ATE462991T1 - Belichtungsapparat und verfahren zur herstellung einer vorrichtung - Google Patents

Belichtungsapparat und verfahren zur herstellung einer vorrichtung

Info

Publication number
ATE462991T1
ATE462991T1 AT03250001T AT03250001T ATE462991T1 AT E462991 T1 ATE462991 T1 AT E462991T1 AT 03250001 T AT03250001 T AT 03250001T AT 03250001 T AT03250001 T AT 03250001T AT E462991 T1 ATE462991 T1 AT E462991T1
Authority
AT
Austria
Prior art keywords
space
exposure apparatus
optical path
stage
forms
Prior art date
Application number
AT03250001T
Other languages
English (en)
Inventor
Noriyasu Hasegawa
Eiji Sakamoto
Shigeru Terashima
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2002032274A external-priority patent/JP2003234281A/ja
Priority claimed from JP2002377086A external-priority patent/JP3809416B2/ja
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE462991T1 publication Critical patent/ATE462991T1/de

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
    • G03F7/70933—Purge, e.g. exchanging fluid or gas to remove pollutants
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
AT03250001T 2002-01-07 2003-01-02 Belichtungsapparat und verfahren zur herstellung einer vorrichtung ATE462991T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002000689 2002-01-07
JP2002032274A JP2003234281A (ja) 2002-02-08 2002-02-08 露光装置、デバイス製造方法
JP2002377086A JP3809416B2 (ja) 2002-01-07 2002-12-26 走査露光装置及びそれを用いたデバイス製造方法

Publications (1)

Publication Number Publication Date
ATE462991T1 true ATE462991T1 (de) 2010-04-15

Family

ID=27348060

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03250001T ATE462991T1 (de) 2002-01-07 2003-01-02 Belichtungsapparat und verfahren zur herstellung einer vorrichtung

Country Status (4)

Country Link
US (3) US6934003B2 (de)
EP (1) EP1326139B1 (de)
AT (1) ATE462991T1 (de)
DE (1) DE60331874D1 (de)

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TWI347741B (en) * 2003-05-30 2011-08-21 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
JP4517367B2 (ja) * 2003-09-03 2010-08-04 株式会社ニコン 露光装置及びデバイス製造方法
US20050153424A1 (en) * 2004-01-08 2005-07-14 Derek Coon Fluid barrier with transparent areas for immersion lithography
US20070103661A1 (en) * 2004-06-04 2007-05-10 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
EP1768169B9 (de) * 2004-06-04 2013-03-06 Nikon Corporation Belichtungsvorrichtung, belichtungsverfahren und verfahren zur herstellung eines bauelementes
WO2005122220A1 (ja) 2004-06-10 2005-12-22 Nikon Corporation 露光装置及び露光方法、並びにデバイス製造方法
US20070222959A1 (en) * 2004-06-10 2007-09-27 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US7522261B2 (en) * 2004-09-24 2009-04-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP3977377B2 (ja) * 2005-03-04 2007-09-19 キヤノン株式会社 露光装置およびデバイス製造方法
JP2006245400A (ja) * 2005-03-04 2006-09-14 Canon Inc 光学装置およびデバイス製造方法。
JP2006269942A (ja) * 2005-03-25 2006-10-05 Canon Inc 露光装置及びデバイス製造方法
US20070024982A1 (en) * 2005-06-14 2007-02-01 Carl Zeiss Smt Ag Imaging system for a microlithographic projection exposure system
JP4708876B2 (ja) * 2005-06-21 2011-06-22 キヤノン株式会社 液浸露光装置
JP2007067344A (ja) * 2005-09-02 2007-03-15 Canon Inc 露光装置および方法ならびにデバイス製造方法
US20080073596A1 (en) * 2006-08-24 2008-03-27 Asml Netherlands B.V. Lithographic apparatus and method
JP4966922B2 (ja) * 2008-07-07 2012-07-04 東京エレクトロン株式会社 レジスト処理装置、レジスト塗布現像装置、およびレジスト処理方法
SG159467A1 (en) * 2008-09-02 2010-03-30 Asml Netherlands Bv Fluid handling structure, lithographic apparatus and device manufacturing method
NL2006243A (en) * 2010-03-19 2011-09-20 Asml Netherlands Bv A lithographic apparatus, an illumination system, a projection system and a method of manufacturing a device using a lithographic apparatus.
JP5241862B2 (ja) 2011-01-01 2013-07-17 キヤノン株式会社 露光装置及びデバイスの製造方法
NL2008954A (en) 2011-07-08 2013-01-09 Asml Netherlands Bv Lithographic apparatus and device manufacturing method.
US9625835B2 (en) 2011-11-17 2017-04-18 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP6169114B2 (ja) 2012-03-14 2017-07-26 エーエスエムエル ネザーランズ ビー．ブイ． リソグラフィ装置
US9513568B2 (en) 2012-07-06 2016-12-06 Asml Netherlands B.V. Lithographic apparatus
NL2012291A (en) 2013-02-20 2014-08-21 Asml Netherlands Bv Gas flow optimization in reticle stage environment.
US9488924B2 (en) 2014-01-07 2016-11-08 Applied Materials Israel Ltd. Cleaning an object within a non-vacuumed environment
JP6400827B2 (ja) * 2014-07-16 2018-10-03 エーエスエムエル ネザーランズ ビー．ブイ． リソグラフィ装置およびデバイス製造方法
KR102592761B1 (ko) * 2015-04-21 2023-10-24 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치
US10453734B2 (en) 2015-07-02 2019-10-22 Asml Netherlands B.V. Substrate holder, a lithographic apparatus and method of manufacturing devices
US10168626B2 (en) 2016-06-17 2019-01-01 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus and a method of forming a particle shield
US11397385B2 (en) 2016-06-17 2022-07-26 Taiwan Semiconductor Manufacturing Company, Ltd Apparatus and a method of forming a particle shield
US10788764B2 (en) 2016-06-17 2020-09-29 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus and a method of forming a particle shield
CN107783283B (zh) * 2016-08-30 2020-01-24 上海微电子装备（集团）股份有限公司 镜片防污染装置及方法
KR102455352B1 (ko) * 2016-09-02 2022-10-18 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치
CN109283797B (zh) * 2017-07-21 2021-04-30 上海微电子装备（集团）股份有限公司 物镜保护装置、物镜系统以及光刻设备
CN113333234A (zh) * 2020-03-03 2021-09-03 伊利诺斯工具制品有限公司 分配装置

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JP2000357643A (ja) 1999-06-14 2000-12-26 Canon Inc 露光方法及びそれを用いた露光装置
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US6933513B2 (en) 1999-11-05 2005-08-23 Asml Netherlands B.V. Gas flushing system for use in lithographic apparatus
TW563002B (en) 1999-11-05 2003-11-21 Asml Netherlands Bv Lithographic projection apparatus, method of manufacturing a device using a lithographic projection apparatus, and device manufactured by the method
EP1098226A3 (de) 1999-11-05 2002-01-09 Asm Lithography B.V. Lithographischer Apparat mit Spülgassystem
JP2001250759A (ja) 2000-03-06 2001-09-14 Canon Inc 露光装置
JP2001284224A (ja) 2000-03-30 2001-10-12 Nikon Corp 露光装置及び露光方法
JP3869999B2 (ja) 2000-03-30 2007-01-17 キヤノン株式会社 露光装置および半導体デバイス製造方法
JP3531914B2 (ja) 2000-04-14 2004-05-31 キヤノン株式会社 光学装置、露光装置及びデバイス製造方法
JP4503906B2 (ja) 2000-05-03 2010-07-14 エーエスエムエル ホールディング エヌ．ブイ． パージガスを用いた非接触型シール
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JP4560182B2 (ja) 2000-07-06 2010-10-13 キヤノン株式会社 減圧処理装置、半導体製造装置およびデバイス製造方法
JP2002198277A (ja) 2000-12-22 2002-07-12 Canon Inc 補正装置、露光装置、デバイス製造方法及びデバイス
US6954255B2 (en) 2001-06-15 2005-10-11 Canon Kabushiki Kaisha Exposure apparatus
JP2002373852A (ja) 2001-06-15 2002-12-26 Canon Inc 露光装置

Also Published As

Publication number Publication date
EP1326139A2 (de) 2003-07-09
US7738076B2 (en) 2010-06-15
EP1326139B1 (de) 2010-03-31
EP1326139A3 (de) 2004-10-13
US20050213063A1 (en) 2005-09-29
US20060274292A1 (en) 2006-12-07
DE60331874D1 (de) 2010-05-12
US20030169407A1 (en) 2003-09-11
US6934003B2 (en) 2005-08-23
US7123343B2 (en) 2006-10-17

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties