fee Related
- 2008-08-01 CN CN200880102322.XA patent/CN101802923B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6246626B1 (en) * | 2000-07-28 | 2001-06-12 | Micron Technology, Inc. | Protection after brown out in a synchronous memory |
CN1639799A (zh) * | 2002-03-05 | 2005-07-13 | 皇家飞利浦电子股份有限公司 | 用于防止错误的数据存储的产品和方法 |
US20060034120A1 (en) * | 2004-08-13 | 2006-02-16 | Kabushiki Kaisha Toshiba | Non-volatile semiconductor memory device |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104050107A (zh) * | 2013-03-12 | 2014-09-17 | 光宝科技股份有限公司 | 固态储存装置及遭遇低电压时的数据处理方法 |
CN104050107B (zh) * | 2013-03-12 | 2017-01-25 | 光宝电子(广州)有限公司 | 固态储存装置及遭遇低电压时的数据处理方法 |
CN108536622A (zh) * | 2017-03-06 | 2018-09-14 | 爱思开海力士有限公司 | 存储装置、数据处理系统以及操作存储装置的方法 |
CN108536622B (zh) * | 2017-03-06 | 2023-07-21 | 爱思开海力士有限公司 | 存储装置、数据处理系统以及操作存储装置的方法 |
CN106683703A (zh) * | 2017-03-15 | 2017-05-17 | 珠海格力电器股份有限公司 | 一种数据读取方法、集成电路及芯片 |
CN106683703B (zh) * | 2017-03-15 | 2023-09-15 | 珠海零边界集成电路有限公司 | 一种数据读取方法、集成电路及芯片 |
CN109117391A (zh) * | 2017-06-22 | 2019-01-01 | 旺宏电子股份有限公司 | 用于存储器系统的控制器 |
CN109192234A (zh) * | 2018-07-13 | 2019-01-11 | 上海移远通信技术股份有限公司 | 一种保护电路及通信模块 |
Also Published As
Publication number | Publication date |
---|---|
JP4938893B2 (ja) | 2012-05-23 |
EP2183749B1 (en) | 2013-05-29 |
CN101802923B (zh) | 2014-09-03 |
KR101070601B1 (ko) | 2011-10-06 |
JP2010536098A (ja) | 2010-11-25 |
EP2183749A1 (en) | 2010-05-12 |
EP2183749A4 (en) | 2010-08-04 |
WO2009020845A1 (en) | 2009-02-12 |
KR20100029268A (ko) | 2010-03-16 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
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ASS | Succession or assignment of patent right |
Owner name: SANDISK CORPORATION Free format text: FORMER OWNER: SANDISK CORP. Effective date: 20140811 |
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C14 | Grant of patent or utility model | ||
C41 | Transfer of patent application or patent right or utility model | ||
GR01 | Patent grant | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20140811 Address after: American Texas Applicant after: Sandisk Corp. Address before: American California Applicant before: Sandisk Corp. |
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CP03 | Change of name, title or address |
Address after: texas Patentee after: DELPHI INT OPERATIONS LUX SRL Address before: American Texas Patentee before: Sandisk Corp. |