ATE493754T1 - Belichtungsvorrichtung, belichtungsverfahren und verfahren zur herstellung einer vorrichtung - Google Patents
Belichtungsvorrichtung, belichtungsverfahren und verfahren zur herstellung einer vorrichtungInfo
- Publication number
- ATE493754T1 ATE493754T1 AT09158917T AT09158917T ATE493754T1 AT E493754 T1 ATE493754 T1 AT E493754T1 AT 09158917 T AT09158917 T AT 09158917T AT 09158917 T AT09158917 T AT 09158917T AT E493754 T1 ATE493754 T1 AT E493754T1
- Authority
- AT
- Austria
- Prior art keywords
- liquid
- flow path
- supplying
- substrate
- section
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Public Health (AREA)
- Atmospheric Sciences (AREA)
- Epidemiology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Toxicology (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Prostheses (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003362279 | 2003-10-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE493754T1 true ATE493754T1 (de) | 2011-01-15 |
Family
ID=34463503
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT09158917T ATE493754T1 (de) | 2003-10-22 | 2004-10-21 | Belichtungsvorrichtung, belichtungsverfahren und verfahren zur herstellung einer vorrichtung |
| AT04792768T ATE490548T1 (de) | 2003-10-22 | 2004-10-21 | Belichtungsvorrichtung, belichtungsverfahren und verfahren zur bauelementeherstellung |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT04792768T ATE490548T1 (de) | 2003-10-22 | 2004-10-21 | Belichtungsvorrichtung, belichtungsverfahren und verfahren zur bauelementeherstellung |
Country Status (7)
| Country | Link |
|---|---|
| US (7) | US7643129B2 (de) |
| EP (2) | EP2079100B1 (de) |
| JP (1) | JP4325623B2 (de) |
| KR (8) | KR101712297B1 (de) |
| AT (2) | ATE493754T1 (de) |
| DE (2) | DE602004030365D1 (de) |
| WO (1) | WO2005038888A1 (de) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101712297B1 (ko) * | 2003-10-22 | 2017-03-13 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법, 디바이스의 제조 방법 |
| KR101204157B1 (ko) | 2004-01-20 | 2012-11-22 | 칼 짜이스 에스엠테 게엠베하 | 마이크로 리소그래픽 투영 노광 장치 및 그 투영 렌즈를 위한 측정 장치 |
| KR101554772B1 (ko) | 2004-02-04 | 2015-09-22 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
| WO2005124835A1 (ja) * | 2004-06-21 | 2005-12-29 | Nikon Corporation | 露光装置及びデバイス製造方法 |
| US7378025B2 (en) | 2005-02-22 | 2008-05-27 | Asml Netherlands B.V. | Fluid filtration method, fluid filtered thereby, lithographic apparatus and device manufacturing method |
| JP4072543B2 (ja) | 2005-03-18 | 2008-04-09 | キヤノン株式会社 | 液浸露光装置及びデバイス製造方法 |
| EP1873816A4 (de) | 2005-04-18 | 2010-11-24 | Nikon Corp | Belichtungseinrichtung, belichtungsverfahren und bauelemente-herstellungsverfahren |
| JP4661322B2 (ja) * | 2005-04-22 | 2011-03-30 | 株式会社ニコン | 露光装置、デバイスの製造方法及び液体供給方法 |
| US7652746B2 (en) * | 2005-06-21 | 2010-01-26 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101449055B1 (ko) | 2005-08-23 | 2014-10-08 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법, 및 디바이스 제조 방법 |
| JP2007286162A (ja) * | 2006-04-13 | 2007-11-01 | Nikon Corp | 液浸顕微鏡装置 |
| DE102006021797A1 (de) | 2006-05-09 | 2007-11-15 | Carl Zeiss Smt Ag | Optische Abbildungseinrichtung mit thermischer Dämpfung |
| US8681308B2 (en) | 2007-09-13 | 2014-03-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| NL1035970A1 (nl) * | 2007-09-28 | 2009-04-03 | Asml Holding Nv | Lithographic Apparatus and Device Manufacturing Method. |
| EP2136250A1 (de) | 2008-06-18 | 2009-12-23 | ASML Netherlands B.V. | Lithographische Vorrichtung und Verfahren |
| JP2009164642A (ja) * | 2009-04-20 | 2009-07-23 | Smc Corp | 液浸露光のための屈折率調整用小流量液体の温調方法 |
| NL2004808A (en) * | 2009-06-30 | 2011-01-12 | Asml Netherlands Bv | Fluid handling structure, lithographic apparatus and device manufacturing method. |
| JP6467265B2 (ja) * | 2015-03-30 | 2019-02-06 | 株式会社Screenホールディングス | 基板処理装置 |
| JP6700794B2 (ja) * | 2015-04-03 | 2020-05-27 | キヤノン株式会社 | インプリント材吐出装置 |
| KR102645839B1 (ko) * | 2018-12-18 | 2024-03-08 | 엘지이노텍 주식회사 | 액체 렌즈를 포함하는 카메라 모듈 |
| CN114815524B (zh) * | 2022-06-23 | 2022-09-02 | 江苏美信光电科技有限公司 | 一种光刻机工作台的清洁装置 |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE221563C (de) | ||||
| US4346164A (en) * | 1980-10-06 | 1982-08-24 | Werner Tabarelli | Photolithographic method for the manufacture of integrated circuits |
| US4509852A (en) * | 1980-10-06 | 1985-04-09 | Werner Tabarelli | Apparatus for the photolithographic manufacture of integrated circuit elements |
| DD221563A1 (de) * | 1983-09-14 | 1985-04-24 | Mikroelektronik Zt Forsch Tech | Immersionsobjektiv fuer die schrittweise projektionsabbildung einer maskenstruktur |
| JPH04330961A (ja) * | 1991-05-01 | 1992-11-18 | Matsushita Electron Corp | 現像処理装置 |
| JP3246615B2 (ja) | 1992-07-27 | 2002-01-15 | 株式会社ニコン | 照明光学装置、露光装置、及び露光方法 |
| JPH06188169A (ja) | 1992-08-24 | 1994-07-08 | Canon Inc | 結像方法及び該方法を用いる露光装置及び該方法を用いるデバイス製造方法 |
| JPH06124873A (ja) * | 1992-10-09 | 1994-05-06 | Canon Inc | 液浸式投影露光装置 |
| JP2753930B2 (ja) * | 1992-11-27 | 1998-05-20 | キヤノン株式会社 | 液浸式投影露光装置 |
| US5528118A (en) | 1994-04-01 | 1996-06-18 | Nikon Precision, Inc. | Guideless stage with isolated reaction stage |
| US5874820A (en) | 1995-04-04 | 1999-02-23 | Nikon Corporation | Window frame-guided stage mechanism |
| JPH08145299A (ja) * | 1994-11-22 | 1996-06-07 | Nec Corp | 液体用配管構造 |
| US5825043A (en) * | 1996-10-07 | 1998-10-20 | Nikon Precision Inc. | Focusing and tilting adjustment system for lithography aligner, manufacturing apparatus or inspection apparatus |
| JP4029182B2 (ja) | 1996-11-28 | 2008-01-09 | 株式会社ニコン | 露光方法 |
| JP4029183B2 (ja) | 1996-11-28 | 2008-01-09 | 株式会社ニコン | 投影露光装置及び投影露光方法 |
| EP0890136B9 (de) | 1996-12-24 | 2003-12-10 | ASML Netherlands B.V. | In zwei richtungen ausgewogenes positioniergerät, sowie lithographisches gerät mit einem solchen positioniergerät |
| JP3747566B2 (ja) * | 1997-04-23 | 2006-02-22 | 株式会社ニコン | 液浸型露光装置 |
| JPH11176727A (ja) | 1997-12-11 | 1999-07-02 | Nikon Corp | 投影露光装置 |
| AU2747999A (en) * | 1998-03-26 | 1999-10-18 | Nikon Corporation | Projection exposure method and system |
| TW417148B (en) * | 1998-07-02 | 2001-01-01 | Tokyo Electron Ltd | Process solution supplying apparatus and fluid passageway opening-closing valve device for process solution supplying apparatus |
| JP4776791B2 (ja) * | 2000-03-31 | 2011-09-21 | カルソニックカンセイ株式会社 | 二重管端末加工方法 |
| JP2002243071A (ja) * | 2001-02-19 | 2002-08-28 | Fuji Kucho Kogyo Kk | 可撓性2重パイプ |
| JP4056858B2 (ja) * | 2001-11-12 | 2008-03-05 | 東京エレクトロン株式会社 | 基板処理装置 |
| US7093375B2 (en) * | 2002-09-30 | 2006-08-22 | Lam Research Corporation | Apparatus and method for utilizing a meniscus in substrate processing |
| JP4184346B2 (ja) | 2002-12-13 | 2008-11-19 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 層上のスポットを照射するための方法及び装置における液体除去 |
| JP4582089B2 (ja) * | 2003-04-11 | 2010-11-17 | 株式会社ニコン | 液浸リソグラフィ用の液体噴射回収システム |
| US6867844B2 (en) * | 2003-06-19 | 2005-03-15 | Asml Holding N.V. | Immersion photolithography system and method using microchannel nozzles |
| EP2264531B1 (de) * | 2003-07-09 | 2013-01-16 | Nikon Corporation | Belichtungsgerät und Verfahren zur Herstellung einer Vorrichtung |
| US7779781B2 (en) * | 2003-07-31 | 2010-08-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101345020B1 (ko) | 2003-08-29 | 2013-12-26 | 가부시키가이샤 니콘 | 액체회수장치, 노광장치, 노광방법 및 디바이스 제조방법 |
| TWI245163B (en) * | 2003-08-29 | 2005-12-11 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| JP2005136374A (ja) * | 2003-10-06 | 2005-05-26 | Matsushita Electric Ind Co Ltd | 半導体製造装置及びそれを用いたパターン形成方法 |
| KR101712297B1 (ko) | 2003-10-22 | 2017-03-13 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법, 디바이스의 제조 방법 |
| US7697110B2 (en) * | 2004-01-26 | 2010-04-13 | Nikon Corporation | Exposure apparatus and device manufacturing method |
| US7050146B2 (en) * | 2004-02-09 | 2006-05-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP4072543B2 (ja) * | 2005-03-18 | 2008-04-09 | キヤノン株式会社 | 液浸露光装置及びデバイス製造方法 |
-
2004
- 2004-10-21 KR KR1020157007453A patent/KR101712297B1/ko not_active Expired - Fee Related
- 2004-10-21 KR KR1020177005270A patent/KR20170024154A/ko not_active Ceased
- 2004-10-21 AT AT09158917T patent/ATE493754T1/de not_active IP Right Cessation
- 2004-10-21 KR KR1020147005576A patent/KR20140049044A/ko not_active Ceased
- 2004-10-21 AT AT04792768T patent/ATE490548T1/de not_active IP Right Cessation
- 2004-10-21 KR KR1020127014051A patent/KR101547388B1/ko not_active Expired - Fee Related
- 2004-10-21 DE DE602004030365T patent/DE602004030365D1/de not_active Expired - Lifetime
- 2004-10-21 KR KR1020067007676A patent/KR20060071430A/ko not_active Ceased
- 2004-10-21 KR KR1020117021891A patent/KR101275464B1/ko not_active Expired - Fee Related
- 2004-10-21 WO PCT/JP2004/015619 patent/WO2005038888A1/ja not_active Ceased
- 2004-10-21 EP EP09158917A patent/EP2079100B1/de not_active Expired - Lifetime
- 2004-10-21 JP JP2005514865A patent/JP4325623B2/ja not_active Expired - Fee Related
- 2004-10-21 KR KR1020137012836A patent/KR20130061770A/ko not_active Ceased
- 2004-10-21 EP EP04792768A patent/EP1677341B1/de not_active Expired - Lifetime
- 2004-10-21 DE DE602004030838T patent/DE602004030838D1/de not_active Expired - Lifetime
- 2004-10-21 KR KR1020127022945A patent/KR101332543B1/ko not_active Expired - Fee Related
-
2006
- 2006-04-20 US US11/407,126 patent/US7643129B2/en not_active Expired - Fee Related
-
2007
- 2007-09-21 US US11/902,437 patent/US7973906B2/en not_active Expired - Fee Related
-
2009
- 2009-02-13 US US12/379,183 patent/US7948608B2/en not_active Expired - Fee Related
-
2011
- 2011-06-02 US US13/067,463 patent/US8896813B2/en not_active Expired - Fee Related
-
2014
- 2014-07-24 US US14/339,777 patent/US9581913B2/en not_active Expired - Fee Related
-
2017
- 2017-02-22 US US15/439,270 patent/US9829807B2/en not_active Expired - Fee Related
- 2017-11-09 US US15/808,457 patent/US20180067406A1/en not_active Abandoned
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |