ATE534079T1 - Halbleiterspeicher mit analoger übertragung von datenwerten - Google Patents

Halbleiterspeicher mit analoger übertragung von datenwerten

Info

Publication number
ATE534079T1
ATE534079T1 AT08770154T AT08770154T ATE534079T1 AT E534079 T1 ATE534079 T1 AT E534079T1 AT 08770154 T AT08770154 T AT 08770154T AT 08770154 T AT08770154 T AT 08770154T AT E534079 T1 ATE534079 T1 AT E534079T1
Authority
AT
Austria
Prior art keywords
semiconductor memory
data values
analog transmission
memory cell
bit
Prior art date
Application number
AT08770154T
Other languages
English (en)
Inventor
Frankie Roohparvar
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE534079T1 publication Critical patent/ATE534079T1/de

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628Programming or writing circuits; Data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5642Sensing or reading circuits; Data output circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/26Sensing or reading circuits; Data output circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C27/00Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/005Electric analogue stores, e.g. for storing instantaneous values with non-volatile charge storage, e.g. on floating gate or MNOS
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/16Storage of analogue signals in digital stores using an arrangement comprising analogue/digital [A/D] converters, digital memories and digital/analogue [D/A] converters 

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)
  • Communication Control (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
AT08770154T 2007-06-05 2008-06-05 Halbleiterspeicher mit analoger übertragung von datenwerten ATE534079T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/758,307 US7719901B2 (en) 2007-06-05 2007-06-05 Solid state memory utilizing analog communication of data values
PCT/US2008/065846 WO2008151262A2 (en) 2007-06-05 2008-06-05 Solid state memory utilizing analog communication of data values

Publications (1)

Publication Number Publication Date
ATE534079T1 true ATE534079T1 (de) 2011-12-15

Family

ID=40094416

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08770154T ATE534079T1 (de) 2007-06-05 2008-06-05 Halbleiterspeicher mit analoger übertragung von datenwerten

Country Status (8)

Country Link
US (4) US7719901B2 (de)
EP (1) EP2156304B1 (de)
JP (2) JP2010529586A (de)
KR (1) KR101120248B1 (de)
CN (1) CN101681321B (de)
AT (1) ATE534079T1 (de)
TW (1) TWI370970B (de)
WO (1) WO2008151262A2 (de)

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US7995412B2 (en) 2007-09-07 2011-08-09 Micron Technology, Inc. Analog-to-digital and digital-to-analog conversion window adjustment based on reference cells in a memory device
US7782674B2 (en) 2007-10-18 2010-08-24 Micron Technology, Inc. Sensing of memory cells in NAND flash
US7751253B2 (en) 2008-03-17 2010-07-06 Micron Technology, Inc. Analog sensing of memory cells with a source follower driver in a semiconductor memory device
US7768832B2 (en) 2008-04-07 2010-08-03 Micron Technology, Inc. Analog read and write paths in a solid state memory device
US9892800B2 (en) 2015-09-30 2018-02-13 Sunrise Memory Corporation Multi-gate NOR flash thin-film transistor strings arranged in stacked horizontal active strips with vertical control gates
US10121553B2 (en) 2015-09-30 2018-11-06 Sunrise Memory Corporation Capacitive-coupled non-volatile thin-film transistor NOR strings in three-dimensional arrays
KR101751407B1 (ko) * 2016-02-16 2017-07-11 단국대학교 산학협력단 플래시 메모리의 신뢰성 검증을 위한 아날로그 정보 기반 에뮬레이션 방법 및 그 장치
US10347329B2 (en) * 2017-08-29 2019-07-09 Micron Technology, Inc. Reflow protection
US10614899B2 (en) * 2018-06-29 2020-04-07 Micron Technology, Inc. Program progress monitoring in a memory array
US11787173B2 (en) 2019-02-06 2023-10-17 Hewlett-Packard Development Company, L.P. Print component with memory circuit
US11787172B2 (en) 2019-02-06 2023-10-17 Hewlett-Packard Development Company, L.P. Communicating print component
KR102667043B1 (ko) 2019-02-06 2024-05-20 휴렛-팩커드 디벨롭먼트 컴퍼니, 엘.피. 메모리 회로를 갖는 프린트 컴포넌트
JP7181418B2 (ja) 2019-02-06 2022-11-30 ヒューレット-パッカード デベロップメント カンパニー エル.ピー. 流体ダイのメモリ
AU2019428297B2 (en) 2019-02-06 2023-03-09 Hewlett-Packard Development Company, L.P. Multiple circuits coupled to an interface
CN110610739B (zh) * 2019-09-17 2021-06-18 珠海创飞芯科技有限公司 一种阈值电压调节方法
US11295209B2 (en) * 2019-12-20 2022-04-05 Micron Technology, Inc. Analysis of memory sub-systems based on threshold distributions
TWI768496B (zh) * 2020-10-07 2022-06-21 群聯電子股份有限公司 讀取電壓控制方法、記憶體儲存裝置及記憶體控制電路單元
CN113314165A (zh) * 2021-06-21 2021-08-27 量子新能技术有限公司 磁性模拟存储器

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US7782674B2 (en) 2007-10-18 2010-08-24 Micron Technology, Inc. Sensing of memory cells in NAND flash
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Also Published As

Publication number Publication date
CN101681321B (zh) 2012-10-10
JP2013175276A (ja) 2013-09-05
US7719901B2 (en) 2010-05-18
US20120063225A1 (en) 2012-03-15
KR20100028091A (ko) 2010-03-11
JP2010529586A (ja) 2010-08-26
TW200912653A (en) 2009-03-16
WO2008151262A3 (en) 2009-02-26
KR101120248B1 (ko) 2012-03-19
US8064266B2 (en) 2011-11-22
EP2156304A2 (de) 2010-02-24
EP2156304A4 (de) 2010-07-21
US20100226175A1 (en) 2010-09-09
WO2008151262A2 (en) 2008-12-11
US20080304317A1 (en) 2008-12-11
US8811092B2 (en) 2014-08-19
EP2156304B1 (de) 2011-11-16
TWI370970B (en) 2012-08-21
US20130223145A1 (en) 2013-08-29
CN101681321A (zh) 2010-03-24
US8411511B2 (en) 2013-04-02

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