ATE512457T1 - Gleitlager zur verwendung mit einer eine vakuumkammer umfassenden vorrichtung - Google Patents

Gleitlager zur verwendung mit einer eine vakuumkammer umfassenden vorrichtung

Info

Publication number
ATE512457T1
ATE512457T1 AT07756002T AT07756002T ATE512457T1 AT E512457 T1 ATE512457 T1 AT E512457T1 AT 07756002 T AT07756002 T AT 07756002T AT 07756002 T AT07756002 T AT 07756002T AT E512457 T1 ATE512457 T1 AT E512457T1
Authority
AT
Austria
Prior art keywords
plate
base plate
flexible
vacuum chamber
contact
Prior art date
Application number
AT07756002T
Other languages
English (en)
Inventor
Johannes Persoon
Andreas Engelen
Siegfried Lichtenegger
Dooren Petrus Van
Original Assignee
Fei Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fei Co filed Critical Fei Co
Application granted granted Critical
Publication of ATE512457T1 publication Critical patent/ATE512457T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/18Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
    • H01J37/185Means for transferring objects between different enclosures of different pressure or atmosphere
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/16Vessels
    • H01J2237/166Sealing means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/18Vacuum control means
    • H01J2237/184Vacuum locks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2005Seal mechanisms
    • H01J2237/2006Vacuum seals
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/204Means for introducing and/or outputting objects

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sliding-Contact Bearings (AREA)
  • Magnetic Bearings And Hydrostatic Bearings (AREA)
  • Bearings For Parts Moving Linearly (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sliding Valves (AREA)
AT07756002T 2006-06-07 2007-04-26 Gleitlager zur verwendung mit einer eine vakuumkammer umfassenden vorrichtung ATE512457T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US81162106P 2006-06-07 2006-06-07
PCT/US2007/010006 WO2007145712A2 (en) 2006-06-07 2007-04-26 Slider bearing for use with an apparatus comprising a vacuum chamber

Publications (1)

Publication Number Publication Date
ATE512457T1 true ATE512457T1 (de) 2011-06-15

Family

ID=40343642

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07756002T ATE512457T1 (de) 2006-06-07 2007-04-26 Gleitlager zur verwendung mit einer eine vakuumkammer umfassenden vorrichtung

Country Status (5)

Country Link
US (1) US8598524B2 (de)
EP (1) EP2033206B1 (de)
JP (1) JP5033873B2 (de)
AT (1) ATE512457T1 (de)
WO (1) WO2007145712A2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1816668A2 (de) 2006-02-01 2007-08-08 FEI Company Teilchenstrahlgerät mit vrobestimmtem Arbeitsdruck
EP2033206B1 (de) 2006-06-07 2011-06-08 FEI Company Gleitlager zur verwendung mit einer eine vakuumkammer umfassenden vorrichtung
CN101461026B (zh) * 2006-06-07 2012-01-18 Fei公司 与包含真空室的装置一起使用的滑动轴承
JP5572553B2 (ja) 2007-12-11 2014-08-13 アイゼントロピック リミテッド バルブ
EP2292953A1 (de) 2009-09-07 2011-03-09 Fei Company Hochvakuumabdichtung
FR2979684B1 (fr) * 2011-09-07 2014-08-08 Commissariat Energie Atomique Dispositif de deplacement relatif de deux pieces sous pression differentielle
JP5989471B2 (ja) * 2012-09-14 2016-09-07 日本発條株式会社 圧電素子供給方法
US20150097485A1 (en) * 2013-10-08 2015-04-09 XEI Scientific Inc. Method and apparatus for plasma ignition in high vacuum chambers
TWI674392B (zh) * 2014-03-27 2019-10-11 日商荏原製作所股份有限公司 頂板開閉機構及檢查裝置
NL2013432B1 (en) 2014-09-05 2016-09-28 Delmic B V Compact inspection apparatus comprising a combination of a Scanning Electron Microscope and an Optical microscope.
CN108984933B (zh) * 2018-07-25 2022-05-20 太原科技大学 弹流润滑条件下计算滚动轴承载荷和压力的边界元法
KR102198707B1 (ko) * 2019-03-25 2021-01-05 (주)코셈 착탈 가능한 컬럼을 구비하는 주사 전자 현미경 및, 이를 이용한 영상 획득 방법

Family Cites Families (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3602686A (en) 1967-04-11 1971-08-31 Westinghouse Electric Corp Electron-beam apparatus and method of welding with this apparatus
US3981546A (en) * 1969-09-29 1976-09-21 Sperman Jacob H Air bearing construction
US3971546A (en) * 1975-04-21 1976-07-27 Bruner A J Animal crossing guard
JPS5523746Y2 (de) * 1976-02-05 1980-06-06
US4165881A (en) * 1976-07-15 1979-08-28 Morgan Construction Company Flexible seal and seal assembly
US4162391A (en) * 1977-12-19 1979-07-24 Sciaky Bros., Inc. Sliding vacuum seal means
DE2819165A1 (de) * 1978-05-02 1979-11-15 Siemens Ag Rasterelektronenmikroskop
EP0017472A1 (de) * 1979-04-06 1980-10-15 Lintott Engineering Limited Vakuumapparatur mit einer Vorrichtung zur Wärmeübertragung und Verfahren zur Herstellung von Halbleiterkomponenten unter Anwendung dieser Apparatus
US4229655A (en) * 1979-05-23 1980-10-21 Nova Associates, Inc. Vacuum chamber for treating workpieces with beams
FR2499314A1 (fr) * 1981-02-04 1982-08-06 Centre Nat Rech Scient Ensemble de microscope electronique a balayage a fonctionnement in situ
US4584479A (en) * 1982-10-19 1986-04-22 Varian Associates, Inc. Envelope apparatus for localized vacuum processing
US4607167A (en) * 1982-10-19 1986-08-19 Varian Associates, Inc. Charged particle beam lithography machine incorporating localized vacuum envelope
DE3332248A1 (de) 1983-09-07 1985-03-21 Lutz-Achim Dipl.-Ing. 7000 Stuttgart Gäng System zum ableiten von probenaufladungen bei rasterelektronenmikroskopischen untersuchungen
US4705949A (en) 1985-11-25 1987-11-10 The United States Of America As Represented By The Secretary Of Commerce Method and apparatus relating to specimen cells for scanning electron microscopes
DE3618283A1 (de) 1986-05-30 1987-12-03 Messer Griesheim Gmbh Vorrichtung zum bearbeiten von werkstuecken mit einem elektronenstrahl
US4818838A (en) * 1988-01-11 1989-04-04 The Perkin-Elmer Corporation Apparatus for preselecting and maintaining a fixed gap between a workpiece and a vacuum seal apparatus in particle beam lithography systems
JPH01296549A (ja) 1988-05-25 1989-11-29 Hitachi Ltd 荷電粒子光学系
US5103102A (en) * 1989-02-24 1992-04-07 Micrion Corporation Localized vacuum apparatus and method
JPH03194838A (ja) 1989-12-22 1991-08-26 Sumitomo Metal Ind Ltd 帯電防止方法及び該方法に使用する帯電防止装置
DE69132441T2 (de) * 1990-06-20 2001-06-07 Hitachi Ltd Ladungsträgerstrahlgerät
JPH04363849A (ja) 1991-06-10 1992-12-16 Mitsubishi Electric Corp 電子ビーム装置
US5396067A (en) * 1992-06-11 1995-03-07 Nikon Corporation Scan type electron microscope
JP2851213B2 (ja) * 1992-09-28 1999-01-27 株式会社東芝 走査電子顕微鏡
JPH06139984A (ja) 1992-10-23 1994-05-20 Hitachi Ltd 電子顕微鏡の真空リーク機構
JP3422045B2 (ja) * 1993-06-21 2003-06-30 株式会社日立製作所 組成及び格子歪測定用電子顕微鏡及びその観察方法
JP3310136B2 (ja) * 1994-09-17 2002-07-29 株式会社東芝 荷電ビーム装置
FR2747112B1 (fr) 1996-04-03 1998-05-07 Commissariat Energie Atomique Dispositif de transport d'objets plats et procede de transfert de ces objets entre ledit dispositif et une machine de traitement
US5869833A (en) * 1997-01-16 1999-02-09 Kla-Tencor Corporation Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments
SG74599A1 (en) 1997-09-27 2000-08-22 Inst Of Material Res & Enginee Portable high resolution scanning electron microscope column using permanent magnet electron lenses
US5989444A (en) * 1998-02-13 1999-11-23 Zywno; Marek Fluid bearings and vacuum chucks and methods for producing same
EP0969494A1 (de) 1998-07-03 2000-01-05 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Gerät und Verfahren zur Probenuntersuchung mittels Ladungsträgerstrahlen
US6476913B1 (en) * 1998-11-30 2002-11-05 Hitachi, Ltd. Inspection method, apparatus and system for circuit pattern
TWI242111B (en) * 1999-04-19 2005-10-21 Asml Netherlands Bv Gas bearings for use in vacuum chambers and their application in lithographic projection apparatus
TWI233535B (en) * 1999-04-19 2005-06-01 Asml Netherlands Bv Motion feed-through into a vacuum chamber and its application in lithographic projection apparatuses
EP1122761B1 (de) 2000-02-01 2004-05-26 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Optische Säule für Teilchenstrahlvorrichtung
US6515288B1 (en) * 2000-03-16 2003-02-04 Applied Materials, Inc. Vacuum bearing structure and a method of supporting a movable member
US6559457B1 (en) * 2000-03-23 2003-05-06 Advanced Micro Devices, Inc. System and method for facilitating detection of defects on a wafer
US6582251B1 (en) * 2000-04-28 2003-06-24 Greene, Tweed Of Delaware, Inc. Hermetic electrical connector and method of making the same
JP3619132B2 (ja) * 2000-08-25 2005-02-09 株式会社日立製作所 電子顕微鏡
US6507147B1 (en) * 2000-08-31 2003-01-14 Intevac, Inc. Unitary vacuum tube incorporating high voltage isolation
US6683316B2 (en) * 2001-08-01 2004-01-27 Aspex, Llc Apparatus for correlating an optical image and a SEM image and method of use thereof
JP2003086355A (ja) * 2001-09-05 2003-03-20 Kiko Kenji Kagi Kofun Yugenkoshi 有機el素子の封止構造並びに封止方法及び封止装置
JP3886777B2 (ja) * 2001-11-02 2007-02-28 日本電子株式会社 電子線照射装置および方法
US6710354B1 (en) * 2001-12-11 2004-03-23 Kla-Tencor Corporation Scanning electron microscope architecture and related material handling system
JP4014916B2 (ja) * 2002-04-11 2007-11-28 株式会社キーエンス 電子顕微鏡、電子顕微鏡の操作方法、電子顕微鏡操作プログラムおよびコンピュータで読み取り可能な記録媒体
US6891170B1 (en) * 2002-06-17 2005-05-10 Zyvex Corporation Modular manipulation system for manipulating a sample under study with a microscope
JP2004031207A (ja) 2002-06-27 2004-01-29 Canon Inc 電子線照射装置および走査型電子顕微鏡装置
US6667475B1 (en) * 2003-01-08 2003-12-23 Applied Materials, Inc. Method and apparatus for cleaning an analytical instrument while operating the analytical instrument
JP4373104B2 (ja) 2003-02-18 2009-11-25 株式会社荏原製作所 荷電粒子ビーム装置
NL1022886C2 (nl) * 2003-03-10 2004-09-14 Fei Co Deeltjes optische inrichting voor het bestralen van een object.
JP4211473B2 (ja) 2003-04-25 2009-01-21 ソニー株式会社 電子顕微鏡
JP2004349515A (ja) * 2003-05-23 2004-12-09 Hitachi High-Technologies Corp Sem式外観検査装置,レビュー装置、およびアライメント座標設定方法
US6897443B2 (en) * 2003-06-02 2005-05-24 Harald Gross Portable scanning electron microscope
US7060990B2 (en) * 2003-06-16 2006-06-13 Sumitomo Heavy Industries, Ltd. Stage base, substrate processing apparatus, and maintenance method for stage
US7100925B2 (en) * 2003-07-31 2006-09-05 Perkin Elmer, Inc. Pressure energized metallic seal
KR100592242B1 (ko) * 2003-08-12 2006-06-21 삼성에스디아이 주식회사 캐리어 및 이를 구비하는 분석장치
JP4063201B2 (ja) 2003-11-18 2008-03-19 ソニー株式会社 電子ビーム照射装置
US7043848B2 (en) * 2003-11-26 2006-05-16 The Micromanipulator Company Method and apparatus for maintaining accurate positioning between a probe and a DUT
JP2005203123A (ja) 2004-01-13 2005-07-28 Sony Corp 荷電粒子ビーム装置。
JP4528014B2 (ja) * 2004-04-05 2010-08-18 株式会社日立ハイテクノロジーズ 試料検査方法
JP4559137B2 (ja) * 2004-06-30 2010-10-06 キヤノン株式会社 真空機器の製造装置及び製造方法
NL1026547C2 (nl) * 2004-07-01 2006-01-03 Fei Co Apparaat voor het evacueren van een sample.
US20060249917A1 (en) * 2005-04-07 2006-11-09 Saint-Gobain Performance Plastics Corporation Composite sealing device
US20070011300A1 (en) 2005-07-11 2007-01-11 Hollebeek Robert J Monitoring method and system for monitoring operation of resources
US7301157B2 (en) 2005-09-28 2007-11-27 Fei Company Cluster tool for microscopic processing of samples
NL1030295C2 (nl) * 2005-10-28 2007-05-03 Fei Co Hermetisch afgesloten behuizing met elektrische doorvoer.
EP1816668A2 (de) * 2006-02-01 2007-08-08 FEI Company Teilchenstrahlgerät mit vrobestimmtem Arbeitsdruck
EP1863066A1 (de) * 2006-05-29 2007-12-05 FEI Company Probenträger und Probenhalter
CN101461026B (zh) 2006-06-07 2012-01-18 Fei公司 与包含真空室的装置一起使用的滑动轴承
EP2033206B1 (de) 2006-06-07 2011-06-08 FEI Company Gleitlager zur verwendung mit einer eine vakuumkammer umfassenden vorrichtung
EP2105944A1 (de) * 2008-03-28 2009-09-30 FEI Company "Environmental Cell" für eine TeilchenoptischeVorrichtung
US8087309B2 (en) * 2009-05-22 2012-01-03 Sion Power Corporation Hermetic sample holder and method for performing microanalysis under controlled atmosphere environment

Also Published As

Publication number Publication date
EP2033206B1 (de) 2011-06-08
JP5033873B2 (ja) 2012-09-26
WO2007145712A2 (en) 2007-12-21
WO2007145712A3 (en) 2008-04-17
JP2009540499A (ja) 2009-11-19
US8598524B2 (en) 2013-12-03
EP2033206A2 (de) 2009-03-11
US20100276592A1 (en) 2010-11-04

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