ATE431011T1 - Einen differentiellen kaskode-schalter verwendender gepulster flip-flop des d-typs - Google Patents

Einen differentiellen kaskode-schalter verwendender gepulster flip-flop des d-typs

Info

Publication number
ATE431011T1
ATE431011T1 AT01270955T AT01270955T ATE431011T1 AT E431011 T1 ATE431011 T1 AT E431011T1 AT 01270955 T AT01270955 T AT 01270955T AT 01270955 T AT01270955 T AT 01270955T AT E431011 T1 ATE431011 T1 AT E431011T1
Authority
AT
Austria
Prior art keywords
gates
clock signal
inverse
latch
cascode structure
Prior art date
Application number
AT01270955T
Other languages
English (en)
Inventor
Anand Ganesan
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE431011T1 publication Critical patent/ATE431011T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/023—Generators characterised by the type of circuit or by the means used for producing pulses by the use of differential amplifiers or comparators, with internal or external positive feedback
    • H03K3/0233—Bistable circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356104—Bistable circuits using complementary field-effect transistors
    • H03K3/356113—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit
    • H03K3/356147—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit using pass gates
    • H03K3/356156—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit using pass gates with synchronous operation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356104—Bistable circuits using complementary field-effect transistors
    • H03K3/356113—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit
    • H03K3/356121—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit with synchronous operation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/012—Modifications of generator to improve response time or to decrease power consumption

Landscapes

  • Logic Circuits (AREA)
  • Dc Digital Transmission (AREA)
  • Electronic Switches (AREA)
  • Amplifiers (AREA)
AT01270955T 2000-12-15 2001-12-05 Einen differentiellen kaskode-schalter verwendender gepulster flip-flop des d-typs ATE431011T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/738,781 US6433601B1 (en) 2000-12-15 2000-12-15 Pulsed D-Flip-Flop using differential cascode switch
PCT/IB2001/002314 WO2002049214A2 (en) 2000-12-15 2001-12-05 Pulsed d-flip-flop using differential cascode switch

Publications (1)

Publication Number Publication Date
ATE431011T1 true ATE431011T1 (de) 2009-05-15

Family

ID=24969447

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01270955T ATE431011T1 (de) 2000-12-15 2001-12-05 Einen differentiellen kaskode-schalter verwendender gepulster flip-flop des d-typs

Country Status (9)

Country Link
US (1) US6433601B1 (de)
EP (1) EP1346477B1 (de)
JP (1) JP4168326B2 (de)
KR (1) KR20020077455A (de)
CN (1) CN100521534C (de)
AT (1) ATE431011T1 (de)
DE (1) DE60138646D1 (de)
TW (1) TW576020B (de)
WO (1) WO2002049214A2 (de)

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US6686775B2 (en) * 2002-04-22 2004-02-03 Broadcom Corp Dynamic scan circuitry for B-phase
US6956421B1 (en) * 2003-07-10 2005-10-18 Intel Corporation Slave-less edge-triggered flip-flop
US6937079B1 (en) 2003-07-28 2005-08-30 University Of Louisiana At Lafayette Single-transistor-clocked flip-flop
DE602004010285T2 (de) * 2003-09-03 2008-09-25 Nxp B.V. Statisches latch
DE10343565B3 (de) * 2003-09-19 2005-03-10 Infineon Technologies Ag Master-Latchschaltung mit Signalpegelverschiebung für ein dynamisches Flip-Flop
US7164302B1 (en) * 2004-06-21 2007-01-16 Sun Microsystems, Inc. One gate delay output noise insensitive latch
US7095255B2 (en) * 2004-06-29 2006-08-22 Intel Corporation Ultra-drowsy circuit
KR100630740B1 (ko) * 2005-03-03 2006-10-02 삼성전자주식회사 스캔 기능을 갖는 고속 펄스 기반의 리텐션 플립플롭
KR100613458B1 (ko) 2005-03-29 2006-08-17 주식회사 하이닉스반도체 플립플롭
CN1741381B (zh) * 2005-09-16 2010-04-07 清华大学 高性能低时钟信号摆幅主从型d触发器
CN1744437B (zh) * 2005-09-30 2010-04-21 清华大学 高性能低功耗主从型d触发器
CN1761153B (zh) * 2005-11-04 2010-05-05 清华大学 高速低功耗主从型d触发器
US7800411B1 (en) * 2006-01-30 2010-09-21 National Semiconductor Corporation System and method for providing a strobed comparator with reduced offset and reduced charge kickback
US7855587B1 (en) 2006-06-02 2010-12-21 Marvell International Ltd. Asymmetric sense-amp flip-flop
FR2905043B1 (fr) 2006-08-16 2008-11-21 St Microelectronics Sa Circuit bistable a basculement d'etat auto-ajuste temporellement et bascule flip-flop utilisant un tel circuit bistable.
JP2008131320A (ja) * 2006-11-21 2008-06-05 Sony Corp フリップフロップ回路および表示装置
WO2009046603A1 (en) * 2007-10-10 2009-04-16 Hong Kong Applied Science And Technology Research Institute Co. Ltd. Low voltage synchronous oscillator for dc-dc converter
US7768320B1 (en) * 2007-11-20 2010-08-03 Nvidia Corporation Process variation tolerant sense amplifier flop design
US7802159B1 (en) * 2008-07-09 2010-09-21 Lsi Corporation Enhanced logic built-in self-test module and method of online system testing employing the same
TWI404335B (zh) * 2009-11-30 2013-08-01 Univ Nat Yunlin Sci & Tech Low power pulse trigger type positive and negative
KR101736437B1 (ko) * 2010-12-02 2017-05-17 삼성전자주식회사 플립플롭 회로
US8436668B2 (en) * 2011-01-04 2013-05-07 Oracle International Corporation Min-time hardended pulse flop
US8618856B1 (en) 2011-03-31 2013-12-31 Applied Micro Circuits Corporation Shadow latch
US8497721B1 (en) 2011-06-15 2013-07-30 Applied Micro Circuits Corporation Pass gate shadow latch
US10469062B2 (en) * 2011-05-03 2019-11-05 Aeroflex Colorado Springs Inc. Circuit and method for reducing the propagation of single event transient effects
KR101928271B1 (ko) 2012-03-16 2018-12-13 삼성전자 주식회사 스캔 플립-플롭, 이의 동작 방법, 및 이를 포함하는 데이터 처리 장치들
US9473123B2 (en) 2012-03-16 2016-10-18 Samsung Electronics Co., Ltd. Semiconductor circuit and method of operating the circuit
TWI524670B (zh) 2013-04-17 2016-03-01 原相科技股份有限公司 高精度之電容式開關
US9176636B1 (en) 2014-10-22 2015-11-03 Cypress Semiconductor Corporation Low power capacitive sensor button
US9692419B2 (en) * 2014-11-15 2017-06-27 Wave Computing, Inc. Compact logic evaluation gates using null convention
US9537489B1 (en) * 2016-04-21 2017-01-03 Novatek Microelectronics Corp. Level shifter with dynamic bias technique under overstress voltage
CN107707221A (zh) * 2016-08-08 2018-02-16 中芯国际集成电路制造（天津）有限公司 D触发器及其控制方法
KR102596875B1 (ko) * 2016-11-23 2023-11-01 삼성전자주식회사 플립 플롭
CN108540110A (zh) * 2017-03-01 2018-09-14 中芯国际集成电路制造(上海)有限公司 D触发器
US10361686B2 (en) * 2017-06-27 2019-07-23 Mediatek Inc. Scan output flip-flops
KR102174586B1 (ko) * 2019-07-09 2020-11-05 충북대학교 산학협력단 단방향 및 양방향 서머미터 코드 래치

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Also Published As

Publication number Publication date
CN100521534C (zh) 2009-07-29
JP4168326B2 (ja) 2008-10-22
JP2004516704A (ja) 2004-06-03
WO2002049214A3 (en) 2002-08-29
DE60138646D1 (de) 2009-06-18
US20020075053A1 (en) 2002-06-20
EP1346477A2 (de) 2003-09-24
WO2002049214A2 (en) 2002-06-20
US6433601B1 (en) 2002-08-13
CN1439196A (zh) 2003-08-27
KR20020077455A (ko) 2002-10-11
EP1346477B1 (de) 2009-05-06
TW576020B (en) 2004-02-11

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