ATE462198T1 - Zusammensetzung zur reinigung nach einer chemisch-mechanischen planarisierung - Google Patents
Zusammensetzung zur reinigung nach einer chemisch-mechanischen planarisierungInfo
- Publication number
- ATE462198T1 ATE462198T1 AT01942043T AT01942043T ATE462198T1 AT E462198 T1 ATE462198 T1 AT E462198T1 AT 01942043 T AT01942043 T AT 01942043T AT 01942043 T AT01942043 T AT 01942043T AT E462198 T1 ATE462198 T1 AT E462198T1
- Authority
- AT
- Austria
- Prior art keywords
- cleaning
- cleaning solution
- chemical
- composition
- mechanical planarization
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/20—Cleaning during device manufacture
- H10P70/23—Cleaning during device manufacture during, before or after processing of insulating materials
- H10P70/234—Cleaning during device manufacture during, before or after processing of insulating materials the processing being the formation of vias or contact holes
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D1/00—Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
- C11D1/38—Cationic compounds
- C11D1/62—Quaternary ammonium compounds
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/0005—Other compounding ingredients characterised by their effect
- C11D3/0073—Anticorrosion compositions
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/26—Organic compounds containing nitrogen
- C11D3/28—Heterocyclic compounds containing nitrogen in the ring
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/26—Organic compounds containing nitrogen
- C11D3/30—Amines; Substituted amines ; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/26—Organic compounds containing oxygen
- C11D7/265—Carboxylic acids or salts thereof
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3209—Amines or imines with one to four nitrogen atoms; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3218—Alkanolamines or alkanolimines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3245—Aminoacids
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3254—Esters or carbonates thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
- G03F7/422—Stripping or agents therefor using liquids only
- G03F7/425—Stripping or agents therefor using liquids only containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/20—Cleaning during device manufacture
- H10P70/27—Cleaning during device manufacture during, before or after processing of conductive materials, e.g. polysilicon or amorphous silicon layers
- H10P70/277—Cleaning during device manufacture during, before or after processing of conductive materials, e.g. polysilicon or amorphous silicon layers the processing being a planarisation of conductive layers
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Emergency Medicine (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/587,883 US6492308B1 (en) | 1999-11-16 | 2000-06-06 | Post chemical-mechanical planarization (CMP) cleaning composition |
| PCT/US2001/018402 WO2001095381A2 (en) | 2000-06-06 | 2001-06-06 | Post chemical-mechanical planarization (cmp) cleaning composition |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE462198T1 true ATE462198T1 (de) | 2010-04-15 |
Family
ID=24351570
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT01942043T ATE462198T1 (de) | 2000-06-06 | 2001-06-06 | Zusammensetzung zur reinigung nach einer chemisch-mechanischen planarisierung |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6492308B1 (https=) |
| EP (1) | EP1287550B1 (https=) |
| JP (1) | JP4942275B2 (https=) |
| KR (2) | KR100831180B1 (https=) |
| CN (1) | CN1205655C (https=) |
| AT (1) | ATE462198T1 (https=) |
| DE (1) | DE60141629D1 (https=) |
| TW (1) | TW574369B (https=) |
| WO (1) | WO2001095381A2 (https=) |
Families Citing this family (85)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6723691B2 (en) * | 1999-11-16 | 2004-04-20 | Advanced Technology Materials, Inc. | Post chemical-mechanical planarization (CMP) cleaning composition |
| KR20030007969A (ko) * | 2000-06-16 | 2003-01-23 | 카오카부시키가이샤 | 세정제 조성물 |
| US6627587B2 (en) * | 2001-04-19 | 2003-09-30 | Esc Inc. | Cleaning compositions |
| US6653265B2 (en) * | 2001-06-20 | 2003-11-25 | Cornell Research Foundation, Inc. | Removable marking system |
| US20030119692A1 (en) * | 2001-12-07 | 2003-06-26 | So Joseph K. | Copper polishing cleaning solution |
| US20030138737A1 (en) | 2001-12-27 | 2003-07-24 | Kazumasa Wakiya | Photoresist stripping solution and a method of stripping photoresists using the same |
| CN1639846A (zh) * | 2002-01-28 | 2005-07-13 | 三菱化学株式会社 | 半导体器件用基板的清洗液及清洗方法 |
| US8003587B2 (en) * | 2002-06-06 | 2011-08-23 | Ekc Technology, Inc. | Semiconductor process residue removal composition and process |
| TWI264620B (en) * | 2003-03-07 | 2006-10-21 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| US7306663B2 (en) * | 2003-08-05 | 2007-12-11 | Halox, Division Of Hammond Group, Inc. | Corrosion inhibitor |
| JP2005075924A (ja) * | 2003-08-29 | 2005-03-24 | Neos Co Ltd | シリカスケール除去剤 |
| WO2005066325A2 (en) * | 2003-12-31 | 2005-07-21 | Ekc Technology, Inc. | Cleaner compositions containing free radical quenchers |
| US20070251154A1 (en) * | 2004-02-04 | 2007-11-01 | Lombardi John L | Lapping Composition and Method Using Same |
| KR100795364B1 (ko) * | 2004-02-10 | 2008-01-17 | 삼성전자주식회사 | 반도체 기판용 세정액 조성물, 이를 이용한 세정 방법 및도전성 구조물의 제조 방법 |
| US7498295B2 (en) | 2004-02-12 | 2009-03-03 | Air Liquide Electronics U.S. Lp | Alkaline chemistry for post-CMP cleaning comprising tetra alkyl ammonium hydroxide |
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| US7087564B2 (en) * | 2004-03-05 | 2006-08-08 | Air Liquide America, L.P. | Acidic chemistry for post-CMP cleaning |
| US7253111B2 (en) | 2004-04-21 | 2007-08-07 | Rohm And Haas Electronic Materials Cmp Holding, Inc. | Barrier polishing solution |
| KR20050110470A (ko) * | 2004-05-19 | 2005-11-23 | 테크노세미켐 주식회사 | 반도체 기판용 세정액 조성물, 이를 이용한 반도체 기판세정방법 및 반도체 장치 제조 방법 |
| CN1300377C (zh) * | 2004-11-25 | 2007-02-14 | 长沙艾森设备维护技术有限公司 | 飞机清洗剂 |
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| US11127587B2 (en) | 2014-02-05 | 2021-09-21 | Entegris, Inc. | Non-amine post-CMP compositions and method of use |
| CN106661518B (zh) * | 2014-07-18 | 2020-01-14 | 嘉柏微电子材料股份公司 | 在cmp后使用的清洁组合物及其相关方法 |
| KR102183400B1 (ko) * | 2015-06-23 | 2020-11-26 | 주식회사 이엔에프테크놀로지 | 세정액 조성물 |
| US10832917B2 (en) * | 2017-06-09 | 2020-11-10 | International Business Machines Corporation | Low oxygen cleaning for CMP equipment |
| KR102230869B1 (ko) | 2017-09-14 | 2021-03-23 | 주식회사 이엔에프테크놀로지 | 세정액 조성물 |
| KR102242969B1 (ko) | 2018-03-06 | 2021-04-22 | 주식회사 이엔에프테크놀로지 | 반도체 기판용 세정액 조성물 |
| JP7276343B2 (ja) | 2018-08-30 | 2023-05-18 | 三菱ケミカル株式会社 | 洗浄液、洗浄方法及び半導体ウェハの製造方法 |
| JP7192461B2 (ja) * | 2018-12-11 | 2022-12-20 | 三菱ケミカル株式会社 | 洗浄液、洗浄方法及び半導体ウェハの製造方法 |
| KR20240002608A (ko) | 2022-06-29 | 2024-01-05 | 삼성전자주식회사 | 기판 세정 장비 |
| CN117946812A (zh) * | 2022-10-18 | 2024-04-30 | 安集微电子科技(上海)股份有限公司 | 一种清洗组合物 |
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| JPH08502367A (ja) | 1992-09-28 | 1996-03-12 | デユコーア・エル・ピー | N,n−ジメチル−ビス(2−ヒドロキシエチル)第4アンモニウムヒドロオキサイドを使用するフォトレジストの剥離方法 |
| DE4317792A1 (de) * | 1993-05-28 | 1994-12-01 | Herberts Gmbh | Emulgatorfreies Überzugsmittel, dessen Herstellung und Verwendung |
| JP3302120B2 (ja) | 1993-07-08 | 2002-07-15 | 関東化学株式会社 | レジスト用剥離液 |
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| TW274630B (https=) * | 1994-01-28 | 1996-04-21 | Wako Zunyaku Kogyo Kk | |
| US5466389A (en) * | 1994-04-20 | 1995-11-14 | J. T. Baker Inc. | PH adjusted nonionic surfactant-containing alkaline cleaner composition for cleaning microelectronics substrates |
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| US6465403B1 (en) * | 1998-05-18 | 2002-10-15 | David C. Skee | Silicate-containing alkaline compositions for cleaning microelectronic substrates |
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| US6194366B1 (en) * | 1999-11-16 | 2001-02-27 | Esc, Inc. | Post chemical-mechanical planarization (CMP) cleaning composition |
| US6475966B1 (en) | 2000-02-25 | 2002-11-05 | Shipley Company, L.L.C. | Plasma etching residue removal |
-
2000
- 2000-06-06 US US09/587,883 patent/US6492308B1/en not_active Expired - Lifetime
-
2001
- 2001-06-06 WO PCT/US2001/018402 patent/WO2001095381A2/en not_active Ceased
- 2001-06-06 KR KR1020027016692A patent/KR100831180B1/ko not_active Expired - Lifetime
- 2001-06-06 EP EP01942043A patent/EP1287550B1/en not_active Expired - Lifetime
- 2001-06-06 DE DE60141629T patent/DE60141629D1/de not_active Expired - Lifetime
- 2001-06-06 JP JP2002502824A patent/JP4942275B2/ja not_active Expired - Fee Related
- 2001-06-06 CN CNB018107230A patent/CN1205655C/zh not_active Expired - Lifetime
- 2001-06-06 KR KR1020077026381A patent/KR100831182B1/ko not_active Expired - Lifetime
- 2001-06-06 AT AT01942043T patent/ATE462198T1/de not_active IP Right Cessation
- 2001-10-15 TW TW90125393A patent/TW574369B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| WO2001095381A2 (en) | 2001-12-13 |
| EP1287550A2 (en) | 2003-03-05 |
| WO2001095381A3 (en) | 2002-05-23 |
| CN1433567A (zh) | 2003-07-30 |
| KR100831182B1 (ko) | 2008-05-22 |
| JP2003536258A (ja) | 2003-12-02 |
| TW574369B (en) | 2004-02-01 |
| JP4942275B2 (ja) | 2012-05-30 |
| CN1205655C (zh) | 2005-06-08 |
| DE60141629D1 (de) | 2010-05-06 |
| US6492308B1 (en) | 2002-12-10 |
| EP1287550B1 (en) | 2010-03-24 |
| KR100831180B1 (ko) | 2008-05-21 |
| KR20070114326A (ko) | 2007-11-30 |
| KR20030025238A (ko) | 2003-03-28 |
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| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |