CN101783664B - 电源电压监视电路以及具有电源电压监视电路的电子电路 - Google Patents

电源电压监视电路以及具有电源电压监视电路的电子电路 Download PDF

Info

Publication number
CN101783664B
CN101783664B CN2010100039107A CN201010003910A CN101783664B CN 101783664 B CN101783664 B CN 101783664B CN 2010100039107 A CN2010100039107 A CN 2010100039107A CN 201010003910 A CN201010003910 A CN 201010003910A CN 101783664 B CN101783664 B CN 101783664B
Authority
CN
China
Prior art keywords
circuit
signal
voltage
supply voltage
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2010100039107A
Other languages
English (en)
Chinese (zh)
Other versions
CN101783664A (zh
Inventor
杉浦正一
五十岚敦史
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ablic Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Publication of CN101783664A publication Critical patent/CN101783664A/zh
Application granted granted Critical
Publication of CN101783664B publication Critical patent/CN101783664B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0008—Arrangements for reducing power consumption

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Electronic Switches (AREA)
CN2010100039107A 2009-01-13 2010-01-13 电源电压监视电路以及具有电源电压监视电路的电子电路 Expired - Fee Related CN101783664B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009005214A JP4636461B2 (ja) 2009-01-13 2009-01-13 電源電圧監視回路、および該電源電圧監視回路を備える電子回路
JP2009-005214 2009-01-13

Publications (2)

Publication Number Publication Date
CN101783664A CN101783664A (zh) 2010-07-21
CN101783664B true CN101783664B (zh) 2013-09-25

Family

ID=42318604

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010100039107A Expired - Fee Related CN101783664B (zh) 2009-01-13 2010-01-13 电源电压监视电路以及具有电源电压监视电路的电子电路

Country Status (5)

Country Link
US (1) US8604821B2 (enExample)
JP (1) JP4636461B2 (enExample)
KR (1) KR101372795B1 (enExample)
CN (1) CN101783664B (enExample)
TW (1) TWI517573B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102486517B (zh) * 2010-12-01 2015-11-25 中国电力科学研究院 冲击电压复合的高压直流输电换流阀故障电流试验方法
JP5754343B2 (ja) * 2011-10-25 2015-07-29 ミツミ電機株式会社 低電圧検出回路
US9086434B1 (en) * 2011-12-06 2015-07-21 Altera Corporation Methods and systems for voltage reference power detection
JP2015211345A (ja) * 2014-04-25 2015-11-24 セイコーインスツル株式会社 電源電圧監視回路、および該電源電圧監視回路を備える電子回路
JP6436728B2 (ja) * 2014-11-11 2018-12-12 エイブリック株式会社 温度検出回路及び半導体装置
KR101742875B1 (ko) 2015-06-18 2017-06-01 인하대학교 산학협력단 고 임피던스 전류 보정 회로를 갖는 테스트 보드용 엑티브 로드
US9927317B2 (en) 2015-07-09 2018-03-27 Mks Instruments, Inc. Ionization pressure gauge with bias voltage and emission current control and measurement
CN105141119B (zh) * 2015-10-10 2018-01-05 上海灿瑞科技股份有限公司 一种上电清零和欠压锁定启动电路
CN109379065B (zh) * 2018-11-30 2023-11-10 上海艾为电子技术股份有限公司 电压检测电路、过压保护开关及电子设备
KR102699879B1 (ko) * 2019-12-06 2024-08-29 삼성전기주식회사 홀 센서 출력단자 전압 감시 회로 및 렌즈 모듈 구동 제어기 지원 회로

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001127594A (ja) * 1999-10-25 2001-05-11 Seiko Instruments Inc ラッチ回路
JP2001147725A (ja) * 1999-11-22 2001-05-29 Nec Ic Microcomput Syst Ltd バンドギャップレファレンス回路
US7138851B2 (en) * 2002-10-21 2006-11-21 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit apparatus
CN101247087A (zh) * 2007-02-17 2008-08-20 精工电子有限公司 电流检测电路以及电流方式型开关调节器

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02108323A (ja) * 1988-10-18 1990-04-20 Sanyo Electric Co Ltd 混成集積回路
JPH04181810A (ja) * 1990-11-15 1992-06-29 Mitsubishi Electric Corp 半導体装置
JPH06213941A (ja) * 1993-01-14 1994-08-05 Sharp Corp 外部電源電圧検知回路
JPH08279739A (ja) 1995-04-06 1996-10-22 Fuji Electric Co Ltd 電子回路用動作指令の制御回路
JP3817446B2 (ja) * 2001-02-15 2006-09-06 株式会社リコー 電源回路及びｄｃ−ｄｃコンバータの出力電圧制御方法
US6970334B1 (en) * 2003-09-09 2005-11-29 National Semiconductor Corporation Power regulation loop performs two functions
US7148742B2 (en) * 2004-07-07 2006-12-12 Micron Technology, Inc. Power supply voltage detection circuitry and methods for use of the same
JP4660160B2 (ja) * 2004-10-28 2011-03-30 Ｏｋｉセミコンダクタ株式会社 リセット回路
JP2006217544A (ja) * 2005-02-07 2006-08-17 Sanyo Electric Co Ltd 発振器
JP4896472B2 (ja) * 2005-09-12 2012-03-14 株式会社リコー パワーオンリセット回路
CN1959595A (zh) * 2005-11-04 2007-05-09 鸿富锦精密工业（深圳）有限公司 计算机系统复位电路
JP5090202B2 (ja) * 2008-02-19 2012-12-05 株式会社リコー 電源回路
US8339188B1 (en) * 2008-07-01 2012-12-25 Cypress Semiconductor Corporation Floating gate reference for sleep/hibernate regulator
JP5283078B2 (ja) * 2009-01-13 2013-09-04 セイコーインスツル株式会社 検出回路及びセンサ装置
JP2012108087A (ja) * 2010-10-28 2012-06-07 Seiko Instruments Inc 温度検知装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001127594A (ja) * 1999-10-25 2001-05-11 Seiko Instruments Inc ラッチ回路
JP2001147725A (ja) * 1999-11-22 2001-05-29 Nec Ic Microcomput Syst Ltd バンドギャップレファレンス回路
US7138851B2 (en) * 2002-10-21 2006-11-21 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit apparatus
CN101247087A (zh) * 2007-02-17 2008-08-20 精工电子有限公司 电流检测电路以及电流方式型开关调节器

Also Published As

Publication number Publication date
CN101783664A (zh) 2010-07-21
TW201041300A (en) 2010-11-16
KR101372795B1 (ko) 2014-03-10
TWI517573B (zh) 2016-01-11
JP2010166184A (ja) 2010-07-29
JP4636461B2 (ja) 2011-02-23
KR20100083728A (ko) 2010-07-22
US20100176839A1 (en) 2010-07-15
US8604821B2 (en) 2013-12-10

Similar Documents

Publication Publication Date Title
CN101783664B (zh) 电源电压监视电路以及具有电源电压监视电路的电子电路
JP2008219486A (ja) パワーオン検知回路
US10591947B2 (en) Power supply voltage monitoring circuit
US9819173B2 (en) Overheat protection circuit and voltage regulator
CN103762965B (zh) 检测电路和传感器装置
US20150042386A1 (en) Highly accurate power-on reset circuit with least delay
JP2004350290A (ja) バンドギャップ電圧基準発生器回路、熱検知回路、及び集積回路
CN101105414A (zh) 用以产生一感测信号的温度感测装置及其方法
TWI651609B (zh) 低電壓鎖定電路及其整合參考電壓產生電路之裝置
US11061426B2 (en) Voltage reference circuit with combined power-on reset
JP5272467B2 (ja) 基準電圧発生回路およびリセット回路を内蔵した半導体集積回路
JP6476049B2 (ja) 温度センサ回路
JP6658269B2 (ja) 過電流検出回路
JP5353490B2 (ja) 半導体装置
TWI686030B (zh) 過熱檢測電路以及電源裝置
CN113424447A (zh) 温度变化时开关电平精度提高的上电复位电路的阈值检测器
JP4029757B2 (ja) ヒステリシス付コンパレータ
JP5817306B2 (ja) 電源電圧検出回路
KR20150049142A (ko) 기준 전압 발생 회로
US20190288501A1 (en) Semiconductor integrated circuit
JP4970200B2 (ja) 電圧検出回路
JP7776762B2 (ja) 基準電圧発生回路及び半導体集積回路
JP4230205B2 (ja) 温度判定回路
JP2008085541A (ja) 電圧レベル検出回路およびそれを用いたパワーオンリセット回路
TWI267902B (en) Current sensing circuit compatible to CMOS manufacturing process

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C41 Transfer of patent application or patent right or utility model
TR01 Transfer of patent right

Effective date of registration: 20160318

Address after: Chiba County, Japan

Patentee after: DynaFine Semiconductor Co.,Ltd.

Address before: Chiba County, Japan

Patentee before: Seiko Instruments Inc.

CP01 Change in the name or title of a patent holder
CP01 Change in the name or title of a patent holder

Address after: Chiba County, Japan

Patentee after: ABLIC Inc.

Address before: Chiba County, Japan

Patentee before: DynaFine Semiconductor Co.,Ltd.

CP02 Change in the address of a patent holder
CP02 Change in the address of a patent holder

Address after: Nagano

Patentee after: ABLIC Inc.

Address before: Chiba County, Japan

Patentee before: ABLIC Inc.

CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130925