CN101553962B - 形成在单个薄片上的半导体激光器谐振腔 - Google Patents
形成在单个薄片上的半导体激光器谐振腔 Download PDFInfo
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- CN101553962B CN101553962B CN2006800393451A CN200680039345A CN101553962B CN 101553962 B CN101553962 B CN 101553962B CN 2006800393451 A CN2006800393451 A CN 2006800393451A CN 200680039345 A CN200680039345 A CN 200680039345A CN 101553962 B CN101553962 B CN 101553962B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0206—Substrates, e.g. growth, shape, material, removal or bonding
- H01S5/0207—Substrates having a special shape
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
- G11B7/125—Optical beam sources therefor, e.g. laser control circuitry specially adapted for optical storage devices; Modulators, e.g. means for controlling the size or intensity of optical spots or optical traces
- G11B7/127—Lasers; Multiple laser arrays
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
- G11B7/22—Apparatus or processes for the manufacture of optical heads, e.g. assembly
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/185—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only horizontal cavities, e.g. horizontal cavity surface-emitting lasers [HCSEL]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/18—Semiconductor lasers with special structural design for influencing the near- or far-field
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
- H01S5/0042—On wafer testing, e.g. lasers are tested before separating wafer into chips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0201—Separation of the wafer into individual elements, e.g. by dicing, cleaving, etching or directly during growth
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/1039—Details on the cavity length
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
- H01S5/32341—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
- H01S5/4031—Edge-emitting structures
- H01S5/4056—Edge-emitting structures emitting light in more than one direction
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US71088205P | 2005-08-25 | 2005-08-25 | |
| US60/710,882 | 2005-08-25 | ||
| PCT/US2006/033058 WO2007025032A2 (en) | 2005-08-25 | 2006-08-24 | Semiconductor laser cavity formed on singulated chip |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010537742XA Division CN102013631B (zh) | 2005-08-25 | 2006-08-24 | 形成在单个薄片上的半导体激光器谐振腔 |
| CN2010105377059A Division CN102035135B (zh) | 2005-08-25 | 2006-08-24 | 形成在单个薄片上的半导体激光器谐振腔 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101553962A CN101553962A (zh) | 2009-10-07 |
| CN101553962B true CN101553962B (zh) | 2012-07-04 |
Family
ID=37772379
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2006800393451A Active CN101553962B (zh) | 2005-08-25 | 2006-08-24 | 形成在单个薄片上的半导体激光器谐振腔 |
| CN201010537742XA Active CN102013631B (zh) | 2005-08-25 | 2006-08-24 | 形成在单个薄片上的半导体激光器谐振腔 |
| CN2010105377059A Active CN102035135B (zh) | 2005-08-25 | 2006-08-24 | 形成在单个薄片上的半导体激光器谐振腔 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010537742XA Active CN102013631B (zh) | 2005-08-25 | 2006-08-24 | 形成在单个薄片上的半导体激光器谐振腔 |
| CN2010105377059A Active CN102035135B (zh) | 2005-08-25 | 2006-08-24 | 形成在单个薄片上的半导体激光器谐振腔 |
Country Status (5)
| Country | Link |
|---|---|
| US (4) | US7408183B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP1917687A2 (cg-RX-API-DMAC7.html) |
| JP (2) | JP5624720B2 (cg-RX-API-DMAC7.html) |
| CN (3) | CN101553962B (cg-RX-API-DMAC7.html) |
| WO (1) | WO2007025032A2 (cg-RX-API-DMAC7.html) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7667645B2 (en) | 2006-05-25 | 2010-02-23 | The Boeing Company | GPS gyro calibration |
| USD580890S1 (en) * | 2007-02-09 | 2008-11-18 | Panasonic Corporation | Light source of light-emitting diode |
| USD580889S1 (en) * | 2007-02-09 | 2008-11-18 | Panasonic Corporation | Light source of light-emitting diode |
| USD586764S1 (en) * | 2007-02-09 | 2009-02-17 | Panasonic Corporation | Light source of light-emitting diode |
| USD580377S1 (en) * | 2007-02-09 | 2008-11-11 | Panasonic Corporation | Light source of light-emitting diode |
| US8064493B2 (en) | 2009-06-12 | 2011-11-22 | Binoptics Corporation | Surface emitting photonic device |
| EP2643907A4 (en) * | 2010-10-25 | 2017-12-06 | MACOM Technology Solutions Holdings, Inc. | Long semiconductor laser cavity in a compact chip |
| US8934512B2 (en) * | 2011-12-08 | 2015-01-13 | Binoptics Corporation | Edge-emitting etched-facet lasers |
| EP4228109A3 (en) * | 2012-05-08 | 2023-10-25 | MACOM Technology Solutions Holdings, Inc. | Lasers with beam-shape modification |
| US10852492B1 (en) * | 2014-10-29 | 2020-12-01 | Acacia Communications, Inc. | Techniques to combine two integrated photonic substrates |
| US11025029B2 (en) * | 2015-07-09 | 2021-06-01 | International Business Machines Corporation | Monolithic III-V nanolaser on silicon with blanket growth |
| US10170455B2 (en) | 2015-09-04 | 2019-01-01 | PlayNitride Inc. | Light emitting device with buffer pads |
| TWI552385B (zh) * | 2015-09-04 | 2016-10-01 | 錼創科技股份有限公司 | 發光元件 |
| CN105826813B (zh) * | 2016-05-06 | 2019-02-05 | 华中科技大学 | 一种基于高阶表面光栅的单模激光器 |
| USD825148S1 (en) * | 2016-06-08 | 2018-08-14 | Troy Horning | Clothing accessory to prevent slippage |
| US9964702B1 (en) * | 2016-10-13 | 2018-05-08 | Oracle International Corporation | Surface-normal optical coupling interface with thermal-optic coefficient compensation |
| KR101929465B1 (ko) * | 2016-10-18 | 2019-03-14 | 주식회사 옵텔라 | 광학모듈 |
| CN110178275B (zh) * | 2017-01-19 | 2021-01-22 | 三菱电机株式会社 | 半导体激光元件、半导体激光元件的制造方法 |
| JP6394832B1 (ja) * | 2017-11-17 | 2018-09-26 | 三菱電機株式会社 | 半導体レーザ装置 |
| DE102018111319A1 (de) * | 2018-05-11 | 2019-11-14 | Osram Opto Semiconductors Gmbh | Optoelektronisches Halbleiterbauelement und Verfahren zur Herstellung eines optoelektronischen Halbleiterbauelements |
| US11011424B2 (en) * | 2019-08-06 | 2021-05-18 | Applied Materials, Inc. | Hybrid wafer dicing approach using a spatially multi-focused laser beam laser scribing process and plasma etch process |
| US20210313760A1 (en) * | 2020-04-06 | 2021-10-07 | Asahi Kasei Kabushiki Kaisha | Method for manufacturing semiconductor laser diode and semiconductor laser diode |
| CN117008087B (zh) * | 2022-04-29 | 2024-11-05 | 深圳市速腾聚创科技有限公司 | 基于平面波导芯片的光收发装置及激光雷达 |
| CN119596480A (zh) * | 2023-09-11 | 2025-03-11 | 华为技术有限公司 | 一种封装结构、光模块和光通信设备 |
Citations (1)
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| US6222206B1 (en) * | 1998-06-25 | 2001-04-24 | Lucent Technologies Inc | Wafer having top and bottom emitting vertical-cavity lasers |
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| JPS61111592A (ja) * | 1984-07-25 | 1986-05-29 | Hitachi Tobu Semiconductor Ltd | 発光素子および発光素子を組み込んだ光電子装置 |
| JPS6140080A (ja) * | 1984-08-01 | 1986-02-26 | Matsushita Electric Ind Co Ltd | 半導体レ−ザ−装置 |
| JPH07335987A (ja) * | 1994-06-14 | 1995-12-22 | Sony Corp | Ii−vi族化合物半導体発光素子の製法 |
| JPH09237940A (ja) * | 1995-12-28 | 1997-09-09 | Mitsubishi Electric Corp | 半導体装置,及びその製造方法 |
| JP3218980B2 (ja) * | 1996-07-02 | 2001-10-15 | 日亜化学工業株式会社 | 2次元レーザアレー |
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| JP4438101B2 (ja) * | 1997-12-12 | 2010-03-24 | ソニー株式会社 | 光ディスクの記録/再生方法、光ディスク及び光ディスク装置 |
| US6002703A (en) * | 1998-01-28 | 1999-12-14 | University Of Utah Research Foundation | Gaussian profile promoting cavity for semiconductor laser |
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| JP3319585B2 (ja) * | 1998-06-16 | 2002-09-03 | 日亜化学工業株式会社 | 窒化物半導体レーザ素子の製造方法 |
| US6744800B1 (en) * | 1998-12-30 | 2004-06-01 | Xerox Corporation | Method and structure for nitride based laser diode arrays on an insulating substrate |
| US6324204B1 (en) * | 1999-10-19 | 2001-11-27 | Sparkolor Corporation | Channel-switched tunable laser for DWDM communications |
| JP3623713B2 (ja) * | 2000-03-24 | 2005-02-23 | 日本電気株式会社 | 窒化物半導体発光素子 |
| US6611544B1 (en) * | 2000-04-11 | 2003-08-26 | E20 Communications, Inc. | Method and apparatus for narrow bandwidth distributed bragg reflector semiconductor lasers |
| JP2001339121A (ja) * | 2000-05-29 | 2001-12-07 | Sharp Corp | 窒化物半導体発光素子とそれを含む光学装置 |
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| US6912237B2 (en) * | 2001-02-06 | 2005-06-28 | The Furukawa Electric Co., Ltd. | Semiconductor laser module and semiconductor laser device having light feedback function |
| JP2002335049A (ja) * | 2001-05-09 | 2002-11-22 | Nichia Chem Ind Ltd | 窒化ガリウム系素子用半導体基板 |
| WO2003085790A1 (fr) * | 2002-04-04 | 2003-10-16 | Sharp Kabushiki Kaisha | Dispositif laser a semi-conducteur |
| JP2004071657A (ja) * | 2002-08-01 | 2004-03-04 | Nec Corp | Iii族窒化物半導体素子、iii族窒化物半導体基板およびiii族窒化物半導体素子の製造方法 |
| US7462882B2 (en) * | 2003-04-24 | 2008-12-09 | Sharp Kabushiki Kaisha | Nitride semiconductor light-emitting device, method of fabricating it, and semiconductor optical apparatus |
| US7211873B2 (en) * | 2003-09-24 | 2007-05-01 | Denso Corporation | Sensor device having thin membrane and method of manufacturing the same |
| JP4800974B2 (ja) * | 2004-01-20 | 2011-10-26 | ビノプティクス・コーポレイション | 光装置および単一チップ上に双方向光動作用の統合されたレーザおよび検出器を製造する方法 |
| JP4830315B2 (ja) * | 2004-03-05 | 2011-12-07 | 日亜化学工業株式会社 | 半導体レーザ素子 |
| JP4322187B2 (ja) * | 2004-08-19 | 2009-08-26 | シャープ株式会社 | 窒化物半導体発光素子 |
-
2006
- 2006-08-24 CN CN2006800393451A patent/CN101553962B/zh active Active
- 2006-08-24 US US11/509,015 patent/US7408183B2/en active Active
- 2006-08-24 CN CN201010537742XA patent/CN102013631B/zh active Active
- 2006-08-24 WO PCT/US2006/033058 patent/WO2007025032A2/en not_active Ceased
- 2006-08-24 JP JP2008528144A patent/JP5624720B2/ja active Active
- 2006-08-24 EP EP06802250A patent/EP1917687A2/en not_active Withdrawn
- 2006-08-24 CN CN2010105377059A patent/CN102035135B/zh active Active
-
2008
- 2008-07-10 US US12/171,286 patent/US7830939B2/en active Active
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2009
- 2009-12-15 US US12/637,893 patent/US20100091809A1/en not_active Abandoned
- 2009-12-15 US US12/637,959 patent/US8290012B2/en active Active
-
2011
- 2011-09-07 JP JP2011195170A patent/JP2012015542A/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6222206B1 (en) * | 1998-06-25 | 2001-04-24 | Lucent Technologies Inc | Wafer having top and bottom emitting vertical-cavity lasers |
Also Published As
| Publication number | Publication date |
|---|---|
| US8290012B2 (en) | 2012-10-16 |
| JP2012015542A (ja) | 2012-01-19 |
| US7408183B2 (en) | 2008-08-05 |
| US20100091811A1 (en) | 2010-04-15 |
| US20080298413A1 (en) | 2008-12-04 |
| US20070045637A1 (en) | 2007-03-01 |
| EP1917687A2 (en) | 2008-05-07 |
| WO2007025032A2 (en) | 2007-03-01 |
| CN102013631B (zh) | 2012-07-04 |
| CN101553962A (zh) | 2009-10-07 |
| US20100091809A1 (en) | 2010-04-15 |
| CN102035135A (zh) | 2011-04-27 |
| US7830939B2 (en) | 2010-11-09 |
| CN102035135B (zh) | 2013-02-27 |
| WO2007025032A3 (en) | 2009-05-07 |
| JP2009506550A (ja) | 2009-02-12 |
| JP5624720B2 (ja) | 2014-11-12 |
| CN102013631A (zh) | 2011-04-13 |
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