CN100335956C - 图像显示装置 - Google Patents
图像显示装置 Download PDFInfo
- Publication number
- CN100335956C CN100335956C CNB021405980A CN02140598A CN100335956C CN 100335956 C CN100335956 C CN 100335956C CN B021405980 A CNB021405980 A CN B021405980A CN 02140598 A CN02140598 A CN 02140598A CN 100335956 C CN100335956 C CN 100335956C
- Authority
- CN
- China
- Prior art keywords
- circuit
- tft
- display device
- block
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13454—Drivers integrated on the active matrix substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
- H10D30/6713—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes
- H10D30/6715—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes characterised by the doping profiles, e.g. having lightly-doped source or drain extensions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
- H10D30/6731—Top-gate only TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
- H10D30/6743—Silicon
- H10D30/6745—Polycrystalline or microcrystalline silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/40—Crystalline structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0221—Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies
- H10D86/0223—Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies comprising crystallisation of amorphous, microcrystalline or polycrystalline semiconductor materials
- H10D86/0229—Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies comprising crystallisation of amorphous, microcrystalline or polycrystalline semiconductor materials characterised by control of the annealing or irradiation parameters
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2202/00—Materials and properties
- G02F2202/10—Materials and properties semiconductor
- G02F2202/104—Materials and properties semiconductor poly-Si
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Thin Film Transistor (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Liquid Crystal (AREA)
- Recrystallisation Techniques (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP378027/2001 | 2001-12-12 | ||
| JP2001378027A JP2003179068A (ja) | 2001-12-12 | 2001-12-12 | 画像表示装置およびその製造方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2007101411769A Division CN100487921C (zh) | 2001-12-12 | 2002-07-10 | 图像显示装置及其制造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1426043A CN1426043A (zh) | 2003-06-25 |
| CN100335956C true CN100335956C (zh) | 2007-09-05 |
Family
ID=19185862
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB021405980A Expired - Fee Related CN100335956C (zh) | 2001-12-12 | 2002-07-10 | 图像显示装置 |
| CNB2007101411769A Expired - Fee Related CN100487921C (zh) | 2001-12-12 | 2002-07-10 | 图像显示装置及其制造方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2007101411769A Expired - Fee Related CN100487921C (zh) | 2001-12-12 | 2002-07-10 | 图像显示装置及其制造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US6713324B2 (https=) |
| JP (1) | JP2003179068A (https=) |
| KR (1) | KR100894945B1 (https=) |
| CN (2) | CN100335956C (https=) |
| TW (1) | TWI268612B (https=) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4310076B2 (ja) * | 2001-05-31 | 2009-08-05 | キヤノン株式会社 | 結晶性薄膜の製造方法 |
| JP3903761B2 (ja) * | 2001-10-10 | 2007-04-11 | 株式会社日立製作所 | レ−ザアニ−ル方法およびレ−ザアニ−ル装置 |
| JP4813743B2 (ja) * | 2002-07-24 | 2011-11-09 | 株式会社 日立ディスプレイズ | 画像表示装置の製造方法 |
| KR100450761B1 (ko) * | 2002-09-14 | 2004-10-01 | 한국전자통신연구원 | 능동 구동형 유기 이엘 다이오드 디스플레이 패널 회로 |
| US7142030B2 (en) | 2002-12-03 | 2006-11-28 | Semiconductor Energy Laboratory Co., Ltd. | Data latch circuit and electronic device |
| US6870895B2 (en) * | 2002-12-19 | 2005-03-22 | Semiconductor Energy Laboratory Co., Ltd. | Shift register and driving method thereof |
| JP4116465B2 (ja) | 2003-02-20 | 2008-07-09 | 株式会社日立製作所 | パネル型表示装置とその製造方法および製造装置 |
| JP4413569B2 (ja) * | 2003-09-25 | 2010-02-10 | 株式会社 日立ディスプレイズ | 表示パネルの製造方法及び表示パネル |
| JP4887599B2 (ja) * | 2003-11-19 | 2012-02-29 | セイコーエプソン株式会社 | 回路基板、回路基板の製造方法、表示装置および電子機器 |
| JP4838982B2 (ja) | 2004-01-30 | 2011-12-14 | 株式会社 日立ディスプレイズ | レーザアニール方法およびレーザアニール装置 |
| DE102004007398B4 (de) * | 2004-02-16 | 2007-10-18 | Infineon Technologies Ag | Konfigurierbare Gate-Array-Zelle mit erweiterter Gate-Elektrode |
| JP2006019609A (ja) * | 2004-07-05 | 2006-01-19 | Hitachi Displays Ltd | 画像表示装置 |
| JP2006054073A (ja) * | 2004-08-10 | 2006-02-23 | Fujitsu Hitachi Plasma Display Ltd | プラズマディスプレイパネルの製造方法 |
| KR101064186B1 (ko) * | 2005-08-10 | 2011-09-14 | 삼성전자주식회사 | 레벨쉬프터와, 이를 갖는 표시장치 |
| JP2007088364A (ja) | 2005-09-26 | 2007-04-05 | Hitachi Displays Ltd | 表示装置 |
| CN108172625B (zh) * | 2016-12-07 | 2020-09-29 | 清华大学 | 一种逻辑电路 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09321310A (ja) * | 1996-05-31 | 1997-12-12 | Sanyo Electric Co Ltd | 半導体装置の製造方法 |
| JPH11121753A (ja) * | 1997-10-14 | 1999-04-30 | Hitachi Ltd | 半導体装置及びその製造方法 |
| JP2000243970A (ja) * | 1999-02-24 | 2000-09-08 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタとその製造方法及びそれを用いた液晶表示装置とその製造方法 |
| CN1312587A (zh) * | 1994-08-29 | 2001-09-12 | 株式会社半导体能源研究所 | 用于电子光学器件的半导体电路及其制造方法 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS642088A (en) | 1987-06-24 | 1989-01-06 | Nec Corp | Active matrix liquid crystal display device and its production |
| JP2000058863A (ja) * | 1993-05-26 | 2000-02-25 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
| TW272319B (https=) * | 1993-12-20 | 1996-03-11 | Sharp Kk | |
| US6723590B1 (en) * | 1994-03-09 | 2004-04-20 | Semiconductor Energy Laboratory Co., Ltd. | Method for laser-processing semiconductor device |
| JP3081497B2 (ja) * | 1995-03-30 | 2000-08-28 | 三洋電機株式会社 | 表示装置及びその製造方法 |
| JP3870420B2 (ja) * | 1995-12-26 | 2007-01-17 | セイコーエプソン株式会社 | アクティブマトリクス基板の製造方法、エレクトロルミネッセンス装置の製造方法、表示装置の製造方法、及び電子機器の製造方法 |
| JPH09283438A (ja) * | 1996-04-08 | 1997-10-31 | A G Technol Kk | 多結晶半導体薄膜、その形成方法、多結晶半導体tft及びtft基板 |
| US6190949B1 (en) * | 1996-05-22 | 2001-02-20 | Sony Corporation | Silicon thin film, group of silicon single crystal grains and formation process thereof, and semiconductor device, flash memory cell and fabrication process thereof |
| JP4086925B2 (ja) * | 1996-12-27 | 2008-05-14 | 株式会社半導体エネルギー研究所 | アクティブマトリクスディスプレイ |
| JP3343492B2 (ja) * | 1997-04-02 | 2002-11-11 | シャープ株式会社 | 薄膜半導体装置の製造方法 |
| JPH1187720A (ja) * | 1997-09-08 | 1999-03-30 | Sanyo Electric Co Ltd | 半導体装置及び液晶表示装置 |
| JP3445121B2 (ja) * | 1997-10-24 | 2003-09-08 | キヤノン株式会社 | マトリクス基板と液晶表示装置及びこれを用いるプロジェクター |
| EP1049144A4 (en) * | 1997-12-17 | 2006-12-06 | Matsushita Electronics Corp | THIN SEMICONDUCTOR FILM, MANUFACTURING METHOD, APPARATUS AND ARRANGEMENT |
| KR100292048B1 (ko) * | 1998-06-09 | 2001-07-12 | 구본준, 론 위라하디락사 | 박막트랜지스터액정표시장치의제조방법 |
| WO2000002251A1 (en) * | 1998-07-06 | 2000-01-13 | Matsushita Electric Industrial Co., Ltd. | Thin film transistor and liquid crystal display |
| JP2000252228A (ja) * | 1999-03-04 | 2000-09-14 | Toshiba Corp | レーザアニール装置 |
| JP2000275668A (ja) * | 1999-03-19 | 2000-10-06 | Fujitsu Ltd | レーザアニーリング装置、液晶表示装置及びその製造方法 |
| JP5210478B2 (ja) * | 2001-08-31 | 2013-06-12 | 株式会社半導体エネルギー研究所 | 表示装置 |
| JP2003224084A (ja) * | 2001-11-22 | 2003-08-08 | Semiconductor Energy Lab Co Ltd | 半導体製造装置 |
| JP4190798B2 (ja) * | 2002-05-08 | 2008-12-03 | Nec液晶テクノロジー株式会社 | 薄膜トランジスタ及びその製造方法 |
| JP2004119919A (ja) * | 2002-09-30 | 2004-04-15 | Hitachi Ltd | 半導体薄膜および半導体薄膜の製造方法 |
-
2001
- 2001-12-12 JP JP2001378027A patent/JP2003179068A/ja active Pending
-
2002
- 2002-05-31 TW TW091111687A patent/TWI268612B/zh not_active IP Right Cessation
- 2002-07-03 US US10/187,999 patent/US6713324B2/en not_active Expired - Lifetime
- 2002-07-09 KR KR1020020039650A patent/KR100894945B1/ko not_active Expired - Fee Related
- 2002-07-10 CN CNB021405980A patent/CN100335956C/zh not_active Expired - Fee Related
- 2002-07-10 CN CNB2007101411769A patent/CN100487921C/zh not_active Expired - Fee Related
-
2004
- 2004-02-17 US US10/778,082 patent/US6949419B2/en not_active Expired - Lifetime
- 2004-11-09 US US10/983,683 patent/US7193238B2/en not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1312587A (zh) * | 1994-08-29 | 2001-09-12 | 株式会社半导体能源研究所 | 用于电子光学器件的半导体电路及其制造方法 |
| JPH09321310A (ja) * | 1996-05-31 | 1997-12-12 | Sanyo Electric Co Ltd | 半導体装置の製造方法 |
| JPH11121753A (ja) * | 1997-10-14 | 1999-04-30 | Hitachi Ltd | 半導体装置及びその製造方法 |
| JP2000243970A (ja) * | 1999-02-24 | 2000-09-08 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタとその製造方法及びそれを用いた液晶表示装置とその製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20030109074A1 (en) | 2003-06-12 |
| CN101114098A (zh) | 2008-01-30 |
| CN1426043A (zh) | 2003-06-25 |
| US6949419B2 (en) | 2005-09-27 |
| KR20030051152A (ko) | 2003-06-25 |
| KR100894945B1 (ko) | 2009-04-27 |
| US20040185605A1 (en) | 2004-09-23 |
| JP2003179068A (ja) | 2003-06-27 |
| TWI268612B (en) | 2006-12-11 |
| US20050085021A1 (en) | 2005-04-21 |
| US7193238B2 (en) | 2007-03-20 |
| US6713324B2 (en) | 2004-03-30 |
| CN100487921C (zh) | 2009-05-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: HITACHI DISPLAY CO., LTD. Free format text: FORMER OWNER: HITACHI,LTD. Effective date: 20101012 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: TOKYO, JAPAN TO: CHIBA PREFECTURE, JAPAN |
|
| TR01 | Transfer of patent right |
Effective date of registration: 20101012 Address after: Chiba County, Japan Patentee after: Hitachi Displays, Ltd. Address before: Tokyo, Japan Patentee before: Hitachi, Ltd. |
|
| ASS | Succession or assignment of patent right |
Owner name: IPS ALPHA SUPPORT CO., LTD. Effective date: 20111130 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| C56 | Change in the name or address of the patentee | ||
| CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Co-patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Patentee after: Hitachi Displays, Ltd. Address before: Chiba County, Japan Co-patentee before: IPS pioneer support society Patentee before: Hitachi Displays, Ltd. |
|
| TR01 | Transfer of patent right |
Effective date of registration: 20111130 Address after: Chiba County, Japan Co-patentee after: IPS Pioneer Support Society Patentee after: Hitachi Displays, Ltd. Address before: Chiba County, Japan Patentee before: Hitachi Displays, Ltd. |
|
| C56 | Change in the name or address of the patentee |
Owner name: JAPAN DISPLAY, INC. Free format text: FORMER NAME: APAN DISPLAY EAST, INC. Owner name: APAN DISPLAY EAST, INC. Free format text: FORMER NAME: HITACHI DISPLAY CO., LTD. |
|
| CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Patentee after: JAPAN DISPLAY Inc. Patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Address before: Chiba County, Japan Patentee before: Japan Display East Inc. Patentee before: Panasonic Liquid Crystal Display Co.,Ltd. Address after: Chiba County, Japan Patentee after: Japan Display East Inc. Patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Address before: Chiba County, Japan Patentee before: Hitachi Displays, Ltd. Patentee before: Panasonic Liquid Crystal Display Co.,Ltd. |
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| CP02 | Change in the address of a patent holder |
Address after: Tokyo, Japan Patentee after: JAPAN DISPLAY Inc. Patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Address before: Chiba County, Japan Patentee before: JAPAN DISPLAY Inc. Patentee before: Panasonic Liquid Crystal Display Co.,Ltd. |
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| EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20030625 Assignee: BOE TECHNOLOGY GROUP Co.,Ltd. Assignor: JAPAN DISPLAY Inc.|Panasonic Liquid Crystal Display Co.,Ltd. Contract record no.: 2013990000688 Denomination of invention: Projection lens for image display equipment Granted publication date: 20070905 License type: Common License Record date: 20131016 |
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Granted publication date: 20070905 Termination date: 20200710 |
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| CF01 | Termination of patent right due to non-payment of annual fee |