ATE459097T1 - Flüssigkeitsbehandlungsapparat - Google Patents

Flüssigkeitsbehandlungsapparat

Info

Publication number
ATE459097T1
ATE459097T1 AT01114880T AT01114880T ATE459097T1 AT E459097 T1 ATE459097 T1 AT E459097T1 AT 01114880 T AT01114880 T AT 01114880T AT 01114880 T AT01114880 T AT 01114880T AT E459097 T1 ATE459097 T1 AT E459097T1
Authority
AT
Austria
Prior art keywords
holder
substrates
substrate
posture
process chamber
Prior art date
Application number
AT01114880T
Other languages
English (en)
Inventor
Yuji Kamikawa
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2000198646A external-priority patent/JP4506916B2/ja
Priority claimed from JP2000198645A external-priority patent/JP4505563B2/ja
Priority claimed from JP2000381717A external-priority patent/JP3922881B2/ja
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Application granted granted Critical
Publication of ATE459097T1 publication Critical patent/ATE459097T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3411—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • H10P72/3412—Batch transfer of wafers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04—Apparatus for manufacture or treatment
    • H10P72/0402—Apparatus for fluid treatment
    • H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0602—Temperature monitoring
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/12—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/13—Horizontal boat type carrier whereby the substrates are vertically supported, e.g. comprising rod-shaped elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
    • H10P72/3304—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber characterised by movements or sequence of movements of transfer devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
    • H10P72/3306—Horizontal transfer of a single workpiece
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
    • H10P72/3308—Vertical transfer of a single workpiece
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
    • H10P72/3311—Horizontal transfer of a batch of workpieces
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
    • H10P72/3312—Vertical transfer of a batch of workpieces
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00—Cleaning and liquid contact with solids
    • Y10S134/902—Semiconductor wafer

Landscapes

  • Cleaning Or Drying Semiconductors (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Weting (AREA)
  • Coating Apparatus (AREA)
  • Devices And Processes Conducted In The Presence Of Fluids And Solid Particles (AREA)
AT01114880T 2000-06-30 2001-06-29 Flüssigkeitsbehandlungsapparat ATE459097T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000198646A JP4506916B2 (ja) 2000-06-30 2000-06-30 液処理装置および液処理方法
JP2000198645A JP4505563B2 (ja) 2000-06-30 2000-06-30 液処理装置
JP2000381717A JP3922881B2 (ja) 2000-12-15 2000-12-15 液処理装置

Publications (1)

Publication Number Publication Date
ATE459097T1 true ATE459097T1 (de) 2010-03-15

Family

ID=27343929

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01114880T ATE459097T1 (de) 2000-06-30 2001-06-29 Flüssigkeitsbehandlungsapparat

Country Status (7)

Country Link
US (2) US6776173B2 (de)
EP (1) EP1168421B1 (de)
KR (2) KR100797435B1 (de)
CN (1) CN1290161C (de)
AT (1) ATE459097T1 (de)
DE (1) DE60141374D1 (de)
TW (1) TW507282B (de)

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US6418945B1 (en) * 2000-07-07 2002-07-16 Semitool, Inc. Dual cassette centrifugal processor
JP3511514B2 (ja) * 2001-05-31 2004-03-29 エム・エフエスアイ株式会社 基板浄化処理装置、ディスペンサー、基板保持機構、基板の浄化処理用チャンバー、及びこれらを用いた基板の浄化処理方法
US7147661B2 (en) * 2001-12-20 2006-12-12 Boston Scientific Santa Rosa Corp. Radially expandable stent
JP4033689B2 (ja) * 2002-03-01 2008-01-16 東京エレクトロン株式会社 液処理装置および液処理方法
JP4091340B2 (ja) * 2002-05-28 2008-05-28 東京エレクトロン株式会社 基板処理装置
JP3980941B2 (ja) * 2002-06-04 2007-09-26 東京エレクトロン株式会社 基板処理装置
WO2004102646A1 (ja) * 2003-05-15 2004-11-25 Nikon Corporation 露光装置及びデバイス製造方法
JP4413562B2 (ja) * 2003-09-05 2010-02-10 東京エレクトロン株式会社 処理システム及び処理方法
JP3870182B2 (ja) * 2003-09-09 2007-01-17 キヤノン株式会社 露光装置及びデバイス製造方法
US7581551B2 (en) * 2004-09-01 2009-09-01 Sanyo Electric Co., Ltd. Cleaning apparatus
JP4486649B2 (ja) * 2004-10-28 2010-06-23 東京エレクトロン株式会社 液処理装置
US20060137726A1 (en) * 2004-12-24 2006-06-29 Dainippon Screen Mfg. Co., Ltd. Substrate treating apparatus
US20060152527A1 (en) * 2005-01-10 2006-07-13 Carl Minchew System for representing true colors with device-dependent colors on surfaces and for producing paints and coatings matching the true colors
US7754026B2 (en) * 2007-11-08 2010-07-13 Whirlpool Corporation Dishwasher with sonic cleaner
JP5437168B2 (ja) * 2009-08-07 2014-03-12 東京エレクトロン株式会社 基板の液処理装置および液処理方法
US9646859B2 (en) * 2010-04-30 2017-05-09 Applied Materials, Inc. Disk-brush cleaner module with fluid jet
JP5654807B2 (ja) * 2010-09-07 2015-01-14 東京エレクトロン株式会社 基板搬送方法及び記憶媒体
CN103715120A (zh) * 2012-10-09 2014-04-09 沈阳芯源微电子设备有限公司 一种前开式晶片盒
US9579697B2 (en) * 2012-12-06 2017-02-28 Taiwan Semiconductor Manufacturing Co., Ltd. System and method of cleaning FOUP
TWI584351B (zh) * 2013-10-08 2017-05-21 東京威力科創股份有限公司 Liquid container exchange device, container-mounted module and exchange solution of chemical liquid container, substrate processing device
US10727374B2 (en) 2015-09-04 2020-07-28 Seoul Semiconductor Co., Ltd. Transparent conductive structure and formation thereof
WO2017180823A1 (en) * 2016-04-14 2017-10-19 Seoul Semiconductor Co., Ltd. METHOD AND/OR SYSTEM FOR SYNTHESIS OF ZINC OXIDE (ZnO)
US10981800B2 (en) * 2016-04-14 2021-04-20 Seoul Semiconductor Co., Ltd. Chamber enclosure and/or wafer holder for synthesis of zinc oxide
US10981801B2 (en) * 2016-04-14 2021-04-20 Seoul Semiconductor Co., Ltd. Fluid handling system for synthesis of zinc oxide
CN107993919A (zh) * 2017-11-21 2018-05-04 长江存储科技有限责任公司 用于晶圆清洗的化学液喷淋管及清洗装置
CN111630637B (zh) * 2018-01-26 2024-10-01 东京毅力科创株式会社 基板处理装置
JP7336955B2 (ja) * 2019-10-10 2023-09-01 東京エレクトロン株式会社 基板処理システム、及び基板処理方法
KR102406721B1 (ko) * 2020-10-07 2022-06-10 에이펫(주) 기판 처리 모듈 및 이를 포함하는 장치
CN112452874A (zh) * 2020-10-29 2021-03-09 杜亮 一种具有干燥功能的连续式机械零件超声波清洗装置
JP7581091B2 (ja) 2021-03-12 2024-11-12 東京エレクトロン株式会社 基板処理装置および基板処理方法
CN113257682B (zh) * 2021-07-09 2021-10-01 深圳和美精艺半导体科技股份有限公司 一种封装基板的加工生产设备及加工方法
TWI812008B (zh) * 2022-02-15 2023-08-11 辛耘企業股份有限公司 晶圓製程裝置
CN114628291B (zh) * 2022-04-01 2025-04-11 合肥真萍电子科技有限公司 一种晶圆烘烤用石英舟结构

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Also Published As

Publication number Publication date
EP1168421B1 (de) 2010-02-24
EP1168421A3 (de) 2005-10-19
TW507282B (en) 2002-10-21
US7284560B2 (en) 2007-10-23
US6776173B2 (en) 2004-08-17
US20050103364A1 (en) 2005-05-19
DE60141374D1 (de) 2010-04-08
KR20070067057A (ko) 2007-06-27
KR100797435B1 (ko) 2008-01-24
CN1290161C (zh) 2006-12-13
US20020000240A1 (en) 2002-01-03
KR20020002237A (ko) 2002-01-09
KR100825935B1 (ko) 2008-04-29
EP1168421A2 (de) 2002-01-02
CN1334596A (zh) 2002-02-06

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