CN100466311C - 半导体发光元件 - Google Patents
半导体发光元件 Download PDFInfo
- Publication number
- CN100466311C CN100466311C CNB2006101375363A CN200610137536A CN100466311C CN 100466311 C CN100466311 C CN 100466311C CN B2006101375363 A CNB2006101375363 A CN B2006101375363A CN 200610137536 A CN200610137536 A CN 200610137536A CN 100466311 C CN100466311 C CN 100466311C
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- China
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- light
- emitting diode
- electric current
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 239000004065 semiconductor Substances 0.000 title description 6
- 239000000758 substrate Substances 0.000 claims abstract description 35
- 230000000903 blocking effect Effects 0.000 claims description 40
- 239000011248 coating agent Substances 0.000 claims description 6
- 238000000576 coating method Methods 0.000 claims description 6
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 4
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 239000002131 composite material Substances 0.000 claims description 2
- 229910052737 gold Inorganic materials 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 238000005253 cladding Methods 0.000 abstract 4
- 235000012431 wafers Nutrition 0.000 description 19
- 238000009940 knitting Methods 0.000 description 16
- 238000000034 method Methods 0.000 description 14
- 238000001579 optical reflectometry Methods 0.000 description 11
- 238000009792 diffusion process Methods 0.000 description 6
- 238000001704 evaporation Methods 0.000 description 6
- 230000008020 evaporation Effects 0.000 description 6
- 238000009434 installation Methods 0.000 description 6
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 5
- 229910000679 solder Inorganic materials 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000003475 lamination Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 229910001316 Ag alloy Inorganic materials 0.000 description 3
- 238000005275 alloying Methods 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 3
- 238000000227 grinding Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 230000005764 inhibitory process Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000002310 reflectometry Methods 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 230000005587 bubbling Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 230000035611 feeding Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000011900 installation process Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/14—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a carrier transport control structure, e.g. highly-doped semiconductor layer or current-blocking structure
- H01L33/145—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a carrier transport control structure, e.g. highly-doped semiconductor layer or current-blocking structure with a current-blocking structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/14—Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0093—Wafer bonding; Removal of the growth substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/38—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
- H01L33/405—Reflective materials
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
Abstract
Description
Claims (9)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005369243 | 2005-12-22 | ||
JP2005369243A JP4655920B2 (ja) | 2005-12-22 | 2005-12-22 | 半導体発光素子 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008101743379A Division CN101399308B (zh) | 2005-12-22 | 2006-10-25 | 半导体发光元件 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1988195A CN1988195A (zh) | 2007-06-27 |
CN100466311C true CN100466311C (zh) | 2009-03-04 |
Family
ID=38184897
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008101743379A Expired - Fee Related CN101399308B (zh) | 2005-12-22 | 2006-10-25 | 半导体发光元件 |
CNB2006101375363A Expired - Fee Related CN100466311C (zh) | 2005-12-22 | 2006-10-25 | 半导体发光元件 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008101743379A Expired - Fee Related CN101399308B (zh) | 2005-12-22 | 2006-10-25 | 半导体发光元件 |
Country Status (3)
Country | Link |
---|---|
US (2) | US7728340B2 (zh) |
JP (1) | JP4655920B2 (zh) |
CN (2) | CN101399308B (zh) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007020291A1 (de) * | 2007-01-31 | 2008-08-07 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip und Verfahren zur Herstellung einer Kontaktstruktur für einen derartigen Chip |
JP4770785B2 (ja) * | 2007-04-25 | 2011-09-14 | 日立電線株式会社 | 発光ダイオード |
JP5223102B2 (ja) | 2007-08-08 | 2013-06-26 | 豊田合成株式会社 | フリップチップ型発光素子 |
JP5236924B2 (ja) * | 2007-10-11 | 2013-07-17 | ローム株式会社 | 半導体発光素子およびその製造方法 |
KR101449005B1 (ko) | 2007-11-26 | 2014-10-08 | 엘지이노텍 주식회사 | 반도체 발광소자 및 그 제조방법 |
TWI370560B (en) * | 2007-12-14 | 2012-08-11 | Delta Electronics Inc | Light-emitting diode device and manufacturing method thereof |
CN102037575B (zh) * | 2008-03-27 | 2013-04-10 | 宋俊午 | 发光元件及其制造方法 |
KR101448153B1 (ko) * | 2008-06-25 | 2014-10-08 | 삼성전자주식회사 | 발광 다이오드용 멀티칩 패키지 및 멀티칩 패키지 방식의발광 다이오드 소자 |
CN102292834A (zh) * | 2008-12-15 | 2011-12-21 | 因西亚瓦(控股)有限公司 | 利用穿通效应的硅发光器件 |
TWI473292B (zh) * | 2008-12-15 | 2015-02-11 | Lextar Electronics Corp | 發光二極體晶片 |
TWI418060B (zh) * | 2008-12-26 | 2013-12-01 | Lextar Electronics Corp | 發光二極體晶片的製造方法 |
KR100999695B1 (ko) | 2009-02-16 | 2010-12-08 | 엘지이노텍 주식회사 | 반도체 발광소자 및 그 제조방법 |
KR101007140B1 (ko) * | 2009-07-28 | 2011-01-10 | 엘지이노텍 주식회사 | 발광 소자 |
CN102097559B (zh) * | 2009-12-09 | 2014-07-16 | 鸿富锦精密工业(深圳)有限公司 | 发光二极管及其制作方法 |
KR101047721B1 (ko) * | 2010-03-09 | 2011-07-08 | 엘지이노텍 주식회사 | 발광 소자, 발광 소자 제조방법 및 발광 소자 패키지 |
JP2011249510A (ja) * | 2010-05-26 | 2011-12-08 | Toshiba Corp | 発光素子 |
TWI452730B (zh) * | 2010-09-14 | 2014-09-11 | Formosa Epitaxy Inc | 發光二極體 |
CN102468377A (zh) * | 2010-11-23 | 2012-05-23 | 孙智江 | 一种提高电流扩展效应的led制作方法 |
JP2012248795A (ja) | 2011-05-31 | 2012-12-13 | Toshiba Corp | 半導体発光素子およびその製造方法 |
TWI462334B (zh) * | 2011-08-01 | 2014-11-21 | Lextar Electronics Corp | 發光二極體結構與其製造方法 |
US8564010B2 (en) * | 2011-08-04 | 2013-10-22 | Toshiba Techno Center Inc. | Distributed current blocking structures for light emitting diodes |
KR101861222B1 (ko) * | 2011-08-12 | 2018-05-28 | 서울바이오시스 주식회사 | 전극 연장부들을 갖는 발광 다이오드 |
US9490409B2 (en) * | 2011-10-24 | 2016-11-08 | Formosa Epitaxy Incorporation | Light emmiting diode chip |
TWI540753B (zh) | 2013-07-30 | 2016-07-01 | 隆達電子股份有限公司 | 發光二極體結構 |
CN103456853A (zh) * | 2013-08-15 | 2013-12-18 | 扬州中科半导体照明有限公司 | 一种白光led芯片及其生产方法 |
US9484492B2 (en) * | 2015-01-06 | 2016-11-01 | Apple Inc. | LED structures for reduced non-radiative sidewall recombination |
US9865772B2 (en) * | 2015-01-06 | 2018-01-09 | Apple Inc. | LED structures for reduced non-radiative sidewall recombination |
US9601659B2 (en) * | 2015-01-06 | 2017-03-21 | Apple Inc. | LED structures for reduced non-radiative sidewall recombination |
US10396241B1 (en) * | 2016-08-04 | 2019-08-27 | Apple Inc. | Diffusion revealed blocking junction |
TWI759289B (zh) * | 2017-03-21 | 2022-04-01 | 晶元光電股份有限公司 | 發光元件 |
CN107845711A (zh) * | 2017-11-03 | 2018-03-27 | 江苏新广联半导体有限公司 | 提升电流扩展均匀性的led倒装芯片及其制作方法 |
TWI657594B (zh) * | 2018-06-20 | 2019-04-21 | 友達光電股份有限公司 | 發光二極體 |
JP7130128B2 (ja) * | 2019-05-27 | 2022-09-02 | 三菱電機株式会社 | 光半導体装置 |
JP2020010056A (ja) * | 2019-09-11 | 2020-01-16 | 晶元光電股▲ふん▼有限公司Epistar Corporation | 半導体発光部品 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1045457A2 (en) * | 1999-04-15 | 2000-10-18 | Daido Tokushuko Kabushiki Kaisha | Quantum well type light-emitting diode |
CN1622349A (zh) * | 2003-11-28 | 2005-06-01 | 三星电子株式会社 | 倒装芯片发光二极管及其制造方法 |
CN2733598Y (zh) * | 2004-10-08 | 2005-10-12 | 炬鑫科技股份有限公司 | 氮化镓系发光二极管的垂直电极结构 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2543190B2 (ja) * | 1989-06-16 | 1996-10-16 | 松下電器産業株式会社 | 化合物半導体素子の製造方法 |
JP2837580B2 (ja) * | 1992-06-17 | 1998-12-16 | シャープ株式会社 | 発光ダイオード |
JP2937692B2 (ja) * | 1993-05-27 | 1999-08-23 | シャープ株式会社 | 半導体発光素子およびその製造方法 |
JPH07254732A (ja) * | 1994-03-15 | 1995-10-03 | Toshiba Corp | 半導体発光装置 |
JPH07263743A (ja) * | 1994-03-18 | 1995-10-13 | Hitachi Cable Ltd | 発光ダイオード |
JP3496512B2 (ja) * | 1997-06-30 | 2004-02-16 | 日亜化学工業株式会社 | 窒化物半導体素子 |
JP2001015798A (ja) * | 1999-06-29 | 2001-01-19 | Toshiba Corp | 半導体発光素子 |
JP3725382B2 (ja) | 1999-11-11 | 2005-12-07 | 株式会社東芝 | 半導体素子の製造方法および半導体発光素子の製造方法 |
JP2001223384A (ja) * | 2000-02-08 | 2001-08-17 | Toshiba Corp | 半導体発光素子 |
JP2002170986A (ja) * | 2000-11-29 | 2002-06-14 | Kyocera Corp | 半導体発光装置 |
JP4396055B2 (ja) * | 2001-05-22 | 2010-01-13 | 日立電線株式会社 | 発光ダイオードの製造方法 |
US6974688B2 (en) * | 2001-08-10 | 2005-12-13 | Cytokinetics, Inc. | Human smooth muscle myosin heavy chain |
JP4054631B2 (ja) * | 2001-09-13 | 2008-02-27 | シャープ株式会社 | 半導体発光素子およびその製造方法、ledランプ並びにled表示装置 |
JP2004047760A (ja) * | 2002-07-12 | 2004-02-12 | Hitachi Cable Ltd | 発光ダイオード用エピタキシャルウェハ及び発光ダイオード |
JP2004128452A (ja) * | 2002-07-31 | 2004-04-22 | Shin Etsu Handotai Co Ltd | 発光素子の製造方法及び発光素子 |
JP4062111B2 (ja) * | 2003-01-31 | 2008-03-19 | 信越半導体株式会社 | 発光素子の製造方法 |
US20050205886A1 (en) * | 2002-11-29 | 2005-09-22 | Sanken Electric Co., Ltd. | Gallium-containing light-emitting semiconductor device and method of fabrication |
US20040188696A1 (en) * | 2003-03-28 | 2004-09-30 | Gelcore, Llc | LED power package |
KR100571818B1 (ko) * | 2003-10-08 | 2006-04-17 | 삼성전자주식회사 | 질화물계 발광소자 및 그 제조방법 |
TWM255518U (en) * | 2004-04-23 | 2005-01-11 | Super Nova Optoelectronics Cor | Vertical electrode structure of Gallium Nitride based LED |
US7166483B2 (en) * | 2004-06-17 | 2007-01-23 | Tekcore Co., Ltd. | High brightness light-emitting device and manufacturing process of the light-emitting device |
JP4985260B2 (ja) * | 2007-09-18 | 2012-07-25 | 日立電線株式会社 | 発光装置 |
-
2005
- 2005-12-22 JP JP2005369243A patent/JP4655920B2/ja not_active Expired - Fee Related
-
2006
- 2006-07-12 US US11/484,603 patent/US7728340B2/en not_active Expired - Fee Related
- 2006-10-25 CN CN2008101743379A patent/CN101399308B/zh not_active Expired - Fee Related
- 2006-10-25 CN CNB2006101375363A patent/CN100466311C/zh not_active Expired - Fee Related
-
2010
- 2010-04-15 US US12/662,406 patent/US20100308301A1/en not_active Abandoned
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1045457A2 (en) * | 1999-04-15 | 2000-10-18 | Daido Tokushuko Kabushiki Kaisha | Quantum well type light-emitting diode |
CN1622349A (zh) * | 2003-11-28 | 2005-06-01 | 三星电子株式会社 | 倒装芯片发光二极管及其制造方法 |
CN2733598Y (zh) * | 2004-10-08 | 2005-10-12 | 炬鑫科技股份有限公司 | 氮化镓系发光二极管的垂直电极结构 |
Also Published As
Publication number | Publication date |
---|---|
US20100308301A1 (en) | 2010-12-09 |
JP4655920B2 (ja) | 2011-03-23 |
CN101399308A (zh) | 2009-04-01 |
CN101399308B (zh) | 2012-02-15 |
CN1988195A (zh) | 2007-06-27 |
US7728340B2 (en) | 2010-06-01 |
US20070145381A1 (en) | 2007-06-28 |
JP2007173530A (ja) | 2007-07-05 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: HITACHI METALS, LTD. Free format text: FORMER OWNER: HITACHI CABLE CO., LTD. Effective date: 20141217 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20141217 Address after: Tokyo, Japan, Japan Patentee after: Hitachi Metals Co., Ltd. Address before: Tokyo, Japan, Japan Patentee before: Hitachi Cable Co., Ltd. |
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ASS | Succession or assignment of patent right |
Owner name: SCIOCS COMPANY LIMITED Free format text: FORMER OWNER: HITACHI METALS, LTD. Effective date: 20150807 |
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C41 | Transfer of patent application or patent right or utility model | ||
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Effective date of registration: 20150807 Address after: Ibaraki Patentee after: Hitachi Cable Address before: Tokyo, Japan, Japan Patentee before: Hitachi Metals Co., Ltd. |
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C41 | Transfer of patent application or patent right or utility model | ||
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Effective date of registration: 20160315 Address after: Tokyo, Japan, Japan Patentee after: Sumitomo Chemical Co., Ltd. Address before: Ibaraki Patentee before: Hitachi Cable |
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CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090304 Termination date: 20171025 |