CN100433379C - 半导体发光元件及其制造方法 - Google Patents
半导体发光元件及其制造方法 Download PDFInfo
- Publication number
- CN100433379C CN100433379C CNB2005100529092A CN200510052909A CN100433379C CN 100433379 C CN100433379 C CN 100433379C CN B2005100529092 A CNB2005100529092 A CN B2005100529092A CN 200510052909 A CN200510052909 A CN 200510052909A CN 100433379 C CN100433379 C CN 100433379C
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- Prior art keywords
- layer
- main surface
- light
- ohmic contact
- semiconductor
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- 238000004519 manufacturing process Methods 0.000 title description 12
- 238000005389 semiconductor device fabrication Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 claims abstract description 226
- 229910052751 metal Inorganic materials 0.000 claims abstract description 48
- 239000002184 metal Substances 0.000 claims abstract description 48
- 230000000694 effects Effects 0.000 claims abstract description 17
- 238000009792 diffusion process Methods 0.000 claims description 27
- 229910045601 alloy Inorganic materials 0.000 claims description 26
- 239000000956 alloy Substances 0.000 claims description 26
- 150000001875 compounds Chemical class 0.000 claims description 18
- 229910052782 aluminium Inorganic materials 0.000 claims description 15
- 229910052737 gold Inorganic materials 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 13
- 229910052802 copper Inorganic materials 0.000 claims description 11
- 229910052707 ruthenium Inorganic materials 0.000 claims description 8
- 229910052759 nickel Inorganic materials 0.000 claims description 7
- 229910052804 chromium Inorganic materials 0.000 claims description 6
- 229910052741 iridium Inorganic materials 0.000 claims description 6
- 239000000203 mixture Substances 0.000 claims description 6
- 229910052762 osmium Inorganic materials 0.000 claims description 6
- 229910052763 palladium Inorganic materials 0.000 claims description 6
- 229910052697 platinum Inorganic materials 0.000 claims description 6
- 229910052709 silver Inorganic materials 0.000 claims description 6
- 229910052719 titanium Inorganic materials 0.000 claims description 6
- 229910052720 vanadium Inorganic materials 0.000 claims description 6
- 230000005641 tunneling Effects 0.000 claims description 5
- 229910052703 rhodium Inorganic materials 0.000 claims description 4
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 2
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 2
- 239000000758 substrate Substances 0.000 abstract description 53
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 11
- 229910052710 silicon Inorganic materials 0.000 abstract description 11
- 239000010703 silicon Substances 0.000 abstract description 11
- 238000005275 alloying Methods 0.000 abstract description 6
- 238000000605 extraction Methods 0.000 abstract description 5
- 239000010931 gold Substances 0.000 description 18
- 238000000034 method Methods 0.000 description 15
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 12
- 230000002093 peripheral effect Effects 0.000 description 12
- 239000012535 impurity Substances 0.000 description 10
- 239000010949 copper Substances 0.000 description 9
- 230000000903 blocking effect Effects 0.000 description 8
- 239000000126 substance Substances 0.000 description 8
- 238000005229 chemical vapour deposition Methods 0.000 description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 7
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 6
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 239000011651 chromium Substances 0.000 description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 230000001629 suppression Effects 0.000 description 5
- 239000010936 titanium Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 229910005540 GaP Inorganic materials 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 description 4
- 229910002601 GaN Inorganic materials 0.000 description 3
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 3
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 239000000395 magnesium oxide Substances 0.000 description 3
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 3
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 3
- 229910000480 nickel oxide Inorganic materials 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- 239000011787 zinc oxide Substances 0.000 description 3
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000005253 cladding Methods 0.000 description 2
- 230000031700 light absorption Effects 0.000 description 2
- 229910001092 metal group alloy Inorganic materials 0.000 description 2
- 150000004767 nitrides Chemical class 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 239000010944 silver (metal) Substances 0.000 description 2
- 238000003892 spreading Methods 0.000 description 2
- 229910001316 Ag alloy Inorganic materials 0.000 description 1
- 229910017083 AlN Inorganic materials 0.000 description 1
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 1
- GNRSAWUEBMWBQH-UHFFFAOYSA-N oxonickel Chemical compound [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000005610 quantum mechanics Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/822—Materials of the light-emitting regions
- H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/832—Electrodes characterised by their material
- H10H20/835—Reflective materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/816—Bodies having carrier transport control structures, e.g. highly-doped semiconductor layers or current-blocking structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/832—Electrodes characterised by their material
- H10H20/833—Transparent materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/84—Coatings, e.g. passivation layers or antireflective coatings
- H10H20/841—Reflective coatings, e.g. dielectric Bragg reflectors
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- Led Devices (AREA)
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004050378 | 2004-02-25 | ||
| JP50378/04 | 2004-02-25 | ||
| JP50378/2004 | 2004-02-25 | ||
| JP2004264342A JP2005277372A (ja) | 2004-02-25 | 2004-09-10 | 半導体発光素子及びその製造方法 |
| JP264342/04 | 2004-09-10 | ||
| JP264342/2004 | 2004-09-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1661826A CN1661826A (zh) | 2005-08-31 |
| CN100433379C true CN100433379C (zh) | 2008-11-12 |
Family
ID=34863533
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005100529092A Expired - Fee Related CN100433379C (zh) | 2004-02-25 | 2005-02-25 | 半导体发光元件及其制造方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7199401B2 (enExample) |
| JP (1) | JP2005277372A (enExample) |
| CN (1) | CN100433379C (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104393140A (zh) * | 2014-11-06 | 2015-03-04 | 中国科学院半导体研究所 | 一种高反射率的垂直结构发光二级管芯片及其制备方法 |
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| JP4960665B2 (ja) * | 2006-08-11 | 2012-06-27 | キヤノン株式会社 | 発光素子アレイ及び画像形成装置 |
| US7180099B2 (en) | 2002-11-11 | 2007-02-20 | Oki Data Corporation | Semiconductor apparatus with thin semiconductor film |
| US20080121918A1 (en) * | 2006-11-15 | 2008-05-29 | The Regents Of The University Of California | High light extraction efficiency sphere led |
| CN100375303C (zh) * | 2005-10-27 | 2008-03-12 | 晶能光电(江西)有限公司 | 含有金锗镍的欧姆电极、铟镓铝氮半导体发光元件及制造方法 |
| CN100388515C (zh) * | 2005-09-30 | 2008-05-14 | 晶能光电(江西)有限公司 | 半导体发光器件及其制造方法 |
| WO2007040295A1 (en) * | 2005-10-04 | 2007-04-12 | Seoul Opto Device Co., Ltd. | (al, ga, in)n-based compound semiconductor and method of fabricating the same |
| US8729580B2 (en) * | 2005-12-06 | 2014-05-20 | Toshiba Techno Center, Inc. | Light emitter with metal-oxide coating |
| KR100845037B1 (ko) * | 2006-08-02 | 2008-07-09 | 포항공과대학교 산학협력단 | 오믹 전극 및 그 형성 방법, 이를 구비하는 반도체 발광소자 |
| US7439548B2 (en) * | 2006-08-11 | 2008-10-21 | Bridgelux, Inc | Surface mountable chip |
| JP4967580B2 (ja) * | 2006-10-11 | 2012-07-04 | サンケン電気株式会社 | 半導体発光素子及びその製造方法 |
| TW200830593A (en) * | 2006-11-15 | 2008-07-16 | Univ California | Transparent mirrorless light emitting diode |
| EP2843716A3 (en) | 2006-11-15 | 2015-04-29 | The Regents of The University of California | Textured phosphor conversion layer light emitting diode |
| US20090121250A1 (en) * | 2006-11-15 | 2009-05-14 | Denbaars Steven P | High light extraction efficiency light emitting diode (led) using glass packaging |
| TW201448263A (zh) | 2006-12-11 | 2014-12-16 | 美國加利福尼亞大學董事會 | 透明發光二極體 |
| TWI452716B (zh) * | 2007-06-08 | 2014-09-11 | Formosa Epitaxy Inc | Gallium nitride based light emitting diode and manufacturing method thereof |
| JP2009004625A (ja) | 2007-06-22 | 2009-01-08 | Sanken Electric Co Ltd | 半導体発光装置 |
| GB0717802D0 (en) * | 2007-09-12 | 2007-10-24 | Photonstar Led Ltd | Electrically isolated vertical light emitting diode structure |
| JP5224859B2 (ja) * | 2008-03-19 | 2013-07-03 | Dowaエレクトロニクス株式会社 | 半導体発光素子およびその製造方法 |
| WO2009120044A2 (ko) * | 2008-03-27 | 2009-10-01 | Song June O | 발광소자 및 그 제조방법 |
| US7791101B2 (en) * | 2008-03-28 | 2010-09-07 | Cree, Inc. | Indium gallium nitride-based ohmic contact layers for gallium nitride-based devices |
| EP2302705B1 (en) * | 2008-06-02 | 2018-03-14 | LG Innotek Co., Ltd. | Supporting substrate for fabrication of semiconductor light emitting device and semiconductor light emitting device using the same |
| TWI373153B (en) * | 2008-09-22 | 2012-09-21 | Ind Tech Res Inst | Light emitting diode, and package structure and manufacturing method therefor |
| KR101064082B1 (ko) | 2009-01-21 | 2011-09-08 | 엘지이노텍 주식회사 | 발광 소자 |
| WO2010087851A1 (en) | 2009-01-30 | 2010-08-05 | Hewlett-Packard Development Company, L.P. | Plasmonic light emitting diode |
| KR101550922B1 (ko) * | 2009-03-10 | 2015-09-07 | 엘지이노텍 주식회사 | 발광 소자 |
| US8207547B2 (en) | 2009-06-10 | 2012-06-26 | Brudgelux, Inc. | Thin-film LED with P and N contacts electrically isolated from the substrate |
| FR2961948B1 (fr) * | 2010-06-23 | 2012-08-03 | Soitec Silicon On Insulator | Procede de traitement d'une piece en materiau compose |
| KR101125025B1 (ko) * | 2010-07-23 | 2012-03-27 | 엘지이노텍 주식회사 | 발광소자 및 그 제조방법 |
| KR20120032305A (ko) * | 2010-09-28 | 2012-04-05 | 삼성엘이디 주식회사 | 반도체 발광다이오드 칩, 그 제조방법 및 품질관리방법 |
| KR101020996B1 (ko) | 2010-10-14 | 2011-03-09 | (주)더리즈 | 반도체 발광소자 제조방법 |
| KR20120044036A (ko) * | 2010-10-27 | 2012-05-07 | 엘지이노텍 주식회사 | 발광소자 |
| KR101694175B1 (ko) * | 2010-10-29 | 2017-01-17 | 엘지이노텍 주식회사 | 발광소자, 발광소자 패키지 및 조명시스템 |
| CN102610705A (zh) * | 2011-01-24 | 2012-07-25 | 鸿富锦精密工业(深圳)有限公司 | 氮化镓基板的制作方法 |
| US8802461B2 (en) | 2011-03-22 | 2014-08-12 | Micron Technology, Inc. | Vertical light emitting devices with nickel silicide bonding and methods of manufacturing |
| CN103094430B (zh) * | 2013-02-20 | 2015-06-17 | 佛山市国星半导体技术有限公司 | 一种发光结构 |
| WO2015053595A1 (ko) * | 2013-10-11 | 2015-04-16 | 주식회사 세미콘라이트 | 반도체 발광소자 |
| DE102013112549B4 (de) | 2013-11-14 | 2021-08-05 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Verfahren zur Herstellung von optoelektronischen Halbleiterbauelementen und optoelektronisches Halbleiterbauelement |
| KR102529980B1 (ko) * | 2014-11-06 | 2023-05-08 | 루미리즈 홀딩 비.브이. | 상부 접점 아래에 트렌치를 갖는 발광 디바이스 |
| US9673368B2 (en) | 2015-05-11 | 2017-06-06 | Lg Innotek Co., Ltd. | Light emitting device having first and second electrodes on one side of a light emitting structure |
| US20170350752A1 (en) * | 2016-06-01 | 2017-12-07 | Ventsislav Metodiev Lavchiev | Light emitting structures and systems on the basis of group iv material(s) for the ultraviolet and visible spectral ranges |
| US10804438B2 (en) * | 2017-10-18 | 2020-10-13 | Rohm Co., Ltd. | Semiconductor light-emitting device |
| DE102018103169A1 (de) * | 2018-02-13 | 2019-08-14 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines Halbleiterbauelements und Halbleiterbauelement |
| CN109509821B (zh) * | 2018-11-14 | 2024-02-20 | 佛山市国星半导体技术有限公司 | 一种抗大电流冲击的led芯片及其制作方法 |
| US11145689B2 (en) * | 2018-11-29 | 2021-10-12 | Creeled, Inc. | Indicia for light emitting diode chips |
| CN109768137B (zh) * | 2018-12-29 | 2022-06-14 | 晶能光电(江西)有限公司 | 垂直结构led芯片及其制备方法 |
| CN109994578B (zh) * | 2019-01-09 | 2020-12-11 | 南京邮电大学 | 垂直结构蓝光发光二极管及其制备方法 |
| US11592166B2 (en) | 2020-05-12 | 2023-02-28 | Feit Electric Company, Inc. | Light emitting device having improved illumination and manufacturing flexibility |
| US11876042B2 (en) | 2020-08-03 | 2024-01-16 | Feit Electric Company, Inc. | Omnidirectional flexible light emitting device |
| CN112447889A (zh) * | 2020-11-27 | 2021-03-05 | 广东省科学院半导体研究所 | 一种led芯片及其制作方法 |
| JP7369761B2 (ja) * | 2021-12-24 | 2023-10-26 | 日東電工株式会社 | 光半導体素子封止用シート |
Citations (6)
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| WO2001047038A1 (en) * | 1999-12-22 | 2001-06-28 | Lumileds Lighting U.S., Llc | Multi-layer highly reflective ohmic contacts for light-emitting semiconductor devices |
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| US6492661B1 (en) * | 1999-11-04 | 2002-12-10 | Fen-Ren Chien | Light emitting semiconductor device having reflection layer structure |
| US20030164503A1 (en) * | 2002-03-04 | 2003-09-04 | United Epitaxy Co., Ltd. | High efficiency light emitting diode and method of making the same |
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| US6649437B1 (en) * | 2002-08-20 | 2003-11-18 | United Epitaxy Company, Ltd. | Method of manufacturing high-power light emitting diodes |
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| JP3985283B2 (ja) * | 1997-01-22 | 2007-10-03 | ソニー株式会社 | 発光素子 |
| JPH114020A (ja) | 1997-04-15 | 1999-01-06 | Toshiba Corp | 半導体発光素子及びその製造方法、並びに半導体発光装置 |
| JP2002217450A (ja) | 2001-01-22 | 2002-08-02 | Sanken Electric Co Ltd | 半導体発光素子及びその製造方法 |
| JP4122785B2 (ja) | 2002-01-30 | 2008-07-23 | 日亜化学工業株式会社 | 発光素子 |
| KR100476567B1 (ko) * | 2003-09-26 | 2005-03-17 | 삼성전기주식회사 | 질화물 반도체 소자 |
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- 2005-02-16 US US11/058,942 patent/US7199401B2/en not_active Expired - Fee Related
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| US6492661B1 (en) * | 1999-11-04 | 2002-12-10 | Fen-Ren Chien | Light emitting semiconductor device having reflection layer structure |
| WO2001047038A1 (en) * | 1999-12-22 | 2001-06-28 | Lumileds Lighting U.S., Llc | Multi-layer highly reflective ohmic contacts for light-emitting semiconductor devices |
| CN1330416A (zh) * | 2000-06-30 | 2002-01-09 | 株式会社东芝 | 半导体发光元件及其制造方法以及半导体发光装置 |
| US20030164503A1 (en) * | 2002-03-04 | 2003-09-04 | United Epitaxy Co., Ltd. | High efficiency light emitting diode and method of making the same |
| CN1449060A (zh) * | 2002-04-04 | 2003-10-15 | 国联光电科技股份有限公司 | 发光二极管的结构及其制造方法 |
| US6649437B1 (en) * | 2002-08-20 | 2003-11-18 | United Epitaxy Company, Ltd. | Method of manufacturing high-power light emitting diodes |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104393140A (zh) * | 2014-11-06 | 2015-03-04 | 中国科学院半导体研究所 | 一种高反射率的垂直结构发光二级管芯片及其制备方法 |
| CN104393140B (zh) * | 2014-11-06 | 2018-03-23 | 中国科学院半导体研究所 | 一种高反射率的垂直结构发光二级管芯片及其制备方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20050184300A1 (en) | 2005-08-25 |
| CN1661826A (zh) | 2005-08-31 |
| US7199401B2 (en) | 2007-04-03 |
| JP2005277372A (ja) | 2005-10-06 |
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