CN101359720B - 有机晶体管及有源矩阵基板 - Google Patents

有机晶体管及有源矩阵基板 Download PDF

Info

Publication number
CN101359720B
CN101359720B CN2008101280748A CN200810128074A CN101359720B CN 101359720 B CN101359720 B CN 101359720B CN 2008101280748 A CN2008101280748 A CN 2008101280748A CN 200810128074 A CN200810128074 A CN 200810128074A CN 101359720 B CN101359720 B CN 101359720B
Authority
CN
China
Prior art keywords
aforementioned
gate electrode
wiring portion
electrode
drain electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN2008101280748A
Other languages
English (en)
Chinese (zh)
Other versions
CN101359720A (zh
Inventor
青木敬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
E Ink Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of CN101359720A publication Critical patent/CN101359720A/zh
Application granted granted Critical
Publication of CN101359720B publication Critical patent/CN101359720B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K19/00Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00
    • H10K19/10Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00 comprising field-effect transistors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/80Constructional details
    • H10K10/82Electrodes
    • H10K10/84Ohmic electrodes, e.g. source or drain electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/464Lateral top-gate IGFETs comprising only a single gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/466Lateral bottom-gate IGFETs comprising only a single gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/10Organic polymers or oligomers
    • H10K85/111Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
    • H10K85/113Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene

Landscapes

  • Thin Film Transistor (AREA)
  • Liquid Crystal (AREA)
  • Electroluminescent Light Sources (AREA)
  • Electrodes Of Semiconductors (AREA)
CN2008101280748A 2007-07-30 2008-07-29 有机晶体管及有源矩阵基板 Active CN101359720B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007197350A JP5200443B2 (ja) 2007-07-30 2007-07-30 有機トランジスタ及びアクティブマトリックス基板
JP197350/2007 2007-07-30

Publications (2)

Publication Number Publication Date
CN101359720A CN101359720A (zh) 2009-02-04
CN101359720B true CN101359720B (zh) 2012-01-04

Family

ID=40332109

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2008101280748A Active CN101359720B (zh) 2007-07-30 2008-07-29 有机晶体管及有源矩阵基板

Country Status (3)

Country Link
US (1) US7595505B2 (https=)
JP (1) JP5200443B2 (https=)
CN (1) CN101359720B (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002215065A (ja) * 2000-11-02 2002-07-31 Seiko Epson Corp 有機エレクトロルミネッセンス装置及びその製造方法、並びに電子機器
JP5742099B2 (ja) * 2010-02-19 2015-07-01 セイコーエプソン株式会社 半導体装置、半導体装置の製造方法、及び電子機器
CN102280580A (zh) * 2011-07-15 2011-12-14 中国科学院苏州纳米技术与纳米仿生研究所 有机薄膜晶体管及其制备方法
JP2013048680A (ja) * 2011-08-30 2013-03-14 Gc Corp 咬合圧測定器、咬合圧測定システム
JP5875880B2 (ja) * 2012-01-31 2016-03-02 シチズンホールディングス株式会社 有機トランジスタ
JP2014096454A (ja) * 2012-11-08 2014-05-22 Tokyo Electron Ltd 有機半導体素子の製造方法、絶縁膜の形成方法、及び溶液
JP6357663B2 (ja) * 2013-09-06 2018-07-18 株式会社Joled 表示装置
CN105140293B (zh) * 2015-08-10 2018-03-27 京东方科技集团股份有限公司 薄膜晶体管、goa栅极驱动电路、阵列基板和显示装置
CN105552132B (zh) * 2016-02-04 2018-11-13 京东方科技集团股份有限公司 薄膜晶体管传感器及其制备方法
CN105977380A (zh) * 2016-06-17 2016-09-28 国家纳米科学中心 有机场效应晶体管及制备方法、电子电路
JP6945836B2 (ja) * 2017-03-17 2021-10-06 株式会社ホタルクス 電界効果トランジスタおよび電子装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1577913A (zh) * 2003-07-07 2005-02-09 精工爱普生株式会社 有机薄膜晶体管及其制造方法
CN1702877A (zh) * 2003-07-17 2005-11-30 精工爱普生株式会社 薄膜晶体管及其制造方法、电路、显示装置和电子机器
CN1790766A (zh) * 2004-11-05 2006-06-21 精工爱普生株式会社 电子器件、电子器件的制造方法以及电子设备

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4368007B2 (ja) * 1999-07-30 2009-11-18 カシオ計算機株式会社 薄膜トランジスタパネル
JP2004538618A (ja) * 1999-10-11 2004-12-24 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 集積回路
GB0112563D0 (en) * 2001-05-23 2001-07-18 Koninl Philips Electronics Nv Active plate
KR20040052226A (ko) * 2001-10-11 2004-06-22 코닌클리즈케 필립스 일렉트로닉스 엔.브이. 전자 장치 및 전자 장치의 제조 방법
CN1650225A (zh) 2002-04-26 2005-08-03 皇家飞利浦电子股份有限公司 有源矩阵显示装置
GB2388709A (en) * 2002-05-17 2003-11-19 Seiko Epson Corp Circuit fabrication method
US6821811B2 (en) * 2002-08-02 2004-11-23 Semiconductor Energy Laboratory Co., Ltd. Organic thin film transistor and method of manufacturing the same, and semiconductor device having the organic thin film transistor
TWI256732B (en) * 2002-08-30 2006-06-11 Sharp Kk Thin film transistor, liquid crystal display apparatus, manufacturing method of thin film transistor, and manufacturing method of liquid crystal display apparatus
JP2005084416A (ja) * 2003-09-09 2005-03-31 Sharp Corp アクティブマトリクス基板およびそれを用いた表示装置
KR101186966B1 (ko) * 2004-11-09 2012-10-02 코닌클리케 필립스 일렉트로닉스 엔.브이. 유기 트랜지스터를 제조하기 위한 자체-정렬 공정
KR101097920B1 (ko) * 2004-12-10 2011-12-23 삼성전자주식회사 광 센서와, 이를 구비한 표시 패널 및 표시 장치
JP4686232B2 (ja) 2005-03-30 2011-05-25 セイコーエプソン株式会社 半導体装置及び半導体装置の製造方法
JP2006294653A (ja) * 2005-04-05 2006-10-26 Canon Inc 有機薄膜トランジスタおよびその製造方法
JP5194468B2 (ja) * 2006-03-07 2013-05-08 コニカミノルタホールディングス株式会社 有機薄膜トランジスタの製造方法及び有機薄膜トランジスタ
JP2007305802A (ja) * 2006-05-11 2007-11-22 Seiko Epson Corp 半導体装置、電気光学装置、電子機器及び半導体装置の製造方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1577913A (zh) * 2003-07-07 2005-02-09 精工爱普生株式会社 有机薄膜晶体管及其制造方法
CN1702877A (zh) * 2003-07-17 2005-11-30 精工爱普生株式会社 薄膜晶体管及其制造方法、电路、显示装置和电子机器
CN1790766A (zh) * 2004-11-05 2006-06-21 精工爱普生株式会社 电子器件、电子器件的制造方法以及电子设备

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JP特开2007-129007A 2007.05.24

Also Published As

Publication number Publication date
US20090032810A1 (en) 2009-02-05
US7595505B2 (en) 2009-09-29
JP5200443B2 (ja) 2013-06-05
CN101359720A (zh) 2009-02-04
JP2009033020A (ja) 2009-02-12

Similar Documents

Publication Publication Date Title
CN101359720B (zh) 有机晶体管及有源矩阵基板
JP5376287B2 (ja) 回路基板、電気光学装置、電子機器
JP4946286B2 (ja) 薄膜トランジスタアレイ、それを用いた画像表示装置およびその駆動方法
US7504709B2 (en) Electronic device, method of manufacturing an electronic device, and electronic apparatus
US20080036698A1 (en) Display
US20080230778A1 (en) Method for manufacturing an organic semiconductor device, as well as organic semiconductor device, electronic device, and electronic apparatus
JP2008235861A (ja) 薄膜トランジスタアレイ、薄膜トランジスタアレイの製造方法、および薄膜トランジスタアレイを用いたアクティブマトリクス型ディスプレイ
CN101582391B (zh) 图样形成方法、半导体装置制造方法以及显示器制造方法
JP5439723B2 (ja) 薄膜トランジスタ、マトリクス基板、電気泳動表示装置および電子機器
JP5396709B2 (ja) 薄膜トランジスタ、電気光学装置および電子機器
JP4408903B2 (ja) トランジスタ、トランジスタ回路、電気光学装置および電子機器
CN101262042B (zh) 有机晶体管、其制造方法及电子设备
CN103855085A (zh) 薄膜器件、薄膜器件制造方法和显示器制造方法
US20080076204A1 (en) Method for manufacturing a thin film transistor array panel
JP2010224403A (ja) アクティブマトリックス基板の製造方法、アクティブマトリックス基板、電気光学装置、および電子機器
JP5671911B2 (ja) 薄膜トランジスタアレイ及び画像表示装置並びに薄膜トランジスタアレイの製造方法
US7759676B2 (en) Thin film transistor array panel having groups of proximately located thin film transistors and manufacturing method thereof
US8653527B2 (en) Thin film transistor and method for manufacturing the same
CN101123265A (zh) 薄膜晶体管阵列面板及其制造方法
JP5182603B2 (ja) 有機トランジスタ及び有機トランジスタの製造方法
JP2008102265A (ja) 電気泳動表示装置、電子機器、および電気泳動表示装置の製造方法
JP6331644B2 (ja) 薄膜トランジスタアレイおよびその製造方法
JP2010062241A (ja) 有機薄膜トランジスタの製造方法、有機薄膜トランジスタ素子及び表示装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20181102

Address after: Massachusetts, USA

Patentee after: E Ink Corp.

Address before: Tokyo, Japan, Japan

Patentee before: Seiko Epson Corp.